using far infra-red light using Terahertz radiation

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G01N21/3581

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/3581using far infra-red light using Terahertz radiation

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method for calibrating a THz measuring apparatus, THz measuring met...
- Patent number 12,216,050
- Issue date Feb 4, 2025
- CiTEX Holding GmbH
- Roland Böhm
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and method of inspecting wafer
- Patent number 12,196,669
- Issue date Jan 14, 2025
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- G01 - MEASURING TESTING
Information Patent Grant
Far-infrared spectroscopy device
- Patent number 12,196,670
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Touya Ono
- G01 - MEASURING TESTING
Information Patent Grant
Method and a system for detecting features of a water layer between...
- Patent number 12,196,643
- Issue date Jan 14, 2025
- Fameccanica.Data S.p.A.
- Anselmo Cicchitti
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus comprising at least one THz device and method of operatin...
- Patent number 12,188,859
- Issue date Jan 7, 2025
- HELMUT FISCHER GMBH INSTITUT FÜR ELEKRONIK UND MESSTECHNIK
- Rüdiger Mästle
- G01 - MEASURING TESTING
Information Patent Grant
Contactless measurement of rock wettability by photonic techniques
- Patent number 12,181,406
- Issue date Dec 31, 2024
- Saudi Arabian Oil Company
- Adrian Cesar Cavazos Sepulveda
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for controlling a production system for planar or...
- Patent number 12,157,263
- Issue date Dec 3, 2024
- Sikora AG
- Harald Sikora
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Method and apparatus for imaging a biological sample by total inter...
- Patent number 12,152,985
- Issue date Nov 26, 2024
- Qinetiq Limited
- Christopher Robert Lawrence
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz radiator based on coherent SPR amplified by stimulation
- Patent number 12,149,041
- Issue date Nov 19, 2024
- Tsinghua University
- Fang Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring device and method of operating a measuring device
- Patent number 12,146,733
- Issue date Nov 19, 2024
- Helmut Fischer GmbH Institut für Elektronik und Messtechnik
- Rüdiger Mästle
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz sensing system and terahertz sensing array
- Patent number 12,140,537
- Issue date Nov 12, 2024
- Huawei Technologies Co., Ltd.
- Oupeng Li
- G01 - MEASURING TESTING
Information Patent Grant
Method of imaging a sample material
- Patent number 12,135,282
- Issue date Nov 5, 2024
- The University of Western Australia
- Vincent Patrick Wallace
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Cooperative polarization skylight background radiation measurement...
- Patent number 12,135,277
- Issue date Nov 5, 2024
- Hefei Institutes of Physical Science, CAS
- Congming Dai
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Permittivity measuring device and thickness measuring device
- Patent number 12,117,285
- Issue date Oct 15, 2024
- Nippon Telegraph and Telephone Corporation
- Masaki Nakamori
- G01 - MEASURING TESTING
Information Patent Grant
System for detecting surface type of object and artificial neural n...
- Patent number 12,111,267
- Issue date Oct 8, 2024
- Getac Holdings Corporation
- Kun-Yu Tsai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
THz measuring device and method for measuring a measuring object
- Patent number 12,105,021
- Issue date Oct 1, 2024
- CiTEX Holding GmbH
- Ralph Klose
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz device
- Patent number 12,099,005
- Issue date Sep 24, 2024
- Rohm Co., Ltd.
- Tomoichiro Toyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods, systems, and apparatuses for non-destructively inspecting,...
- Patent number 12,098,975
- Issue date Sep 24, 2024
- The Boeing Company
- Russell L. Keller
- G01 - MEASURING TESTING
Information Patent Grant
Wideband subharmonic mixer
- Patent number 12,099,006
- Issue date Sep 24, 2024
- UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
- Berhanu Bulcha
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Terahertz wave detection device, terahertz wave detection method, a...
- Patent number 12,072,284
- Issue date Aug 27, 2024
- MAXELL, LTD.
- Osamu Kawamae
- G01 - MEASURING TESTING
Information Patent Grant
Sensing apparatus and method of operation thereof
- Patent number 12,066,379
- Issue date Aug 20, 2024
- CAMBRIDGE BATTERY RESEARCH LIMITED
- Hatice Munevver Tuncer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for detecting water status in plants using tera...
- Patent number 12,066,380
- Issue date Aug 20, 2024
- The Regents of the University of California
- Mona Jarrahi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for measuring a tubular strand
- Patent number 12,055,386
- Issue date Aug 6, 2024
- Sikora AG
- Armin Holle
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric constant measurement method, dielectric measurement devi...
- Patent number 12,025,642
- Issue date Jul 2, 2024
- Nippon Telegraph and Telephone Corporation
- Teruo Jo
- G01 - MEASURING TESTING
Information Patent Grant
Method and laboratory system to process a laboratory carrier based...
- Patent number 12,017,216
- Issue date Jun 25, 2024
- Roche Diagnostics Operations, Inc.
- Andreas Drechsler
- G01 - MEASURING TESTING
Information Patent Grant
THz measuring device and THz measuring method for determining a lay...
- Patent number 11,988,499
- Issue date May 21, 2024
- CiTEX Holding GmbH
- Roland Böhm
- G01 - MEASURING TESTING
Information Patent Grant
Far-infrared spectroscopy device and far-infrared spectroscopy method
- Patent number 11,977,026
- Issue date May 7, 2024
- HITACHI HIGH-TECH CORPORATION
- Mizuki Mohara
- G01 - MEASURING TESTING
Information Patent Grant
Method and THz measuring device for measuring a measurement object...
- Patent number 11,971,350
- Issue date Apr 30, 2024
- 1NOEX GMBH INNOVATIONEN UND AUSRÜSTUNGEN FÜR DIE EXTRUSIONSTECHNIK
- Ralph Klose
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for non-invasive microwave testing of bottles o...
- Patent number 11,953,485
- Issue date Apr 9, 2024
- The Trustees of Dartmouth College
- Paul M. Meaney
- G01 - MEASURING TESTING
Information Patent Grant
Target device for characterizing terahertz imaging systems
- Patent number 11,892,620
- Issue date Feb 6, 2024
- Institut National D'Optique
- Alex Paquet
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TERAHERTZ RADIATION DETECTORS BASED ON THIN FILMS OF NON-CENTROSYMM...
- Publication number 20250052676
- Publication date Feb 13, 2025
- Wisconsin Alumni Research Foundation
- Jun Xiao
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
- Publication number 20250020588
- Publication date Jan 16, 2025
- Yokogawa Electric Corporation
- Syuhei Okada
- G01 - MEASURING TESTING
Information Patent Application
IMAGING APPARATUS
- Publication number 20250012918
- Publication date Jan 9, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- Shunsuke TOMOMATSU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR SIMULATING A SOLAR SPECTRUM
- Publication number 20240418643
- Publication date Dec 19, 2024
- United States of America, as Represented by the Secretary of the Army (U.S. A...
- Hajin Kim
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DETERMINING AT LEAST ONE PROPERTY OF AT LEAST...
- Publication number 20240418640
- Publication date Dec 19, 2024
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Ruediger Maestle
- G01 - MEASURING TESTING
Information Patent Application
CRYSTAL FORM DETERMINATION METHOD
- Publication number 20240418641
- Publication date Dec 19, 2024
- Hamamatsu Photonics K.K.
- Kazuhiro TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
MONOLITHIC MULTI-WAVELENGTH OPTICAL DEVICES
- Publication number 20240405148
- Publication date Dec 5, 2024
- Analog Devices, Inc.
- Ryan M. IUTZI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BIOMETRIC INFORMATION ACQUISITION DEVICE
- Publication number 20240404696
- Publication date Dec 5, 2024
- SEIKO EPSON CORPORATION
- Satoshi SHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
ULTRA-WIDEBAND TERAHERTZ IMAGING SYSTEM AND IMAGING METHOD
- Publication number 20240393238
- Publication date Nov 28, 2024
- Shenzhen Technology University
- Lulu WANG
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
MEASURING DEVICE AND METHOD FOR MEASURING A GEOMETRIC PARAMETER OF...
- Publication number 20240377320
- Publication date Nov 14, 2024
- Sikora AG
- Christian Frank
- G01 - MEASURING TESTING
Information Patent Application
DEVICE, SYSTEM AND METHOD FOR DETERMINING DEGRADATION
- Publication number 20240369355
- Publication date Nov 7, 2024
- Nippon Telegraph and Telephone Corporation
- Masaki NAKAMORI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DETERMINING THE REFRACTIVE INDEX OF A SURFACE...
- Publication number 20240369480
- Publication date Nov 7, 2024
- Sikora AG
- Harald Sikora
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ ASYMMETRIC S-SHAPED COMPLEMENTARY METASURFACE BIOSENSOR F...
- Publication number 20240369477
- Publication date Nov 7, 2024
- Imam Abdulrahman Bin Faisal University
- Ibraheem AL-NAIB
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR ESTIMATING RESIDUAL STRESS IN OBJECT
- Publication number 20240344909
- Publication date Oct 17, 2024
- IIDA Co., Ltd.
- Shigeo MIYAKE
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ DETECTION DEVICE
- Publication number 20240344978
- Publication date Oct 17, 2024
- Sony Semiconductor Solutions Corporation
- MITSUNARI HOSHI
- G01 - MEASURING TESTING
Information Patent Application
ADSORPTION EVALUATION APPARATUS AND ADSORPTION EVALUATION METHOD
- Publication number 20240337597
- Publication date Oct 10, 2024
- HAMAMATSU PHOTONICS K. K.
- Takashi Yasuda
- G01 - MEASURING TESTING
Information Patent Application
CURVATURE CORRECTION
- Publication number 20240328781
- Publication date Oct 3, 2024
- TERAVIEW LIMITED
- Ian Alasdair Pentland
- G01 - MEASURING TESTING
Information Patent Application
FRUIT MATURITY AND QUALITY SCANNING
- Publication number 20240302272
- Publication date Sep 12, 2024
- Colorado State University Research Foundation
- Ioannis Minas
- G01 - MEASURING TESTING
Information Patent Application
Far-Infrared Spectroscopy Device and Sample Adapter
- Publication number 20240288365
- Publication date Aug 29, 2024
- Hitachi High-Tech Corporation
- Mizuki MOHARA
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ SIGNAL MEASURING APPARATUS AND MEASURING METHOD
- Publication number 20240230528
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Sunhong Jun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACTLESS MEASUREMENT OF ROCK WETTABILITY BY PHOTONIC TECHNIQUES
- Publication number 20240201079
- Publication date Jun 20, 2024
- Saudi Arabian Oil Company
- Adrian Cesar Cavazos Sepulveda
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS AND TESTING APPARATUS HAVING THE SAME
- Publication number 20240183777
- Publication date Jun 6, 2024
- Samsung Electronics Co., Ltd.
- Yasuhiro HIDAKA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING COATING THICKNESS
- Publication number 20240167810
- Publication date May 23, 2024
- Teraview Limited
- Ian Stephen Gregory
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ WAVE DETECTION CHIP AND TERAHERTZ WAVE DETECTION SYSTEM
- Publication number 20240151642
- Publication date May 9, 2024
- Industrial Technology Research Institute
- Yu-Tai LI
- G01 - MEASURING TESTING
Information Patent Application
MEMBER FOR TERAHERTZ EQUIPMENT
- Publication number 20240125986
- Publication date Apr 18, 2024
- NGK Insulators, Ltd.
- Kentaro TANI
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ CHARACTERIZATION OF A MULTI-LAYERED TIRE TREAD
- Publication number 20240102926
- Publication date Mar 28, 2024
- The Goodyear Tire and Rubber Company
- Claude Schweitzer
- G01 - MEASURING TESTING
Information Patent Application
BIOMOLECULE DETECTION METHOD, COMPUTING DEVICE PERFORMING THE METHO...
- Publication number 20240094121
- Publication date Mar 21, 2024
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Won Kyoung LEE
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SYSTEM AND METHOD FOR ENSURING SEED QUALITY AT PLANTING USING TERAH...
- Publication number 20240074345
- Publication date Mar 7, 2024
- Deere & Company
- Mahesh SOMAROWTHU
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
METHOD AND DEVICE FOR DETECTING DEFECTS OF A STRAND-LIKE PRODUCT
- Publication number 20240068939
- Publication date Feb 29, 2024
- Sikora AG
- Harold Sikora
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE NON-DESTRUCTIVE TESTING OF A STATOR WINDING INSULATION
- Publication number 20240053263
- Publication date Feb 15, 2024
- Siemens Energy Global GmbH & Co. KG
- Maris Bauer
- G01 - MEASURING TESTING

using far infra-red light using Terahertz radiation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for calibrating a THz measuring apparatus, THz measuring met...

Inspection apparatus and method of inspecting wafer

Far-infrared spectroscopy device

Method and a system for detecting features of a water layer between...

Apparatus comprising at least one THz device and method of operatin...

Contactless measurement of rock wettability by photonic techniques

Method and device for controlling a production system for planar or...

Method and apparatus for imaging a biological sample by total inter...

Terahertz radiator based on coherent SPR amplified by stimulation

Measuring device and method of operating a measuring device

Terahertz sensing system and terahertz sensing array

Method of imaging a sample material

Cooperative polarization skylight background radiation measurement...

Permittivity measuring device and thickness measuring device

System for detecting surface type of object and artificial neural n...

THz measuring device and method for measuring a measuring object

Terahertz device

Methods, systems, and apparatuses for non-destructively inspecting,...

Wideband subharmonic mixer

Terahertz wave detection device, terahertz wave detection method, a...

Sensing apparatus and method of operation thereof

Methods and systems for detecting water status in plants using tera...

Method and device for measuring a tubular strand

Dielectric constant measurement method, dielectric measurement devi...

Method and laboratory system to process a laboratory carrier based...

THz measuring device and THz measuring method for determining a lay...

Far-infrared spectroscopy device and far-infrared spectroscopy method

Method and THz measuring device for measuring a measurement object...

Systems and methods for non-invasive microwave testing of bottles o...

Target device for characterizing terahertz imaging systems

Patents Applicationslast 30 patents

TERAHERTZ RADIATION DETECTORS BASED ON THIN FILMS OF NON-CENTROSYMM...

MEASUREMENT APPARATUS AND MEASUREMENT METHOD

IMAGING APPARATUS

METHOD AND DEVICE FOR SIMULATING A SOLAR SPECTRUM

METHOD AND DEVICE FOR DETERMINING AT LEAST ONE PROPERTY OF AT LEAST...

CRYSTAL FORM DETERMINATION METHOD

MONOLITHIC MULTI-WAVELENGTH OPTICAL DEVICES

BIOMETRIC INFORMATION ACQUISITION DEVICE

ULTRA-WIDEBAND TERAHERTZ IMAGING SYSTEM AND IMAGING METHOD

MEASURING DEVICE AND METHOD FOR MEASURING A GEOMETRIC PARAMETER OF...

DEVICE, SYSTEM AND METHOD FOR DETERMINING DEGRADATION

METHOD AND DEVICE FOR DETERMINING THE REFRACTIVE INDEX OF A SURFACE...

TERAHERTZ ASYMMETRIC S-SHAPED COMPLEMENTARY METASURFACE BIOSENSOR F...

METHODS AND SYSTEMS FOR ESTIMATING RESIDUAL STRESS IN OBJECT

TERAHERTZ DETECTION DEVICE

ADSORPTION EVALUATION APPARATUS AND ADSORPTION EVALUATION METHOD

CURVATURE CORRECTION

FRUIT MATURITY AND QUALITY SCANNING

Far-Infrared Spectroscopy Device and Sample Adapter

TERAHERTZ SIGNAL MEASURING APPARATUS AND MEASURING METHOD

CONTACTLESS MEASUREMENT OF ROCK WETTABILITY BY PHOTONIC TECHNIQUES

MEASURING APPARATUS AND TESTING APPARATUS HAVING THE SAME

METHOD AND SYSTEM FOR MEASURING COATING THICKNESS

TERAHERTZ WAVE DETECTION CHIP AND TERAHERTZ WAVE DETECTION SYSTEM

MEMBER FOR TERAHERTZ EQUIPMENT

TERAHERTZ CHARACTERIZATION OF A MULTI-LAYERED TIRE TREAD

BIOMOLECULE DETECTION METHOD, COMPUTING DEVICE PERFORMING THE METHO...

SYSTEM AND METHOD FOR ENSURING SEED QUALITY AT PLANTING USING TERAH...

METHOD AND DEVICE FOR DETECTING DEFECTS OF A STRAND-LIKE PRODUCT

METHOD FOR THE NON-DESTRUCTIVE TESTING OF A STATOR WINDING INSULATION