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G01J3/24
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
G01J3/00
Spectrometry Spectrophotometry Monochromators Measuring colour
Current Industry
G01J3/24
using gratings profiled to favour a specific order
Industries
Overview
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Patents Grants
last 30 patents
Information
Patent Grant
Hyperspectral imaging (HSI) apparatus and inspection apparatus incl...
Patent number
11,898,912
Issue date
Feb 13, 2024
Samsung Electronics Co., Ltd.
Sungho Jang
G01 - MEASURING TESTING
Information
Patent Grant
Holographic mode filter for super-resolution imaging
Patent number
11,550,164
Issue date
Jan 10, 2023
Honeywell International Inc.
Mary Salit
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Integrated bound-mode spectral sensors with chirped gratings
Patent number
11,326,946
Issue date
May 10, 2022
Steven R. J. Brueck
G02 - OPTICS
Information
Patent Grant
Apparatus and method for evaluation of spectral properties of a mea...
Patent number
10,481,000
Issue date
Nov 19, 2019
Reinhard März
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer
Patent number
10,024,715
Issue date
Jul 17, 2018
Hamamatsu Photonics K.K.
Takafumi Yokino
G01 - MEASURING TESTING
Information
Patent Grant
Hyperspectral imaging system, monolithic spectrometer and methods f...
Patent number
9,435,689
Issue date
Sep 6, 2016
Corning Incorporated
Lovell Elgin Comstock
G01 - MEASURING TESTING
Information
Patent Grant
Method for producing a diffraction grating
Patent number
9,323,070
Issue date
Apr 26, 2016
Nederlandse Organisatie voor Toegepast-Natuurwetenschappelijk Onderzoek TNO
Henri Johannes Petrus Vink
G01 - MEASURING TESTING
Information
Patent Grant
Multispectral camera using zero-mode channel
Patent number
9,232,130
Issue date
Jan 5, 2016
Raytheon Canada Limited
Donald J. Denis
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Spectroscope
Patent number
9,222,831
Issue date
Dec 29, 2015
Hamamatsu Photonics K.K.
Takafumi Yokino
G01 - MEASURING TESTING
Information
Patent Grant
Spectra shaping device for chirped pulse amplification
Patent number
9,158,117
Issue date
Oct 13, 2015
Ming Li
G01 - MEASURING TESTING
Information
Patent Grant
Optical system and manufacturing method thereof
Patent number
9,146,155
Issue date
Sep 29, 2015
OtO Photonics, Inc.
Cheng-Hao Ko
G01 - MEASURING TESTING
Information
Patent Grant
Grating spectrometer system and method for the acquisition of measu...
Patent number
7,692,790
Issue date
Apr 6, 2010
Carl Zeiss MicroImaging GmbH
Felix Kerstan
G01 - MEASURING TESTING
Information
Patent Grant
Tunable dispersive optical system
Patent number
7,317,575
Issue date
Jan 8, 2008
Instrument Technology Research Center
Kuen-Wey Shieh
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer using diffraction grating
Patent number
7,170,600
Issue date
Jan 30, 2007
Nippon Sheet Glass Company, Limited
Junji Nishii
G01 - MEASURING TESTING
Information
Patent Grant
Echelle spectroscope
Patent number
5,973,780
Issue date
Oct 26, 1999
Shimadzu Corporation
Naohiro Tsuboi
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for carrying out spectral analysis of an optical light so...
Patent number
5,859,702
Issue date
Jan 12, 1999
Peter Lindblom
G01 - MEASURING TESTING
Information
Patent Grant
Optical spectrometer for detecting spectra in separate ranges
Patent number
5,565,983
Issue date
Oct 15, 1996
The Perkin-Elmer Corporation
Thomas W. Barnard
G02 - OPTICS
Information
Patent Grant
Planar waveguide spectrograph
Patent number
5,493,393
Issue date
Feb 20, 1996
The Boeing Company
Mark W. Beranek
G02 - OPTICS
Information
Patent Grant
High sensitive multi-wavelength spectral analyzer
Patent number
5,329,353
Issue date
Jul 12, 1994
Research Development Corp. of Japan
Tsutomu Ichimura
G01 - MEASURING TESTING
Information
Patent Grant
Monolithic optical programmable spectrograph (MOPS)
Patent number
5,026,160
Issue date
Jun 25, 1991
The United States of America as represented by the Secretary of the Navy
Paul B. Dorain
G01 - MEASURING TESTING
Information
Patent Grant
3384756
Patent number
3,384,756
Issue date
May 21, 1968
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
INTEGRATED CHIRPED-GRATING SPECTROMETER-ON-A-CHIP
Publication number
20220412800
Publication date
Dec 29, 2022
UNM Rainforest Innovations
Steven R.J. BRUECK
G01 - MEASURING TESTING
Information
Patent Application
HYPERSPECTRAL IMAGING (HSI) APPARATUS AND INSPECTION APPARATUS INCL...
Publication number
20220170792
Publication date
Jun 2, 2022
Samsung Electronics Co., Ltd.
Sungho Jang
G01 - MEASURING TESTING
Information
Patent Application
HOLOGRAPHIC MODE FILTER FOR SUPER-RESOLUTION IMAGING
Publication number
20200256732
Publication date
Aug 13, 2020
HONEYWELL INTERNATIONAL INC.
Mary Salit
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED BOUND-MODE SPECTRAL SENSORS WITH CHIRPED GRATINGS
Publication number
20200124474
Publication date
Apr 23, 2020
STC.UNM
Steven R. J. BRUECK
G02 - OPTICS
Information
Patent Application
Apparatus and Method for Evaluation of Spectral Properties of a Mea...
Publication number
20190316964
Publication date
Oct 17, 2019
Reinhard März
G01 - MEASURING TESTING
Information
Patent Application
Ultra-High Efficiency Color Mixing and Color Separation
Publication number
20150338665
Publication date
Nov 26, 2015
Massachusetts Institute of Technology
Jose Dominguez-Caballero
G02 - OPTICS
Information
Patent Application
SPECTROSCOPE
Publication number
20140268138
Publication date
Sep 18, 2014
Hamamatsu Photonics K.K.
Takafumi Yokino
G01 - MEASURING TESTING
Information
Patent Application
HYPERSPECTRAL IMAGING SYSTEM, MONOLITHIC SPECTROMETER AND METHODS F...
Publication number
20140118738
Publication date
May 1, 2014
Corning Incorporated
Lovell Elgin Comstock
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETER, AND IMAGE EVALUATING UNIT AND IMAGE FORMING DEVICE IN...
Publication number
20130235376
Publication date
Sep 12, 2013
RICOH COMPANY, LTD.
Naohiro Kamijo
G01 - MEASURING TESTING
Information
Patent Application
Ultra-High Efficiency Color Mixing and Color Separation
Publication number
20130208273
Publication date
Aug 15, 2013
Massachusetts Institute of Technology
Jose Dominguez-Caballero
G02 - OPTICS
Information
Patent Application
SPECTRA SHAPING DEVICE FOR CHIRPED PULSE AMPLIFICATION
Publication number
20130128343
Publication date
May 23, 2013
Ming Li
G02 - OPTICS
Information
Patent Application
Optical System
Publication number
20110080584
Publication date
Apr 7, 2011
OtO Photonics, Inc.
Cheng-Hao Ko
G02 - OPTICS
Information
Patent Application
OPTICAL SYSTEM
Publication number
20080225392
Publication date
Sep 18, 2008
Cheng-Hao KO
G02 - OPTICS
Information
Patent Application
GRATING SPECTROMETER SYSTEM AND METHOD FOR THE ACQUISITION OF MEASU...
Publication number
20060268270
Publication date
Nov 30, 2006
Carl Zeiss Microlmaging GmbH
Felix Kerstan
G01 - MEASURING TESTING
Information
Patent Application
Tunable dispersive optical system
Publication number
20060169881
Publication date
Aug 3, 2006
Instrument Technology Research Center
Kuen-Wey Shieh
G02 - OPTICS
Information
Patent Application
Spectrometer using diffraction grating
Publication number
20060023212
Publication date
Feb 2, 2006
Junji Nishii
G02 - OPTICS
Information
Patent Application
Super high resolution optical resonator
Publication number
20020135879
Publication date
Sep 26, 2002
Valdimir Pogrebinsky
G01 - MEASURING TESTING