using non-ionising electromagnetic radiation

Industry

CPC
G01R31/2656

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2656using non-ionising electromagnetic radiation

Industries

Patents Grantslast 30 patents

Information Patent Grant
High resolution imaging of microelectronic devices
- Patent number 12,315,105
- Issue date May 27, 2025
- Battelle Memorial Institute
- Thomas F. Kent
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer metrology technologies
- Patent number 12,241,924
- Issue date Mar 4, 2025
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Illuminator method and device for semiconductor package testing
- Patent number 12,228,610
- Issue date Feb 18, 2025
- UTAC HEADQUARTERS PTE. LTD.
- Boon Chew Goh
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor fault analysis device and semiconductor fault analysi...
- Patent number 12,203,974
- Issue date Jan 21, 2025
- Hamamatsu Photonics K.K.
- Masataka Ikesu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection method
- Patent number 12,181,513
- Issue date Dec 31, 2024
- HITACHI HIGH-TECH CORPORATION
- Shota Mitsugi
- G01 - MEASURING TESTING
Information Patent Grant
Luminous flux test circuitry, test method and display panel
- Patent number 12,181,338
- Issue date Dec 31, 2024
- Beijing BOE Optoelectronics Technology Co., Ltd
- Yifan Song
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for determining characteristics of semiconducto...
- Patent number 12,158,492
- Issue date Dec 3, 2024
- FemtoMetrix, Inc.
- Ming Lei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor failure analysis device and semiconductor failure ana...
- Patent number 12,117,480
- Issue date Oct 15, 2024
- Hamamatsu Photonics K.K.
- Masataka Ikesu
- G01 - MEASURING TESTING
Information Patent Grant
Metrology apparatus and method for determining a characteristic of...
- Patent number 12,066,764
- Issue date Aug 20, 2024
- ASML Netherlands B.V.
- Patricius Aloysius Jacobus Tinnemans
- G01 - MEASURING TESTING
Information Patent Grant
Vertical convolute metal bellows for rotary motion, vacuum sealing,...
- Patent number 12,044,701
- Issue date Jul 23, 2024
- KLA Corporation
- Bruce Borchers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of analyzing semiconductor structure
- Patent number 11,959,958
- Issue date Apr 16, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Yi Min Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,927,539
- Issue date Mar 12, 2024
- Tokyo Electron Limited
- Naoki Akiyama
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer evaluation apparatus and semiconductor wafer ma...
- Patent number 11,906,569
- Issue date Feb 20, 2024
- Showa Denko K.K.
- Koichi Murata
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Optical inspection apparatus
- Patent number 11,867,612
- Issue date Jan 9, 2024
- Samsung Display Co., Ltd.
- Je Won Yoo
- G02 - OPTICS
Information Patent Grant
Pump and probe type second harmonic generation metrology
- Patent number 11,821,911
- Issue date Nov 21, 2023
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microwave photoconductance spectrometer and methods of using the same
- Patent number 11,824,497
- Issue date Nov 21, 2023
- Alliance for Sustainable Energy, LLC
- Bryon William Larson
- G01 - MEASURING TESTING
Information Patent Grant
Optical systems and methods of characterizing high-k dielectrics
- Patent number 11,808,706
- Issue date Nov 7, 2023
- California Institute of Technology
- Philippe C. Adell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-destructive imaging techniques for integrated circuits and othe...
- Patent number 11,798,157
- Issue date Oct 24, 2023
- The Regents of the University of Michigan
- Parag Deotare
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Efficient laser-induced single-event latchup and methods of operation
- Patent number 11,774,494
- Issue date Oct 3, 2023
- Vanderbilt University
- Andrew L. Sternberg
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection device
- Patent number 11,714,120
- Issue date Aug 1, 2023
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology apparatus and method for determining a characteristic of...
- Patent number 11,709,436
- Issue date Jul 25, 2023
- ASML Netherlands B.V.
- Patricius Aloysius Jacobus Tinnemans
- G01 - MEASURING TESTING
Information Patent Grant
Opto electrical test measurement system for integrated photonic dev...
- Patent number 11,680,870
- Issue date Jun 20, 2023
- STMicroelectronics (Crolles 2) SAS
- Philippe Grosse
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz plasmonics for testing very large-scale integrated circui...
- Patent number 11,675,002
- Issue date Jun 13, 2023
- The Government of the United States, as represented by the Secretary of the Army
- Greg Rupper
- G01 - MEASURING TESTING
Information Patent Grant
Group III nitride semiconductor substrate
- Patent number 11,662,374
- Issue date May 30, 2023
- Furukawa Co., Ltd.
- Hiroki Goto
- C30 - CRYSTAL GROWTH
Information Patent Grant
Analysis method, analysis device, analysis program, and recording m...
- Patent number 11,579,184
- Issue date Feb 14, 2023
- Hamamatsu Photonics K.K.
- Akira Shimase
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor sample inspection device and inspection method
- Patent number 11,573,251
- Issue date Feb 7, 2023
- Hamamatsu Photonics K.K.
- Yoshitaka Iwaki
- G01 - MEASURING TESTING
Information Patent Grant
Topside contact device and method for characterization of high elec...
- Patent number 11,561,254
- Issue date Jan 24, 2023
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall Wilson
- G01 - MEASURING TESTING
Information Patent Grant
Microwave photoconductance spectrometer and methods of using the same
- Patent number 11,563,405
- Issue date Jan 24, 2023
- Alliance for Sustainable Energy, LLC
- Bryon William Larson
- G01 - MEASURING TESTING
Information Patent Grant
Test of an examination tool
- Patent number 11,536,792
- Issue date Dec 27, 2022
- Applied Materials Israel Ltd.
- Gagandeep Narang
- G01 - MEASURING TESTING
Information Patent Grant
Dual-sided wafer imaging apparatus and methods thereof
- Patent number 11,435,391
- Issue date Sep 6, 2022
- NANYA TECHNOLOGY CORPORATION
- Ying-Chuan Wang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER METROLOGY TECHNOLOGIES
- Publication number 20250155486
- Publication date May 15, 2025
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION APPARATUS AND METHOD OF INSPECTING A SUBSTRATE...
- Publication number 20250147096
- Publication date May 8, 2025
- Samsung Electronics Co., Ltd.
- Jaewon Yang
- G01 - MEASURING TESTING
Information Patent Application
PHOTONIC DEVICE, A PHOTONIC SYSTEM COMPRISING THE PHOTONIC DEVICE A...
- Publication number 20250107274
- Publication date Mar 27, 2025
- Junsheng XIE
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND METHOD FOR DATA VERIFICATION FOR THE SAME
- Publication number 20240402238
- Publication date Dec 5, 2024
- MPI Corporation
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR FAULT ANALYSIS DEVICE AND SEMICONDUCTOR FAULT ANALYSI...
- Publication number 20240393384
- Publication date Nov 28, 2024
- HAMAMATSU PHOTONICS K. K.
- Masataka IKESU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Failure Analysis and Location Method for Short Circuit Structure
- Publication number 20240282648
- Publication date Aug 22, 2024
- Shanghai Huali Integrated Circuit Corporation
- Lingye Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LUMINOUS FLUX TEST CIRCUITRY, TEST METHOD AND DISPLAY PANEL
- Publication number 20240230403
- Publication date Jul 11, 2024
- BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Yifan SONG
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ANALYZING SEMICONDUCTOR STRUCTURE
- Publication number 20240192262
- Publication date Jun 13, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- Yi Min LIU
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE TESTING
- Publication number 20240142512
- Publication date May 2, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Zhi Peng Feng
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION APPARATUS
- Publication number 20240102921
- Publication date Mar 28, 2024
- SAMSUNG DISPLAY CO., LTD.
- Je Won YOO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR NON-INVASIVE, NON-INTRUSIVE, AND UN-GROUND...
- Publication number 20240085470
- Publication date Mar 14, 2024
- FemtoMetrix, Inc.
- Timothy M. Wong
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ PROBE
- Publication number 20230417820
- Publication date Dec 28, 2023
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- G01 - MEASURING TESTING
Information Patent Application
Terahertz Plasmonics for Testing Very Large-Scale Integrated Circui...
- Publication number 20230393195
- Publication date Dec 7, 2023
- The Government of the United States, as Represented by the Secretary of the Army
- Greg Rupper
- G01 - MEASURING TESTING
Information Patent Application
Inspection Method
- Publication number 20230273254
- Publication date Aug 31, 2023
- Hitachi High-Tech Corporation
- Shota MITSUGI
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY APPARATUS AND METHOD FOR DETERMINING A CHARACTERISTIC OF...
- Publication number 20230273255
- Publication date Aug 31, 2023
- ASML NETHERLANDS B.V.
- Patricius Aloysius Jacobus TINNEMANS
- G01 - MEASURING TESTING
Information Patent Application
MICROWAVE PHOTOCONDUCTANCE SPECTROMETER AND METHODS OF USING THE SAME
- Publication number 20230070273
- Publication date Mar 9, 2023
- ALLIANCE FOR SUSTAINABLE ENERGY, LLC
- Bryon William LARSON
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SEMICONDUCTOR FAULT ANALYSIS DEVICE AND SEMICONDUCTOR FAULT ANALYSI...
- Publication number 20230061399
- Publication date Mar 2, 2023
- Hamamatsu Photonics K.K.
- Masataka IKESU
- G01 - MEASURING TESTING
Information Patent Application
WAFER METROLOGY TECHNOLOGIES
- Publication number 20220413029
- Publication date Dec 29, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION IMAGING OF MICROELECTRONIC DEVICES
- Publication number 20220392016
- Publication date Dec 8, 2022
- Battelle Memorial Institute
- Thomas F. Kent
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EFFICIENT LASER-INDUCED SINGLE-EVENT LATCHUP AND METHODS OF OPERATION
- Publication number 20220390511
- Publication date Dec 8, 2022
- Vanderbilt University
- Andrew L. STERNBERG
- G01 - MEASURING TESTING
Information Patent Application
TOPSIDE CONTACT DEVICE AND METHOD FOR CHARACTERIZATION OF HIGH ELEC...
- Publication number 20220381816
- Publication date Dec 1, 2022
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall Wilson
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING DEFECTS IN GALLIUM NITRIDE HIGH ELECTRON MOBIL...
- Publication number 20220334167
- Publication date Oct 20, 2022
- NATIONAL SUN YAT-SEN UNIVERSITY
- Ting-Chang CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VERTICAL CONVOLUTE METAL BELLOWS FOR ROTARY MOTION, VACUUM SEALING,...
- Publication number 20220268808
- Publication date Aug 25, 2022
- KLA Corporation
- Bruce Borchers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY
- Publication number 20220260626
- Publication date Aug 18, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER EVALUATION APPARATUS AND SEMICONDUCTOR WAFER MA...
- Publication number 20220146564
- Publication date May 12, 2022
- SHOWA DENKO K.K.
- Koichi Murata
- G01 - MEASURING TESTING
Information Patent Application
OPTO ELECTRICAL TEST MEASUREMENT SYSTEM FOR INTEGRATED PHOTONIC DEV...
- Publication number 20220050010
- Publication date Feb 17, 2022
- STMicroelectronics (Crolles 2) SAS
- Philippe Grosse
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INSPECTION DEVICE
- Publication number 20220050137
- Publication date Feb 17, 2022
- HAMAMATSU PHOTONICS K. K.
- Tomonori NAKAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION METHOD AND INSPECTION SYSTEM
- Publication number 20220034959
- Publication date Feb 3, 2022
- Kabushiki Kaisha Nihon Micronics
- Osamu ARAI
- G01 - MEASURING TESTING
Information Patent Application
Terahertz Plasmonics for Testing Very Large-Scale Integrated Circui...
- Publication number 20220011363
- Publication date Jan 13, 2022
- The Government of the United States, as Represented by the Secretary of the Army
- Greg Rupper
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEMS AND METHODS OF CHARACTERIZING HIGH-K DIELECTRICS
- Publication number 20220003678
- Publication date Jan 6, 2022
- California Institute of Technology
- Philippe C. Adell
- H01 - BASIC ELECTRIC ELEMENTS

using non-ionising electromagnetic radiation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

High resolution imaging of microelectronic devices

Wafer metrology technologies

Illuminator method and device for semiconductor package testing

Semiconductor fault analysis device and semiconductor fault analysi...

Inspection method

Luminous flux test circuitry, test method and display panel

Systems and methods for determining characteristics of semiconducto...

Semiconductor failure analysis device and semiconductor failure ana...

Metrology apparatus and method for determining a characteristic of...

Vertical convolute metal bellows for rotary motion, vacuum sealing,...

Method of analyzing semiconductor structure

Inspection apparatus and inspection method

Semiconductor wafer evaluation apparatus and semiconductor wafer ma...

Optical inspection apparatus

Pump and probe type second harmonic generation metrology

Microwave photoconductance spectrometer and methods of using the same

Optical systems and methods of characterizing high-k dielectrics

Non-destructive imaging techniques for integrated circuits and othe...

Efficient laser-induced single-event latchup and methods of operation

Semiconductor inspection device

Metrology apparatus and method for determining a characteristic of...

Opto electrical test measurement system for integrated photonic dev...

Terahertz plasmonics for testing very large-scale integrated circui...

Group III nitride semiconductor substrate

Analysis method, analysis device, analysis program, and recording m...

Semiconductor sample inspection device and inspection method

Topside contact device and method for characterization of high elec...

Microwave photoconductance spectrometer and methods of using the same

Test of an examination tool

Dual-sided wafer imaging apparatus and methods thereof

Patents Applicationslast 30 patents

WAFER METROLOGY TECHNOLOGIES

SUBSTRATE INSPECTION APPARATUS AND METHOD OF INSPECTING A SUBSTRATE...

PHOTONIC DEVICE, A PHOTONIC SYSTEM COMPRISING THE PHOTONIC DEVICE A...

TEST SYSTEM AND METHOD FOR DATA VERIFICATION FOR THE SAME

SEMICONDUCTOR FAULT ANALYSIS DEVICE AND SEMICONDUCTOR FAULT ANALYSI...

Failure Analysis and Location Method for Short Circuit Structure

LUMINOUS FLUX TEST CIRCUITRY, TEST METHOD AND DISPLAY PANEL

METHOD OF ANALYZING SEMICONDUCTOR STRUCTURE

SEMICONDUCTOR DEVICE TESTING

OPTICAL INSPECTION APPARATUS

METHOD AND APPARATUS FOR NON-INVASIVE, NON-INTRUSIVE, AND UN-GROUND...

TERAHERTZ PROBE

Terahertz Plasmonics for Testing Very Large-Scale Integrated Circui...

Inspection Method

METROLOGY APPARATUS AND METHOD FOR DETERMINING A CHARACTERISTIC OF...

MICROWAVE PHOTOCONDUCTANCE SPECTROMETER AND METHODS OF USING THE SAME

SEMICONDUCTOR FAULT ANALYSIS DEVICE AND SEMICONDUCTOR FAULT ANALYSI...

WAFER METROLOGY TECHNOLOGIES

HIGH RESOLUTION IMAGING OF MICROELECTRONIC DEVICES

EFFICIENT LASER-INDUCED SINGLE-EVENT LATCHUP AND METHODS OF OPERATION

TOPSIDE CONTACT DEVICE AND METHOD FOR CHARACTERIZATION OF HIGH ELEC...

METHOD FOR DETECTING DEFECTS IN GALLIUM NITRIDE HIGH ELECTRON MOBIL...

VERTICAL CONVOLUTE METAL BELLOWS FOR ROTARY MOTION, VACUUM SEALING,...

PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY

SEMICONDUCTOR WAFER EVALUATION APPARATUS AND SEMICONDUCTOR WAFER MA...

OPTO ELECTRICAL TEST MEASUREMENT SYSTEM FOR INTEGRATED PHOTONIC DEV...

SEMICONDUCTOR INSPECTION DEVICE

INSPECTION METHOD AND INSPECTION SYSTEM

Terahertz Plasmonics for Testing Very Large-Scale Integrated Circui...

OPTICAL SYSTEMS AND METHODS OF CHARACTERIZING HIGH-K DIELECTRICS