using high-frequency excitation

Industry

CPC
H01J49/105

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/105using high-frequency excitation

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Vaporizer, ion source and method for generating aluminum-containing...
- Patent number 12,328,807
- Issue date Jun 10, 2025
- NISSIN ION EQUIPMENT CO., LTD.
- George Sacco
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Standard sample film, method for producing standard sample film, st...
- Patent number 12,326,418
- Issue date Jun 10, 2025
- FUJIFILM Corporation
- Takuro Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and methods for detection and quantification of elements...
- Patent number 12,322,584
- Issue date Jun 3, 2025
- Georgetown University
- Kaveh Jorabchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shaped-channel scanning nozzle for scanning of a material surface
- Patent number 12,300,480
- Issue date May 13, 2025
- Elemental Scientific, Inc.
- Beau A. Marth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flow analysis device and flow analysis method
- Patent number 12,298,250
- Issue date May 13, 2025
- BL TEC K.K.
- Yorihiro Kumazawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution imaging apparatus and method
- Patent number 12,278,098
- Issue date Apr 15, 2025
- STANDARD BIOTOOLS CANADA INC.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining direction and distance of metallogenic pluto...
- Patent number 12,255,058
- Issue date Mar 18, 2025
- Tibet Julong Copper Co., Ltd.
- Youye Zheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle mass spectrometry
- Patent number 12,243,736
- Issue date Mar 4, 2025
- SHANGHAI POLARIS BIOLOGY CO., LTD.
- Yupeng Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Switchable ion guide
- Patent number 12,243,734
- Issue date Mar 4, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Henning Wehrs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inductively coupled plasma torch structure with flared outlet
- Patent number 12,219,687
- Issue date Feb 4, 2025
- Elemental Scientific, Inc.
- Daniel R. Wiederin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system to align the firing of a laser ablation apparatus...
- Patent number 12,211,683
- Issue date Jan 28, 2025
- Nicholas Russell West
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining ore-forming environment of porphyry deposit...
- Patent number 12,203,917
- Issue date Jan 21, 2025
- China University of Geosciences (Beijing)
- Youye Zheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 12,198,918
- Issue date Jan 14, 2025
- YOUNG IN ACE Co., Ltd.
- Sung Won Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for single particle analysis
- Patent number 12,154,777
- Issue date Nov 26, 2024
- SHANGHAI POLARIS BIOLOGY CO., LTD.
- Yupeng Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
- Patent number 12,152,966
- Issue date Nov 26, 2024
- Elemental Scientific, Inc.
- Beau A. Marth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interference suppression in mass spectrometer
- Patent number 12,148,605
- Issue date Nov 19, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Mikhail Belov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Autofocus sample imaging apparatus and method
- Patent number 12,124,020
- Issue date Oct 22, 2024
- STANDARD BIOTOOLS CANADA INC.
- Daaf Sandkuijl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing a magnetic powder
- Patent number 12,119,170
- Issue date Oct 15, 2024
- ABB Schweiz AG
- Reinhard Simon
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Magnetically coupled valve
- Patent number 12,104,710
- Issue date Oct 1, 2024
- Elemental Scientific, Inc.
- Caleb Gilmore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection method of metal impurity in wafer
- Patent number 12,107,016
- Issue date Oct 1, 2024
- ZING SEMICONDUCTOR CORPORATION
- Lanlin Wen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
- Patent number 12,094,738
- Issue date Sep 17, 2024
- Elemental Scientific, Inc.
- Tyler Yost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanoparticle analysis for ultra-low level concentrations of nanopar...
- Patent number 12,085,497
- Issue date Sep 10, 2024
- Elemental Scientific, Inc.
- Myung Hwan Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inductively coupled plasma based atomic analysis systems and methods
- Patent number 12,087,568
- Issue date Sep 10, 2024
- STANDARD BIOTOOLS CANADA INC.
- Alexander Loboda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guide with reduced noding effect
- Patent number 12,087,567
- Issue date Sep 10, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Henning Wehrs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Techniques for determining active ingredient (AI) volatility for ag...
- Patent number 12,078,623
- Issue date Sep 3, 2024
- Battelle Memorial Institute
- Timothy E. Lane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas analyzing apparatus and control method
- Patent number 12,078,611
- Issue date Sep 3, 2024
- Atonarp Inc.
- Naoki Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inline chemical agent addition for inline reaction with fluid sampl...
- Patent number 12,074,017
- Issue date Aug 27, 2024
- Elemental Scientific, Inc.
- Charles D. Quarles
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Automated system for online detection of organic molecular impuriti...
- Patent number 12,055,530
- Issue date Aug 6, 2024
- Elemental Scientific, Inc.
- Alexander Lang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stack for an energy storage device
- Patent number 12,040,452
- Issue date Jul 16, 2024
- Dyson Technology Limited
- Michael Edward Rendall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for ICPMS instrument stability control with strong acid resi...
- Patent number 12,040,172
- Issue date Jul 16, 2024
- Elemental Scientific, Inc.
- Kevin Wiederin
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INDUCTIVELY COUPLED PLASMA TORCH WITH REVERSE VORTEX FLOW AND METHO...
- Publication number 20250189455
- Publication date Jun 12, 2025
- Standard BioTools Canada Inc.
- Alexander V. Loboda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTI...
- Publication number 20250189412
- Publication date Jun 12, 2025
- ELEMENTAL SCIENTIFIC, INC.
- Beau A. Marth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS, METHOD, AND PROGRAM THAT PROVIDE TOTAL HEALTHCARE SOLUTI...
- Publication number 20250166833
- Publication date May 22, 2025
- PRECISION AND PERSONALIZED MEDICINE INCORPORATION (PPMI)
- Tai Gyu LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR SPECTROMETRY OF A SAMPLE IN A PLASMA
- Publication number 20250159789
- Publication date May 15, 2025
- FEI Company
- Sean KELLOGG
- G01 - MEASURING TESTING
Information Patent Application
ABLATION DEVICE
- Publication number 20250157807
- Publication date May 15, 2025
- GEOMAR Helmholtz Centre for Ocean Research Kiel
- Jan Fietzke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SKIMMERS FOR PLASMA INTERFACES
- Publication number 20250149322
- Publication date May 8, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Joachim Hinrichs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETICALLY COUPLED VALVE
- Publication number 20250129862
- Publication date Apr 24, 2025
- ELEMENTAL SCIENTIFIC, INC.
- Caleb Gilmore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INDUCTIVELY COUPLED PLASMA TORCH STRUCTURE WITH FLARED OUTLET
- Publication number 20250126700
- Publication date Apr 17, 2025
- ELEMENTAL SCIENTIFIC, INC.
- Daniel R. Wiederin
- G01 - MEASURING TESTING
Information Patent Application
FLOW ANALYSIS DEVICE AND FLOW ANALYSIS METHOD
- Publication number 20250110056
- Publication date Apr 3, 2025
- BL TEC K.K.
- Yorihiro KUMAZAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRETCHABLE COUPLING TUBE
- Publication number 20250093252
- Publication date Mar 20, 2025
- Standard BioTools Canada Inc.
- Alexander Loboda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR RECOVERING ORGANIC CONTAMINANTS FROM SEMICO...
- Publication number 20250079145
- Publication date Mar 6, 2025
- ELEMENTAL SCIENTIFIC, INC.
- Jacob Unnerstall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAILURE DETECTION OF SAMPLE INTRODUCTION SYSTEMS
- Publication number 20250069876
- Publication date Feb 27, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Antonella Guzzonato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOFOCUS SAMPLE IMAGING APPARATUS AND METHOD
- Publication number 20250044571
- Publication date Feb 6, 2025
- Standard BioTools Canada Inc.
- Daaf Sandkuijl
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER AND CONTROL METHOD THEREFOR
- Publication number 20250037984
- Publication date Jan 30, 2025
- Shimadzu Corporation
- Ryo FUJITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE-PARTICLE INDUCTIVELY-COUPLED PLASMA MASS SPECTROMETRY PARTIC...
- Publication number 20250020567
- Publication date Jan 16, 2025
- ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)
- Cedric David KOOLEN
- G01 - MEASURING TESTING
Information Patent Application
GAS ANALYZING APPARATUS AND CONTROL METHOD
- Publication number 20250020613
- Publication date Jan 16, 2025
- ATONARP INC.
- Naoki TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
INDUCTIVELY COUPLED PLASMA MASS SPECTROMETER
- Publication number 20250014884
- Publication date Jan 9, 2025
- Shimadzu Corporation
- Tomoyoshi MATSUSHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Techniques for Determining Active Ingredient (AI) Volatility for Ag...
- Publication number 20240426795
- Publication date Dec 26, 2024
- Battelle Memorial Institute
- Timothy E. Lane
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
AUTOMATED SYSTEM FOR ONLINE DETECTION OF ORGANIC MOLECULAR IMPURITI...
- Publication number 20240426796
- Publication date Dec 26, 2024
- ELEMENTAL SCIENTIFIC, INC.
- Alexander Lang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINING ORE-FORMING ENVIRONMENT OF PORPHYRY DEPOSIT...
- Publication number 20240426802
- Publication date Dec 26, 2024
- China University of Geosciences (Beijing)
- Youye ZHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER FOR ANALYZING AN ANALYTE SAMPLE
- Publication number 20240429037
- Publication date Dec 26, 2024
- Analytik Jena GmbH+Co. KG
- Iouri Kalinitchenko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ANALYZING MAGNETIC MATERIALS IN LITHIUM HYDROXIDE MONOHY...
- Publication number 20240426719
- Publication date Dec 26, 2024
- ENERGYSOURCE MINERALS, LLC
- Carlos Maria Valerio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE CONTROL PLASMA SOURCE ANALYZER ARRANGEMENT AND TEMPERAT...
- Publication number 20240420941
- Publication date Dec 19, 2024
- GEOMAR Helmholtz Centre for Ocean Research Kiel
- Jan Fietzke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-CERULOPLASMIN BOUND COPPER LEVEL MONITORING
- Publication number 20240382435
- Publication date Nov 21, 2024
- ORPHALAN S.A.
- Naseem Amin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION IMAGING APPARATUS AND METHOD
- Publication number 20240371622
- Publication date Nov 7, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STABILIZED CELL ACQUISITION FOR ELEMENTAL ANALYSIS
- Publication number 20240361304
- Publication date Oct 31, 2024
- Standard BioTools Canada Inc.
- Vladimir Baranov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20240363324
- Publication date Oct 31, 2024
- Shimadzu Corporation
- Tomoyoshi MATSUSHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Clinical Methods and Pharmaceutical Compositions Employing AMPA Rec...
- Publication number 20240355686
- Publication date Oct 24, 2024
- Daniel Pierce RADIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EX VIVO ANALYTIC METHOD
- Publication number 20240353432
- Publication date Oct 24, 2024
- HELMHOLTZ ZENTRUM MÜNCHEN DEUTSCHES FORSCHUNGSZENTRUM FÜR GESUNDHEIT UND UMWE...
- Bernhard MICHALKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR INLINE, DUAL-STAGE SAMPLE DILUTION
- Publication number 20240299928
- Publication date Sep 12, 2024
- ELEMENTAL SCIENTIFIC, INC.
- Daniel R. Wiederin
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

using high-frequency excitation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Vaporizer, ion source and method for generating aluminum-containing...

Standard sample film, method for producing standard sample film, st...

Apparatus and methods for detection and quantification of elements...

Shaped-channel scanning nozzle for scanning of a material surface

Flow analysis device and flow analysis method

High resolution imaging apparatus and method

Method for determining direction and distance of metallogenic pluto...

Particle mass spectrometry

Switchable ion guide

Inductively coupled plasma torch structure with flared outlet

Method and system to align the firing of a laser ablation apparatus...

Method for determining ore-forming environment of porphyry deposit...

Mass spectrometer

Systems and methods for single particle analysis

Systems for integrated decomposition and scanning of a semiconducti...

Interference suppression in mass spectrometer

Autofocus sample imaging apparatus and method

Method for producing a magnetic powder

Magnetically coupled valve

Detection method of metal impurity in wafer

Systems for integrated decomposition and scanning of a semiconducti...

Nanoparticle analysis for ultra-low level concentrations of nanopar...

Inductively coupled plasma based atomic analysis systems and methods

Ion guide with reduced noding effect

Techniques for determining active ingredient (AI) volatility for ag...

Gas analyzing apparatus and control method

Inline chemical agent addition for inline reaction with fluid sampl...

Automated system for online detection of organic molecular impuriti...

Stack for an energy storage device

Method for ICPMS instrument stability control with strong acid resi...

Patents Applicationslast 30 patents

INDUCTIVELY COUPLED PLASMA TORCH WITH REVERSE VORTEX FLOW AND METHO...

SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTI...

APPARATUS, METHOD, AND PROGRAM THAT PROVIDE TOTAL HEALTHCARE SOLUTI...

SYSTEM AND METHOD FOR SPECTROMETRY OF A SAMPLE IN A PLASMA

ABLATION DEVICE

SKIMMERS FOR PLASMA INTERFACES

MAGNETICALLY COUPLED VALVE

INDUCTIVELY COUPLED PLASMA TORCH STRUCTURE WITH FLARED OUTLET

FLOW ANALYSIS DEVICE AND FLOW ANALYSIS METHOD

STRETCHABLE COUPLING TUBE

SYSTEMS AND METHODS FOR RECOVERING ORGANIC CONTAMINANTS FROM SEMICO...

FAILURE DETECTION OF SAMPLE INTRODUCTION SYSTEMS

AUTOFOCUS SAMPLE IMAGING APPARATUS AND METHOD

MASS SPECTROMETER AND CONTROL METHOD THEREFOR

SINGLE-PARTICLE INDUCTIVELY-COUPLED PLASMA MASS SPECTROMETRY PARTIC...

GAS ANALYZING APPARATUS AND CONTROL METHOD

INDUCTIVELY COUPLED PLASMA MASS SPECTROMETER

Techniques for Determining Active Ingredient (AI) Volatility for Ag...

AUTOMATED SYSTEM FOR ONLINE DETECTION OF ORGANIC MOLECULAR IMPURITI...

METHOD FOR DETERMINING ORE-FORMING ENVIRONMENT OF PORPHYRY DEPOSIT...

MASS SPECTROMETER FOR ANALYZING AN ANALYTE SAMPLE

METHOD FOR ANALYZING MAGNETIC MATERIALS IN LITHIUM HYDROXIDE MONOHY...

TEMPERATURE CONTROL PLASMA SOURCE ANALYZER ARRANGEMENT AND TEMPERAT...

NON-CERULOPLASMIN BOUND COPPER LEVEL MONITORING

HIGH RESOLUTION IMAGING APPARATUS AND METHOD

STABILIZED CELL ACQUISITION FOR ELEMENTAL ANALYSIS

MASS SPECTROMETER

Clinical Methods and Pharmaceutical Compositions Employing AMPA Rec...

EX VIVO ANALYTIC METHOD

SYSTEMS AND METHODS FOR INLINE, DUAL-STAGE SAMPLE DILUTION