using non-ionising electromagnetic radiation

Industry

CPC
G01R31/308

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/308using non-ionising electromagnetic radiation

Industries

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor doping characterization method using photoneutralizat...
- Patent number 12,154,833
- Issue date Nov 26, 2024
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall D. Wilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensing apparatus and method of operation thereof
- Patent number 12,066,379
- Issue date Aug 20, 2024
- CAMBRIDGE BATTERY RESEARCH LIMITED
- Hatice Munevver Tuncer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Active optical plug to optically or electrically test a photonics p...
- Patent number 12,061,230
- Issue date Aug 13, 2024
- Intel Corporation
- Todd R. Coons
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor doping characterization method using photoneutralizat...
- Patent number 12,027,430
- Issue date Jul 2, 2024
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall D. Wilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of determining an X and Y location of a surface particle
- Patent number 11,959,961
- Issue date Apr 16, 2024
- Orbotech Ltd.
- Robert Barnett
- B08 - CLEANING
Information Patent Grant
Method for the -destructive detecting of ageing symptoms of a compo...
- Patent number 11,940,499
- Issue date Mar 26, 2024
- Siemens Energy Global GmbH &Co. KG
- Andrey Mashkin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test system
- Patent number 11,921,154
- Issue date Mar 5, 2024
- TeraView Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Grant
Probe systems including imaging devices with objective lens isolato...
- Patent number 11,874,301
- Issue date Jan 16, 2024
- FormFactor, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Grant
Pump and probe type second harmonic generation metrology
- Patent number 11,821,911
- Issue date Nov 21, 2023
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-destructive imaging techniques for integrated circuits and othe...
- Patent number 11,798,157
- Issue date Oct 24, 2023
- The Regents of the University of Michigan
- Parag Deotare
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Compact opto-electric probe
- Patent number 11,747,363
- Issue date Sep 5, 2023
- OpenLight Photonics, Inc.
- Molly Piels
- G01 - MEASURING TESTING
Information Patent Grant
Test system
- Patent number 11,726,136
- Issue date Aug 15, 2023
- TeraView Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Grant
Image test system, test assembly and image capture card
- Patent number 11,693,042
- Issue date Jul 4, 2023
- KING YUAN ELECTRONICS CO, LTD.
- Pin-Yan Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Control method of inspection apparatus and inspection apparatus
- Patent number 11,668,747
- Issue date Jun 6, 2023
- Tokyo Electron Limited
- Naoki Akiyama
- G01 - MEASURING TESTING
Information Patent Grant
In-situ monitoring method and apparatus for power electronic device...
- Patent number 11,630,144
- Issue date Apr 18, 2023
- WUHAN UNIVERSITY
- Sheng Liu
- G01 - MEASURING TESTING
Information Patent Grant
Analysis method, analysis device, analysis program, and recording m...
- Patent number 11,579,184
- Issue date Feb 14, 2023
- Hamamatsu Photonics K.K.
- Akira Shimase
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 11,536,768
- Issue date Dec 27, 2022
- Tokyo Electron Limited
- Hiroyuki Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,525,856
- Issue date Dec 13, 2022
- Tokyo Electron Limited
- Naoki Akiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field-biased second harmonic generation metrology
- Patent number 11,415,617
- Issue date Aug 16, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test system for testing the integrity of an electronic device
- Patent number 11,366,158
- Issue date Jun 21, 2022
- TeraView Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Grant
Over the air measuring device with feed switcher positioner
- Patent number 11,333,705
- Issue date May 17, 2022
- Rohde & Schwarz GmbH & Co. KG
- Corbett Rowell
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting defects in ultra-high resolution panels
- Patent number 11,335,222
- Issue date May 17, 2022
- Raul Albert Martin
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Probe systems and methods for characterizing optical coupling betwe...
- Patent number 11,313,936
- Issue date Apr 26, 2022
- FormFactor, Inc.
- Joseph George Frankel
- G01 - MEASURING TESTING
Information Patent Grant
Wafer metrology technologies
- Patent number 11,293,965
- Issue date Apr 5, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact opto-electric probe
- Patent number 11,243,230
- Issue date Feb 8, 2022
- Juniper Networks, Inc.
- Molly Piels
- G01 - MEASURING TESTING
Information Patent Grant
Test system
- Patent number 11,169,202
- Issue date Nov 9, 2021
- TeraView Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Grant
Pump and probe type second harmonic generation metrology
- Patent number 11,150,287
- Issue date Oct 19, 2021
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Grant
Field-biased second harmonic generation metrology
- Patent number 11,092,637
- Issue date Aug 17, 2021
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for inspecting boards for microelectronics or opt...
- Patent number 11,092,644
- Issue date Aug 17, 2021
- UNITY SEMICONDUCTOR
- Philippe Gastaldo
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing an interconnection substrate and apparatus for pe...
- Patent number 11,047,901
- Issue date Jun 29, 2021
- Samsung Electronics Co., Ltd.
- Mee-Hyun Lim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTROMETER WITH RADIO FREQUENCY (RF) TUNING WAVEGUIDE
- Publication number 20240353462
- Publication date Oct 24, 2024
- Northrop Grumman Systems Corporation
- ERIC A. IMHOF
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DOPING CHARACTERIZATION METHOD USING PHOTONEUTRALIZAT...
- Publication number 20240347399
- Publication date Oct 17, 2024
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall D. Wilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST SYSTEM
- Publication number 20240192270
- Publication date Jun 13, 2024
- Teraview Limited
- Brian Edward Cole
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For Measurement Of Semiconductor Structures Bas...
- Publication number 20240151770
- Publication date May 9, 2024
- KLA Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING
Information Patent Application
Resampling with TDI Sensors
- Publication number 20230408579
- Publication date Dec 21, 2023
- ORBOTECH LTD.
- Doron SINAI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEST SYSTEM
- Publication number 20230324452
- Publication date Oct 12, 2023
- Teraview Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING AN X AND Y LOCATION OF A SURFACE PARTICLE
- Publication number 20230324454
- Publication date Oct 12, 2023
- ORBOTECH LTD.
- Robert Barnett
- B08 - CLEANING
Information Patent Application
MOTORIZED CHUCK STAGE CONTROLLING METHOD
- Publication number 20230314505
- Publication date Oct 5, 2023
- MPI Corporation
- Sebastian Giessmann
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SEMICONDUCTOR INSPECTING METHOD AND SEMICONDUCTOR INSPECTING DEVICE
- Publication number 20230206422
- Publication date Jun 29, 2023
- Hamamatsu Photonics K.K.
- Akira SHIMASE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF CREATING AN ELECTRONICALLY READABLE OPTICAL FINGERPRINT T...
- Publication number 20230160956
- Publication date May 25, 2023
- Raytheon Company
- Peter A. Bellus
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IN-SITU MONITORING METHOD AND APPARATUS FOR POWER ELECTRONIC DEVICE...
- Publication number 20230029364
- Publication date Jan 26, 2023
- WUHAN UNIVERSITY
- Sheng LIU
- G01 - MEASURING TESTING
Information Patent Application
WAFER METROLOGY TECHNOLOGIES
- Publication number 20220413029
- Publication date Dec 29, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SENSING APPARATUS AND METHOD OF OPERATION THEREOF
- Publication number 20220341845
- Publication date Oct 27, 2022
- CAMBRIDGE BATTERY RESEARCH LIMITED
- Hatice Munevver Tuncer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST SYSTEM
- Publication number 20220268833
- Publication date Aug 25, 2022
- Teraview Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Application
PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY
- Publication number 20220260626
- Publication date Aug 18, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE OPTICAL PLUG TO OPTICALLY OR ELECTRICALLY TEST A PHOTONICS P...
- Publication number 20220196732
- Publication date Jun 23, 2022
- Intel Corporation
- Todd R. COONS
- G02 - OPTICS
Information Patent Application
IMAGE TEST SYSTEM, TEST ASSEMBLY AND IMAGE CAPTURE CARD
- Publication number 20220155361
- Publication date May 19, 2022
- King Yuan Electronics Co., Ltd.
- Pin-Yan TSAI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE -DESTRUCTIVE DETECTING OF AGEING SYMPTOMS OF A COMPO...
- Publication number 20220146579
- Publication date May 12, 2022
- Siemens Energy Global GmbH & Co. KG
- Andrey Mashkin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPACT OPTO-ELECTRIC PROBE
- Publication number 20220107341
- Publication date Apr 7, 2022
- Juniper Networks, Inc.
- Molly Piels
- G01 - MEASURING TESTING
Information Patent Application
CONTROL METHOD OF INSPECTION APPARATUS AND INSPECTION APPARATUS
- Publication number 20220043055
- Publication date Feb 10, 2022
- TOKYO ELECTRON LIMITED
- Naoki AKIYAMA
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM
- Publication number 20220026482
- Publication date Jan 27, 2022
- Teraview Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20220018898
- Publication date Jan 20, 2022
- TOKYO ELECTRON LIMITED
- Hiroyuki NAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20210382105
- Publication date Dec 9, 2021
- TOKYO ELECTRON LIMITED
- Naoki AKIYAMA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS METHOD, ANALYSIS DEVICE, ANALYSIS PROGRAM, AND RECORDING M...
- Publication number 20210373071
- Publication date Dec 2, 2021
- Hamamatsu Photonics K.K.
- Akira SHIMASE
- G01 - MEASURING TESTING
Information Patent Application
COMPACT OPTO-ELECTRIC PROBE
- Publication number 20210199691
- Publication date Jul 1, 2021
- Juniper Networks, Inc.
- Molly Piels
- G01 - MEASURING TESTING
Information Patent Application
OVER THE AIR MEASURING DEVICE WITH FEED SWITCHER POSITIONER
- Publication number 20210165039
- Publication date Jun 3, 2021
- ROHDE & SCHWARZ GMBH & CO. KG
- Corbett ROWELL
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS INCLUDING IMAGING DEVICES WITH OBJECTIVE LENS ISOLATO...
- Publication number 20210132115
- Publication date May 6, 2021
- FormFactor Beaverton, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS AND METHODS FOR CHARACTERIZING OPTICAL COUPLING BETWE...
- Publication number 20210096206
- Publication date Apr 1, 2021
- FormFactor Beaverton, Inc.
- Joseph George Frankel
- G01 - MEASURING TESTING
Information Patent Application
PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY
- Publication number 20210055338
- Publication date Feb 25, 2021
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER METROLOGY TECHNOLOGIES
- Publication number 20200400732
- Publication date Dec 24, 2020
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING

using non-ionising electromagnetic radiation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Semiconductor doping characterization method using photoneutralizat...

Sensing apparatus and method of operation thereof

Active optical plug to optically or electrically test a photonics p...

Semiconductor doping characterization method using photoneutralizat...

Method of determining an X and Y location of a surface particle

Method for the -destructive detecting of ageing symptoms of a compo...

Test system

Probe systems including imaging devices with objective lens isolato...

Pump and probe type second harmonic generation metrology

Non-destructive imaging techniques for integrated circuits and othe...

Compact opto-electric probe

Test system

Image test system, test assembly and image capture card

Control method of inspection apparatus and inspection apparatus

In-situ monitoring method and apparatus for power electronic device...

Analysis method, analysis device, analysis program, and recording m...

Inspection apparatus

Inspection apparatus and inspection method

Field-biased second harmonic generation metrology

Test system for testing the integrity of an electronic device

Over the air measuring device with feed switcher positioner

Method for detecting defects in ultra-high resolution panels

Probe systems and methods for characterizing optical coupling betwe...

Wafer metrology technologies

Compact opto-electric probe

Test system

Pump and probe type second harmonic generation metrology

Field-biased second harmonic generation metrology

Method and system for inspecting boards for microelectronics or opt...

Method of testing an interconnection substrate and apparatus for pe...

Patents Applicationslast 30 patents

ELECTROMETER WITH RADIO FREQUENCY (RF) TUNING WAVEGUIDE

SEMICONDUCTOR DOPING CHARACTERIZATION METHOD USING PHOTONEUTRALIZAT...

TEST SYSTEM

Methods And Systems For Measurement Of Semiconductor Structures Bas...

Resampling with TDI Sensors

TEST SYSTEM

METHOD OF DETERMINING AN X AND Y LOCATION OF A SURFACE PARTICLE

MOTORIZED CHUCK STAGE CONTROLLING METHOD

SEMICONDUCTOR INSPECTING METHOD AND SEMICONDUCTOR INSPECTING DEVICE

METHOD OF CREATING AN ELECTRONICALLY READABLE OPTICAL FINGERPRINT T...

IN-SITU MONITORING METHOD AND APPARATUS FOR POWER ELECTRONIC DEVICE...

WAFER METROLOGY TECHNOLOGIES

SENSING APPARATUS AND METHOD OF OPERATION THEREOF

TEST SYSTEM

PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY

ACTIVE OPTICAL PLUG TO OPTICALLY OR ELECTRICALLY TEST A PHOTONICS P...

IMAGE TEST SYSTEM, TEST ASSEMBLY AND IMAGE CAPTURE CARD

METHOD FOR THE -DESTRUCTIVE DETECTING OF AGEING SYMPTOMS OF A COMPO...

COMPACT OPTO-ELECTRIC PROBE

CONTROL METHOD OF INSPECTION APPARATUS AND INSPECTION APPARATUS

TEST SYSTEM

INSPECTION APPARATUS

INSPECTION APPARATUS AND INSPECTION METHOD

ANALYSIS METHOD, ANALYSIS DEVICE, ANALYSIS PROGRAM, AND RECORDING M...

COMPACT OPTO-ELECTRIC PROBE

OVER THE AIR MEASURING DEVICE WITH FEED SWITCHER POSITIONER

PROBE SYSTEMS INCLUDING IMAGING DEVICES WITH OBJECTIVE LENS ISOLATO...

PROBE SYSTEMS AND METHODS FOR CHARACTERIZING OPTICAL COUPLING BETWE...

PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY

WAFER METROLOGY TECHNOLOGIES