using far infra-red light using Terahertz radiation

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CPC
G01N21/3581

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/3581using far infra-red light using Terahertz radiation

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Methods for generating and controlling terahertz radiation
- Patent number 12,326,620
- Issue date Jun 10, 2025
- Ramot at Tel Aviv University Ltd.
- Tal Ellenbogen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Biomolecule detection method, computing device performing the metho...
- Patent number 12,313,538
- Issue date May 27, 2025
- Electronics and Telecommunications Research Institute
- Won Kyoung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz asymmetric S-shaped complementary metasurface biosensor f...
- Patent number 12,313,539
- Issue date May 27, 2025
- Imam Abdulrahman Bin Faisal University
- Ibraheem Al-Naib
- G01 - MEASURING TESTING
Information Patent Grant
Imaging apparatus including sub-terahertz wave reflective member
- Patent number 12,306,292
- Issue date May 20, 2025
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Kazuhiro Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring coating thickness
- Patent number 12,298,118
- Issue date May 13, 2025
- TeraView Limited
- Ian Stephen Gregory
- G01 - MEASURING TESTING
Information Patent Grant
Multi-waveband-tunable multi-scale meta-material and preparation me...
- Patent number 12,292,377
- Issue date May 6, 2025
- Zhejiang University
- Lijuan Xie
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device
- Patent number 12,287,286
- Issue date Apr 29, 2025
- Mitsubishi Heavy Industries, Ltd.
- Syusaku Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz modulator and terahertz spatial light modulator
- Patent number 12,282,213
- Issue date Apr 22, 2025
- National Tsing Hua University
- Ho-Hsiu Chou
- G01 - MEASURING TESTING
Information Patent Grant
Ultra-spectrally selective terahertz band stop reflector
- Patent number 12,276,606
- Issue date Apr 15, 2025
- University of Central Florida Research Foundation, Inc.
- Anthony C. Terracciano
- G01 - MEASURING TESTING
Information Patent Grant
Imaging device
- Patent number 12,279,026
- Issue date Apr 15, 2025
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Kazuhiro Yamada
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
THz measuring device and THz measurement method for measuring test...
- Patent number 12,265,022
- Issue date Apr 1, 2025
- CiTEX Holding GmbH
- Ralph Klose
- G01 - MEASURING TESTING
Information Patent Grant
Imaging device
- Patent number 12,259,320
- Issue date Mar 25, 2025
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yosuke Asai
- G01 - MEASURING TESTING
Information Patent Grant
High frequency detection method and apparatus
- Patent number 12,253,464
- Issue date Mar 18, 2025
- Thruvision Limited
- Christopher Mark Mann
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz imaging system with evanescent-wave coupling
- Patent number 12,256,133
- Issue date Mar 18, 2025
- Institut National D'Optique
- Michel Doucet
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and device for simulating a solar spectrum
- Patent number 12,247,918
- Issue date Mar 11, 2025
- USA as Represented by the Secretary of the Army
- Hajin Kim
- G01 - MEASURING TESTING
Information Patent Grant
Optical scanning
- Patent number 12,228,505
- Issue date Feb 18, 2025
- TOPTICA Photonics AG
- Thomas A. Puppe
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating a THz measuring apparatus, THz measuring met...
- Patent number 12,216,050
- Issue date Feb 4, 2025
- CiTEX Holding GmbH
- Roland Böhm
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and method of inspecting wafer
- Patent number 12,196,669
- Issue date Jan 14, 2025
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- G01 - MEASURING TESTING
Information Patent Grant
Far-infrared spectroscopy device
- Patent number 12,196,670
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Touya Ono
- G01 - MEASURING TESTING
Information Patent Grant
Method and a system for detecting features of a water layer between...
- Patent number 12,196,643
- Issue date Jan 14, 2025
- Fameccanica.Data S.p.A.
- Anselmo Cicchitti
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus comprising at least one THz device and method of operatin...
- Patent number 12,188,859
- Issue date Jan 7, 2025
- HELMUT FISCHER GMBH INSTITUT FÜR ELEKRONIK UND MESSTECHNIK
- Rüdiger Mästle
- G01 - MEASURING TESTING
Information Patent Grant
Contactless measurement of rock wettability by photonic techniques
- Patent number 12,181,406
- Issue date Dec 31, 2024
- Saudi Arabian Oil Company
- Adrian Cesar Cavazos Sepulveda
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for controlling a production system for planar or...
- Patent number 12,157,263
- Issue date Dec 3, 2024
- Sikora AG
- Harald Sikora
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Method and apparatus for imaging a biological sample by total inter...
- Patent number 12,152,985
- Issue date Nov 26, 2024
- Qinetiq Limited
- Christopher Robert Lawrence
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz radiator based on coherent SPR amplified by stimulation
- Patent number 12,149,041
- Issue date Nov 19, 2024
- Tsinghua University
- Fang Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring device and method of operating a measuring device
- Patent number 12,146,733
- Issue date Nov 19, 2024
- Helmut Fischer GmbH Institut für Elektronik und Messtechnik
- Rüdiger Mästle
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz sensing system and terahertz sensing array
- Patent number 12,140,537
- Issue date Nov 12, 2024
- Huawei Technologies Co., Ltd.
- Oupeng Li
- G01 - MEASURING TESTING
Information Patent Grant
Method of imaging a sample material
- Patent number 12,135,282
- Issue date Nov 5, 2024
- The University of Western Australia
- Vincent Patrick Wallace
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Cooperative polarization skylight background radiation measurement...
- Patent number 12,135,277
- Issue date Nov 5, 2024
- Hefei Institutes of Physical Science, CAS
- Congming Dai
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Permittivity measuring device and thickness measuring device
- Patent number 12,117,285
- Issue date Oct 15, 2024
- Nippon Telegraph and Telephone Corporation
- Masaki Nakamori
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RADIATION EMITTER AND MEASUREMENT SYSTEM
- Publication number 20250189444
- Publication date Jun 12, 2025
- Industrial Technology Research Institute
- Karthickraj Muthuramalingam
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ SIGNAL-BASED IMAGE COLLECTION METHOD AND IMAGE COLLECTION...
- Publication number 20250189445
- Publication date Jun 12, 2025
- TSINGHUA UNIVERSITY
- Ziran ZHAO
- G01 - MEASURING TESTING
Information Patent Application
HIGH FREQUENCY DETECTION METHOD AND APPARATUS
- Publication number 20250155369
- Publication date May 15, 2025
- Thruvision Limited
- Christopher Mark MANN
- G01 - MEASURING TESTING
Information Patent Application
PROCESS MONITORING METHOD AND DEVICE
- Publication number 20250155379
- Publication date May 15, 2025
- UNIVERSITY-INDUSTRY FOUNDATION(UIF), YONSEI UNIVERSITY
- Mann Ho CHO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEMBER, OPTICAL ELEMENT AND METHOD FOR PRODUCING OPTICAL ME...
- Publication number 20250102429
- Publication date Mar 27, 2025
- Hamamatsu Photonics K.K.
- Kouichiro AKIYAMA
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ WAVE DETECTION DEVICE AND TERAHERTZ WAVE DETECTION METHOD
- Publication number 20250079805
- Publication date Mar 6, 2025
- HAMAMATSU PHOTONICS K. K.
- Hisanari TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TERAHERTZ RADIATION DETECTORS BASED ON THIN FILMS OF NON-CENTROSYMM...
- Publication number 20250052676
- Publication date Feb 13, 2025
- Wisconsin Alumni Research Foundation
- Jun Xiao
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
- Publication number 20250020588
- Publication date Jan 16, 2025
- Yokogawa Electric Corporation
- Syuhei Okada
- G01 - MEASURING TESTING
Information Patent Application
IMAGING APPARATUS
- Publication number 20250012918
- Publication date Jan 9, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- Shunsuke TOMOMATSU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR SIMULATING A SOLAR SPECTRUM
- Publication number 20240418643
- Publication date Dec 19, 2024
- United States of America, as Represented by the Secretary of the Army (U.S. A...
- Hajin Kim
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DETERMINING AT LEAST ONE PROPERTY OF AT LEAST...
- Publication number 20240418640
- Publication date Dec 19, 2024
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Ruediger Maestle
- G01 - MEASURING TESTING
Information Patent Application
CRYSTAL FORM DETERMINATION METHOD
- Publication number 20240418641
- Publication date Dec 19, 2024
- Hamamatsu Photonics K.K.
- Kazuhiro TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
MONOLITHIC MULTI-WAVELENGTH OPTICAL DEVICES
- Publication number 20240405148
- Publication date Dec 5, 2024
- Analog Devices, Inc.
- Ryan M. IUTZI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BIOMETRIC INFORMATION ACQUISITION DEVICE
- Publication number 20240404696
- Publication date Dec 5, 2024
- SEIKO EPSON CORPORATION
- Satoshi SHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
ULTRA-WIDEBAND TERAHERTZ IMAGING SYSTEM AND IMAGING METHOD
- Publication number 20240393238
- Publication date Nov 28, 2024
- Shenzhen Technology University
- Lulu WANG
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
MEASURING DEVICE AND METHOD FOR MEASURING A GEOMETRIC PARAMETER OF...
- Publication number 20240377320
- Publication date Nov 14, 2024
- Sikora AG
- Christian Frank
- G01 - MEASURING TESTING
Information Patent Application
DEVICE, SYSTEM AND METHOD FOR DETERMINING DEGRADATION
- Publication number 20240369355
- Publication date Nov 7, 2024
- Nippon Telegraph and Telephone Corporation
- Masaki NAKAMORI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DETERMINING THE REFRACTIVE INDEX OF A SURFACE...
- Publication number 20240369480
- Publication date Nov 7, 2024
- Sikora AG
- Harald Sikora
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ ASYMMETRIC S-SHAPED COMPLEMENTARY METASURFACE BIOSENSOR F...
- Publication number 20240369477
- Publication date Nov 7, 2024
- Imam Abdulrahman Bin Faisal University
- Ibraheem AL-NAIB
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR ESTIMATING RESIDUAL STRESS IN OBJECT
- Publication number 20240344909
- Publication date Oct 17, 2024
- IIDA Co., Ltd.
- Shigeo MIYAKE
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ DETECTION DEVICE
- Publication number 20240344978
- Publication date Oct 17, 2024
- Sony Semiconductor Solutions Corporation
- MITSUNARI HOSHI
- G01 - MEASURING TESTING
Information Patent Application
ADSORPTION EVALUATION APPARATUS AND ADSORPTION EVALUATION METHOD
- Publication number 20240337597
- Publication date Oct 10, 2024
- HAMAMATSU PHOTONICS K. K.
- Takashi Yasuda
- G01 - MEASURING TESTING
Information Patent Application
CURVATURE CORRECTION
- Publication number 20240328781
- Publication date Oct 3, 2024
- TERAVIEW LIMITED
- Ian Alasdair Pentland
- G01 - MEASURING TESTING
Information Patent Application
FRUIT MATURITY AND QUALITY SCANNING
- Publication number 20240302272
- Publication date Sep 12, 2024
- Colorado State University Research Foundation
- Ioannis Minas
- G01 - MEASURING TESTING
Information Patent Application
Far-Infrared Spectroscopy Device and Sample Adapter
- Publication number 20240288365
- Publication date Aug 29, 2024
- Hitachi High-Tech Corporation
- Mizuki MOHARA
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ SIGNAL MEASURING APPARATUS AND MEASURING METHOD
- Publication number 20240230528
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Sunhong Jun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACTLESS MEASUREMENT OF ROCK WETTABILITY BY PHOTONIC TECHNIQUES
- Publication number 20240201079
- Publication date Jun 20, 2024
- Saudi Arabian Oil Company
- Adrian Cesar Cavazos Sepulveda
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS AND TESTING APPARATUS HAVING THE SAME
- Publication number 20240183777
- Publication date Jun 6, 2024
- Samsung Electronics Co., Ltd.
- Yasuhiro HIDAKA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING COATING THICKNESS
- Publication number 20240167810
- Publication date May 23, 2024
- Teraview Limited
- Ian Stephen Gregory
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ WAVE DETECTION CHIP AND TERAHERTZ WAVE DETECTION SYSTEM
- Publication number 20240151642
- Publication date May 9, 2024
- Industrial Technology Research Institute
- Yu-Tai LI
- G01 - MEASURING TESTING

using far infra-red light using Terahertz radiation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Methods for generating and controlling terahertz radiation

Biomolecule detection method, computing device performing the metho...

Terahertz asymmetric S-shaped complementary metasurface biosensor f...

Imaging apparatus including sub-terahertz wave reflective member

Method and system for measuring coating thickness

Multi-waveband-tunable multi-scale meta-material and preparation me...

Inspection device

Terahertz modulator and terahertz spatial light modulator

Ultra-spectrally selective terahertz band stop reflector

Imaging device

THz measuring device and THz measurement method for measuring test...

Imaging device

High frequency detection method and apparatus

Terahertz imaging system with evanescent-wave coupling

Method and device for simulating a solar spectrum

Optical scanning

Method for calibrating a THz measuring apparatus, THz measuring met...

Inspection apparatus and method of inspecting wafer

Far-infrared spectroscopy device

Method and a system for detecting features of a water layer between...

Apparatus comprising at least one THz device and method of operatin...

Contactless measurement of rock wettability by photonic techniques

Method and device for controlling a production system for planar or...

Method and apparatus for imaging a biological sample by total inter...

Terahertz radiator based on coherent SPR amplified by stimulation

Measuring device and method of operating a measuring device

Terahertz sensing system and terahertz sensing array

Method of imaging a sample material

Cooperative polarization skylight background radiation measurement...

Permittivity measuring device and thickness measuring device

Patents Applicationslast 30 patents

RADIATION EMITTER AND MEASUREMENT SYSTEM

TERAHERTZ SIGNAL-BASED IMAGE COLLECTION METHOD AND IMAGE COLLECTION...

HIGH FREQUENCY DETECTION METHOD AND APPARATUS

PROCESS MONITORING METHOD AND DEVICE

OPTICAL MEMBER, OPTICAL ELEMENT AND METHOD FOR PRODUCING OPTICAL ME...

TERAHERTZ WAVE DETECTION DEVICE AND TERAHERTZ WAVE DETECTION METHOD

TERAHERTZ RADIATION DETECTORS BASED ON THIN FILMS OF NON-CENTROSYMM...

MEASUREMENT APPARATUS AND MEASUREMENT METHOD

IMAGING APPARATUS

METHOD AND DEVICE FOR SIMULATING A SOLAR SPECTRUM

METHOD AND DEVICE FOR DETERMINING AT LEAST ONE PROPERTY OF AT LEAST...

CRYSTAL FORM DETERMINATION METHOD

MONOLITHIC MULTI-WAVELENGTH OPTICAL DEVICES

BIOMETRIC INFORMATION ACQUISITION DEVICE

ULTRA-WIDEBAND TERAHERTZ IMAGING SYSTEM AND IMAGING METHOD

MEASURING DEVICE AND METHOD FOR MEASURING A GEOMETRIC PARAMETER OF...

DEVICE, SYSTEM AND METHOD FOR DETERMINING DEGRADATION

METHOD AND DEVICE FOR DETERMINING THE REFRACTIVE INDEX OF A SURFACE...

TERAHERTZ ASYMMETRIC S-SHAPED COMPLEMENTARY METASURFACE BIOSENSOR F...

METHODS AND SYSTEMS FOR ESTIMATING RESIDUAL STRESS IN OBJECT

TERAHERTZ DETECTION DEVICE

ADSORPTION EVALUATION APPARATUS AND ADSORPTION EVALUATION METHOD

CURVATURE CORRECTION

FRUIT MATURITY AND QUALITY SCANNING

Far-Infrared Spectroscopy Device and Sample Adapter

TERAHERTZ SIGNAL MEASURING APPARATUS AND MEASURING METHOD

CONTACTLESS MEASUREMENT OF ROCK WETTABILITY BY PHOTONIC TECHNIQUES

MEASURING APPARATUS AND TESTING APPARATUS HAVING THE SAME

METHOD AND SYSTEM FOR MEASURING COATING THICKNESS

TERAHERTZ WAVE DETECTION CHIP AND TERAHERTZ WAVE DETECTION SYSTEM