using hard- or software simulation or using knowledge-based systems

Industry

CPC
G01R31/2846

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2846using hard- or software simulation or using knowledge-based systems

Industries

Patents Grantslast 30 patents

Information Patent Grant
Electrical device condition determining sensor and method
- Patent number 12,068,544
- Issue date Aug 20, 2024
- NOKOMIS, INC.
- Karen Heike Spieler Canne
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Managing health condition of a rotating system
- Patent number 11,933,838
- Issue date Mar 19, 2024
- Siemens Aktiengesellschaft
- P. V. Sudev Nair
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Grant
Electrical power analyzer for large and small scale devices for env...
- Patent number 11,906,575
- Issue date Feb 20, 2024
- International Business Machines Corporation
- Jia Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Collaborative AI on transactional data with privacy guarantees
- Patent number 11,669,633
- Issue date Jun 6, 2023
- International Business Machines Corporation
- Sebastien Blandin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Solar array fault detection, classification, and localization using...
- Patent number 11,621,668
- Issue date Apr 4, 2023
- Arizona Board of Regents on behalf of Arizona State University
- Sunil Srinivasa Manjanbail Rao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Signal detection and monitoring
- Patent number 11,442,100
- Issue date Sep 13, 2022
- International Business Machines Corporation
- Rui W W Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing system and information processing method
- Patent number 11,402,427
- Issue date Aug 2, 2022
- Kabushiki Kaisha Toshiba
- Michinobu Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analog-circuit fault diagnosis method based on continuous wavelet a...
- Patent number 11,280,826
- Issue date Mar 22, 2022
- HEFEI UNIVERSITY OF TECHNOLOGY
- Yigang He
- G01 - MEASURING TESTING
Information Patent Grant
Method and electronic system for detecting rail switch degradation...
- Patent number 11,186,304
- Issue date Nov 30, 2021
- ALSTOM TRANSPORT TECHNOLOGIES
- Nenad Mijatovic
- B61 - RAILWAYS
Information Patent Grant
Tester and method for testing a device under test and tester and me...
- Patent number 11,105,855
- Issue date Aug 31, 2021
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection-guided critical site selection for critical dimension me...
- Patent number 11,035,666
- Issue date Jun 15, 2021
- KLA-Tencor Corporation
- Jagdish Chandra Saraswatula
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Universal automated testing of embedded systems
- Patent number 10,997,045
- Issue date May 4, 2021
- Y Soft Corporation, a.s.
- Jiri Kyzlink
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for identifying integrated circuit failures caused by async...
- Patent number 10,935,595
- Issue date Mar 2, 2021
- Real Intent, Inc.
- Vishnu Vimjam
- G01 - MEASURING TESTING
Information Patent Grant
Recording medium recording via lifetime calculation program, via li...
- Patent number 10,929,585
- Issue date Feb 23, 2021
- Fujitsu Limited
- Mitsunori Abe
- G01 - MEASURING TESTING
Information Patent Grant
Protocol analysis and visualization during simulation
- Patent number 10,816,600
- Issue date Oct 27, 2020
- Xilinx, Inc.
- David K. Liddell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multilevel fault simulations for integrated circuits (IC)
- Patent number 10,747,633
- Issue date Aug 18, 2020
- Intel Corporation
- Kevin Locker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Programmable actuator simulation card
- Patent number 10,691,088
- Issue date Jun 23, 2020
- The Boeing Company
- Michael Moore
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for recognizing partial discharges emitted inside or outside...
- Patent number 10,379,151
- Issue date Aug 13, 2019
- General Electric Technology GmbH
- Bouchra Daoudi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated analog fault injection
- Patent number 10,346,273
- Issue date Jul 9, 2019
- Analog Devices Global Unlimited Company
- Courtney E. Fricano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Closed loop simulation of a computer model of a physical system and...
- Patent number 10,331,813
- Issue date Jun 25, 2019
- The University of Manitoba
- Mohammad Goulkhah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Arc plasma-generating systems and methods thereof
- Patent number 10,261,120
- Issue date Apr 16, 2019
- National Technology & Engineering Solutions of Sandia, LLC
- Eric John Schindelholz
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection apparatus
- Patent number 10,114,070
- Issue date Oct 30, 2018
- Tokyo Electron Limited
- Michio Murata
- G01 - MEASURING TESTING
Information Patent Grant
Computer systems and computer-implemented methods for warning users...
- Patent number 9,859,754
- Issue date Jan 2, 2018
- VERTIV ENERGY SYSTEMS, INC.
- Carl Johan Henrik Nilén
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Battery simulator
- Patent number 9,823,295
- Issue date Nov 21, 2017
- CHROMA ATE INC.
- Chien-Ming Wu
- G01 - MEASURING TESTING
Information Patent Grant
Techniques for determining a fault probability of a location on a chip
- Patent number 9,658,282
- Issue date May 23, 2017
- Advantest Corporation
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
Probe card analysis system and method
- Patent number 9,638,782
- Issue date May 2, 2017
- Rudolph Technologies, Inc.
- Eric Endres
- G01 - MEASURING TESTING
Information Patent Grant
System and method for testing vehicle traction battery components
- Patent number 9,383,416
- Issue date Jul 5, 2016
- Ford Global Technologies, LLC
- Michael Edward Loftus
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining relevance values for a detecti...
- Patent number 8,745,568
- Issue date Jun 3, 2014
- Advantest (Singapore) Pte Ltd
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
Fault diagnosis based on design partitioning
- Patent number 8,707,232
- Issue date Apr 22, 2014
- Mentor Graphics Corporation
- Huaxing Tang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for de-embedding
- Patent number 8,618,826
- Issue date Dec 31, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiu-Ying Cho
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and System of Developing and Executing Test Program for Veri...
- Publication number 20240337683
- Publication date Oct 10, 2024
- Microtest S.p.A.
- Giuseppe AMELIO
- G01 - MEASURING TESTING
Information Patent Application
PARTIAL DISCHARGE DETERMINATION APPARATUS AND PARTIAL DISCHARGE DET...
- Publication number 20240183894
- Publication date Jun 6, 2024
- Hitachi, Ltd
- Hiromichi YAMADA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PREDICTING A REMAINING FAILURE OR LIFETIME OF AN ELECTRI...
- Publication number 20240159844
- Publication date May 16, 2024
- TRIDONIC GMBH & CO. KG.
- Tobias Klein
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR REMAINING USEFUL LIFE PREDICTION IN ELECTRO...
- Publication number 20230160950
- Publication date May 25, 2023
- UNIVERSITY OF HOUSTON SYSTEM
- Harish Krishnamoorthy
- G01 - MEASURING TESTING
Information Patent Application
Recipe Information Presentation System and Recipe Error Inference S...
- Publication number 20220334172
- Publication date Oct 20, 2022
- Hitachi High-Tech Corporation
- Kouichi HAYAKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIGNAL DETECTION AND MONITORING
- Publication number 20220128619
- Publication date Apr 28, 2022
- International Business Machines Corporation
- Rui WW Wang
- G01 - MEASURING TESTING
Information Patent Application
MANAGING HEALTH CONDITION OF A ROTATING SYSTEM
- Publication number 20220128620
- Publication date Apr 28, 2022
- SIEMENS AKTIENGESELLSCHAFT
- P. V. Sudev Nair
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PRODUCT GRADING METHOD AND GRADING SYSTEM
- Publication number 20220091175
- Publication date Mar 24, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Chia-Sheng LIN
- G01 - MEASURING TESTING
Information Patent Application
Electrical Power Analyzer for Large and Small Scale Devices for Env...
- Publication number 20210325447
- Publication date Oct 21, 2021
- International Business Machines Corporation
- Jia Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEGRADATION ESTIMATION APPARATUS, COMPUTER PROGRAM, AND DEGRADATION...
- Publication number 20210033680
- Publication date Feb 4, 2021
- GS YUASA INTERNATIONAL LTD.
- Nan UKUMORI
- G01 - MEASURING TESTING
Information Patent Application
SOLAR ARRAY FAULT DETECTION, CLASSIFICATION, AND LOCALIZATION USING...
- Publication number 20200358396
- Publication date Nov 12, 2020
- Arizona Board of Regents on behalf of Arizona State University
- Sunil Srinivasa Manjanbail Rao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALOG-CIRCUIT FAULT DIAGNOSIS METHOD BASED ON CONTINUOUS WAVELET A...
- Publication number 20200300907
- Publication date Sep 24, 2020
- HEFEI UNIVERSITY OF TECHNOLOGY
- Yigang HE
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED ANALOG FAULT INJECTION
- Publication number 20190095298
- Publication date Mar 28, 2019
- Analog Devices Global Unlimited Company
- Courtney E. FRICANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION-GUIDED CRITICAL SITE SELECTION FOR CRITICAL DIMENSION ME...
- Publication number 20190041202
- Publication date Feb 7, 2019
- KLA-Tencor Corporation
- Jagdish Chandra SARASWATULA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE, SYSTEM AND METHOD FOR DETECTING DEGRADATION OF A FLEXIBLE C...
- Publication number 20180089984
- Publication date Mar 29, 2018
- Intel Corporation
- Vijay Krishnan Subramanian
- G01 - MEASURING TESTING
Information Patent Application
Techniques for Determining a Fault Probability of a Location on a Chip
- Publication number 20140336958
- Publication date Nov 13, 2014
- ADVANTEST (SINGAPORE) PTE LTD
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD ANALYSIS SYSTEM AND METHOD
- Publication number 20140021970
- Publication date Jan 23, 2014
- Eric Endres
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEVICE ANOMALY
- Publication number 20130204552
- Publication date Aug 8, 2013
- Industrial Technology Research Institute
- Chung-Wei Lin
- G01 - MEASURING TESTING
Information Patent Application
Fault Diagnosis Based On Design Partitioning
- Publication number 20130024830
- Publication date Jan 24, 2013
- Huaxing Tang
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC FAULT INSERTION, CALIBRATION AND TEST SYSTEM
- Publication number 20120242357
- Publication date Sep 27, 2012
- Hamilton Sundstrand Corporation
- William N. Eccles
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ANALYZING CORRELATIONS AMONG DEVICE ELECTRICAL CHARACTER...
- Publication number 20120191392
- Publication date Jul 26, 2012
- Institute of Microelectronics Chinese Academy of Science
- Qingqing Liang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIMULATING AN UMBILICAL
- Publication number 20120065922
- Publication date Mar 15, 2012
- Silviu Puchianu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPRATUS FOR DE-EMBEDDING
- Publication number 20110254576
- Publication date Oct 20, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiu-Ying Cho
- G01 - MEASURING TESTING
Information Patent Application
Thread Allocation and Clock Cycle Adjustment in an Interleaved Mult...
- Publication number 20110138393
- Publication date Jun 9, 2011
- QUALCOMM Incorporated
- Suresh K. Venkumahanti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRANSFORMER WITHIN WAFER TEST PROBE
- Publication number 20110133766
- Publication date Jun 9, 2011
- QUALCOMM Incorporated
- John T. Josefosky
- G01 - MEASURING TESTING
Information Patent Application
COMPUTER PROGRAM AND COMPUTER SYSTEM FOR PRODUCING TEST FLOW
- Publication number 20110131217
- Publication date Jun 2, 2011
- SILICON TEST TECHNOLOGIES INC.
- Kazuhiko Iwasaki
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD ANALYSIS SYSTEM AND METHOD
- Publication number 20110089965
- Publication date Apr 21, 2011
- Rudolph Technologies, Inc.
- Eric Endres
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING RELEVANCE VALUES FOR A DETECTI...
- Publication number 20110032829
- Publication date Feb 10, 2011
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS OF DEEMBEDDING
- Publication number 20110001504
- Publication date Jan 6, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shu-Ying Cho
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS FOR COMPUTER MOTHERBOARD DESIGN
- Publication number 20100246633
- Publication date Sep 30, 2010
- HONG FU JIN PRECISION INDUSTRY(SHENZHEN) CO., LTD.
- XIAO-ZHU CHEN
- G01 - MEASURING TESTING

using hard- or software simulation or using knowledge-based systems

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electrical device condition determining sensor and method

Managing health condition of a rotating system

Electrical power analyzer for large and small scale devices for env...

Collaborative AI on transactional data with privacy guarantees

Solar array fault detection, classification, and localization using...

Signal detection and monitoring

Information processing system and information processing method

Analog-circuit fault diagnosis method based on continuous wavelet a...

Method and electronic system for detecting rail switch degradation...

Tester and method for testing a device under test and tester and me...

Inspection-guided critical site selection for critical dimension me...

Universal automated testing of embedded systems

Methods for identifying integrated circuit failures caused by async...

Recording medium recording via lifetime calculation program, via li...

Protocol analysis and visualization during simulation

Multilevel fault simulations for integrated circuits (IC)

Programmable actuator simulation card

Method for recognizing partial discharges emitted inside or outside...

Automated analog fault injection

Closed loop simulation of a computer model of a physical system and...

Arc plasma-generating systems and methods thereof

Substrate inspection apparatus

Computer systems and computer-implemented methods for warning users...

Battery simulator

Techniques for determining a fault probability of a location on a chip

Probe card analysis system and method

System and method for testing vehicle traction battery components

Method and apparatus for determining relevance values for a detecti...

Fault diagnosis based on design partitioning

Method and apparatus for de-embedding

Patents Applicationslast 30 patents

Method and System of Developing and Executing Test Program for Veri...

PARTIAL DISCHARGE DETERMINATION APPARATUS AND PARTIAL DISCHARGE DET...

METHOD FOR PREDICTING A REMAINING FAILURE OR LIFETIME OF AN ELECTRI...

SYSTEMS AND METHODS FOR REMAINING USEFUL LIFE PREDICTION IN ELECTRO...

Recipe Information Presentation System and Recipe Error Inference S...

SIGNAL DETECTION AND MONITORING

MANAGING HEALTH CONDITION OF A ROTATING SYSTEM

SEMICONDUCTOR PRODUCT GRADING METHOD AND GRADING SYSTEM

Electrical Power Analyzer for Large and Small Scale Devices for Env...

DEGRADATION ESTIMATION APPARATUS, COMPUTER PROGRAM, AND DEGRADATION...

SOLAR ARRAY FAULT DETECTION, CLASSIFICATION, AND LOCALIZATION USING...

ANALOG-CIRCUIT FAULT DIAGNOSIS METHOD BASED ON CONTINUOUS WAVELET A...

AUTOMATED ANALOG FAULT INJECTION

INSPECTION-GUIDED CRITICAL SITE SELECTION FOR CRITICAL DIMENSION ME...

DEVICE, SYSTEM AND METHOD FOR DETECTING DEGRADATION OF A FLEXIBLE C...

Techniques for Determining a Fault Probability of a Location on a Chip

PROBE CARD ANALYSIS SYSTEM AND METHOD

METHOD AND APPARATUS FOR DETECTING DEVICE ANOMALY

Fault Diagnosis Based On Design Partitioning

AUTOMATIC FAULT INSERTION, CALIBRATION AND TEST SYSTEM

METHOD FOR ANALYZING CORRELATIONS AMONG DEVICE ELECTRICAL CHARACTER...

SIMULATING AN UMBILICAL

METHOD AND APPRATUS FOR DE-EMBEDDING

Thread Allocation and Clock Cycle Adjustment in an Interleaved Mult...

TRANSFORMER WITHIN WAFER TEST PROBE

COMPUTER PROGRAM AND COMPUTER SYSTEM FOR PRODUCING TEST FLOW

PROBE CARD ANALYSIS SYSTEM AND METHOD

METHOD AND APPARATUS FOR DETERMINING RELEVANCE VALUES FOR A DETECTI...

METHOD AND APPARATUS OF DEEMBEDDING

TESTING APPARATUS FOR COMPUTER MOTHERBOARD DESIGN