using far infra-red light using Terahertz radiation

Industry

CPC
G01N21/3581

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/3581using far infra-red light using Terahertz radiation

Industries

Patents Grantslast 30 patents

Information Patent Grant
Far-infrared spectroscopy device and far-infrared spectroscopy method
- Patent number 11,977,026
- Issue date May 7, 2024
- HITACHI HIGH-TECH CORPORATION
- Mizuki Mohara
- G01 - MEASURING TESTING
Information Patent Grant
Method and THz measuring device for measuring a measurement object...
- Patent number 11,971,350
- Issue date Apr 30, 2024
- 1NOEX GMBH INNOVATIONEN UND AUSRÜSTUNGEN FÜR DIE EXTRUSIONSTECHNIK
- Ralph Klose
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for non-invasive microwave testing of bottles o...
- Patent number 11,953,485
- Issue date Apr 9, 2024
- The Trustees of Dartmouth College
- Paul M. Meaney
- G01 - MEASURING TESTING
Information Patent Grant
Target device for characterizing terahertz imaging systems
- Patent number 11,892,620
- Issue date Feb 6, 2024
- Institut National D'Optique
- Alex Paquet
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring coating thickness
- Patent number 11,885,610
- Issue date Jan 30, 2024
- TeraView Limited
- Ian Stephen Gregory
- G01 - MEASURING TESTING
Information Patent Grant
Tailored terahertz radiation
- Patent number 11,888,233
- Issue date Jan 30, 2024
- Ramot at Tel Aviv University Ltd.
- Tal Ellenbogen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Terahertz characterization of a multi-layered tire tread
- Patent number 11,874,223
- Issue date Jan 16, 2024
- The Goodyear Tire & Rubber Company
- Claude Schweitzer
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz illumination source for terahertz imaging
- Patent number 11,852,951
- Issue date Dec 26, 2023
- Institut National D'Optique
- Michel Jacob
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for detecting slurry spread volume using terahertz wave,...
- Patent number 11,846,584
- Issue date Dec 19, 2023
- Hyundai Motor Company
- Ha Seung Seong
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring concentrations of multiple gases by using infr...
- Patent number 11,841,320
- Issue date Dec 12, 2023
- XINJIANG TECHNICAL INSTITUTE OF PHYSICS & CHEMISTRY, CHINESE ACADEMY OF SCIENCES
- Linjun Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Blood analysis method
- Patent number 11,841,321
- Issue date Dec 12, 2023
- Imam Abdulrahman Bin Faisal University
- Ibraheem Abdalwahhab Ibraheem Al-Naib
- G01 - MEASURING TESTING
Information Patent Grant
THz measuring device and THz measuring method for determining defec...
- Patent number 11,835,467
- Issue date Dec 5, 2023
- INOEX GMBH INNOVATIONEN UND AUSRÜSTUNGEN FÜR DIE EXTRUSIONSTECHNIK
- Ralph Klose
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz wave camera system and method for controlling terahertz w...
- Patent number 11,835,452
- Issue date Dec 5, 2023
- Canon Kabushiki Kaisha
- Takeaki Itsuji
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System for detecting surface type of object and artificial neural n...
- Patent number 11,821,844
- Issue date Nov 21, 2023
- Getac Technology Corporation
- Kun-Yu Tsai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system and inspection method
- Patent number 11,815,472
- Issue date Nov 14, 2023
- NEC Corporation
- Naoya Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Imaging system
- Patent number 11,808,699
- Issue date Nov 7, 2023
- Canon Kabushiki Kaisha
- Akihisa Iio
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Intelligent manufacturing system and manufacturing method for terah...
- Patent number 11,807,557
- Issue date Nov 7, 2023
- ZHONGSHAN MEILIXIN ELECTRONIC TECHNOLOGY CO., LTD.
- Jiancong Liu
- C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
Information Patent Grant
Device with a heterostructure adapted to be applied as a resonator...
- Patent number 11,803,002
- Issue date Oct 31, 2023
- Terra Quantum AG
- Igor Lukyanchuk
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz spectrum measurement system and method for analyzing a te...
- Patent number 11,788,956
- Issue date Oct 17, 2023
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Hua Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
N×M terahertz detector array imaging system based on multi-frequenc...
- Patent number 11,788,955
- Issue date Oct 17, 2023
- GUANGDONG UNIVERSITY OF TECHNOLOGY
- Jianguo Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen inspection apparatus and specimen inspection method
- Patent number 11,781,981
- Issue date Oct 10, 2023
- ACTRO CO., LTD.
- Hak Sung Kim
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz wave camera and detection module
- Patent number 11,770,596
- Issue date Sep 26, 2023
- Canon Kabushiki Kaisha
- Takeaki Itsuji
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Photonic device and a terahertz signal generator
- Patent number 11,747,376
- Issue date Sep 5, 2023
- City University of Hong Kong
- Cheng Wang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for in ovo sexing of avian embryos
- Patent number 11,723,343
- Issue date Aug 15, 2023
- NOVATRANS GROUP S.A.
- Paul Knepper
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Techniques for rapid detection and quantitation of volatile organic...
- Patent number 11,721,533
- Issue date Aug 8, 2023
- InspectIR Systems, LLC
- Guido Fridolin Verbeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated compact mmW spectroscopy cell system and method
- Patent number 11,719,577
- Issue date Aug 8, 2023
- Texas Instruments Incorporated
- Adam Joseph Fruehling
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods of detecting pipe defects
- Patent number 11,709,139
- Issue date Jul 25, 2023
- New Jersey Institute of Technology
- John F. Federici
- G01 - MEASURING TESTING
Information Patent Grant
Systems with radio frequency resonators, tuning elements, and spect...
- Patent number 11,697,458
- Issue date Jul 11, 2023
- Texas Instruments Incorporated
- Siva RaghuRam Prasad Chennupati
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transient-state THz spectrometer for detecting cells and biological...
- Patent number 11,692,935
- Issue date Jul 4, 2023
- Xi'an University of Technology
- Wei Shi
- G01 - MEASURING TESTING
Information Patent Grant
Multi-pass spectroscopy apparatus, associated sample holder and met...
- Patent number 11,680,897
- Issue date Jun 20, 2023
- Joseph R. Demers
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TERAHERTZ WAVE DETECTION CHIP AND TERAHERTZ WAVE DETECTION SYSTEM
- Publication number 20240151642
- Publication date May 9, 2024
- Industrial Technology Research Institute
- Yu-Tai LI
- G01 - MEASURING TESTING
Information Patent Application
MEMBER FOR TERAHERTZ EQUIPMENT
- Publication number 20240125986
- Publication date Apr 18, 2024
- NGK Insulators, Ltd.
- Kentaro TANI
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ CHARACTERIZATION OF A MULTI-LAYERED TIRE TREAD
- Publication number 20240102926
- Publication date Mar 28, 2024
- The Goodyear Tire and Rubber Company
- Claude Schweitzer
- G01 - MEASURING TESTING
Information Patent Application
BIOMOLECULE DETECTION METHOD, COMPUTING DEVICE PERFORMING THE METHO...
- Publication number 20240094121
- Publication date Mar 21, 2024
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Won Kyoung LEE
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SYSTEM AND METHOD FOR ENSURING SEED QUALITY AT PLANTING USING TERAH...
- Publication number 20240074345
- Publication date Mar 7, 2024
- Deere & Company
- Mahesh SOMAROWTHU
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
METHOD AND DEVICE FOR DETECTING DEFECTS OF A STRAND-LIKE PRODUCT
- Publication number 20240068939
- Publication date Feb 29, 2024
- Sikora AG
- Harold Sikora
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE NON-DESTRUCTIVE TESTING OF A STATOR WINDING INSULATION
- Publication number 20240053263
- Publication date Feb 15, 2024
- Siemens Energy Global GmbH & Co. KG
- Maris Bauer
- G01 - MEASURING TESTING
Information Patent Application
CORONAVIRUS MUTATION DETERMINATION DEVICE COMPRISING METAMATERIAL A...
- Publication number 20240044787
- Publication date Feb 8, 2024
- Korea Institute of Science and Technology
- Minah SEO
- G01 - MEASURING TESTING
Information Patent Application
PROBE AND INSPECTION APPARATUS INCLUDING THE SAME
- Publication number 20240019362
- Publication date Jan 18, 2024
- Samsung Electronics Co., Ltd.
- Junbum Park
- G01 - MEASURING TESTING
Information Patent Application
System For Detecting Surface Type Of Object And Artificial Neural N...
- Publication number 20240011916
- Publication date Jan 11, 2024
- GETAC TECHNOLOGY CORPORATION
- Kun-Yu Tsai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-WAVEBAND-TUNABLE MULTI-SCALE META-MATERIAL AND PREPARATION ME...
- Publication number 20230393063
- Publication date Dec 7, 2023
- Zhejiang University
- Lijuan XIE
- G01 - MEASURING TESTING
Information Patent Application
Foreign Substance Detection Device and Detection Method
- Publication number 20230358688
- Publication date Nov 9, 2023
- LG ENERGY SOLUTION, LTD.
- Jeong Ho Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BLOOD ANALYSIS METHOD
- Publication number 20230341324
- Publication date Oct 26, 2023
- Imam Abdulrahman Bin Faisal University
- Ibraheem Abdalwahhab Ibraheem Al-Naib
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MILLIMETER-WAVE OSCILLATOR DISCIPLINED BY ROTATIONAL SPECTR...
- Publication number 20230333012
- Publication date Oct 19, 2023
- IMRA America, Inc.
- Antoine Jean Gilbert Rolland
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ IMAGING SYSTEM WITH EVANESCENT-WAVE COUPLING
- Publication number 20230328340
- Publication date Oct 12, 2023
- Institut National D'Optique
- Michel DOUCET
- G02 - OPTICS
Information Patent Application
METHOD AND DEVICE FOR PROCESSING DATA ASSOCIATED WITH A MODEL
- Publication number 20230314316
- Publication date Oct 5, 2023
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Ruediger Maestle
- G01 - MEASURING TESTING
Information Patent Application
THZ MEASURING DEVICE AND THZ MEASUREMENT METHOD FOR MEASURING TEST...
- Publication number 20230314315
- Publication date Oct 5, 2023
- CiTEX Holding GmbH
- Ralph KLOSE
- G01 - MEASURING TESTING
Information Patent Application
CONTACTLESS DETERMINATION OF COATING FEATURES
- Publication number 20230304938
- Publication date Sep 28, 2023
- DAS-NANO TECH S.L.
- Israel ARNEDO GIL
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE
- Publication number 20230288327
- Publication date Sep 14, 2023
- Mitsubishi Heavy Industries, Ltd.
- Syusaku Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE
- Publication number 20230288326
- Publication date Sep 14, 2023
- Mitsubishi Heavy Industries, Ltd.
- Syusaku Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
HYGROSCOPICITY EVALUATION METHOD AND WATER CONTENT EVALUATION METHOD
- Publication number 20230258620
- Publication date Aug 17, 2023
- HAMAMATSU PHOTONICS K. K.
- Tetsuya UCHIDA
- G01 - MEASURING TESTING
Information Patent Application
SCANNING INFRARED MEASUREMENT SYSTEM
- Publication number 20230258552
- Publication date Aug 17, 2023
- 1087 SYSTEMS, INC.
- Matthias Wagner
- G02 - OPTICS
Information Patent Application
TERAHERTZ WAVE DETECTION DEVICE, TERAHERTZ WAVE DETECTION METHOD, A...
- Publication number 20230258558
- Publication date Aug 17, 2023
- Maxell, Ltd.
- Osamu KAWAMAE
- G01 - MEASURING TESTING
Information Patent Application
PERMITTIVITY MEASURING DEVICE AND THICKNESS MEASURING DEVICE
- Publication number 20230236005
- Publication date Jul 27, 2023
- Nippon Telegraph and Telephone Corporation
- Masaki NAKAMORI
- G01 - MEASURING TESTING
Information Patent Application
Far-Infrared Spectroscopy Device
- Publication number 20230236123
- Publication date Jul 27, 2023
- Hitachi High-Tech Corporation
- Touya ONO
- G01 - MEASURING TESTING
Information Patent Application
PROMPT VIRUSES INFECTION DETECTION USING THz SPECTROSCOPY IN A BREA...
- Publication number 20230221248
- Publication date Jul 13, 2023
- FLANIMUS LTD.
- Gabby SARUSI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND METHOD OF INSPECTING WAFER
- Publication number 20230204503
- Publication date Jun 29, 2023
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TRANSMITTING AND/OR RECEIVING TERAHERTZ RADIATION, AN...
- Publication number 20230175960
- Publication date Jun 8, 2023
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Ruediger Maestle
- G01 - MEASURING TESTING
Information Patent Application
PHOTO-THERMO-ACOUSTIC MECHANISM-BASED POWER MEASUREMENT APPARATUS A...
- Publication number 20230144262
- Publication date May 11, 2023
- NANKAI UNIVERSITY
- Weiwei LIU
- G01 - MEASURING TESTING
Information Patent Application
HIGH FREQUENCY DETECTION METHOD AND APPARATUS
- Publication number 20230144266
- Publication date May 11, 2023
- Thruvision Limited
- Christopher Mark MANN
- G01 - MEASURING TESTING

using far infra-red light using Terahertz radiation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Far-infrared spectroscopy device and far-infrared spectroscopy method

Method and THz measuring device for measuring a measurement object...

Systems and methods for non-invasive microwave testing of bottles o...

Target device for characterizing terahertz imaging systems

Method and system for measuring coating thickness

Tailored terahertz radiation

Terahertz characterization of a multi-layered tire tread

Terahertz illumination source for terahertz imaging

Apparatus for detecting slurry spread volume using terahertz wave,...

Method for measuring concentrations of multiple gases by using infr...

Blood analysis method

THz measuring device and THz measuring method for determining defec...

Terahertz wave camera system and method for controlling terahertz w...

System for detecting surface type of object and artificial neural n...

Inspection system and inspection method

Imaging system

Intelligent manufacturing system and manufacturing method for terah...

Device with a heterostructure adapted to be applied as a resonator...

Terahertz spectrum measurement system and method for analyzing a te...

N×M terahertz detector array imaging system based on multi-frequenc...

Specimen inspection apparatus and specimen inspection method

Terahertz wave camera and detection module

Photonic device and a terahertz signal generator

System and method for in ovo sexing of avian embryos

Techniques for rapid detection and quantitation of volatile organic...

Integrated compact mmW spectroscopy cell system and method

Systems and methods of detecting pipe defects

Systems with radio frequency resonators, tuning elements, and spect...

Transient-state THz spectrometer for detecting cells and biological...

Multi-pass spectroscopy apparatus, associated sample holder and met...

Patents Applicationslast 30 patents

TERAHERTZ WAVE DETECTION CHIP AND TERAHERTZ WAVE DETECTION SYSTEM

MEMBER FOR TERAHERTZ EQUIPMENT

TERAHERTZ CHARACTERIZATION OF A MULTI-LAYERED TIRE TREAD

BIOMOLECULE DETECTION METHOD, COMPUTING DEVICE PERFORMING THE METHO...

SYSTEM AND METHOD FOR ENSURING SEED QUALITY AT PLANTING USING TERAH...

METHOD AND DEVICE FOR DETECTING DEFECTS OF A STRAND-LIKE PRODUCT

METHOD FOR THE NON-DESTRUCTIVE TESTING OF A STATOR WINDING INSULATION

CORONAVIRUS MUTATION DETERMINATION DEVICE COMPRISING METAMATERIAL A...

PROBE AND INSPECTION APPARATUS INCLUDING THE SAME

System For Detecting Surface Type Of Object And Artificial Neural N...

MULTI-WAVEBAND-TUNABLE MULTI-SCALE META-MATERIAL AND PREPARATION ME...

Foreign Substance Detection Device and Detection Method

BLOOD ANALYSIS METHOD

OPTICAL MILLIMETER-WAVE OSCILLATOR DISCIPLINED BY ROTATIONAL SPECTR...

TERAHERTZ IMAGING SYSTEM WITH EVANESCENT-WAVE COUPLING

METHOD AND DEVICE FOR PROCESSING DATA ASSOCIATED WITH A MODEL

THZ MEASURING DEVICE AND THZ MEASUREMENT METHOD FOR MEASURING TEST...

CONTACTLESS DETERMINATION OF COATING FEATURES

INSPECTION DEVICE

INSPECTION DEVICE

HYGROSCOPICITY EVALUATION METHOD AND WATER CONTENT EVALUATION METHOD

SCANNING INFRARED MEASUREMENT SYSTEM

TERAHERTZ WAVE DETECTION DEVICE, TERAHERTZ WAVE DETECTION METHOD, A...

PERMITTIVITY MEASURING DEVICE AND THICKNESS MEASURING DEVICE

Far-Infrared Spectroscopy Device

PROMPT VIRUSES INFECTION DETECTION USING THz SPECTROSCOPY IN A BREA...

INSPECTION APPARATUS AND METHOD OF INSPECTING WAFER

APPARATUS FOR TRANSMITTING AND/OR RECEIVING TERAHERTZ RADIATION, AN...

PHOTO-THERMO-ACOUSTIC MECHANISM-BASED POWER MEASUREMENT APPARATUS A...

HIGH FREQUENCY DETECTION METHOD AND APPARATUS