using one or more discrete wavelengths

Industry

CPC
G01B11/0633

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/0633using one or more discrete wavelengths

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Electrochemical deposition system including optical probes
- Patent number 12,180,607
- Issue date Dec 31, 2024
- Lam Research Corporation
- Andrew James Pfau
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Plasma processing apparatus and plasma processing method
- Patent number 12,074,076
- Issue date Aug 27, 2024
- HITACHI HIGH-TECH CORPORATION
- Soichiro Eto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical metrology models for in-line film thickness measurements
- Patent number 12,062,583
- Issue date Aug 13, 2024
- Applied Materials Israel Ltd.
- Eric Chin Hong Ng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-destructive method for measuring thickness of three-layered rei...
- Patent number 11,913,773
- Issue date Feb 27, 2024
- LG Chem, Ltd.
- Sung-Hyun Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-shield plate and control system
- Patent number 11,823,919
- Issue date Nov 21, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ping-Tse Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thickness estimation method and processing control method
- Patent number 11,668,558
- Issue date Jun 6, 2023
- Samsung Electronics Co., Ltd.
- Jongsu Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing apparatus, information processing method, pr...
- Patent number 11,635,373
- Issue date Apr 25, 2023
- Japan Aerospace Exploration Agency
- Atsushi Kanda
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Fiber-optic based material property measurement system and related...
- Patent number 11,635,376
- Issue date Apr 25, 2023
- University of Virginia Patent Foundation
- Brian M. Foley
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspection of a target object, control system and inspec...
- Patent number 11,543,237
- Issue date Jan 3, 2023
- ABB Schweiz AG
- Jacobus Lodevicus Martinus Van Mechelen
- G01 - MEASURING TESTING
Information Patent Grant
Ablation sensor with optical measurement
- Patent number 11,513,072
- Issue date Nov 29, 2022
- Raytheon Company
- Gary A. Frazier
- G01 - MEASURING TESTING
Information Patent Grant
Vapor shield replacement system and method
- Patent number 11,398,393
- Issue date Jul 26, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ping-Tse Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Broadband optical monitoring
- Patent number 11,377,728
- Issue date Jul 5, 2022
- EVATEC AG
- Stephan Waldner
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Wafer carrier thickness measuring device
- Patent number 11,371,829
- Issue date Jun 28, 2022
- SK SILTRON CO., LTD.
- Suk Jin Jung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for contactless and non-destructive determination...
- Patent number 11,333,488
- Issue date May 17, 2022
- Motherson Innovations Company Limited
- Simon Maier
- G01 - MEASURING TESTING
Information Patent Grant
Optical intensity method to measure the thickness of coatings depos...
- Patent number 11,125,549
- Issue date Sep 21, 2021
- Arkema Inc.
- Gunter E. Moeller
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Methods and systems for measurement of thick films and high aspect...
- Patent number 11,119,050
- Issue date Sep 14, 2021
- KLA Corporation
- Noam Sapiens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for measuring thickness
- Patent number 11,022,427
- Issue date Jun 1, 2021
- SK Hynix Inc.
- Seung Jae Moon
- G01 - MEASURING TESTING
Information Patent Grant
Growth rate detection apparatus, vapor deposition apparatus, and va...
- Patent number 11,022,428
- Issue date Jun 1, 2021
- NUFLARE TECHNOLOGY, INC.
- Yasushi Iyechika
- G01 - MEASURING TESTING
Information Patent Grant
Film thickness measuring method and film thickness measuring apparatus
- Patent number 11,009,340
- Issue date May 18, 2021
- Toyota Jidosha Kabushiki Kaisha
- Masanori Miura
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus, measurement method, and computer readable me...
- Patent number 10,982,949
- Issue date Apr 20, 2021
- Yokogawa Electric Corporation
- Kazufumi Nishida
- G01 - MEASURING TESTING
Information Patent Grant
Fiber-optic based thermal reflectance material property measurement...
- Patent number 10,928,317
- Issue date Feb 23, 2021
- University of Virginia Patent Foundation
- Brian M. Foley
- G01 - MEASURING TESTING
Information Patent Grant
2D multi-layer thickness measurement
- Patent number 10,893,796
- Issue date Jan 19, 2021
- Topcon Corporation
- Zhenguo Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vapor shield replacement system and method
- Patent number 10,811,285
- Issue date Oct 20, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ping-Tse Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Object position independent method to measure the thickness of coat...
- Patent number 10,788,314
- Issue date Sep 29, 2020
- Arkema Inc.
- Gunter E. Moeller
- G01 - MEASURING TESTING
Information Patent Grant
Optical method to measure the thickness of coatings deposited on su...
- Patent number 10,753,728
- Issue date Aug 25, 2020
- Arkema Inc.
- Gunter E. Moeller
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for measurement of thick films and high aspect...
- Patent number 10,690,602
- Issue date Jun 23, 2020
- KLA-Tencor Corporation
- Noam Sapiens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Polishing apparatus
- Patent number 10,663,287
- Issue date May 26, 2020
- Ebara Corporation
- Toshifumi Kimba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thickness measuring method and device
- Patent number 10,655,947
- Issue date May 19, 2020
- BOE Technology Group Co., Ltd.
- Xuefei Sun
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring thickness variations in a layer of a multilaye...
- Patent number 10,619,997
- Issue date Apr 14, 2020
- Soitec
- Oleg Kononchuk
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for optical measurement of container wall thick...
- Patent number 10,612,909
- Issue date Apr 7, 2020
- Niagara Bottling, LLC
- Jay Clarke Hanan
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL MONITORING DEVICE AND METHOD FOR CONTROLLING COATING THICKN...
- Publication number 20240318302
- Publication date Sep 26, 2024
- Institute of Optics and Electronics, Chinese Academy of Sciences
- Cunding LIU
- G01 - MEASURING TESTING
Information Patent Application
ABNORMALITY DETECTION METHOD FOR PRESET SPECTRUM DATA FOR USE IN ME...
- Publication number 20240255440
- Publication date Aug 1, 2024
- EBARA CORPORATION
- Yuki WATANABE
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING THICKNESS OF DISPLAY DEVICE
- Publication number 20240068800
- Publication date Feb 29, 2024
- SAMSUNG DISPLAY CO., LTD.
- Sang Heon YE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FIBER-OPTIC BASED MATERIAL PROPERTY MEASUREMENT SYSTEM AND RELATED...
- Publication number 20230333015
- Publication date Oct 19, 2023
- University of Virginia Patent Foundation
- Brian M. Foley
- G01 - MEASURING TESTING
Information Patent Application
BUMP MEASUREMENT HEIGHT METROLOGY
- Publication number 20230228559
- Publication date Jul 20, 2023
- Camtek LTD.
- Eyal Segev
- G01 - MEASURING TESTING
Information Patent Application
IMAGING UNIT AND MEASUREMENT DEVICE
- Publication number 20230061667
- Publication date Mar 2, 2023
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
MULTI-SHIELD PLATE AND CONTROL SYSTEM
- Publication number 20220351990
- Publication date Nov 3, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ping-Tse LIN
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PRODUCING A MODEL FOR ESTIMATING FILM THICKNESS OF WORKPI...
- Publication number 20220316863
- Publication date Oct 6, 2022
- EBARA CORPORATION
- Nachiketa CHAUHAN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL METROLOGY MODELS FOR IN-LINE FILM THICKNESS MEASUREMENTS
- Publication number 20220290974
- Publication date Sep 15, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Eric Chin Hong Ng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ABLATION SENSOR WITH OPTICAL MEASUREMENT
- Publication number 20220291125
- Publication date Sep 15, 2022
- Raytheon Company
- Gary A. Frazier
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
ELECTROCHEMICAL DEPOSITION SYSTEM INCLUDING OPTICAL PROBES
- Publication number 20220228287
- Publication date Jul 21, 2022
- LAM RESEARCH CORPORATION
- Andrew James PFAU
- G01 - MEASURING TESTING
Information Patent Application
DUAL LASER MEASUREMENT DEVICE AND ONLINE ORDERING SYSTEM USING THE...
- Publication number 20220136821
- Publication date May 5, 2022
- Michael H Panosian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THICKNESS ESTIMATION METHOD AND PROCESSING CONTROL METHOD
- Publication number 20220065618
- Publication date Mar 3, 2022
- Samsung Electronics Co., Ltd.
- Jongsu Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-DESTRUCTIVE METHOD FOR MEASURING THICKNESS OF THREE-LAYERED REI...
- Publication number 20210207946
- Publication date Jul 8, 2021
- LG CHEM, LTD.
- Sung-Hyun YUN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method For Inspection Of A Target Object, Control System And Inspec...
- Publication number 20210190478
- Publication date Jun 24, 2021
- ABB Schweiz AG
- Jacobus Lodevicus Martinus Van Mechelen
- G01 - MEASURING TESTING
Information Patent Application
FIBER-OPTIC BASED MATERIAL PROPERTY MEASUREMENT SYSTEM AND RELATED...
- Publication number 20210140883
- Publication date May 13, 2021
- University of Virginia Patent Foundation
- Brian M. Foley
- G01 - MEASURING TESTING
Information Patent Application
VAPOR SHIELD REPLACEMENT SYSTEM AND METHOD
- Publication number 20210035829
- Publication date Feb 4, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ping-Tse LIN
- G01 - MEASURING TESTING
Information Patent Application
GROWTH RATE DETECTION APPARATUS, VAPOR DEPOSITION APPARATUS, AND VA...
- Publication number 20200292299
- Publication date Sep 17, 2020
- NuFlare Technology, Inc.
- Yasushi IYECHIKA
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For Measurement Of Thick Films And High Aspect...
- Publication number 20200284733
- Publication date Sep 10, 2020
- KLA Corporation
- Noam Sapiens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR OPTICAL MEASUREMENT OF CONTAINER WALL THICK...
- Publication number 20200256664
- Publication date Aug 13, 2020
- NIAGARA BOTTLING, LLC
- Jay Clarke Hanan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BROADBAND OPTICAL MONITORING
- Publication number 20200181763
- Publication date Jun 11, 2020
- Evatec AG
- Stephan Waldner
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND MEASUREMENT PROGRAM
- Publication number 20200173767
- Publication date Jun 4, 2020
- YOKOGAWA ELECTRIC CORPORATION
- Kazufumi NISHIDA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR CONTACTLESS AND NON-DESTRUCTIVE DETERMINATION...
- Publication number 20200116474
- Publication date Apr 16, 2020
- MOTHERSON INNOVATIONS COMPANY LIMITED
- SIMON MAIER
- G01 - MEASURING TESTING
Information Patent Application
Confocal Displacement Sensor
- Publication number 20190360796
- Publication date Nov 28, 2019
- KEYENCE CORPORATION
- Suketaka Fujimoto
- G01 - MEASURING TESTING
Information Patent Application
POLISHING APPARATUS
- Publication number 20190219381
- Publication date Jul 18, 2019
- EBARA CORPORATION
- Toshifumi KIMBA
- B24 - GRINDING POLISHING
Information Patent Application
FIBER-OPTIC BASED MATERIAL PROPERTY MEASUREMENT SYSTEM AND RELATED...
- Publication number 20190219503
- Publication date Jul 18, 2019
- University of Virginia Patent Foundation
- Brian M. Foley
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR INSPECTING VEHICLE BODIES
- Publication number 20190204072
- Publication date Jul 4, 2019
- Ford Motor Company
- Scott ADAMS
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
METHOD AND SYSTEM FOR ALIGNING A TERAHERTZ SENSOR SYSTEM
- Publication number 20190128661
- Publication date May 2, 2019
- Ford Motor Company
- Scott Adams
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
SURFACE CONDITION MONITORING APPARATUS
- Publication number 20190086323
- Publication date Mar 21, 2019
- JAPAN AEROSPACE EXPLORATION AGENCY
- Atsushi Kanda
- B60 - VEHICLES IN GENERAL
Information Patent Application
OBJECT POSITION INDEPENDENT METHOD TO MEASURE THE THICKNESS OF COAT...
- Publication number 20190011251
- Publication date Jan 10, 2019
- Arkema Inc.
- Gunter E. MOELLER
- G01 - MEASURING TESTING

using one or more discrete wavelengths

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electrochemical deposition system including optical probes

Plasma processing apparatus and plasma processing method

Optical metrology models for in-line film thickness measurements

Non-destructive method for measuring thickness of three-layered rei...

Multi-shield plate and control system

Thickness estimation method and processing control method

Information processing apparatus, information processing method, pr...

Fiber-optic based material property measurement system and related...

Method for inspection of a target object, control system and inspec...

Ablation sensor with optical measurement

Vapor shield replacement system and method

Broadband optical monitoring

Wafer carrier thickness measuring device

Method and device for contactless and non-destructive determination...

Optical intensity method to measure the thickness of coatings depos...

Methods and systems for measurement of thick films and high aspect...

Device and method for measuring thickness

Growth rate detection apparatus, vapor deposition apparatus, and va...

Film thickness measuring method and film thickness measuring apparatus

Measurement apparatus, measurement method, and computer readable me...

Fiber-optic based thermal reflectance material property measurement...

2D multi-layer thickness measurement

Vapor shield replacement system and method

Object position independent method to measure the thickness of coat...

Optical method to measure the thickness of coatings deposited on su...

Methods and systems for measurement of thick films and high aspect...

Polishing apparatus

Thickness measuring method and device

Method for measuring thickness variations in a layer of a multilaye...

Systems and methods for optical measurement of container wall thick...

Patents Applicationslast 30 patents

OPTICAL MONITORING DEVICE AND METHOD FOR CONTROLLING COATING THICKN...

ABNORMALITY DETECTION METHOD FOR PRESET SPECTRUM DATA FOR USE IN ME...

METHOD OF MEASURING THICKNESS OF DISPLAY DEVICE

FIBER-OPTIC BASED MATERIAL PROPERTY MEASUREMENT SYSTEM AND RELATED...

BUMP MEASUREMENT HEIGHT METROLOGY

IMAGING UNIT AND MEASUREMENT DEVICE

MULTI-SHIELD PLATE AND CONTROL SYSTEM

METHOD OF PRODUCING A MODEL FOR ESTIMATING FILM THICKNESS OF WORKPI...

OPTICAL METROLOGY MODELS FOR IN-LINE FILM THICKNESS MEASUREMENTS

ABLATION SENSOR WITH OPTICAL MEASUREMENT

ELECTROCHEMICAL DEPOSITION SYSTEM INCLUDING OPTICAL PROBES

DUAL LASER MEASUREMENT DEVICE AND ONLINE ORDERING SYSTEM USING THE...

THICKNESS ESTIMATION METHOD AND PROCESSING CONTROL METHOD

NON-DESTRUCTIVE METHOD FOR MEASURING THICKNESS OF THREE-LAYERED REI...

Method For Inspection Of A Target Object, Control System And Inspec...

FIBER-OPTIC BASED MATERIAL PROPERTY MEASUREMENT SYSTEM AND RELATED...

VAPOR SHIELD REPLACEMENT SYSTEM AND METHOD

GROWTH RATE DETECTION APPARATUS, VAPOR DEPOSITION APPARATUS, AND VA...

Methods And Systems For Measurement Of Thick Films And High Aspect...

SYSTEMS AND METHODS FOR OPTICAL MEASUREMENT OF CONTAINER WALL THICK...

BROADBAND OPTICAL MONITORING

MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND MEASUREMENT PROGRAM

METHOD AND DEVICE FOR CONTACTLESS AND NON-DESTRUCTIVE DETERMINATION...

Confocal Displacement Sensor

POLISHING APPARATUS

FIBER-OPTIC BASED MATERIAL PROPERTY MEASUREMENT SYSTEM AND RELATED...

SYSTEM FOR INSPECTING VEHICLE BODIES

METHOD AND SYSTEM FOR ALIGNING A TERAHERTZ SENSOR SYSTEM

SURFACE CONDITION MONITORING APPARATUS

OBJECT POSITION INDEPENDENT METHOD TO MEASURE THE THICKNESS OF COAT...