using holographic techniques

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CPC
G01B9/021

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/021using holographic techniques

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Digital holography for alignment in layer deposition
- Patent number 12,163,783
- Issue date Dec 10, 2024
- Applied Materials, Inc.
- Yeishin Tung
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and system for measuring a surface topography of an object
- Patent number 12,146,740
- Issue date Nov 19, 2024
- Carl Zeiss Industrielle Messtechnik GmbH
- Daniel Bublitz
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for measurement of optical wavefronts
- Patent number 12,053,240
- Issue date Aug 6, 2024
- ARIZONA OPTICAL METROLOGY LLC
- James Burge
- G01 - MEASURING TESTING
Information Patent Grant
Wide-area quantitative phase microscopy using spatial phase scannin...
- Patent number 12,050,434
- Issue date Jul 30, 2024
- University of South Florida
- Myung K. Kim
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Holographic microscope
- Patent number 12,045,008
- Issue date Jul 23, 2024
- Seon Kyu Yoon
- G01 - MEASURING TESTING
Information Patent Grant
System, method, and apparatus for digital holographic vibration ima...
- Patent number 12,045,010
- Issue date Jul 23, 2024
- EXCITING TECHNOLOGY LLC
- Matthew P. Dierking
- G01 - MEASURING TESTING
Information Patent Grant
Holographic three-dimensional multi-spot light stimulation device a...
- Patent number 11,921,045
- Issue date Mar 5, 2024
- National University Corporation Kobe University
- Osamu Matoba
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Methods and systems of holographic interferometry
- Patent number 11,892,292
- Issue date Feb 6, 2024
- RD Synergy Ltd.
- Dov Furman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus of automatic optical inspection using scanning...
- Patent number 11,809,134
- Issue date Nov 7, 2023
- CUBIXEL CO., LTD.
- Tae Geun Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for calibrating a measuring apparatus
- Patent number 11,774,237
- Issue date Oct 3, 2023
- Carl Zeiss SMT GmbH
- Jochen Hetzler
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems of holographic interferometry
- Patent number 11,719,531
- Issue date Aug 8, 2023
- RD Synergy Ltd.
- Dov Furman
- G02 - OPTICS
Information Patent Grant
Photonic integrated circuit-based optical phased array phasing tech...
- Patent number 11,532,881
- Issue date Dec 20, 2022
- Raytheon Company
- Richard L. Kendrick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Visual quality assessment augmentation employing holographic interf...
- Patent number 11,499,815
- Issue date Nov 15, 2022
- International Business Machines Corporation
- Eric V. Kline
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for rapid diagnosis of hematologic malignancy...
- Patent number 11,410,304
- Issue date Aug 9, 2022
- TOMOCUBE, INC.
- YongKeun Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Polarization holographic microscope system and sample image acquisi...
- Patent number 11,365,961
- Issue date Jun 21, 2022
- Korea University Research and Business Foundation
- Youngwoon Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fiber splitter device for digital holographic imaging and interfero...
- Patent number 11,340,438
- Issue date May 24, 2022
- Lyncee Tec S.A.
- Etienne Cuche
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Fiber optic sensor and system including a fiber of an optical cable...
- Patent number 11,320,614
- Issue date May 3, 2022
- Geospace Technologies Corporation
- Steven James Maas
- G02 - OPTICS
Information Patent Grant
Method and apparatus for carrying out a time-resolved interferometr...
- Patent number 11,293,747
- Issue date Apr 5, 2022
- Technische Universitaet Berlin
- Michael Lehmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple offset interferometer
- Patent number 11,226,588
- Issue date Jan 18, 2022
- Siemens Healthcare GmbH
- Thomas Engel
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional measurement device
- Patent number 11,118,895
- Issue date Sep 14, 2021
- CKD Corporation
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Grant
Method for defect inspection of transparent substrate by integratin...
- Patent number 10,976,152
- Issue date Apr 13, 2021
- National Taiwan Normal University
- Chau-Jern Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining a phase of an input beam bundle
- Patent number 10,823,547
- Issue date Nov 3, 2020
- Martin Berz
- G01 - MEASURING TESTING
Information Patent Grant
Displacement detecting device with controlled heat generation
- Patent number 10,451,401
- Issue date Oct 22, 2019
- DMG MORI CO., LTD.
- Hideaki Tamiya
- G01 - MEASURING TESTING
Information Patent Grant
Test device and method for testing a mirror
- Patent number 10,422,718
- Issue date Sep 24, 2019
- Carl Zeiss SMT GmbH
- Hans-Michael Stiepan
- G01 - MEASURING TESTING
Information Patent Grant
Optical system phase acquisition method and optical system evaluati...
- Patent number 10,365,164
- Issue date Jul 30, 2019
- Ushio Denki Kabushiki Kaisha
- Masashi Okamoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Fast phase processing of off-axis interferograms
- Patent number 10,337,851
- Issue date Jul 2, 2019
- Ramot at Tel Aviv University Ltd.
- Pinhas Girshovitz
- G01 - MEASURING TESTING
Information Patent Grant
Microscope device and image acquisition method
- Patent number 10,302,569
- Issue date May 28, 2019
- Hamamatsu Photonics K.K.
- Naoya Matsumoto
- G02 - OPTICS
Information Patent Grant
Method for observing a sample by lens-free imaging
- Patent number 10,254,531
- Issue date Apr 9, 2019
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Sophie Morel
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for digital holographic microtomography
- Patent number 10,234,268
- Issue date Mar 19, 2019
- National Taiwan Normal University
- Chau-Jern Cheng
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Unmanned vehicle, system and method for determining a planned path...
- Patent number 10,185,321
- Issue date Jan 22, 2019
- Proxy Technologies, Inc.
- John Klinger
- B64 - AIRCRAFT AVIATION COSMONAUTICS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR MEASUREMENT OF OPTICAL WORKPIECES
- Publication number 20240341587
- Publication date Oct 17, 2024
- ARIZONA OPTICAL METROLOGY LLC
- James Burge
- G01 - MEASURING TESTING
Information Patent Application
HOLOGRAPHIC MICROSCOPE
- Publication number 20240126206
- Publication date Apr 18, 2024
- KOREA PHOTONICS TECHNOLOGY INSTITUTE
- Seon Kyu YOON
- G01 - MEASURING TESTING
Information Patent Application
GEOMETRIC PHASE IN-LINE SCANNING HOLOGRAPHY SYSTEM FOR TRANSMISSIVE...
- Publication number 20230297027
- Publication date Sep 21, 2023
- CUBIXEL CO.,LTD.
- Tae Geun KIM
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND SYSTEM FOR MEASURING A SURFACE TOPOGRAPHY OF AN OBJECT
- Publication number 20230204339
- Publication date Jun 29, 2023
- Carl Zeiss Industrielle Messtechnik GmbH
- Daniel BUBLITZ
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL HOLOGRAPHY FOR ALIGNMENT IN LAYER DEPOSITION
- Publication number 20220341722
- Publication date Oct 27, 2022
- Applied Materials, Inc.
- Yeishin Tung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROL DEVICE, OPERATION METHOD OF CONTROL DEVICE, AND OPERATION P...
- Publication number 20220292740
- Publication date Sep 15, 2022
- FUJIFILM CORPORATION
- Hiroaki Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHOTONIC INTEGRATED CIRCUIT-BASED OPTICAL PHASED ARRAY PHASING TECH...
- Publication number 20220255219
- Publication date Aug 11, 2022
- Raytheon Company
- Richard L. Kendrick
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS OF AUTOMATIC OPTICAL INSPECTION USING SCANNING...
- Publication number 20220221822
- Publication date Jul 14, 2022
- INDUSTRY ACADEMY COOPERATION FOUNDATION OF SEJONG UNIVERSITY
- Tae Geun KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CALIBRATING A MEASURING APPARATUS
- Publication number 20220187061
- Publication date Jun 16, 2022
- Carl Zeiss SMT GMBH
- Jochen HETZLER
- G01 - MEASURING TESTING
Information Patent Application
VISUAL QUALITY ASSESSMENT AUGMENTATION EMPLOYING HOLOGRAPHIC INTERF...
- Publication number 20220178676
- Publication date Jun 9, 2022
- International Business Machines Corporation
- ERIC V. KLINE
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS OF HOLOGRAPHIC INTERFEROMETRY
- Publication number 20220018649
- Publication date Jan 20, 2022
- RD Synergy Ltd.
- Dov FURMAN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MEASUREMENT OF OPTICAL WAVEFRONTS
- Publication number 20210361159
- Publication date Nov 25, 2021
- ARIZONA OPTICAL METROLOGY LLC
- James Burge
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
HOLOGRAPHIC THREE-DIMENSIONAL MULTI-SPOT LIGHT STIMULATION DEVICE A...
- Publication number 20210293714
- Publication date Sep 23, 2021
- NATIONAL UNIVERSITY CORPORATION KOBE UNIVERSITY
- Osamu MATOBA
- G01 - MEASURING TESTING
Information Patent Application
POLARIZATION HOLOGRAPHIC MICROSCOPE SYSTEM AND SAMPLE IMAGE ACQUISI...
- Publication number 20210199417
- Publication date Jul 1, 2021
- Korea University Research and Business Foundation
- Youngwoon CHOI
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS FOR RAPID DIAGNOSIS OF HEMATOLOGIC MALIGNANCY...
- Publication number 20200394794
- Publication date Dec 17, 2020
- TOMOCUBE, INC.
- YongKeun PARK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT DEVICE
- Publication number 20200271434
- Publication date Aug 27, 2020
- CKD CORPORATION
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS OF HOLOGRAPHIC INTERFEROMETRY
- Publication number 20200141715
- Publication date May 7, 2020
- RD Synergy Ltd.
- Dov FURMAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR CARRYING OUT A TIME-RESOLVED INTERFEROMETR...
- Publication number 20200103213
- Publication date Apr 2, 2020
- Technische Universitaet Berlin
- Michael LEHMANN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUGMENTED REALITY PLATFORM AND METHOD FOR NAUTICAL APPLICATIONS
- Publication number 20200082630
- Publication date Mar 12, 2020
- Anuj Sharma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY TARGET
- Publication number 20200011650
- Publication date Jan 9, 2020
- Carl Zeiss SMT GMBH
- Hans-Michael Stiepan
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING A SPHERICAL-ASTIGMATIC OPTICAL SURFACE
- Publication number 20190271532
- Publication date Sep 5, 2019
- Carl Zeiss SMT GMBH
- Stefan SCHULTE
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING A PHASE OF AN INPUT BEAM BUNDLE
- Publication number 20190219378
- Publication date Jul 18, 2019
- Martin BERZ
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OBSERVING A SAMPLE BY LENS-FREE IMAGING
- Publication number 20180341099
- Publication date Nov 29, 2018
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Sophie MOREL
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DIGITAL HOLOGRAPHIC MICROTOMOGRAPHY
- Publication number 20180266806
- Publication date Sep 20, 2018
- National Taiwan Normal University
- Chau-Jern Cheng
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and Apparatus for Defect Inspection of Transparent Substrate
- Publication number 20180188016
- Publication date Jul 5, 2018
- National Taiwan Normal University
- Chau-Jern Cheng
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MICROSCOPE DEVICE AND IMAGE ACQUISITION METHOD
- Publication number 20180143137
- Publication date May 24, 2018
- HAMAMATSU PHOTONICS K. K.
- Naoya MATSUMOTO
- G02 - OPTICS
Information Patent Application
SYSTEM AND METHOD FOR THE REMOVAL OF TWIN-IMAGE ARTIFACT IN LENS FR...
- Publication number 20180128590
- Publication date May 10, 2018
- miDiagnostics NV
- Benjamin D. HAEFFELE
- G02 - OPTICS
Information Patent Application
DEVICE AND METHOD FOR NANOPARTICLE SIZING BASED ON TIME-RESOLVED ON...
- Publication number 20180052425
- Publication date Feb 22, 2018
- The Regents of the University of California
- Aydogan Ozcan
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM PHASE ACQUISITION METHOD AND OPTICAL SYSTEM EVALUATI...
- Publication number 20180024008
- Publication date Jan 25, 2018
- Ushio Denki Kabushiki Kaisha
- Masashi OKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
MORPHOLOGICAL CELL PARAMETER-BASED RED BLOOD CELL TEST METHOD AND D...
- Publication number 20170357211
- Publication date Dec 14, 2017
- Industry-Academic Cooperation Foundation, Chosun University
- Inkyu MOON
- G01 - MEASURING TESTING

using holographic techniques

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Digital holography for alignment in layer deposition

Method and system for measuring a surface topography of an object

Systems and methods for measurement of optical wavefronts

Wide-area quantitative phase microscopy using spatial phase scannin...

Holographic microscope

System, method, and apparatus for digital holographic vibration ima...

Holographic three-dimensional multi-spot light stimulation device a...

Methods and systems of holographic interferometry

Method and apparatus of automatic optical inspection using scanning...

Method for calibrating a measuring apparatus

Methods and systems of holographic interferometry

Photonic integrated circuit-based optical phased array phasing tech...

Visual quality assessment augmentation employing holographic interf...

Method and apparatus for rapid diagnosis of hematologic malignancy...

Polarization holographic microscope system and sample image acquisi...

Fiber splitter device for digital holographic imaging and interfero...

Fiber optic sensor and system including a fiber of an optical cable...

Method and apparatus for carrying out a time-resolved interferometr...

Multiple offset interferometer

Three-dimensional measurement device

Method for defect inspection of transparent substrate by integratin...

Method for determining a phase of an input beam bundle

Displacement detecting device with controlled heat generation

Test device and method for testing a mirror

Optical system phase acquisition method and optical system evaluati...

Fast phase processing of off-axis interferograms

Microscope device and image acquisition method

Method for observing a sample by lens-free imaging

Method and apparatus for digital holographic microtomography

Unmanned vehicle, system and method for determining a planned path...

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR MEASUREMENT OF OPTICAL WORKPIECES

HOLOGRAPHIC MICROSCOPE

GEOMETRIC PHASE IN-LINE SCANNING HOLOGRAPHY SYSTEM FOR TRANSMISSIVE...

METHOD AND SYSTEM FOR MEASURING A SURFACE TOPOGRAPHY OF AN OBJECT

DIGITAL HOLOGRAPHY FOR ALIGNMENT IN LAYER DEPOSITION

CONTROL DEVICE, OPERATION METHOD OF CONTROL DEVICE, AND OPERATION P...

PHOTONIC INTEGRATED CIRCUIT-BASED OPTICAL PHASED ARRAY PHASING TECH...

METHOD AND APPARATUS OF AUTOMATIC OPTICAL INSPECTION USING SCANNING...

METHOD FOR CALIBRATING A MEASURING APPARATUS

VISUAL QUALITY ASSESSMENT AUGMENTATION EMPLOYING HOLOGRAPHIC INTERF...

METHODS AND SYSTEMS OF HOLOGRAPHIC INTERFEROMETRY

SYSTEMS AND METHODS FOR MEASUREMENT OF OPTICAL WAVEFRONTS

HOLOGRAPHIC THREE-DIMENSIONAL MULTI-SPOT LIGHT STIMULATION DEVICE A...

POLARIZATION HOLOGRAPHIC MICROSCOPE SYSTEM AND SAMPLE IMAGE ACQUISI...

METHOD AND APPARATUS FOR RAPID DIAGNOSIS OF HEMATOLOGIC MALIGNANCY...

THREE-DIMENSIONAL MEASUREMENT DEVICE

METHODS AND SYSTEMS OF HOLOGRAPHIC INTERFEROMETRY

METHOD AND APPARATUS FOR CARRYING OUT A TIME-RESOLVED INTERFEROMETR...

AUGMENTED REALITY PLATFORM AND METHOD FOR NAUTICAL APPLICATIONS

METROLOGY TARGET

METHOD FOR MEASURING A SPHERICAL-ASTIGMATIC OPTICAL SURFACE

METHOD FOR DETERMINING A PHASE OF AN INPUT BEAM BUNDLE

METHOD FOR OBSERVING A SAMPLE BY LENS-FREE IMAGING

METHOD AND APPARATUS FOR DIGITAL HOLOGRAPHIC MICROTOMOGRAPHY

Method and Apparatus for Defect Inspection of Transparent Substrate

MICROSCOPE DEVICE AND IMAGE ACQUISITION METHOD

SYSTEM AND METHOD FOR THE REMOVAL OF TWIN-IMAGE ARTIFACT IN LENS FR...

DEVICE AND METHOD FOR NANOPARTICLE SIZING BASED ON TIME-RESOLVED ON...

OPTICAL SYSTEM PHASE ACQUISITION METHOD AND OPTICAL SYSTEM EVALUATI...

MORPHOLOGICAL CELL PARAMETER-BASED RED BLOOD CELL TEST METHOD AND D...