using microprogrammed units

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CPC
G11C29/16

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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/16using microprogrammed units

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for detecting and configuring lanes in a circui...
- Patent number 12,087,381
- Issue date Sep 10, 2024
- Altera Corporation
- Marian Cretu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
JTAG registers with concurrent inputs
- Patent number 12,072,380
- Issue date Aug 27, 2024
- Antonino Mondello
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built-in memory repair with repair code compression
- Patent number 12,033,711
- Issue date Jul 9, 2024
- Texas Instruments Incorporated
- Devanathan Varadarajan
- G11 - INFORMATION STORAGE
Information Patent Grant
JTAG based architecture allowing multi-core operation
- Patent number 11,830,563
- Issue date Nov 28, 2023
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Grant
Test system for executing built-in self-test in deployment for auto...
- Patent number 11,810,632
- Issue date Nov 7, 2023
- NVIDIA Corporation
- Anitha Kalva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test systems for executing self-testing in deployed automotive plat...
- Patent number 11,768,241
- Issue date Sep 26, 2023
- NVIDIA Corporation
- Anitha Kalva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device architecture coupled to a system-on-chip
- Patent number 11,749,369
- Issue date Sep 5, 2023
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device with analog measurement mode features
- Patent number 11,728,002
- Issue date Aug 15, 2023
- Micron Technology, Inc.
- Alberto Troia
- G11 - INFORMATION STORAGE
Information Patent Grant
Simulating memory cell sensing for testing sensing circuitry
- Patent number 11,699,502
- Issue date Jul 11, 2023
- SanDisk Technologies LLC
- Iris Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for the secured storing of a data element of a predefined da...
- Patent number 11,694,759
- Issue date Jul 4, 2023
- Robert Bosch GmbH
- Martin Assel
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus, system, and method for trimming analog temperature sensors
- Patent number 11,668,612
- Issue date Jun 6, 2023
- SanDisk Technologies LLC
- Venkata Nittala
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in memory repair with repair code compression
- Patent number 11,631,472
- Issue date Apr 18, 2023
- Texas Instruments Incorporated
- Devanathan Varadarajan
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory devices and repair methods of the semiconducto...
- Patent number 11,621,050
- Issue date Apr 4, 2023
- SK hynix Inc.
- Jae Il Lim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test systems for executing self-testing in deployed automotive plat...
- Patent number 11,573,269
- Issue date Feb 7, 2023
- NVIDIA Corporation
- Anitha Kalva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Logic built-in self-test of an electronic circuit
- Patent number 11,574,695
- Issue date Feb 7, 2023
- International Business Machines Corporation
- Alejandro Alberto Cook Lobo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory controller with integrated test circuitry
- Patent number 11,567,120
- Issue date Jan 31, 2023
- RAMBUS INC.
- Frederick A. Ware
- G01 - MEASURING TESTING
Information Patent Grant
Managed-NAND real time analyzer and method
- Patent number 11,495,317
- Issue date Nov 8, 2022
- Micron Technology, Inc.
- Andrea Vigilante
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device architecture coupled to a System-on-Chip
- Patent number 11,443,821
- Issue date Sep 13, 2022
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Grant
Test system for executing built-in self-test in deployment for auto...
- Patent number 11,424,000
- Issue date Aug 23, 2022
- NVIDIA Corporation
- Anitha Kalva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
JTAG registers with concurrent inputs
- Patent number 11,408,935
- Issue date Aug 9, 2022
- Micron Technology, Inc.
- Antonino Mondello
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Diagnostic enhancement for multiple instances of identical structures
- Patent number 11,378,623
- Issue date Jul 5, 2022
- International Business Machines Corporation
- Steven Michael Douskey
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device with analog measurement mode features
- Patent number 11,348,655
- Issue date May 31, 2022
- Micron Technology, Inc.
- Alberto Troia
- G11 - INFORMATION STORAGE
Information Patent Grant
Microcontroller architecture for non-volatile memory
- Patent number 11,334,294
- Issue date May 17, 2022
- SanDisk Technologies LLC
- Chi-Lin Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
JTAG based architecture allowing multi-core operation
- Patent number 11,322,223
- Issue date May 3, 2022
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory controller with integrated test circuitry
- Patent number 11,307,243
- Issue date Apr 19, 2022
- RAMBUS INC.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Grant
Microcontroller architecture for non-volatile memory
- Patent number 11,301,176
- Issue date Apr 12, 2022
- SanDisk Technologies LLC
- Chi-Lin Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built-in-self-test circuits and methods using pipeline registers
- Patent number 11,257,562
- Issue date Feb 22, 2022
- Intel Corporation
- Tze Sin Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing memory cells by allocating an access value to a memory acce...
- Patent number 11,238,948
- Issue date Feb 1, 2022
- Infineon Technologies AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Grant
Storage device and operating method thereof
- Patent number 11,182,328
- Issue date Nov 23, 2021
- Samsung Electronics Co., Ltd.
- Boram Hong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining soft data for fractional digit memory cells
- Patent number 11,170,847
- Issue date Nov 9, 2021
- Micron Technology, Inc.
- Sivagnanam Parthasarathy
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
BUILT-IN SELF-TEST ENHANCEMENTS
- Publication number 20240319268
- Publication date Sep 26, 2024
- QUALCOMM Incorporated
- Gaurav VERMA
- B60 - VEHICLES IN GENERAL
Information Patent Application
BUILT-IN MEMORY REPAIR WITH REPAIR CODE COMPRESSION
- Publication number 20240321378
- Publication date Sep 26, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Devanathan VARADARAJAN
- G11 - INFORMATION STORAGE
Information Patent Application
AT-SPEED TEST OF FUNCTIONAL MEMORY INTERFACE LOGIC IN DEVICES
- Publication number 20240120016
- Publication date Apr 11, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Devanathan Varadarajan
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS AND APPARATUS FOR TESTING INACCESSIBLE INTERFACE CIRCUITS I...
- Publication number 20230266385
- Publication date Aug 24, 2023
- Rambus Inc.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN MEMORY REPAIR WITH REPAIR CODE COMPRESSION
- Publication number 20230253062
- Publication date Aug 10, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Devanathan VARADARAJAN
- G11 - INFORMATION STORAGE
Information Patent Application
LOGIC BUILT-IN SELF-TEST OF AN ELECTRONIC CIRCUIT
- Publication number 20230035157
- Publication date Feb 2, 2023
- International Business Machines Corporation
- Alejandro Alberto Cook Lobo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE ARCHITECTURE COUPLED TO A SYSTEM-ON-CHIP
- Publication number 20230005561
- Publication date Jan 5, 2023
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Application
Test System For Executing Built-In Self-Test In Deployment For Auto...
- Publication number 20220399069
- Publication date Dec 15, 2022
- NVIDIA Corporation
- Anitha Kalva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE WITH ANALOG MEASUREMENT MODE FEATURES
- Publication number 20220293203
- Publication date Sep 15, 2022
- Micron Technology, Inc.
- Alberto Troia
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY CONTROLLER WITH INTEGRATED TEST CIRCUITRY
- Publication number 20220283219
- Publication date Sep 8, 2022
- Rambus Inc.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Application
JTAG BASED ARCHITECTURE ALLOWING MULTI-CORE OPERATION
- Publication number 20220254438
- Publication date Aug 11, 2022
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN MEMORY REPAIR WITH REPAIR CODE COMPRESSION
- Publication number 20220199188
- Publication date Jun 23, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Devanathan VARADARAJAN
- G11 - INFORMATION STORAGE
Information Patent Application
DIAGNOSTIC ENHANCEMENT FOR MULTIPLE INSTANCES OF IDENTICAL STRUCTURES
- Publication number 20220178996
- Publication date Jun 9, 2022
- International Business Machines Corporation
- Steven Michael DOUSKEY
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR THE SECURED STORING OF A DATA ELEMENT OF A PREDEFINED DA...
- Publication number 20220028474
- Publication date Jan 27, 2022
- ROBERT BOSCH GmbH
- Martin Assel
- G11 - INFORMATION STORAGE
Information Patent Application
TEST SYSTEMS FOR EXECUTING SELF-TESTING IN DEPLOYED AUTOMOTIVE PLAT...
- Publication number 20210341537
- Publication date Nov 4, 2021
- NVIDIA Corporation
- Anitha Kalva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
A MEMORY DEVICE ARCHITECTURE COUPLED TO A SYSTEM-ON-CHIP
- Publication number 20210335439
- Publication date Oct 28, 2021
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Application
JTAG BASED ARCHITECTURE ALLOWING MULTI-CORE OPERATION
- Publication number 20210335444
- Publication date Oct 28, 2021
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY TEST ENGINE WITH FULLY PROGRAMMABLE PATTERNS
- Publication number 20210335440
- Publication date Oct 28, 2021
- FLC Technology Group, Inc.
- Jiapeng Guo
- G11 - INFORMATION STORAGE
Information Patent Application
JTAG BASED ARCHITECTURE ALLOWING MULTI-CORE OPERATION
- Publication number 20210335435
- Publication date Oct 28, 2021
- Micron Technology, Inc.
- Alberto Troia
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
AT-SPEED TEST OF FUNCTIONAL MEMORY INTERFACE LOGIC IN DEVICES
- Publication number 20210327525
- Publication date Oct 21, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Devanathan Varadarajan
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE WITH ANALOG MEASUREMENT MODE FEATURES
- Publication number 20210327526
- Publication date Oct 21, 2021
- Micron Technology, Inc.
- Alberto Troia
- G11 - INFORMATION STORAGE
Information Patent Application
Systems And Methods For Detecting And Configuring Lanes In A Circui...
- Publication number 20210319841
- Publication date Oct 14, 2021
- Intel Corporation
- Marian Cretu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING MEMORY CELLS BY ALLOCATING AN ACCESS VALUE TO A MEMORY ACCE...
- Publication number 20210158882
- Publication date May 27, 2021
- INFINEON TECHNOLOGIES AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Application
TEST SYSTEM FOR EXECUTING BUILT-IN SELF-TEST IN DEPLOYMENT FOR AUTO...
- Publication number 20210151118
- Publication date May 20, 2021
- NVIDIA Corporation
- Anitha Kalva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY CONTROLLER WITH INTEGRATED TEST CIRCUITRY
- Publication number 20210033665
- Publication date Feb 4, 2021
- Rambus Inc.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Application
Method and Apparatus for enabling Multiple Return Material Authoriz...
- Publication number 20210012855
- Publication date Jan 14, 2021
- Sankaran M. Menon
- G11 - INFORMATION STORAGE
Information Patent Application
MANAGED-NAND REAL TIME ANALYZER AND METHOD
- Publication number 20200411127
- Publication date Dec 31, 2020
- Micron Technology, Inc.
- Andrea Vigilante
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MICROCONTROLLER ARCHITECTURE FOR NON-VOLATILE MEMORY
- Publication number 20200356311
- Publication date Nov 12, 2020
- SANDISK TECHNOLOGIES LLC
- Chi-Lin Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MICROCONTROLLER ARCHITECTURE FOR NON-VOLATILE MEMORY
- Publication number 20200341691
- Publication date Oct 29, 2020
- SANDISK TECHNOLOGIES LLC
- Chi-Lin Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING SOFT DATA FOR FRACTIONAL DIGIT MEMORY CELLS
- Publication number 20200176054
- Publication date Jun 4, 2020
- Micron Technology, Inc.
- Sivagnanam Parthasarathy
- G06 - COMPUTING CALCULATING COUNTING

using microprogrammed units

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for detecting and configuring lanes in a circui...

JTAG registers with concurrent inputs

Built-in memory repair with repair code compression

JTAG based architecture allowing multi-core operation

Test system for executing built-in self-test in deployment for auto...

Test systems for executing self-testing in deployed automotive plat...

Memory device architecture coupled to a system-on-chip

Memory device with analog measurement mode features

Simulating memory cell sensing for testing sensing circuitry

Method for the secured storing of a data element of a predefined da...

Apparatus, system, and method for trimming analog temperature sensors

Built-in memory repair with repair code compression

Semiconductor memory devices and repair methods of the semiconducto...

Test systems for executing self-testing in deployed automotive plat...

Logic built-in self-test of an electronic circuit

Memory controller with integrated test circuitry

Managed-NAND real time analyzer and method

Memory device architecture coupled to a System-on-Chip

Test system for executing built-in self-test in deployment for auto...

JTAG registers with concurrent inputs

Diagnostic enhancement for multiple instances of identical structures

Memory device with analog measurement mode features

Microcontroller architecture for non-volatile memory

JTAG based architecture allowing multi-core operation

Memory controller with integrated test circuitry

Microcontroller architecture for non-volatile memory

Built-in-self-test circuits and methods using pipeline registers

Testing memory cells by allocating an access value to a memory acce...

Storage device and operating method thereof

Determining soft data for fractional digit memory cells

Patents Applicationslast 30 patents

BUILT-IN SELF-TEST ENHANCEMENTS

BUILT-IN MEMORY REPAIR WITH REPAIR CODE COMPRESSION

AT-SPEED TEST OF FUNCTIONAL MEMORY INTERFACE LOGIC IN DEVICES

METHODS AND APPARATUS FOR TESTING INACCESSIBLE INTERFACE CIRCUITS I...

BUILT-IN MEMORY REPAIR WITH REPAIR CODE COMPRESSION

LOGIC BUILT-IN SELF-TEST OF AN ELECTRONIC CIRCUIT

MEMORY DEVICE ARCHITECTURE COUPLED TO A SYSTEM-ON-CHIP

Test System For Executing Built-In Self-Test In Deployment For Auto...

MEMORY DEVICE WITH ANALOG MEASUREMENT MODE FEATURES

MEMORY CONTROLLER WITH INTEGRATED TEST CIRCUITRY

JTAG BASED ARCHITECTURE ALLOWING MULTI-CORE OPERATION

BUILT-IN MEMORY REPAIR WITH REPAIR CODE COMPRESSION

DIAGNOSTIC ENHANCEMENT FOR MULTIPLE INSTANCES OF IDENTICAL STRUCTURES

METHOD FOR THE SECURED STORING OF A DATA ELEMENT OF A PREDEFINED DA...

TEST SYSTEMS FOR EXECUTING SELF-TESTING IN DEPLOYED AUTOMOTIVE PLAT...

A MEMORY DEVICE ARCHITECTURE COUPLED TO A SYSTEM-ON-CHIP

JTAG BASED ARCHITECTURE ALLOWING MULTI-CORE OPERATION

MEMORY TEST ENGINE WITH FULLY PROGRAMMABLE PATTERNS

JTAG BASED ARCHITECTURE ALLOWING MULTI-CORE OPERATION

AT-SPEED TEST OF FUNCTIONAL MEMORY INTERFACE LOGIC IN DEVICES

MEMORY DEVICE WITH ANALOG MEASUREMENT MODE FEATURES

Systems And Methods For Detecting And Configuring Lanes In A Circui...

TESTING MEMORY CELLS BY ALLOCATING AN ACCESS VALUE TO A MEMORY ACCE...

TEST SYSTEM FOR EXECUTING BUILT-IN SELF-TEST IN DEPLOYMENT FOR AUTO...

MEMORY CONTROLLER WITH INTEGRATED TEST CIRCUITRY

Method and Apparatus for enabling Multiple Return Material Authoriz...

MANAGED-NAND REAL TIME ANALYZER AND METHOD

MICROCONTROLLER ARCHITECTURE FOR NON-VOLATILE MEMORY

MICROCONTROLLER ARCHITECTURE FOR NON-VOLATILE MEMORY

DETERMINING SOFT DATA FOR FRACTIONAL DIGIT MEMORY CELLS