using microprogrammed units

Industry

CPC
G11C29/16

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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/16using microprogrammed units

Industries

Patents Grantslast 30 patents

Information Patent Grant
At-speed test of functional memory interface logic in devices
- Patent number 12,243,603
- Issue date Mar 4, 2025
- Texas Instruments Incorporated
- Devanathan Varadarajan
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods and apparatus for testing inaccessible interface circuits i...
- Patent number 12,196,805
- Issue date Jan 14, 2025
- RAMBUS INC.
- Frederick A. Ware
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for enabling multiple return material authoriz...
- Patent number 12,183,412
- Issue date Dec 31, 2024
- Altera Corporation
- Sankaran M. Menon
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods for detecting and configuring lanes in a circui...
- Patent number 12,087,381
- Issue date Sep 10, 2024
- Altera Corporation
- Marian Cretu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
JTAG registers with concurrent inputs
- Patent number 12,072,380
- Issue date Aug 27, 2024
- Antonino Mondello
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built-in memory repair with repair code compression
- Patent number 12,033,711
- Issue date Jul 9, 2024
- Texas Instruments Incorporated
- Devanathan Varadarajan
- G11 - INFORMATION STORAGE
Information Patent Grant
JTAG based architecture allowing multi-core operation
- Patent number 11,830,563
- Issue date Nov 28, 2023
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Grant
Test system for executing built-in self-test in deployment for auto...
- Patent number 11,810,632
- Issue date Nov 7, 2023
- NVIDIA Corporation
- Anitha Kalva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test systems for executing self-testing in deployed automotive plat...
- Patent number 11,768,241
- Issue date Sep 26, 2023
- NVIDIA Corporation
- Anitha Kalva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device architecture coupled to a system-on-chip
- Patent number 11,749,369
- Issue date Sep 5, 2023
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device with analog measurement mode features
- Patent number 11,728,002
- Issue date Aug 15, 2023
- Micron Technology, Inc.
- Alberto Troia
- G11 - INFORMATION STORAGE
Information Patent Grant
Simulating memory cell sensing for testing sensing circuitry
- Patent number 11,699,502
- Issue date Jul 11, 2023
- SanDisk Technologies LLC
- Iris Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for the secured storing of a data element of a predefined da...
- Patent number 11,694,759
- Issue date Jul 4, 2023
- Robert Bosch GmbH
- Martin Assel
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus, system, and method for trimming analog temperature sensors
- Patent number 11,668,612
- Issue date Jun 6, 2023
- SanDisk Technologies LLC
- Venkata Nittala
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in memory repair with repair code compression
- Patent number 11,631,472
- Issue date Apr 18, 2023
- Texas Instruments Incorporated
- Devanathan Varadarajan
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory devices and repair methods of the semiconducto...
- Patent number 11,621,050
- Issue date Apr 4, 2023
- SK hynix Inc.
- Jae Il Lim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test systems for executing self-testing in deployed automotive plat...
- Patent number 11,573,269
- Issue date Feb 7, 2023
- NVIDIA Corporation
- Anitha Kalva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Logic built-in self-test of an electronic circuit
- Patent number 11,574,695
- Issue date Feb 7, 2023
- International Business Machines Corporation
- Alejandro Alberto Cook Lobo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory controller with integrated test circuitry
- Patent number 11,567,120
- Issue date Jan 31, 2023
- RAMBUS INC.
- Frederick A. Ware
- G01 - MEASURING TESTING
Information Patent Grant
Managed-NAND real time analyzer and method
- Patent number 11,495,317
- Issue date Nov 8, 2022
- Micron Technology, Inc.
- Andrea Vigilante
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device architecture coupled to a System-on-Chip
- Patent number 11,443,821
- Issue date Sep 13, 2022
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Grant
Test system for executing built-in self-test in deployment for auto...
- Patent number 11,424,000
- Issue date Aug 23, 2022
- NVIDIA Corporation
- Anitha Kalva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
JTAG registers with concurrent inputs
- Patent number 11,408,935
- Issue date Aug 9, 2022
- Micron Technology, Inc.
- Antonino Mondello
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Diagnostic enhancement for multiple instances of identical structures
- Patent number 11,378,623
- Issue date Jul 5, 2022
- International Business Machines Corporation
- Steven Michael Douskey
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device with analog measurement mode features
- Patent number 11,348,655
- Issue date May 31, 2022
- Micron Technology, Inc.
- Alberto Troia
- G11 - INFORMATION STORAGE
Information Patent Grant
Microcontroller architecture for non-volatile memory
- Patent number 11,334,294
- Issue date May 17, 2022
- SanDisk Technologies LLC
- Chi-Lin Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
JTAG based architecture allowing multi-core operation
- Patent number 11,322,223
- Issue date May 3, 2022
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory controller with integrated test circuitry
- Patent number 11,307,243
- Issue date Apr 19, 2022
- RAMBUS INC.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Grant
Microcontroller architecture for non-volatile memory
- Patent number 11,301,176
- Issue date Apr 12, 2022
- SanDisk Technologies LLC
- Chi-Lin Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built-in-self-test circuits and methods using pipeline registers
- Patent number 11,257,562
- Issue date Feb 22, 2022
- Intel Corporation
- Tze Sin Tan
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
BUILT-IN SELF-TEST ENHANCEMENTS
- Publication number 20240319268
- Publication date Sep 26, 2024
- QUALCOMM Incorporated
- Gaurav VERMA
- B60 - VEHICLES IN GENERAL
Information Patent Application
BUILT-IN MEMORY REPAIR WITH REPAIR CODE COMPRESSION
- Publication number 20240321378
- Publication date Sep 26, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Devanathan VARADARAJAN
- G11 - INFORMATION STORAGE
Information Patent Application
AT-SPEED TEST OF FUNCTIONAL MEMORY INTERFACE LOGIC IN DEVICES
- Publication number 20240120016
- Publication date Apr 11, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Devanathan Varadarajan
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS AND APPARATUS FOR TESTING INACCESSIBLE INTERFACE CIRCUITS I...
- Publication number 20230266385
- Publication date Aug 24, 2023
- Rambus Inc.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN MEMORY REPAIR WITH REPAIR CODE COMPRESSION
- Publication number 20230253062
- Publication date Aug 10, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Devanathan VARADARAJAN
- G11 - INFORMATION STORAGE
Information Patent Application
LOGIC BUILT-IN SELF-TEST OF AN ELECTRONIC CIRCUIT
- Publication number 20230035157
- Publication date Feb 2, 2023
- International Business Machines Corporation
- Alejandro Alberto Cook Lobo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE ARCHITECTURE COUPLED TO A SYSTEM-ON-CHIP
- Publication number 20230005561
- Publication date Jan 5, 2023
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Application
Test System For Executing Built-In Self-Test In Deployment For Auto...
- Publication number 20220399069
- Publication date Dec 15, 2022
- NVIDIA Corporation
- Anitha Kalva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE WITH ANALOG MEASUREMENT MODE FEATURES
- Publication number 20220293203
- Publication date Sep 15, 2022
- Micron Technology, Inc.
- Alberto Troia
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY CONTROLLER WITH INTEGRATED TEST CIRCUITRY
- Publication number 20220283219
- Publication date Sep 8, 2022
- Rambus Inc.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Application
JTAG BASED ARCHITECTURE ALLOWING MULTI-CORE OPERATION
- Publication number 20220254438
- Publication date Aug 11, 2022
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN MEMORY REPAIR WITH REPAIR CODE COMPRESSION
- Publication number 20220199188
- Publication date Jun 23, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Devanathan VARADARAJAN
- G11 - INFORMATION STORAGE
Information Patent Application
DIAGNOSTIC ENHANCEMENT FOR MULTIPLE INSTANCES OF IDENTICAL STRUCTURES
- Publication number 20220178996
- Publication date Jun 9, 2022
- International Business Machines Corporation
- Steven Michael DOUSKEY
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR THE SECURED STORING OF A DATA ELEMENT OF A PREDEFINED DA...
- Publication number 20220028474
- Publication date Jan 27, 2022
- ROBERT BOSCH GmbH
- Martin Assel
- G11 - INFORMATION STORAGE
Information Patent Application
TEST SYSTEMS FOR EXECUTING SELF-TESTING IN DEPLOYED AUTOMOTIVE PLAT...
- Publication number 20210341537
- Publication date Nov 4, 2021
- NVIDIA Corporation
- Anitha Kalva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
A MEMORY DEVICE ARCHITECTURE COUPLED TO A SYSTEM-ON-CHIP
- Publication number 20210335439
- Publication date Oct 28, 2021
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Application
JTAG BASED ARCHITECTURE ALLOWING MULTI-CORE OPERATION
- Publication number 20210335444
- Publication date Oct 28, 2021
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY TEST ENGINE WITH FULLY PROGRAMMABLE PATTERNS
- Publication number 20210335440
- Publication date Oct 28, 2021
- FLC Technology Group, Inc.
- Jiapeng Guo
- G11 - INFORMATION STORAGE
Information Patent Application
JTAG BASED ARCHITECTURE ALLOWING MULTI-CORE OPERATION
- Publication number 20210335435
- Publication date Oct 28, 2021
- Micron Technology, Inc.
- Alberto Troia
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
AT-SPEED TEST OF FUNCTIONAL MEMORY INTERFACE LOGIC IN DEVICES
- Publication number 20210327525
- Publication date Oct 21, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Devanathan Varadarajan
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE WITH ANALOG MEASUREMENT MODE FEATURES
- Publication number 20210327526
- Publication date Oct 21, 2021
- Micron Technology, Inc.
- Alberto Troia
- G11 - INFORMATION STORAGE
Information Patent Application
Systems And Methods For Detecting And Configuring Lanes In A Circui...
- Publication number 20210319841
- Publication date Oct 14, 2021
- Intel Corporation
- Marian Cretu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING MEMORY CELLS BY ALLOCATING AN ACCESS VALUE TO A MEMORY ACCE...
- Publication number 20210158882
- Publication date May 27, 2021
- INFINEON TECHNOLOGIES AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Application
TEST SYSTEM FOR EXECUTING BUILT-IN SELF-TEST IN DEPLOYMENT FOR AUTO...
- Publication number 20210151118
- Publication date May 20, 2021
- NVIDIA Corporation
- Anitha Kalva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY CONTROLLER WITH INTEGRATED TEST CIRCUITRY
- Publication number 20210033665
- Publication date Feb 4, 2021
- Rambus Inc.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Application
Method and Apparatus for enabling Multiple Return Material Authoriz...
- Publication number 20210012855
- Publication date Jan 14, 2021
- Sankaran M. Menon
- G11 - INFORMATION STORAGE
Information Patent Application
MANAGED-NAND REAL TIME ANALYZER AND METHOD
- Publication number 20200411127
- Publication date Dec 31, 2020
- Micron Technology, Inc.
- Andrea Vigilante
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MICROCONTROLLER ARCHITECTURE FOR NON-VOLATILE MEMORY
- Publication number 20200356311
- Publication date Nov 12, 2020
- SANDISK TECHNOLOGIES LLC
- Chi-Lin Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MICROCONTROLLER ARCHITECTURE FOR NON-VOLATILE MEMORY
- Publication number 20200341691
- Publication date Oct 29, 2020
- SANDISK TECHNOLOGIES LLC
- Chi-Lin Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING SOFT DATA FOR FRACTIONAL DIGIT MEMORY CELLS
- Publication number 20200176054
- Publication date Jun 4, 2020
- Micron Technology, Inc.
- Sivagnanam Parthasarathy
- G06 - COMPUTING CALCULATING COUNTING

using microprogrammed units

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

At-speed test of functional memory interface logic in devices

Methods and apparatus for testing inaccessible interface circuits i...

Method and apparatus for enabling multiple return material authoriz...

Systems and methods for detecting and configuring lanes in a circui...

JTAG registers with concurrent inputs

Built-in memory repair with repair code compression

JTAG based architecture allowing multi-core operation

Test system for executing built-in self-test in deployment for auto...

Test systems for executing self-testing in deployed automotive plat...

Memory device architecture coupled to a system-on-chip

Memory device with analog measurement mode features

Simulating memory cell sensing for testing sensing circuitry

Method for the secured storing of a data element of a predefined da...

Apparatus, system, and method for trimming analog temperature sensors

Built-in memory repair with repair code compression

Semiconductor memory devices and repair methods of the semiconducto...

Test systems for executing self-testing in deployed automotive plat...

Logic built-in self-test of an electronic circuit

Memory controller with integrated test circuitry

Managed-NAND real time analyzer and method

Memory device architecture coupled to a System-on-Chip

Test system for executing built-in self-test in deployment for auto...

JTAG registers with concurrent inputs

Diagnostic enhancement for multiple instances of identical structures

Memory device with analog measurement mode features

Microcontroller architecture for non-volatile memory

JTAG based architecture allowing multi-core operation

Memory controller with integrated test circuitry

Microcontroller architecture for non-volatile memory

Built-in-self-test circuits and methods using pipeline registers

Patents Applicationslast 30 patents

BUILT-IN SELF-TEST ENHANCEMENTS

BUILT-IN MEMORY REPAIR WITH REPAIR CODE COMPRESSION

AT-SPEED TEST OF FUNCTIONAL MEMORY INTERFACE LOGIC IN DEVICES

METHODS AND APPARATUS FOR TESTING INACCESSIBLE INTERFACE CIRCUITS I...

BUILT-IN MEMORY REPAIR WITH REPAIR CODE COMPRESSION

LOGIC BUILT-IN SELF-TEST OF AN ELECTRONIC CIRCUIT

MEMORY DEVICE ARCHITECTURE COUPLED TO A SYSTEM-ON-CHIP

Test System For Executing Built-In Self-Test In Deployment For Auto...

MEMORY DEVICE WITH ANALOG MEASUREMENT MODE FEATURES

MEMORY CONTROLLER WITH INTEGRATED TEST CIRCUITRY

JTAG BASED ARCHITECTURE ALLOWING MULTI-CORE OPERATION

BUILT-IN MEMORY REPAIR WITH REPAIR CODE COMPRESSION

DIAGNOSTIC ENHANCEMENT FOR MULTIPLE INSTANCES OF IDENTICAL STRUCTURES

METHOD FOR THE SECURED STORING OF A DATA ELEMENT OF A PREDEFINED DA...

TEST SYSTEMS FOR EXECUTING SELF-TESTING IN DEPLOYED AUTOMOTIVE PLAT...

A MEMORY DEVICE ARCHITECTURE COUPLED TO A SYSTEM-ON-CHIP

JTAG BASED ARCHITECTURE ALLOWING MULTI-CORE OPERATION

MEMORY TEST ENGINE WITH FULLY PROGRAMMABLE PATTERNS

JTAG BASED ARCHITECTURE ALLOWING MULTI-CORE OPERATION

AT-SPEED TEST OF FUNCTIONAL MEMORY INTERFACE LOGIC IN DEVICES

MEMORY DEVICE WITH ANALOG MEASUREMENT MODE FEATURES

Systems And Methods For Detecting And Configuring Lanes In A Circui...

TESTING MEMORY CELLS BY ALLOCATING AN ACCESS VALUE TO A MEMORY ACCE...

TEST SYSTEM FOR EXECUTING BUILT-IN SELF-TEST IN DEPLOYMENT FOR AUTO...

MEMORY CONTROLLER WITH INTEGRATED TEST CIRCUITRY

Method and Apparatus for enabling Multiple Return Material Authoriz...

MANAGED-NAND REAL TIME ANALYZER AND METHOD

MICROCONTROLLER ARCHITECTURE FOR NON-VOLATILE MEMORY

MICROCONTROLLER ARCHITECTURE FOR NON-VOLATILE MEMORY

DETERMINING SOFT DATA FOR FRACTIONAL DIGIT MEMORY CELLS