using near-field effects

Industry

CPC
H01J2237/31759

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/31759using near-field effects

Industries

Patents Grantslast 30 patents

Information Patent Grant
Depassivation lithography by scanning tunneling microscopy
- Patent number 10,983,142
- Issue date Apr 20, 2021
- Zyvex Labs, LLC
- John Randall
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for an imaging system
- Patent number 10,614,993
- Issue date Apr 7, 2020
- Frederick A. Flitsch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for an electromagnetic emission based imaging...
- Patent number 9,697,986
- Issue date Jul 4, 2017
- Frederick A. Flitsch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for a high resolution imaging system
- Patent number 9,558,915
- Issue date Jan 31, 2017
- Frederick A. Flitsch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods, devices, and systems for forming atomically precise struct...
- Patent number 9,329,201
- Issue date May 3, 2016
- Zyvex Labs LLC
- John Neal Randall
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multi-nanometer-projection apparatus for lithography, oxidation, in...
- Patent number 8,624,338
- Issue date Jan 7, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fei-Gwo Tsai
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Device and method for patterning structures on a substrate
- Patent number 8,053,037
- Issue date Nov 8, 2011
- International Business Machines Corporation
- Siegfried F. Karg
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe for scanning probe lithography and making method thereof
- Patent number 7,115,863
- Issue date Oct 3, 2006
- Hitachi, Ltd.
- Masayoshi Ishibashi
- G01 - MEASURING TESTING
Information Patent Grant
Lithographic method using ultra-fine probe needle
- Patent number 6,777,693
- Issue date Aug 17, 2004
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanolithography for multi-passband grating filters
- Patent number 6,322,938
- Issue date Nov 27, 2001
- The United States of America as represented by the Secretary of the Air Force
- Robert W. Cohn
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Active control of temperature in scanning probe lithography and mas...
- Patent number 6,238,830
- Issue date May 29, 2001
- Advanced Micro Devices
- Bharath Rangarajan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Surface atom fabrication method and apparatus
- Patent number 5,689,494
- Issue date Nov 18, 1997
- Hitachi, Ltd.
- Masakazu Ichikawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Surface atom fabrication method and apparatus
- Patent number 5,416,331
- Issue date May 16, 1995
- Hitachi, Ltd.
- Masakazu Ichikawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of making and using a high resolution lithographic mask
- Patent number 5,049,461
- Issue date Sep 17, 1991
- International Business Machines Corporation
- Patrick C. Arnett
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for writing or etching narrow linewidth patter...
- Patent number 5,047,649
- Issue date Sep 10, 1991
- International Business Machines Corporation
- Rodney T. Hodgson
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Narrow line width pattern fabrication
- Patent number 4,550,257
- Issue date Oct 29, 1985
- International Business Machines Corporation
- Gerd K. Binnig
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
Depassivation Lithography by Scanning Tunneling Microscopy
- Publication number 20200132718
- Publication date Apr 30, 2020
- ZYVEX LABS, LLC
- John Randall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR AN ELECTROMAGNETIC EMISSION BASED IMAGING...
- Publication number 20170098525
- Publication date Apr 6, 2017
- Frederick A. Flitsch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-NANOMETER-PROJECTION APPARATUS FOR LITHOGRAPHY, OXIDATION, IN...
- Publication number 20120280333
- Publication date Nov 8, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fei-Gwo Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR PATTERNING STRUCTURES ON A SUBSTRATE
- Publication number 20090258166
- Publication date Oct 15, 2009
- International Business Machines Corporation
- Siegfried F. Karg
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Lithographic method using ultra-fine probe needle
- Publication number 20030020025
- Publication date Jan 30, 2003
- YOSHIKAZU NAKAYAMA and DAIKEN CHEMICAL CO., LTD.
- Yoshikazu Nakayama
- H01 - BASIC ELECTRIC ELEMENTS

using near-field effects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Depassivation lithography by scanning tunneling microscopy

Method and apparatus for an imaging system

Method and apparatus for an electromagnetic emission based imaging...

Method and apparatus for a high resolution imaging system

Methods, devices, and systems for forming atomically precise struct...

Multi-nanometer-projection apparatus for lithography, oxidation, in...

Device and method for patterning structures on a substrate

Probe for scanning probe lithography and making method thereof

Lithographic method using ultra-fine probe needle

Nanolithography for multi-passband grating filters

Active control of temperature in scanning probe lithography and mas...

Surface atom fabrication method and apparatus

Surface atom fabrication method and apparatus

Method of making and using a high resolution lithographic mask

Method and apparatus for writing or etching narrow linewidth patter...

Narrow line width pattern fabrication

Patents Applicationslast 30 patents

Depassivation Lithography by Scanning Tunneling Microscopy

METHOD AND APPARATUS FOR AN ELECTROMAGNETIC EMISSION BASED IMAGING...

MULTI-NANOMETER-PROJECTION APPARATUS FOR LITHOGRAPHY, OXIDATION, IN...

DEVICE AND METHOD FOR PATTERNING STRUCTURES ON A SUBSTRATE

Lithographic method using ultra-fine probe needle