using one or more discrete wavelengths

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CPC
G01B11/065

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/065using one or more discrete wavelengths

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Optical metrology models for in-line film thickness measurements
- Patent number 12,062,583
- Issue date Aug 13, 2024
- Applied Materials Israel Ltd.
- Eric Chin Hong Ng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Oxide film thickness measurement device and method
- Patent number 11,852,458
- Issue date Dec 26, 2023
- Kobe Steel, Ltd.
- Masahiro Inui
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Quality control of substrate coatings
- Patent number 11,828,584
- Issue date Nov 28, 2023
- VAXXAS PTY LIMITED
- Michael Carl Junger
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring oxide film thickness
- Patent number 11,761,752
- Issue date Sep 19, 2023
- Kobe Steel, Ltd.
- Masahiro Inui
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Optical arrangement for an inspection apparatus
- Patent number 11,662,198
- Issue date May 30, 2023
- ASML Holding N.V.
- Parag Vinayak Kelkar
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Information processing apparatus, information processing method, pr...
- Patent number 11,635,373
- Issue date Apr 25, 2023
- Japan Aerospace Exploration Agency
- Atsushi Kanda
- B60 - VEHICLES IN GENERAL
Information Patent Grant
CMCs with luminescence environmental barrier coatings
- Patent number 11,326,469
- Issue date May 10, 2022
- Rolls-Royce Corporation
- Li Li
- F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information Patent Grant
Film thickness measurement device, film thickness measurement metho...
- Patent number 11,280,604
- Issue date Mar 22, 2022
- Hamamatsu Photonics K.K.
- Kenichi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for motion compensation in interferometric sen...
- Patent number 11,193,751
- Issue date Dec 7, 2021
- Intuitive Surgical Operations, Inc.
- Mark E. Froggatt
- G01 - MEASURING TESTING
Information Patent Grant
Quality control of substrate coatings
- Patent number 11,175,128
- Issue date Nov 16, 2021
- VAXXAS PTY LIMITED
- Michael Carl Junger
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for measurement of thick films and high aspect...
- Patent number 11,119,050
- Issue date Sep 14, 2021
- KLA Corporation
- Noam Sapiens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma processing method and plasma processing apparatus
- Patent number 10,971,369
- Issue date Apr 6, 2021
- HITACHI HIGH-TECH CORPORATION
- Miyako Matsui
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus, inspection method, computer program and recor...
- Patent number 10,801,954
- Issue date Oct 13, 2020
- Pioneer Corporation
- Takanori Ochiai
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for measurement of thick films and high aspect...
- Patent number 10,690,602
- Issue date Jun 23, 2020
- KLA-Tencor Corporation
- Noam Sapiens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for measuring thickness of glass article
- Patent number 10,295,330
- Issue date May 21, 2019
- Corning Incorporated
- Chong Pyung An
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
System and method for improved visual detection of protective coatings
- Patent number 10,260,860
- Issue date Apr 16, 2019
- The Boeing Company
- Sergey G. Ponomarev
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and apparatus for motion compensation in interferometric sen...
- Patent number 10,054,420
- Issue date Aug 21, 2018
- Intuitive Surgical Operations, Inc.
- Mark E. Froggatt
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for optical metrology with optimized system pa...
- Patent number 9,879,977
- Issue date Jan 30, 2018
- KLA-Tencor Corporation
- Andrei V. Shchegrov
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for real-time in-process measurement of coating t...
- Patent number 9,863,758
- Issue date Jan 9, 2018
- Sensory Analytics, LLC
- Vivek Komaragiri
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for compensating for a time-varying disturbanc...
- Patent number 9,841,269
- Issue date Dec 12, 2017
- Intuitive Surgical Operations, Inc.
- Mark E. Froggatt
- G01 - MEASURING TESTING
Information Patent Grant
Layered medium for three-dimensional imaging
- Patent number 9,820,636
- Issue date Nov 21, 2017
- Massachusetts Institute of Technology
- Douglas P. Hart
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for measuring the thickness of a layer of material, galvaniz...
- Patent number 9,797,709
- Issue date Oct 24, 2017
- ENOVASENSE
- Jean Inard-Charvin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
System and method for improved visual detection of protective coatings
- Patent number 9,696,139
- Issue date Jul 4, 2017
- The Boeing Company
- Sergey G. Ponomarev
- G01 - MEASURING TESTING
Information Patent Grant
Coating composition and method for determining the uniformity and t...
- Patent number 9,676,948
- Issue date Jun 13, 2017
- Momentive Performance Materials Inc.
- Lesley Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring methods and apparatus
- Patent number 9,593,940
- Issue date Mar 14, 2017
- Samsung Electronics Co., Ltd.
- Dong-Min Seo
- G01 - MEASURING TESTING
Information Patent Grant
Selecting an earpiece based on dynamic data
- Patent number 9,448,061
- Issue date Sep 20, 2016
- Massachusetts Institute of Technology
- Douglas P. Hart
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method of fabricating light-emitting device package
- Patent number 9,368,694
- Issue date Jun 14, 2016
- Samsung Electronics Co., Ltd.
- Raphael Jung
- G01 - MEASURING TESTING
Information Patent Grant
Three dimensional scanning using membrane with optical features
- Patent number 9,291,565
- Issue date Mar 22, 2016
- Massachusetts Institute of Technology
- Douglas P. Hart
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Decoupling measurement of layer thicknesses of a plurality of layer...
- Patent number 9,281,249
- Issue date Mar 8, 2016
- GLOBALFOUNDRIES Inc.
- Alok Vaid
- G01 - MEASURING TESTING
Information Patent Grant
Systems for and methods of characterizing the thickness profile of...
- Patent number 9,239,231
- Issue date Jan 19, 2016
- Corning Incorporated
- Ming-Jun Li
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
QUALITY CONTROL OF SUBSTRATE COATINGS
- Publication number 20240159516
- Publication date May 16, 2024
- Vaxxas Pty Limited
- Michael Carl JUNGER
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR DETECTING THICKNESS OF A COATING AUTONOMOUSLY APPLIED TO...
- Publication number 20230372957
- Publication date Nov 23, 2023
- Foreman Technologies Inc., dba PaintJet
- Tom Jose
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
Method and device for measuring the thickness of thin films even on...
- Publication number 20230282526
- Publication date Sep 7, 2023
- Fyzikální ústav AV CR, v. v. i.
- MARTIN LEDINSKY
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR CONTROLLING INSPECTION SYSTEM
- Publication number 20230112498
- Publication date Apr 13, 2023
- Canon Kabushiki Kaisha
- Takeaki Itsuji
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL MEASUREMENT APPARATUS, MEASURING METHOD USING THE SAME, AND...
- Publication number 20230000343
- Publication date Jan 5, 2023
- Samsung Electronics Co., Ltd.
- Jin Yong KIM
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL METROLOGY MODELS FOR IN-LINE FILM THICKNESS MEASUREMENTS
- Publication number 20220290974
- Publication date Sep 15, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Eric Chin Hong Ng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR OBTAINING INFORMATION ABOUT A LAYER OF AN ORGANIC SOLDER...
- Publication number 20220132673
- Publication date Apr 28, 2022
- Atotech Deutschland GmbH
- Hubertus MERTENS
- G01 - MEASURING TESTING
Information Patent Application
OXIDE FILM THICKNESS MEASUREMENT DEVICE AND METHOD
- Publication number 20210356253
- Publication date Nov 18, 2021
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Masahiro INUI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING OXIDE FILM THICKNESS
- Publication number 20210356254
- Publication date Nov 18, 2021
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Masahiro INUI
- G01 - MEASURING TESTING
Information Patent Application
QUALITY CONTROL OF SUBSTRATE COATINGS
- Publication number 20210270599
- Publication date Sep 2, 2021
- Vaxxas Pty Limited
- Michael Carl JUNGER
- G01 - MEASURING TESTING
Information Patent Application
FILM THICKNESS MEASUREMENT DEVICE, FILM THICKNESS MEASUREMENT METHO...
- Publication number 20210080250
- Publication date Mar 18, 2021
- Hamamatsu Photonics K.K.
- Kenichi OHTSUKA
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For Measurement Of Thick Films And High Aspect...
- Publication number 20200284733
- Publication date Sep 10, 2020
- KLA Corporation
- Noam Sapiens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Optical Arrangement for an Inspection Apparatus
- Publication number 20200271438
- Publication date Aug 27, 2020
- ASML Holding N.V.
- Parag Vinayak KELKAR
- G01 - MEASURING TESTING
Information Patent Application
QUALITY CONTROL OF SUBSTRATE COATINGS
- Publication number 20200182605
- Publication date Jun 11, 2020
- Vaxxas Pty Limited
- Michael Carl JUNGER
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS, INSPECTION METHOD, COMPUTER PROGRAM AND RECOR...
- Publication number 20190234872
- Publication date Aug 1, 2019
- Pioneer Corporation
- Takanori OCHIAI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MOTION COMPENSATION IN INTERFEROMETRIC SEN...
- Publication number 20180356203
- Publication date Dec 13, 2018
- Intuitive Surgical Operations, Inc.
- Mark E. FROGGATT
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For Measurement Of Thick Films And High Aspect...
- Publication number 20180238814
- Publication date Aug 23, 2018
- KLA-Tencor Corporation
- Noam Sapiens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR MOTION COMPENSATION IN INTERFEROMETRIC SEN...
- Publication number 20180058838
- Publication date Mar 1, 2018
- Intuitive Surgical Operations, Inc.
- Mark E. FROGGATT
- G01 - MEASURING TESTING
Information Patent Application
Method And System For Real-Time In-Process Measurement Of Coating T...
- Publication number 20180045507
- Publication date Feb 15, 2018
- Sensory Analytics, LLC
- Vivek Komaragiri
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR IMPROVED VISUAL DETECTION OF PROTECTIVE COATINGS
- Publication number 20170292831
- Publication date Oct 12, 2017
- The Boeing Company
- SERGEY G. PONOMAREV
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
LAYERED MEDIUM FOR THREE-DIMENSIONAL IMAGING
- Publication number 20170258305
- Publication date Sep 14, 2017
- Massachusetts Institute of Technology
- Douglas P. Hart
- G01 - MEASURING TESTING
Information Patent Application
COATING COMPOSITION AND METHOD FOR DETERMINING THE UNIFORMITY AND T...
- Publication number 20170240750
- Publication date Aug 24, 2017
- Momentive Performance Materials Inc.
- Lesley Hwang
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
METHOD AND SYSTEM FOR MEASURING THICKNESS OF GLASS ARTICLE
- Publication number 20170122724
- Publication date May 4, 2017
- Chong Pyung An
- G01 - MEASURING TESTING
Information Patent Application
LAYERED MEDIUM FOR THREE-DIMENSIONAL IMAGING
- Publication number 20170071459
- Publication date Mar 16, 2017
- Massachusetts Institute of Technology
- Douglas P. Hart
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING THE THICKNESS OF A LAYER OF MATERIAL, GALVANIZ...
- Publication number 20160161247
- Publication date Jun 9, 2016
- ENOVASENSE
- Jean INARD-CHARVIN
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Method & System For Real-Time In-Process Measurement Of Coating Thi...
- Publication number 20160033259
- Publication date Feb 4, 2016
- Vivek Komaragiri
- G01 - MEASURING TESTING
Information Patent Application
IN VITRO DETERMINATION OF SUNSCREEN PROTECTION BASED ON IMAGE ANALY...
- Publication number 20160025481
- Publication date Jan 28, 2016
- SUNCARE RESEARCH LABORATORIES, LLC
- Joseph William Stanfield
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS FOR AND METHODS OF CHARACTERIZING THE THICKNESS PROFILE OF...
- Publication number 20150308814
- Publication date Oct 29, 2015
- Corning Incorporated
- Ming-Jun Li
- G02 - OPTICS
Information Patent Application
COATING COMPOSITION AND METHOD FOR DETERMINING THE UNIFORMITY AND T...
- Publication number 20140342164
- Publication date Nov 20, 2014
- Momentive Performance Materials Inc.
- Lesley Hwang
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
METHOD AND APPARATUS FOR MOTION COMPENSATION IN INTERFEROMETRIC SEN...
- Publication number 20140336973
- Publication date Nov 13, 2014
- Mark E. Froggatt
- G01 - MEASURING TESTING

using one or more discrete wavelengths

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Optical metrology models for in-line film thickness measurements

Oxide film thickness measurement device and method

Quality control of substrate coatings

Device and method for measuring oxide film thickness

Optical arrangement for an inspection apparatus

Information processing apparatus, information processing method, pr...

CMCs with luminescence environmental barrier coatings

Film thickness measurement device, film thickness measurement metho...

Method and apparatus for motion compensation in interferometric sen...

Quality control of substrate coatings

Methods and systems for measurement of thick films and high aspect...

Plasma processing method and plasma processing apparatus

Inspection apparatus, inspection method, computer program and recor...

Methods and systems for measurement of thick films and high aspect...

Method and system for measuring thickness of glass article

System and method for improved visual detection of protective coatings

Method and apparatus for motion compensation in interferometric sen...

Apparatus and method for optical metrology with optimized system pa...

Method and system for real-time in-process measurement of coating t...

Method and apparatus for compensating for a time-varying disturbanc...

Layered medium for three-dimensional imaging

Method for measuring the thickness of a layer of material, galvaniz...

System and method for improved visual detection of protective coatings

Coating composition and method for determining the uniformity and t...

Optical measuring methods and apparatus

Selecting an earpiece based on dynamic data

Method of fabricating light-emitting device package

Three dimensional scanning using membrane with optical features

Decoupling measurement of layer thicknesses of a plurality of layer...

Systems for and methods of characterizing the thickness profile of...

Patents Applicationslast 30 patents

QUALITY CONTROL OF SUBSTRATE COATINGS

SYSTEM FOR DETECTING THICKNESS OF A COATING AUTONOMOUSLY APPLIED TO...

Method and device for measuring the thickness of thin films even on...

INSPECTION SYSTEM AND METHOD FOR CONTROLLING INSPECTION SYSTEM

OPTICAL MEASUREMENT APPARATUS, MEASURING METHOD USING THE SAME, AND...

OPTICAL METROLOGY MODELS FOR IN-LINE FILM THICKNESS MEASUREMENTS

METHOD FOR OBTAINING INFORMATION ABOUT A LAYER OF AN ORGANIC SOLDER...

OXIDE FILM THICKNESS MEASUREMENT DEVICE AND METHOD

DEVICE AND METHOD FOR MEASURING OXIDE FILM THICKNESS

QUALITY CONTROL OF SUBSTRATE COATINGS

FILM THICKNESS MEASUREMENT DEVICE, FILM THICKNESS MEASUREMENT METHO...

Methods And Systems For Measurement Of Thick Films And High Aspect...

Optical Arrangement for an Inspection Apparatus

QUALITY CONTROL OF SUBSTRATE COATINGS

INSPECTION APPARATUS, INSPECTION METHOD, COMPUTER PROGRAM AND RECOR...

METHOD AND APPARATUS FOR MOTION COMPENSATION IN INTERFEROMETRIC SEN...

Methods And Systems For Measurement Of Thick Films And High Aspect...

METHOD AND APPARATUS FOR MOTION COMPENSATION IN INTERFEROMETRIC SEN...

Method And System For Real-Time In-Process Measurement Of Coating T...

SYSTEM AND METHOD FOR IMPROVED VISUAL DETECTION OF PROTECTIVE COATINGS

LAYERED MEDIUM FOR THREE-DIMENSIONAL IMAGING

COATING COMPOSITION AND METHOD FOR DETERMINING THE UNIFORMITY AND T...

METHOD AND SYSTEM FOR MEASURING THICKNESS OF GLASS ARTICLE

LAYERED MEDIUM FOR THREE-DIMENSIONAL IMAGING

METHOD FOR MEASURING THE THICKNESS OF A LAYER OF MATERIAL, GALVANIZ...

Method & System For Real-Time In-Process Measurement Of Coating Thi...

IN VITRO DETERMINATION OF SUNSCREEN PROTECTION BASED ON IMAGE ANALY...

SYSTEMS FOR AND METHODS OF CHARACTERIZING THE THICKNESS PROFILE OF...

COATING COMPOSITION AND METHOD FOR DETERMINING THE UNIFORMITY AND T...

METHOD AND APPARATUS FOR MOTION COMPENSATION IN INTERFEROMETRIC SEN...