using high-frequency excitation

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CPC
H01J49/105

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/105using high-frequency excitation

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for single particle analysis
- Patent number 12,154,777
- Issue date Nov 26, 2024
- SHANGHAI POLARIS BIOLOGY CO., LTD.
- Yupeng Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
- Patent number 12,152,966
- Issue date Nov 26, 2024
- Elemental Scientific, Inc.
- Beau A. Marth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interference suppression in mass spectrometer
- Patent number 12,148,605
- Issue date Nov 19, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Mikhail Belov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Autofocus sample imaging apparatus and method
- Patent number 12,124,020
- Issue date Oct 22, 2024
- STANDARD BIOTOOLS CANADA INC.
- Daaf Sandkuijl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing a magnetic powder
- Patent number 12,119,170
- Issue date Oct 15, 2024
- ABB Schweiz AG
- Reinhard Simon
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Magnetically coupled valve
- Patent number 12,104,710
- Issue date Oct 1, 2024
- Elemental Scientific, Inc.
- Caleb Gilmore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection method of metal impurity in wafer
- Patent number 12,107,016
- Issue date Oct 1, 2024
- ZING SEMICONDUCTOR CORPORATION
- Lanlin Wen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
- Patent number 12,094,738
- Issue date Sep 17, 2024
- Elemental Scientific, Inc.
- Tyler Yost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanoparticle analysis for ultra-low level concentrations of nanopar...
- Patent number 12,085,497
- Issue date Sep 10, 2024
- Elemental Scientific, Inc.
- Myung Hwan Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inductively coupled plasma based atomic analysis systems and methods
- Patent number 12,087,568
- Issue date Sep 10, 2024
- STANDARD BIOTOOLS CANADA INC.
- Alexander Loboda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guide with reduced noding effect
- Patent number 12,087,567
- Issue date Sep 10, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Henning Wehrs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Techniques for determining active ingredient (AI) volatility for ag...
- Patent number 12,078,623
- Issue date Sep 3, 2024
- Battelle Memorial Institute
- Timothy E. Lane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas analyzing apparatus and control method
- Patent number 12,078,611
- Issue date Sep 3, 2024
- Atonarp Inc.
- Naoki Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inline chemical agent addition for inline reaction with fluid sampl...
- Patent number 12,074,017
- Issue date Aug 27, 2024
- Elemental Scientific, Inc.
- Charles D. Quarles
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Automated system for online detection of organic molecular impuriti...
- Patent number 12,055,530
- Issue date Aug 6, 2024
- Elemental Scientific, Inc.
- Alexander Lang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stack for an energy storage device
- Patent number 12,040,452
- Issue date Jul 16, 2024
- Dyson Technology Limited
- Michael Edward Rendall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for ICPMS instrument stability control with strong acid resi...
- Patent number 12,040,172
- Issue date Jul 16, 2024
- Elemental Scientific, Inc.
- Kevin Wiederin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Generator for spectrometry
- Patent number 12,022,603
- Issue date Jun 25, 2024
- Analytik Jena GmbH+Co. KG
- Frank Claus
- G01 - MEASURING TESTING
Information Patent Grant
Stabilized cell acquisition for elemental analysis
- Patent number 12,013,391
- Issue date Jun 18, 2024
- STANDARD BIOTOOLS CANADA INC.
- Vladimir Baranov
- G01 - MEASURING TESTING
Information Patent Grant
Plasma generating device
- Patent number 11,996,278
- Issue date May 28, 2024
- Atonarp Inc.
- Naoki Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample transport apparatus for mass spectrometry
- Patent number 11,986,826
- Issue date May 21, 2024
- SHANGHAI POLARIS BIOLOGY CO., LTD.
- Yuchong Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry apparatus
- Patent number 11,984,310
- Issue date May 14, 2024
- Analytik Jena GmbH
- Roland Lehmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution imaging apparatus and method
- Patent number 11,967,496
- Issue date Apr 23, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma generating device
- Patent number 11,961,730
- Issue date Apr 16, 2024
- Atonarp Inc.
- Naoki Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-device removal and installation tool
- Patent number 11,955,326
- Issue date Apr 9, 2024
- Agilent Technologies, Inc.
- Alan D. Loux
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Gas analyzer apparatus
- Patent number 11,942,312
- Issue date Mar 26, 2024
- Atonarp Inc.
- Naoki Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of analyzing metal component and method of manufacturing pur...
- Patent number 11,933,706
- Issue date Mar 19, 2024
- Tokyo Ohka Kogyo Co., Ltd.
- Kohei Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Collecting device and collecting method
- Patent number 11,923,138
- Issue date Mar 5, 2024
- Kioxia Corporation
- Sho Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for ionizing an analyte, and apparatus and met...
- Patent number 11,923,184
- Issue date Mar 5, 2024
- PLASMION GMBH
- Jan-Christoph Wolf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Verification methods and agronomic enhancements for carbon removal...
- Patent number 11,921,098
- Issue date Mar 5, 2024
- Eion Corp.
- Adam Wolf
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Techniques for Determining Active Ingredient (AI) Volatility for Ag...
- Publication number 20240426795
- Publication date Dec 26, 2024
- Battelle Memorial Institute
- Timothy E. Lane
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
AUTOMATED SYSTEM FOR ONLINE DETECTION OF ORGANIC MOLECULAR IMPURITI...
- Publication number 20240426796
- Publication date Dec 26, 2024
- ELEMENTAL SCIENTIFIC, INC.
- Alexander Lang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER FOR ANALYZING AN ANALYTE SAMPLE
- Publication number 20240429037
- Publication date Dec 26, 2024
- Analytik Jena GmbH+Co. KG
- Iouri Kalinitchenko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINING ORE-FORMING ENVIRONMENT OF PORPHYRY DEPOSIT...
- Publication number 20240426802
- Publication date Dec 26, 2024
- China University of Geosciences (Beijing)
- Youye ZHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ANALYZING MAGNETIC MATERIALS IN LITHIUM HYDROXIDE MONOHY...
- Publication number 20240426719
- Publication date Dec 26, 2024
- ENERGYSOURCE MINERALS, LLC
- Carlos Maria Valerio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE CONTROL PLASMA SOURCE ANALYZER ARRANGEMENT AND TEMPERAT...
- Publication number 20240420941
- Publication date Dec 19, 2024
- GEOMAR Helmholtz Centre for Ocean Research Kiel
- Jan Fietzke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-CERULOPLASMIN BOUND COPPER LEVEL MONITORING
- Publication number 20240382435
- Publication date Nov 21, 2024
- ORPHALAN S.A.
- Naseem Amin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION IMAGING APPARATUS AND METHOD
- Publication number 20240371622
- Publication date Nov 7, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STABILIZED CELL ACQUISITION FOR ELEMENTAL ANALYSIS
- Publication number 20240361304
- Publication date Oct 31, 2024
- Standard BioTools Canada Inc.
- Vladimir Baranov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20240363324
- Publication date Oct 31, 2024
- Shimadzu Corporation
- Tomoyoshi MATSUSHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Clinical Methods and Pharmaceutical Compositions Employing AMPA Rec...
- Publication number 20240355686
- Publication date Oct 24, 2024
- Daniel Pierce RADIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EX VIVO ANALYTIC METHOD
- Publication number 20240353432
- Publication date Oct 24, 2024
- HELMHOLTZ ZENTRUM MÜNCHEN DEUTSCHES FORSCHUNGSZENTRUM FÜR GESUNDHEIT UND UMWE...
- Bernhard MICHALKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR INLINE, DUAL-STAGE SAMPLE DILUTION
- Publication number 20240299928
- Publication date Sep 12, 2024
- ELEMENTAL SCIENTIFIC, INC.
- Daniel R. Wiederin
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
APPARATUS FOR ANALYZING METAL CONTAMINATION OF A WAFER AND A METHOD...
- Publication number 20240282566
- Publication date Aug 22, 2024
- SK SILTRON CO., LTD.
- Woo Young PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINING DIRECTION AND DISTANCE OF METALLOGENIC PLUTO...
- Publication number 20240282565
- Publication date Aug 22, 2024
- TIBET JULONG COPPER CO., LTD.
- Youye ZHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VERIFICATION METHODS AND AGRONOMIC ENHANCEMENTS FOR CARBON REMOVAL...
- Publication number 20240264139
- Publication date Aug 8, 2024
- Eion Corp.
- Adam Wolf
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
GAS ANALYZER APPARATUS
- Publication number 20240266155
- Publication date Aug 8, 2024
- ATONARP INC.
- Naoki TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA GENERATING DEVICE
- Publication number 20240258092
- Publication date Aug 1, 2024
- ATONARP INC.
- Naoki TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer and Mass Spectrometry Method
- Publication number 20240242954
- Publication date Jul 18, 2024
- Shimadzu Corporation
- Kazutaka MITSUI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-DEVICE REMOVAL AND INSTALLATION TOOL
- Publication number 20240238952
- Publication date Jul 18, 2024
- Agilent Technologies, Inc.
- Alan D. LOUX
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
METHOD AND APPARATUS FOR OPERATING A VACUUM INTERFACE OF A MASS SPE...
- Publication number 20240239653
- Publication date Jul 18, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Christoph WEHE
- C01 - INORGANIC CHEMISTRY
Information Patent Application
USES AND METHODS FOR ELEMENTOMIC CHARACTERIZATION ANALYSIS IN DIAGN...
- Publication number 20240230630
- Publication date Jul 11, 2024
- SHANGHAITECH UNIVERSITY
- Waichi SHUM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A SYSTEM TO GENERATE A HIGH YIELD OF NEGATIVE IONS FOR ICP-MS
- Publication number 20240203722
- Publication date Jun 20, 2024
- Gholamreza JAVAHERY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-DEVICE REMOVAL AND INSTALLATION TOOL
- Publication number 20240203721
- Publication date Jun 20, 2024
- Agilent Technologies, Inc.
- Alan D. LOUX
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
SWITCHABLE ION GUIDE
- Publication number 20240177985
- Publication date May 30, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Henning WEHRS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STANDARD SAMPLE FILM, METHOD FOR PRODUCING STANDARD SAMPLE FILM, ST...
- Publication number 20240170272
- Publication date May 23, 2024
- FUJIFILM CORPORATION
- Yasuhiko HIRANA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENHANCING MASS SPECTROMETER SIGNALS
- Publication number 20240153752
- Publication date May 9, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Jona THALMANN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD FOR SETTING ANALYSIS CONDITION
- Publication number 20240145223
- Publication date May 2, 2024
- Shimadzu Corporation
- Tomoyoshi MATSUSHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20240145225
- Publication date May 2, 2024
- Shimadzu Corporation
- Tomoyoshi MATSUSHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR ANALYZING A SAMPLE
- Publication number 20240118212
- Publication date Apr 11, 2024
- Analytik Jena GmbH+Co. KG
- Marcus Großmann
- H01 - BASIC ELECTRIC ELEMENTS

using high-frequency excitation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for single particle analysis

Systems for integrated decomposition and scanning of a semiconducti...

Interference suppression in mass spectrometer

Autofocus sample imaging apparatus and method

Method for producing a magnetic powder

Magnetically coupled valve

Detection method of metal impurity in wafer

Systems for integrated decomposition and scanning of a semiconducti...

Nanoparticle analysis for ultra-low level concentrations of nanopar...

Inductively coupled plasma based atomic analysis systems and methods

Ion guide with reduced noding effect

Techniques for determining active ingredient (AI) volatility for ag...

Gas analyzing apparatus and control method

Inline chemical agent addition for inline reaction with fluid sampl...

Automated system for online detection of organic molecular impuriti...

Stack for an energy storage device

Method for ICPMS instrument stability control with strong acid resi...

Generator for spectrometry

Stabilized cell acquisition for elemental analysis

Plasma generating device

Sample transport apparatus for mass spectrometry

Mass spectrometry apparatus

High resolution imaging apparatus and method

Plasma generating device

Multi-device removal and installation tool

Gas analyzer apparatus

Method of analyzing metal component and method of manufacturing pur...

Collecting device and collecting method

Apparatus and method for ionizing an analyte, and apparatus and met...

Verification methods and agronomic enhancements for carbon removal...

Patents Applicationslast 30 patents

Techniques for Determining Active Ingredient (AI) Volatility for Ag...

AUTOMATED SYSTEM FOR ONLINE DETECTION OF ORGANIC MOLECULAR IMPURITI...

MASS SPECTROMETER FOR ANALYZING AN ANALYTE SAMPLE

METHOD FOR DETERMINING ORE-FORMING ENVIRONMENT OF PORPHYRY DEPOSIT...

METHOD FOR ANALYZING MAGNETIC MATERIALS IN LITHIUM HYDROXIDE MONOHY...

TEMPERATURE CONTROL PLASMA SOURCE ANALYZER ARRANGEMENT AND TEMPERAT...

NON-CERULOPLASMIN BOUND COPPER LEVEL MONITORING

HIGH RESOLUTION IMAGING APPARATUS AND METHOD

STABILIZED CELL ACQUISITION FOR ELEMENTAL ANALYSIS

MASS SPECTROMETER

Clinical Methods and Pharmaceutical Compositions Employing AMPA Rec...

EX VIVO ANALYTIC METHOD

SYSTEMS AND METHODS FOR INLINE, DUAL-STAGE SAMPLE DILUTION

APPARATUS FOR ANALYZING METAL CONTAMINATION OF A WAFER AND A METHOD...

METHOD FOR DETERMINING DIRECTION AND DISTANCE OF METALLOGENIC PLUTO...

VERIFICATION METHODS AND AGRONOMIC ENHANCEMENTS FOR CARBON REMOVAL...

GAS ANALYZER APPARATUS

PLASMA GENERATING DEVICE

Mass Spectrometer and Mass Spectrometry Method

MULTI-DEVICE REMOVAL AND INSTALLATION TOOL

METHOD AND APPARATUS FOR OPERATING A VACUUM INTERFACE OF A MASS SPE...

USES AND METHODS FOR ELEMENTOMIC CHARACTERIZATION ANALYSIS IN DIAGN...

A SYSTEM TO GENERATE A HIGH YIELD OF NEGATIVE IONS FOR ICP-MS

MULTI-DEVICE REMOVAL AND INSTALLATION TOOL

SWITCHABLE ION GUIDE

STANDARD SAMPLE FILM, METHOD FOR PRODUCING STANDARD SAMPLE FILM, ST...

ENHANCING MASS SPECTROMETER SIGNALS

MASS SPECTROMETER AND METHOD FOR SETTING ANALYSIS CONDITION

MASS SPECTROMETER

SYSTEM FOR ANALYZING A SAMPLE