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G01J5/38
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Parent Industries
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
G01J5/00
Radiation pyrometry
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G01J5/38
using extension or expansion of solids or fluids
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Patents Grants
last 30 patents
Information
Patent Grant
Infrared sensor structure
Patent number
11,378,459
Issue date
Jul 5, 2022
Shanghai IC R&D Center Co., Ltd.
Xiaoxu Kang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Infrared detector pixel structure and manufactureing method thereof
Patent number
10,816,406
Issue date
Oct 27, 2020
Shanghai IC R&D Center Co., Ltd.
Xiaoxu Kang
G01 - MEASURING TESTING
Information
Patent Grant
Visible light absorption element, and temperature visualization dev...
Patent number
10,775,243
Issue date
Sep 15, 2020
Riken
Takuo Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
Light sensor with a photoresistive element having a comb structure
Patent number
8,912,478
Issue date
Dec 16, 2014
NXP, B.V.
David Tio Castro
G01 - MEASURING TESTING
Information
Patent Grant
Imaging detector array with optical readout
Patent number
8,624,187
Issue date
Jan 7, 2014
Hakan Urey
G01 - MEASURING TESTING
Information
Patent Grant
Infrared sensors, focal plane arrays and thermal imaging systems wi...
Patent number
8,357,901
Issue date
Jan 22, 2013
Shanghai Juge Electronics Technologies Co. Ltd.
Chongfei Shen
G01 - MEASURING TESTING
Information
Patent Grant
Systems for image acquisition
Patent number
8,309,899
Issue date
Nov 13, 2012
Science Research Laboratory, Inc.
Shrenik Deliwala
G01 - MEASURING TESTING
Information
Patent Grant
Systems for image acquisition
Patent number
8,153,948
Issue date
Apr 10, 2012
Science Research Laboratory, Inc.
Shrenik Deliwala
G01 - MEASURING TESTING
Information
Patent Grant
Infrared sensors, focal plane arrays and thermal imaging systems
Patent number
8,143,577
Issue date
Mar 27, 2012
Shanghai Juge Electronics Technologies Co. Ltd.
Chongfei Shen
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for measuring multiple Fabry-Perot gaps
Patent number
8,115,937
Issue date
Feb 14, 2012
Davidson Instruments
David B. Needham
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for image acquisition
Patent number
7,767,951
Issue date
Aug 3, 2010
Science Research Laboratory, Inc.
Shrenik Deliwala
G01 - MEASURING TESTING
Information
Patent Grant
Detector arrangement for electromagnetic radiation and method for m...
Patent number
7,737,403
Issue date
Jun 15, 2010
Noveltech Solutions Ltd.
Jyrki Kauppinen
G01 - MEASURING TESTING
Information
Patent Grant
Mechanical amplification of small dimensional changes using bowing
Patent number
7,707,896
Issue date
May 4, 2010
James A. Kuzdrall
G01 - MEASURING TESTING
Information
Patent Grant
Infrared sensor systems and devices
Patent number
7,547,886
Issue date
Jun 16, 2009
The Regents of the University of California
Michael Mueller
G01 - MEASURING TESTING
Information
Patent Grant
System and methods for image acquisition
Patent number
7,491,922
Issue date
Feb 17, 2009
Science Research Laboratory, Inc.
Shrenik Deliwala
G01 - MEASURING TESTING
Information
Patent Grant
High temperature, minimally invasive optical sensing modules
Patent number
7,327,472
Issue date
Feb 5, 2008
Nusensors, Inc.
Nabeel Agha Riza
G01 - MEASURING TESTING
Information
Patent Grant
Device for inline measurement laser pulses and measuring method by...
Patent number
6,937,340
Issue date
Aug 30, 2005
Commissariat a l'Energie Atomique
Danièle Roudil
G01 - MEASURING TESTING
Information
Patent Grant
Radiation detectors including thermal-type displaceable element wit...
Patent number
6,469,301
Issue date
Oct 22, 2002
Nikon Corporation
Junji Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Luminous intensity sensor element and light beam modulating method...
Patent number
6,414,782
Issue date
Jul 2, 2002
European Atomic Energy Community (EURATOM)
Maurice Whelan
G02 - OPTICS
Information
Patent Grant
Optical frequency and temperature sensor system
Patent number
6,243,506
Issue date
Jun 5, 2001
National Science Council
Jing-shown Wu
G01 - MEASURING TESTING
Information
Patent Grant
Uncooled background limited detector and method
Patent number
6,166,381
Issue date
Dec 26, 2000
Ail Systems, Inc.
Richard C. Augeri
G01 - MEASURING TESTING
Information
Patent Grant
Far infrared thermal imaging system
Patent number
6,124,593
Issue date
Sep 26, 2000
The United States of America as represented by the Secretary of the Army
Vincent T. Bly
G02 - OPTICS
Information
Patent Grant
Optically readable radiation-displacement-conversion devices and me...
Patent number
6,080,988
Issue date
Jun 27, 2000
Nikon Corporation
Tohru Ishizuya
G02 - OPTICS
Information
Patent Grant
Uncooled background limited detector and method
Patent number
5,811,807
Issue date
Sep 22, 1998
Ail Systems, Inc.
Richard C. Augeri
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor wafer temperature determination by optical measuremen...
Patent number
5,350,899
Issue date
Sep 27, 1994
Hiroichi Ishikawa
G01 - MEASURING TESTING
Information
Patent Grant
Radiation detectors having mechanical resonation
Patent number
4,806,760
Issue date
Feb 21, 1989
The General Electric Company p.l.c.
Stuart M. McGlade
G01 - MEASURING TESTING
Information
Patent Grant
System for measuring the radiation power of power-modulated transmi...
Patent number
4,344,172
Issue date
Aug 10, 1982
Gerhard Busse
G01 - MEASURING TESTING
Information
Patent Grant
Radiometer probe
Patent number
3,942,891
Issue date
Mar 9, 1976
Barnes Engineering Company
Seymour C. Spielberger
G01 - MEASURING TESTING
Information
Patent Grant
3568693
Patent number
3,568,693
Issue date
Mar 9, 1971
F15 - FLUID-PRESSURE ACTUATORS HYDRAULICS OR PNEUMATICS IN GENERAL
Information
Patent Grant
3526865
Patent number
3,526,865
Issue date
Sep 1, 1970
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
INFRARED SENSOR STRUCTURE
Publication number
20210055163
Publication date
Feb 25, 2021
SHANGHAI IC R&D CEBTER CO., LTD.
Xiaoxu KANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INFRARED DETECTOR PIXEL STRUCTURE AND MANUFACTUREING METHOD THEREOF
Publication number
20190145830
Publication date
May 16, 2019
Shanghai IC R&D Center Co., Ltd.
Xiaoxu Kang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Terahertz-Wave Detection Element, Manufacturing Method Therefor, an...
Publication number
20150192474
Publication date
Jul 9, 2015
NGK INSULATORS, LTD
Jungo Kondo
B32 - LAYERED PRODUCTS
Information
Patent Application
Ultra Broad Spectral Band Detection
Publication number
20120217399
Publication date
Aug 30, 2012
Araz Yacoubian
G01 - MEASURING TESTING
Information
Patent Application
INFRARED SENSORS, FOCAL PLANE ARRAYS AND THERMAL IMAGING SYSTEMS
Publication number
20120138797
Publication date
Jun 7, 2012
Chongfei SHEN
G01 - MEASURING TESTING
Information
Patent Application
LIGHT SENSOR
Publication number
20110303829
Publication date
Dec 15, 2011
NXP B.V.
David Tio Castro
G01 - MEASURING TESTING
Information
Patent Application
MEMS-BASED FTIR SPECTROMETER
Publication number
20110139990
Publication date
Jun 16, 2011
University of Florida Research Foundation, Inc.
Huikai Xie
G02 - OPTICS
Information
Patent Application
INFRARED SENSORS, FOCAL PLANE ARRAYS AND THERMAL IMAGING SYSTEMS
Publication number
20100193706
Publication date
Aug 5, 2010
Chongfei Shen
G01 - MEASURING TESTING
Information
Patent Application
Mechanical Amplification of Small Dimensional Changes Using Bowing
Publication number
20090178488
Publication date
Jul 16, 2009
James A. Kuzdrall
G05 - CONTROLLING REGULATING
Information
Patent Application
Detector Arrangement for Electromagnetic Radiation and Method for M...
Publication number
20090072147
Publication date
Mar 19, 2009
Noveltech Solutions Ltd.
Jyrki Kauppinen
G01 - MEASURING TESTING
Information
Patent Application
Methods and apparatus for measuring multiple fabry-perot gaps
Publication number
20080043245
Publication date
Feb 21, 2008
David B. Needham
G01 - MEASURING TESTING
Information
Patent Application
Infrared sensor systems and devices
Publication number
20070108384
Publication date
May 17, 2007
Michael Mueller
G01 - MEASURING TESTING
Information
Patent Application
Imaging Detector Array with Optical Readout
Publication number
20070045541
Publication date
Mar 1, 2007
Hakan Urey
G01 - MEASURING TESTING
Information
Patent Application
High temperature, minimally invasive optical sensing modules
Publication number
20060017932
Publication date
Jan 26, 2006
Nabeel Agha Riza
G01 - MEASURING TESTING
Information
Patent Application
Device for inline measurement laser pulses and measuring method by...
Publication number
20030188581
Publication date
Oct 9, 2003
Daniele Roudil
G01 - MEASURING TESTING