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G01J3/021
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
G01J3/00
Spectrometry Spectrophotometry Monochromators Measuring colour
Current Industry
G01J3/021
using plane or convex mirrors, parallel phase plates, or particular reflectors
Industries
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Patents Grants
last 30 patents
Information
Patent Grant
Carbon nano-tube polymer composite mirrors for CubeSat telescope
Patent number
11,971,300
Issue date
Apr 30, 2024
UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
Shahid Aslam
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Grant
System for the real-time high precision measurement of the atmosphe...
Patent number
11,971,302
Issue date
Apr 30, 2024
FUNDACION CENER-CIEMAT
Carlos Fernández Peruchena
F24 - HEATING RANGES VENTILATING
Information
Patent Grant
Quadrilateral common-path time-modulated interferometric spectral i...
Patent number
11,971,303
Issue date
Apr 30, 2024
WUHAN UNIVERSITY
Ruyi Wei
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring Raman spectrum and method thereof
Patent number
11,965,779
Issue date
Apr 23, 2024
TimeGate Instruments Oy
Lauri Kurki
G01 - MEASURING TESTING
Information
Patent Grant
System and method for non-invasive measurement of analytes in vivo
Patent number
11,965,781
Issue date
Apr 23, 2024
SANGUIS CORPORATION
Jeffrey Owen Katz
G01 - MEASURING TESTING
Information
Patent Grant
Curved-slit imaging spectrometer
Patent number
11,959,804
Issue date
Apr 16, 2024
Soochow University
Jiacheng Zhu
G01 - MEASURING TESTING
Information
Patent Grant
High power actively Q-switched downhole LIBS analysis systems
Patent number
11,953,443
Issue date
Apr 9, 2024
Energy, United States Department of
Dustin Langdon McIntyre
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Integrated evanescent wave spectral sensing device
Patent number
11,953,377
Issue date
Apr 9, 2024
Si-Ware Systems
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Grant
Raman spectroscopy equipment
Patent number
11,946,803
Issue date
Apr 2, 2024
Answeray Inc.
Seong Ho Cho
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic analysis device, optical system, and method
Patent number
11,940,326
Issue date
Mar 26, 2024
Yokogawa Electric Corporation
Kodai Murayama
G01 - MEASURING TESTING
Information
Patent Grant
Sensor configuration
Patent number
11,931,146
Issue date
Mar 19, 2024
Luciole Medical AG
Juerg Hans Froehlich
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Methods for calibrating an optical emission spectrometer
Patent number
11,927,482
Issue date
Mar 12, 2024
Applied Materials, Inc.
Kin Pong Lo
G01 - MEASURING TESTING
Information
Patent Grant
Refractory anchor device and system
Patent number
11,927,395
Issue date
Mar 12, 2024
Brand Shared Services, LLC
Eduardo Fernando D'Oracio De Almeida
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Spatially offset Raman probe with coaxial excitation and collection...
Patent number
11,913,834
Issue date
Feb 27, 2024
Endress+Hauser Optical Analysis, Inc.
James M. Tedesco
G01 - MEASURING TESTING
Information
Patent Grant
Compact detection module for flow cytometers
Patent number
11,913,868
Issue date
Feb 27, 2024
Cytek Biosciences, Inc.
Ming Yan
G01 - MEASURING TESTING
Information
Patent Grant
Illumination device for a spectrophotometer having integrated mixin...
Patent number
11,906,357
Issue date
Feb 20, 2024
X-Rite Europe GmbH
Mark Wegmüller
G01 - MEASURING TESTING
Information
Patent Grant
Optic for multi-pass optical channel monitor
Patent number
11,909,437
Issue date
Feb 20, 2024
Lumentum Operations LLC
Paul Colbourne
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Noise aware edge enhancement in a pulsed fluorescence imaging system
Patent number
11,898,909
Issue date
Feb 13, 2024
Cilag GmbH International
Joshua D. Talbert
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Devices, systems, and methods for agrochemical detection and agroch...
Patent number
11,898,955
Issue date
Feb 13, 2024
Spogen Biotech Inc.
Brian M. Thompson
G01 - MEASURING TESTING
Information
Patent Grant
Compact Raman sensor and apparatus for estimating bio-component
Patent number
11,898,910
Issue date
Feb 13, 2024
Samsung Electronics Co., Ltd.
Ho Jun Chang
G01 - MEASURING TESTING
Information
Patent Grant
Hyperspectral imaging (HSI) apparatus and inspection apparatus incl...
Patent number
11,898,912
Issue date
Feb 13, 2024
Samsung Electronics Co., Ltd.
Sungho Jang
G01 - MEASURING TESTING
Information
Patent Grant
Short-wave infrared sensor for identifying based on water content
Patent number
11,896,346
Issue date
Feb 13, 2024
OMNI MEDSCI, LLC
Mohammed N. Islam
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High-speed Fourier-transform spectroscopy apparatus and spectroscop...
Patent number
11,892,354
Issue date
Feb 6, 2024
The University of Tokyo
Takuro Ideguchi
G01 - MEASURING TESTING
Information
Patent Grant
Compact hyperspectral spectrometers based on semiconductor nanomemb...
Patent number
11,894,399
Issue date
Feb 6, 2024
Wisconsin Alumni Research Foundation
Zhenqiang Ma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High-performance on-chip spectrometers and spectrum analyzers
Patent number
11,885,677
Issue date
Jan 30, 2024
Massachusetts Institute of Technology
Derek Kita
G01 - MEASURING TESTING
Information
Patent Grant
Wafer thickness, topography, and layer thickness metrology system
Patent number
11,885,609
Issue date
Jan 30, 2024
Wojciech Jan Walecki
G01 - MEASURING TESTING
Information
Patent Grant
Methods and devices for standoff differential Raman spectroscopy wi...
Patent number
11,885,681
Issue date
Jan 30, 2024
Pendar Technologies, LLC
Daryoosh Vakhshoori
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Field spectral radiometers including calibration assemblies
Patent number
11,885,671
Issue date
Jan 30, 2024
Labsphere, Inc.
Jeffrey William Holt
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for Raman spectroscopy
Patent number
11,885,684
Issue date
Jan 30, 2024
Massachusetts Institute of Technology
Juejun Hu
G01 - MEASURING TESTING
Information
Patent Grant
Mirror unit and optical module
Patent number
11,879,731
Issue date
Jan 23, 2024
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
SOLAR REFLECTION FULL-BAND HYPERSPECTRAL IMAGING DETECTION SYSTEM
Publication number
20240142305
Publication date
May 2, 2024
SHANGHAI INSTITUTE OF TECHNICAL PHYSICS, CHINESE ACADEMY OF SCIENCES
Yinnian LIU
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR DETERMINING SUCCESSIVE SINGLE MOLECULAR DECAY
Publication number
20240133740
Publication date
Apr 25, 2024
MIFTEK CORPORATION
Masanobu Yamamoto
G01 - MEASURING TESTING
Information
Patent Application
CAMERA BASED SYSTEM WITH PROCESSING USING ARTIFICIAL INTELLIGENCE F...
Publication number
20240130621
Publication date
Apr 25, 2024
Omni MedSci, Inc.
Mohammed N. Islam
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SPECTROMETRY DEVICE AND SPECTROMETRY METHOD
Publication number
20240110830
Publication date
Apr 4, 2024
OSAKA UNIVERSITY
Katsumasa FUJITA
G01 - MEASURING TESTING
Information
Patent Application
MIRROR UNIT AND OPTICAL MODULE
Publication number
20240110779
Publication date
Apr 4, 2024
HAMAMATSU PHOTONICS K. K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
REFRACTORY ANCHOR DEVICE AND SYSTEM
Publication number
20240102736
Publication date
Mar 28, 2024
BRAND SHARED SERVICES, LLC
Eduardo Fernando D'ORACIO DE ALMEIDA
G01 - MEASURING TESTING
Information
Patent Application
ULTRATHIN MICRO-SPECTROMETER AND METHOD OF MANUFACTURING THE SAME
Publication number
20240102859
Publication date
Mar 28, 2024
Korea Advanced Institute of Science and Technology
Ki Hun Jeong
G01 - MEASURING TESTING
Information
Patent Application
WATER QUALITY DETECTION SYSTEM
Publication number
20240085395
Publication date
Mar 14, 2024
Huawei Technologies Co., Ltd
Zhenwei Wang
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR INSPECTING SEMICONDUCTOR DEVICE
Publication number
20240077424
Publication date
Mar 7, 2024
Samsung Electronics Co., Ltd.
Hyunwoo RYOO
G01 - MEASURING TESTING
Information
Patent Application
LIGHT MEASURING DEVICE AND METHOD OF MANUFACTURING LIGHT MEASURING...
Publication number
20240068866
Publication date
Feb 29, 2024
HAMAMATSU PHOTONICS K. K.
Tatsuo DOUGAKIUCHI
G01 - MEASURING TESTING
Information
Patent Application
DETECTION AND IDENTIFICATION OF BODY FLUID TRACES WITH STAND-OFF RA...
Publication number
20240053200
Publication date
Feb 15, 2024
The Research Foundation for the State University of New York
Igor Lednev
G01 - MEASURING TESTING
Information
Patent Application
HYPERSPECTRAL IMAGING DEVICE AND METHOD
Publication number
20240053199
Publication date
Feb 15, 2024
UNIVERSITA' DEGLI STUDI DI BARI ''ALDO MORO''
Milena D'ANGELO
G01 - MEASURING TESTING
Information
Patent Application
IMAGE PICKUP APPARATUS, MEASURING APPARATUS, AND ARTICLE MANUFACTUR...
Publication number
20240053197
Publication date
Feb 15, 2024
Canon Kabushiki Kaisha
Soya SAIJO
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SPECTROMETER SYSTEM
Publication number
20240044705
Publication date
Feb 8, 2024
Bar Ilan University
Moti FRIDMAN
G01 - MEASURING TESTING
Information
Patent Application
RAMAN SPECTROSCOPY PROBE AND RAMAN SPECTROSCOPY DETECTION DEVICE
Publication number
20240044708
Publication date
Feb 8, 2024
NANJING NUOYUAN MEDICAL DEVICES CO., LTD.
Huiming CAI
G01 - MEASURING TESTING
Information
Patent Application
Optical Device And Spectroscopy Apparatus
Publication number
20240035889
Publication date
Feb 1, 2024
SEIKO EPSON CORPORATION
Kohei YAMADA
G01 - MEASURING TESTING
Information
Patent Application
SINGLE PHOTON COUNTING FLOW CYTOMETER
Publication number
20240027270
Publication date
Jan 25, 2024
MIFTEK CORPORATION
Masanobu Yamamoto
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL COMPONENT AND SYSTEM FOR SIMULTANEOUS 3D HYPERSPECTRAL IMAGING
Publication number
20240027265
Publication date
Jan 25, 2024
HI-Spectral, LLC
Haosheng LIN
G01 - MEASURING TESTING
Information
Patent Application
LIGHT DETECTION DEVICE
Publication number
20240019304
Publication date
Jan 18, 2024
HAMAMATSU PHOTONICS K. K.
Masaki HIROSE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PHOTOTHERMAL INFRARED SPECTROSCOPY UTILIZING SPATIAL LIGHT MANIPULA...
Publication number
20240011830
Publication date
Jan 11, 2024
Photothermal Spectroscopy Corp.
Derek Decker
G01 - MEASURING TESTING
Information
Patent Application
SPATIAL SPECTROMETER
Publication number
20240011832
Publication date
Jan 11, 2024
Shphotonics Ltd
Lei SUN
G01 - MEASURING TESTING
Information
Patent Application
APPARATUSES AND METHODS FOR EXAMINING THE MOVEMENT OF CONSTITUENTS...
Publication number
20240011903
Publication date
Jan 11, 2024
PURDUE RESEARCH FOUNDATION
David D. NOLTE
G01 - MEASURING TESTING
Information
Patent Application
IDENTIFYING OBJECTS USING NEAR-INFRARED SENSORS, CAMERAS OR TIME-OF...
Publication number
20240000317
Publication date
Jan 4, 2024
Omni MedSci, Inc.
Mohammed N. Islam
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
OPTICAL FIBER SURFACE ELECTRIC FIELD SCREENING APPARATUS
Publication number
20230408332
Publication date
Dec 21, 2023
Liaocheng University
Nan-Kuang CHEN
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
QUADRILATERAL COMMON-PATH TIME-MODULATED INTERFEROMETRIC SPECTRAL I...
Publication number
20230408337
Publication date
Dec 21, 2023
WUHAN UNIVERSITY
Ruyi WEI
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND A METHOD FOR POLARIZATION DEPENDENT IMAGING
Publication number
20230392984
Publication date
Dec 7, 2023
Bruno FIGEYS
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS TO REDISTRIBUTE FIELD OF VIEW IN SPECTROSCOPY
Publication number
20230384156
Publication date
Nov 30, 2023
CHROMATION INC.
Michael Gazes
G01 - MEASURING TESTING
Information
Patent Application
PLASMA PROCESSING APPARATUS AND METHOD OF MANUFACTURE
Publication number
20230377857
Publication date
Nov 23, 2023
Samsung Electronics Co., Ltd.
SE JIN OH
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPTICAL SENSING MODULE
Publication number
20230375525
Publication date
Nov 23, 2023
ROCKLEY PHOTONICS LIMITED
Sean Merritt
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
LIGHT SENSOR AND A METHOD FOR MANUFACTURING A LIGHT SENSOR
Publication number
20230375406
Publication date
Nov 23, 2023
Vladimir PEJOVIC
G01 - MEASURING TESTING