using particle bombardment

Industry

CPC
H01J49/14

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/14using particle bombardment

Industries

Patents Grantslast 30 patents

Information Patent Grant
Tissue analysis by mass spectrometry or ion mobility spectrometry
- Patent number 12,315,714
- Issue date May 27, 2025
- Micromass UK Limited
- Steven Derek Pringle
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Holding device for at least one filament and mass spectrometer
- Patent number 12,278,100
- Issue date Apr 15, 2025
- LEYBOLD GMBH
- Niklas Pengemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution imaging apparatus and method
- Patent number 12,278,098
- Issue date Apr 15, 2025
- STANDARD BIOTOOLS CANADA INC.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source
- Patent number 12,272,537
- Issue date Apr 8, 2025
- Beam Alpha, Inc.
- Gerald Peter Jackson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization device and mass spectrometer
- Patent number 12,176,199
- Issue date Dec 24, 2024
- LEYBOLD GMBH
- Yessica Brachthaeuser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Software for microfluidic systems interfacing with mass spectrometry
- Patent number 12,174,144
- Issue date Dec 24, 2024
- INTABIO, LLC
- Erik Gentalen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 12,165,863
- Issue date Dec 10, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas analyzer apparatus and method for controlling gas analyzer appa...
- Patent number 12,153,017
- Issue date Nov 26, 2024
- Atonarp Inc.
- Naoki Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single cell analysis using secondary ion mass spectrometry
- Patent number 12,135,300
- Issue date Nov 5, 2024
- The Board of Trustees of the Leland Stanford Junior University
- Garry P. Nolan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wide range electron impact ion source for a mass spectrometer
- Patent number 12,106,953
- Issue date Oct 1, 2024
- Inficon, Inc.
- Norbert Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analysis device
- Patent number 12,092,608
- Issue date Sep 17, 2024
- Shimadzu Corporation
- Hidenori Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen imaging systems and methods
- Patent number 12,094,701
- Issue date Sep 17, 2024
- Georgia Tech Research Corporation
- Andrei G. Fedorov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Size selected clusters and nanoparticles
- Patent number 12,068,147
- Issue date Aug 20, 2024
- Universität Innsbruck
- Paul Scheier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry ION source
- Patent number 12,033,843
- Issue date Jul 9, 2024
- Agilent Technologies, Inc.
- Bruce D. Quimby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer sample analysis method and device
- Patent number 12,033,313
- Issue date Jul 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Gaofeng Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for analyzing isoaspartic acid and mass spectrometer
- Patent number 12,020,919
- Issue date Jun 25, 2024
- Shimadzu Corporation
- Hidenori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Source-detector synchronization in multiplexed secondary ion mass s...
- Patent number 12,020,920
- Issue date Jun 25, 2024
- IONpath, Inc.
- David Stumbo
- G01 - MEASURING TESTING
Information Patent Grant
Axial CI source—off-axis electron beam
- Patent number 12,014,916
- Issue date Jun 18, 2024
- Thermo Finnigan LLC.
- Scott T. Quarmby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Case for glasses
- Patent number 11,969,065
- Issue date Apr 30, 2024
- THE SUN AND STAR COLLECTIVE LLC
- Emily Ann Madara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Filament assembly
- Patent number 11,972,937
- Issue date Apr 30, 2024
- Micromass UK Limited
- Alastair Booth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution imaging apparatus and method
- Patent number 11,967,496
- Issue date Apr 23, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In situ chemical transformation and ionization of inorganic perchlo...
- Patent number 11,959,846
- Issue date Apr 16, 2024
- SMITHS DETECTION MONTREAL INC.
- Jan Hendrikse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion molecule reactor and setup for analyzing complex mixtures
- Patent number 11,908,673
- Issue date Feb 20, 2024
- Tofwerk AG
- Felipe Lopez-Hilfiker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectral tissue analysis
- Patent number 11,860,172
- Issue date Jan 2, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometric determination of non-derivatized, non-metabolize...
- Patent number 11,852,636
- Issue date Dec 26, 2023
- QUEST DIAGNOSTICS INVESTMENTS INCORPORATED
- Brett Holmquist
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inner source assembly and associated components
- Patent number 11,848,186
- Issue date Dec 19, 2023
- Micromass UK Limited
- Alastair Booth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample analysis systems and methods of use thereof
- Patent number 11,837,455
- Issue date Dec 5, 2023
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stimulated or non-equilibrium energy-loss and energy-gain spectrosc...
- Patent number 11,830,718
- Issue date Nov 28, 2023
- Centre National de la Recherche Scientifique
- Mathieu Kociak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Encoding of precursor ion beam to aid product ion assignment
- Patent number 11,817,300
- Issue date Nov 14, 2023
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of detecting radicals using mass spectrometry
- Patent number 11,784,031
- Issue date Oct 10, 2023
- Inficon, Inc.
- Norbert Mueller
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SOURCE-DETECTOR SYNCHRONIZATION IN MULTIPLEXED SECONDARY ION MASS S...
- Publication number 20250166985
- Publication date May 22, 2025
- IONpath, Inc.
- David Stumbo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY DEVICE
- Publication number 20250149323
- Publication date May 8, 2025
- Shimadzu Corporation
- Kohei HOSOO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE PROBE SYSTEMS AND ASSOCIATED METHODS
- Publication number 20250104989
- Publication date Mar 27, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE FOR MASS SPECTROMETER
- Publication number 20250079146
- Publication date Mar 6, 2025
- Agilent Technologies, Inc.
- Alexander MORDEHAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A METHOD OF DETERMINING OPERATIONAL PARAMETERS OF A SPECTROMETER, A...
- Publication number 20250062110
- Publication date Feb 20, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Nils Stöbener
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AXIAL ION SOURCE WITH MAGNETIC FIELD ADJUSTMENT
- Publication number 20250037985
- Publication date Jan 30, 2025
- Thermo Finnigan LLC
- Dustin D. HOLDEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AXIAL ION SOURCE
- Publication number 20240420943
- Publication date Dec 19, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Ulf Fröhlich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN IMAGING SYSTEMS AND METHODS
- Publication number 20240412961
- Publication date Dec 12, 2024
- Georgia Tech Research Corporation
- Andrei G. Fedorov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE ASSEMBLY
- Publication number 20240395530
- Publication date Nov 28, 2024
- Micromass UK Limited
- Andrew Whatley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOFTWARE FOR MICROFLUIDIC SYSTEMS INTERFACING WITH MASS SPECTROMETRY
- Publication number 20240377359
- Publication date Nov 14, 2024
- INTABIO, LLC
- Luc Bousse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CORRECTING AGE OF COLUMBITE-TANTALITE BY USING DOUBLE-RE...
- Publication number 20240377344
- Publication date Nov 14, 2024
- INSTITUTE OF GEOLOGY AND GEOPHYSICS CHINESE ACADEMY OF SCIENCES
- Xiaoxiao LING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION IMAGING APPARATUS AND METHOD
- Publication number 20240371622
- Publication date Nov 7, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE ASSEMBLY WITH MULTIPLE ELLIPTICAL FILAMENTS
- Publication number 20240363325
- Publication date Oct 31, 2024
- Inficon, Inc.
- Michael Vollero
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE
- Publication number 20240339313
- Publication date Oct 10, 2024
- Agilent Technologies, Inc.
- Bruce D. QUIMBY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY DEVICE, AND MASS SPECTROMETRY METHOD
- Publication number 20240310327
- Publication date Sep 19, 2024
- OSAKA UNIVERSITY
- Michisato TOYODA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Remote Chamber And Dart-MS System Using Same
- Publication number 20240304432
- Publication date Sep 12, 2024
- LG CHEM, LTD.
- Hyun Sik You
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AN ELECTRON IMPACT IONIZATION WITHIN RADIO FREQUENCY CONFINEMENT FI...
- Publication number 20240258093
- Publication date Aug 1, 2024
- QuadroCore Corp.
- Gholamreza Javahery
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTRAL TISSUE ANALYSIS
- Publication number 20240219410
- Publication date Jul 4, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- G01 - MEASURING TESTING
Information Patent Application
ION MOLECULE REACTOR AND SETUP FOR ANALYZING COMPLEX MIXTURES
- Publication number 20240194470
- Publication date Jun 13, 2024
- TOFWERK AG
- Felipe LOPEZ-HILFIKER
- G01 - MEASURING TESTING
Information Patent Application
Mass Spectrometer
- Publication number 20240186134
- Publication date Jun 6, 2024
- Shimadzu Corporation
- Yoshihiro UENO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20240177980
- Publication date May 30, 2024
- Shimadzu Corporation
- Hidenori TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BUBBLE INTRODUCTION INTO A STEADY-STATE SAMPLE STREAM
- Publication number 20240170271
- Publication date May 23, 2024
- DH Technologies Development Pte. Ltd.
- Peter KOVARIK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE ANALYSIS SYSTEMS AND METHODS OF USE THEREOF
- Publication number 20240170273
- Publication date May 23, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- G01 - MEASURING TESTING
Information Patent Application
A SYSTEM FOR PRODUCTION OF HIGH YIELD OF IONS IN RF ONLY CONFINEMEN...
- Publication number 20240162024
- Publication date May 16, 2024
- QuadroCore Corp.
- Gholamreza Javahery
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ATMOSPHERIC PRESSURE IONIZATION COUPLED TO AN ELECTRON IONIZATION M...
- Publication number 20240153753
- Publication date May 9, 2024
- Inficon Inc.
- Nigel Sousou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INLET INSTRUMENTATION FOR ION ANALYSER COUPLED TO RAPID EVAPORATIVE...
- Publication number 20240128071
- Publication date Apr 18, 2024
- Micromass UK Limited
- Zoltán TAKÁTS
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20240087869
- Publication date Mar 14, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRIC DETERMINATION OF NON-DERIVATIZED, NON-METABOLIZE...
- Publication number 20240077503
- Publication date Mar 7, 2024
- Quest Diagnostics Investments LLC
- Brett Holmquist
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY TO IDENTIFY PREDICTIVE FAILURE WITH CHEMICAL DETE...
- Publication number 20240063007
- Publication date Feb 22, 2024
- Purdue Research Foundation
- Hersh Rai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIDE RANGE ELECTRON IMPACT ION SOURCE FOR A MASS SPECTROMETER
- Publication number 20240038522
- Publication date Feb 1, 2024
- Inficon, Inc.
- Norbert Mueller
- H01 - BASIC ELECTRIC ELEMENTS

using particle bombardment

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Tissue analysis by mass spectrometry or ion mobility spectrometry

Holding device for at least one filament and mass spectrometer

High resolution imaging apparatus and method

Ion source

Ionization device and mass spectrometer

Software for microfluidic systems interfacing with mass spectrometry

Systems and approaches for semiconductor metrology and surface anal...

Gas analyzer apparatus and method for controlling gas analyzer appa...

Single cell analysis using secondary ion mass spectrometry

Wide range electron impact ion source for a mass spectrometer

Ion analysis device

Specimen imaging systems and methods

Size selected clusters and nanoparticles

Mass spectrometry ION source

Wafer sample analysis method and device

Method for analyzing isoaspartic acid and mass spectrometer

Source-detector synchronization in multiplexed secondary ion mass s...

Axial CI source—off-axis electron beam

Case for glasses

Filament assembly

High resolution imaging apparatus and method

In situ chemical transformation and ionization of inorganic perchlo...

Ion molecule reactor and setup for analyzing complex mixtures

Mass spectral tissue analysis

Mass spectrometric determination of non-derivatized, non-metabolize...

Inner source assembly and associated components

Sample analysis systems and methods of use thereof

Stimulated or non-equilibrium energy-loss and energy-gain spectrosc...

Encoding of precursor ion beam to aid product ion assignment

Method of detecting radicals using mass spectrometry

Patents Applicationslast 30 patents

SOURCE-DETECTOR SYNCHRONIZATION IN MULTIPLEXED SECONDARY ION MASS S...

MASS SPECTROMETRY DEVICE

SAMPLE PROBE SYSTEMS AND ASSOCIATED METHODS

ION SOURCE FOR MASS SPECTROMETER

A METHOD OF DETERMINING OPERATIONAL PARAMETERS OF A SPECTROMETER, A...

AXIAL ION SOURCE WITH MAGNETIC FIELD ADJUSTMENT

AXIAL ION SOURCE

SPECIMEN IMAGING SYSTEMS AND METHODS

ION SOURCE ASSEMBLY

SOFTWARE FOR MICROFLUIDIC SYSTEMS INTERFACING WITH MASS SPECTROMETRY

METHOD FOR CORRECTING AGE OF COLUMBITE-TANTALITE BY USING DOUBLE-RE...

HIGH RESOLUTION IMAGING APPARATUS AND METHOD

ION SOURCE ASSEMBLY WITH MULTIPLE ELLIPTICAL FILAMENTS

ION SOURCE

MASS SPECTROMETRY DEVICE, AND MASS SPECTROMETRY METHOD

Remote Chamber And Dart-MS System Using Same

AN ELECTRON IMPACT IONIZATION WITHIN RADIO FREQUENCY CONFINEMENT FI...

MASS SPECTRAL TISSUE ANALYSIS

ION MOLECULE REACTOR AND SETUP FOR ANALYZING COMPLEX MIXTURES

Mass Spectrometer

MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

BUBBLE INTRODUCTION INTO A STEADY-STATE SAMPLE STREAM

SAMPLE ANALYSIS SYSTEMS AND METHODS OF USE THEREOF

A SYSTEM FOR PRODUCTION OF HIGH YIELD OF IONS IN RF ONLY CONFINEMEN...

ATMOSPHERIC PRESSURE IONIZATION COUPLED TO AN ELECTRON IONIZATION M...

INLET INSTRUMENTATION FOR ION ANALYSER COUPLED TO RAPID EVAPORATIVE...

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

MASS SPECTROMETRIC DETERMINATION OF NON-DERIVATIZED, NON-METABOLIZE...

MASS SPECTROMETRY TO IDENTIFY PREDICTIVE FAILURE WITH CHEMICAL DETE...

WIDE RANGE ELECTRON IMPACT ION SOURCE FOR A MASS SPECTROMETER