using polarizing elements

Industry

CPC
G01J5/0825

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Parent Industries

GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J5/00Radiation pyrometry

Current Industry

G01J5/0825using polarizing elements

Industries

Patents Grantslast 30 patents

Information Patent Grant
Thermal image sensing system and thermal image sensing method
- Patent number 11,290,663
- Issue date Mar 29, 2022
- Industrial Technology Research Institute
- Han-Kuei Fu
- G01 - MEASURING TESTING
Information Patent Grant
Thermal infrared detector and manufacturing method for thermal infr...
- Patent number 11,215,510
- Issue date Jan 4, 2022
- Mitsubishi Electric Corporation
- Satoi Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Infrared imaging device
- Patent number 11,125,624
- Issue date Sep 21, 2021
- Safran Electronics & Defense
- Arnaud Davenel
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Kirigami chiroptical modulators for circular dichroism measurements...
- Patent number 10,935,432
- Issue date Mar 2, 2021
- The Regents of the University of Michigan
- Nicholas A. Kotov
- G01 - MEASURING TESTING
Information Patent Grant
Optical detector for an optical detection
- Patent number 10,890,491
- Issue date Jan 12, 2021
- trinamiX GmbH
- Sebastian Valouch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiometry device
- Patent number 10,816,407
- Issue date Oct 27, 2020
- INTER-UNIVERSITY RESEARCH INSTITUTE CORPORATIONHIG
- Osamu Tajima
- G01 - MEASURING TESTING
Information Patent Grant
Self-contained metrology wafer carrier systems
- Patent number 10,818,528
- Issue date Oct 27, 2020
- GLOBALFOUNDRIES Inc.
- Abner Bello
- G05 - CONTROLLING REGULATING
Information Patent Grant
Polarization selective, frequency selective, and wide dynamic range...
- Patent number 10,670,466
- Issue date Jun 2, 2020
- Apple Inc.
- Miikka M. Kangas
- G01 - MEASURING TESTING
Information Patent Grant
Imaging apparatus, methods, and applications
- Patent number 10,451,486
- Issue date Oct 22, 2019
- Arizona Board of Regents on behalf of the University of Arizona
- Stanley Pau
- G01 - MEASURING TESTING
Information Patent Grant
Polarization selective, frequency selective, and wide dynamic range...
- Patent number 10,323,987
- Issue date Jun 18, 2019
- Apple Inc.
- Miikka M. Kangas
- G01 - MEASURING TESTING
Information Patent Grant
Self-contained metrology wafer carrier systems
- Patent number 10,242,895
- Issue date Mar 26, 2019
- GLOBALFOUNDRIES Inc.
- Abner Bello
- G05 - CONTROLLING REGULATING
Information Patent Grant
Uncooled, high sensitivity spectral selective infrared detector
- Patent number 10,168,221
- Issue date Jan 1, 2019
- Board of Trustees of the University of Illinois
- Songbin Gong
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Sensor and information acquisition apparatus using sensor
- Patent number 9,958,330
- Issue date May 1, 2018
- Canon Kabushiki Kaisha
- Yasushi Koyama
- G01 - MEASURING TESTING
Information Patent Grant
Polarization selective, frequency selective, and wide dynamic range...
- Patent number 9,939,322
- Issue date Apr 10, 2018
- Apple Inc.
- Miikka M. Kangas
- G01 - MEASURING TESTING
Information Patent Grant
Self-contained metrology wafer carrier systems
- Patent number 9,911,634
- Issue date Mar 6, 2018
- GLOBALFOUNDRIES Inc.
- Abner Bello
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of apparatus for cross-modal face matching using polarimetri...
- Patent number 9,830,506
- Issue date Nov 28, 2017
- The United States of America as represented by the Secretary of the Army
- Nathaniel J. Short
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for making wavelength-selective, integrated resonance detect...
- Patent number 9,423,301
- Issue date Aug 23, 2016
- Nanohmics, Inc.
- Steve M. Savoy
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic wave detector and electromagnetic wave detector array
- Patent number 9,157,789
- Issue date Oct 13, 2015
- Mitsubishi Electric Corporation
- Shimpei Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength-selective, integrated resonance detector for electromagn...
- Patent number 9,040,913
- Issue date May 26, 2015
- Nanohmics, Inc.
- Steve M. Savoy
- G01 - MEASURING TESTING
Information Patent Grant
Optically transitioning thermal detector structures
- Patent number 9,000,373
- Issue date Apr 7, 2015
- L-3 Communications Corporation
- Howard Beratan
- G01 - MEASURING TESTING
Information Patent Grant
Frequency selective electromagnetic detector
- Patent number 8,907,265
- Issue date Dec 9, 2014
- The Boeing Company
- Jeffrey H. Hunt
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Frequency selective electromagnetic detector
- Patent number 8,729,456
- Issue date May 20, 2014
- The Boeing Company
- Jeffrey H. Hunt
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Pixel-level optical elements for uncooled infrared detector devices
- Patent number 8,610,070
- Issue date Dec 17, 2013
- L-3 Communications Corporation
- Thomas R. Schimert
- G01 - MEASURING TESTING
Information Patent Grant
Optically transitioning thermal detector structures
- Patent number 8,513,605
- Issue date Aug 20, 2013
- L-3 Communications Corporation
- Howard Beratan
- G01 - MEASURING TESTING
Information Patent Grant
Detection device, sensor device, and electronic apparatus
- Patent number 8,481,940
- Issue date Jul 9, 2013
- Seiko Epson Corporation
- Kei Yoshizaki
- G01 - MEASURING TESTING
Information Patent Grant
Infrared imaging apparatus
- Patent number 7,851,759
- Issue date Dec 14, 2010
- Alcatel-Lucent USA Inc.
- Vladimir Anatolyevich Aksyuk
- G01 - MEASURING TESTING
Information Patent Grant
Plasmon coupling apparatus and method
- Patent number 7,772,555
- Issue date Aug 10, 2010
- ITN Energy Systems, Inc.
- Russell E. Hollingsworth
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for temperature measurement and control on a...
- Patent number 7,744,274
- Issue date Jun 29, 2010
- Ultratech, Inc.
- Boris Grek
- G01 - MEASURING TESTING
Information Patent Grant
Optically readable radiation-displacement-conversion devices and me...
- Patent number 6,080,988
- Issue date Jun 27, 2000
- Nikon Corporation
- Tohru Ishizuya
- G02 - OPTICS
Information Patent Grant
Non-contacting infrared temperature thermometer detector apparatus
- Patent number 5,653,537
- Issue date Aug 5, 1997
- Ircon, Inc.
- Steven A. Ignatowicz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC DEVICE, METHOD AND APPARATUS FOR MEASURING COLOR TEMPERA...
- Publication number 20210396589
- Publication date Dec 23, 2021
- Beijing Xiaomi Mobile Software Co., Ltd.
- Li GUO
- G01 - MEASURING TESTING
Information Patent Application
SENSITIVITY SURFACE CRACK DETECTION
- Publication number 20210304398
- Publication date Sep 30, 2021
- The Boeing Company
- Morteza Safai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFRARED IMAGING DEVICE
- Publication number 20210255043
- Publication date Aug 19, 2021
- SAFRAN ELECTRONICS & DEFENSE
- Arnaud DAVENEL
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS OF ADAPTIVE TWO-WAVELENGTH SINGLE-CAMERA IMAGIN...
- Publication number 20210140830
- Publication date May 13, 2021
- Xiayun Zhao
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING THE SURFACE TEMPERATURE OF A SUB...
- Publication number 20200292390
- Publication date Sep 17, 2020
- Laser Systems & Solutions of Europe
- Sylvain PERROT
- G01 - MEASURING TESTING
Information Patent Application
THERMAL IMAGE SENSING SYSTEM AND THERMAL IMAGE SENSING METHOD
- Publication number 20200252558
- Publication date Aug 6, 2020
- Industrial Technology Research Institute
- Han-Kuei Fu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RADIATION TEMPERATURE MEASURING DEVICE
- Publication number 20200080897
- Publication date Mar 12, 2020
- Asahi Kasei Kabushiki Kaisha
- Hiroyuki SASAKI
- G02 - OPTICS
Information Patent Application
KIRIGAMI CHIROPTICAL MODULATORS FOR CIRCULAR DICHROISM MEASUREMENTS...
- Publication number 20200025618
- Publication date Jan 23, 2020
- The Regents of the University of Michigan
- Nicholas A. KOTOV
- G01 - MEASURING TESTING
Information Patent Application
MICROBOLOMETER APPARATUS, METHODS, AND APPLICATIONS
- Publication number 20200003626
- Publication date Jan 2, 2020
- Arizona Board of Regents on behalf of The University of Arizona
- Stanley Pau
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OPTICAL DETECTOR FOR AN OPTICAL DETECTION
- Publication number 20190277703
- Publication date Sep 12, 2019
- trinamiX GmbH
- Sebastian VALOUCH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POLARIZATION SELECTIVE, FREQUENCY SELECTIVE, AND WIDE DYNAMIC RANGE...
- Publication number 20190250041
- Publication date Aug 15, 2019
- Apple Inc.
- Miikka M. KANGAS
- G01 - MEASURING TESTING
Information Patent Application
IMAGING APPARATUS, METHODS, AND APPLICATIONS
- Publication number 20180180486
- Publication date Jun 28, 2018
- Arizona Board of Regents on behalf of The University of Arizona
- Stanley Pau
- G02 - OPTICS
Information Patent Application
POLARIZATION SELECTIVE, FREQUENCY SELECTIVE, AND WIDE DYNAMIC RANGE...
- Publication number 20180143078
- Publication date May 24, 2018
- Apple Inc.
- Miikka M. KANGAS
- G01 - MEASURING TESTING
Information Patent Application
POLARIZATION SELECTIVE, FREQUENCY SELECTIVE, AND WIDE DYNAMIC RANGE...
- Publication number 20170370776
- Publication date Dec 28, 2017
- Apple Inc.
- Miikka M. KANGAS
- G01 - MEASURING TESTING
Information Patent Application
SELF-CONTAINED METROLOGY WAFER CARRIER SYSTEMS
- Publication number 20170372924
- Publication date Dec 28, 2017
- GLOBALFOUNDRIES INC.
- Abner BELLO
- G01 - MEASURING TESTING
Information Patent Application
UNCOOLED, HIGH SENSITIVITY SPECTRAL SELECTIVE INFRARED DETECTOR
- Publication number 20170268931
- Publication date Sep 21, 2017
- THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
- Songbin Gong
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD OF APPARATUS FOR CROSS-MODAL FACE MATCHING USING POLARIMETRI...
- Publication number 20170132458
- Publication date May 11, 2017
- U.S. ARMY RESEARCH LABORATORY ATTN: RDRL-LOC-I
- Nathaniel J. Short
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PHOTODETECTOR
- Publication number 20160351732
- Publication date Dec 1, 2016
- UNIVERSITE PARIS DIDEROT PARIS 7
- Yuk Nga Chen
- G01 - MEASURING TESTING
Information Patent Application
SENSOR AND INFORMATION ACQUISITION APPARATUS USING SENSOR
- Publication number 20160169746
- Publication date Jun 16, 2016
- Canon Kabushiki Kaisha
- Yasushi Koyama
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, METHODS, AND APPARATUS FOR SENSITIVE THERMAL IMAGING
- Publication number 20160070125
- Publication date Mar 10, 2016
- Robert K. Reich
- G02 - OPTICS
Information Patent Application
ELECTROMAGNETIC WAVE DETECTOR AND ELECTROMAGNETIC WAVE DETECTOR ARRAY
- Publication number 20140319357
- Publication date Oct 30, 2014
- MITSUBISHI ELECTRIC CORPORATION
- Shimpei OGAWA
- G02 - OPTICS
Information Patent Application
SENSOR
- Publication number 20140264028
- Publication date Sep 18, 2014
- SEIKO EPSON CORPORATION
- Yasuaki Hamada
- G01 - MEASURING TESTING
Information Patent Application
Optically Transitioning Thermal Detector Structures
- Publication number 20130292789
- Publication date Nov 7, 2013
- Howard Beratan
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY SELECTIVE ELECTROMAGNETIC DETECTOR
- Publication number 20130221210
- Publication date Aug 29, 2013
- The Boeing Company
- Jeffrey H. Hunt
- B82 - NANO-TECHNOLOGY
Information Patent Application
Wavelength-Selective, Integrated resonance Detector for Electromagn...
- Publication number 20130153767
- Publication date Jun 20, 2013
- Nanohmics, Inc.
- Steve M. Savoy
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY SELECTIVE ELECTROMAGNETIC DETECTOR
- Publication number 20120193521
- Publication date Aug 2, 2012
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Application
DETECTION DEVICE, SENSOR DEVICE, AND ELECTRONIC APPARATUS
- Publication number 20120161002
- Publication date Jun 28, 2012
- SEIKO EPSON CORPORATION
- Kei YOSHIZAKI
- G01 - MEASURING TESTING
Information Patent Application
Optically transitioning thermal detector structures
- Publication number 20110266445
- Publication date Nov 3, 2011
- Howard Beratan
- G01 - MEASURING TESTING
Information Patent Application
Pixel-level optical elements for uncooled infrared detector devices
- Publication number 20110266443
- Publication date Nov 3, 2011
- Thomas R. Schimert
- G01 - MEASURING TESTING
Information Patent Application
RADIATION THERMOMETRY AND RADIATION THERMOMETRY SYSTEM
- Publication number 20100292950
- Publication date Nov 18, 2010
- TOYO UNIVERSITY
- Tohru Iuchi
- G01 - MEASURING TESTING

using polarizing elements

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Thermal image sensing system and thermal image sensing method

Thermal infrared detector and manufacturing method for thermal infr...

Infrared imaging device

Kirigami chiroptical modulators for circular dichroism measurements...

Optical detector for an optical detection

Radiometry device

Self-contained metrology wafer carrier systems

Polarization selective, frequency selective, and wide dynamic range...

Imaging apparatus, methods, and applications

Polarization selective, frequency selective, and wide dynamic range...

Self-contained metrology wafer carrier systems

Uncooled, high sensitivity spectral selective infrared detector

Sensor and information acquisition apparatus using sensor

Polarization selective, frequency selective, and wide dynamic range...

Self-contained metrology wafer carrier systems

Method of apparatus for cross-modal face matching using polarimetri...

Method for making wavelength-selective, integrated resonance detect...

Electromagnetic wave detector and electromagnetic wave detector array

Wavelength-selective, integrated resonance detector for electromagn...

Optically transitioning thermal detector structures

Frequency selective electromagnetic detector

Frequency selective electromagnetic detector

Pixel-level optical elements for uncooled infrared detector devices

Optically transitioning thermal detector structures

Detection device, sensor device, and electronic apparatus

Infrared imaging apparatus

Plasmon coupling apparatus and method

Methods and apparatus for temperature measurement and control on a...

Optically readable radiation-displacement-conversion devices and me...

Non-contacting infrared temperature thermometer detector apparatus

Patents Applicationslast 30 patents

ELECTRONIC DEVICE, METHOD AND APPARATUS FOR MEASURING COLOR TEMPERA...

SENSITIVITY SURFACE CRACK DETECTION

INFRARED IMAGING DEVICE

SYSTEMS AND METHODS OF ADAPTIVE TWO-WAVELENGTH SINGLE-CAMERA IMAGIN...

APPARATUS AND METHOD FOR MEASURING THE SURFACE TEMPERATURE OF A SUB...

THERMAL IMAGE SENSING SYSTEM AND THERMAL IMAGE SENSING METHOD

RADIATION TEMPERATURE MEASURING DEVICE

KIRIGAMI CHIROPTICAL MODULATORS FOR CIRCULAR DICHROISM MEASUREMENTS...

MICROBOLOMETER APPARATUS, METHODS, AND APPLICATIONS

OPTICAL DETECTOR FOR AN OPTICAL DETECTION

POLARIZATION SELECTIVE, FREQUENCY SELECTIVE, AND WIDE DYNAMIC RANGE...

IMAGING APPARATUS, METHODS, AND APPLICATIONS

POLARIZATION SELECTIVE, FREQUENCY SELECTIVE, AND WIDE DYNAMIC RANGE...

POLARIZATION SELECTIVE, FREQUENCY SELECTIVE, AND WIDE DYNAMIC RANGE...

SELF-CONTAINED METROLOGY WAFER CARRIER SYSTEMS

UNCOOLED, HIGH SENSITIVITY SPECTRAL SELECTIVE INFRARED DETECTOR

METHOD OF APPARATUS FOR CROSS-MODAL FACE MATCHING USING POLARIMETRI...

SEMICONDUCTOR PHOTODETECTOR

SENSOR AND INFORMATION ACQUISITION APPARATUS USING SENSOR

SYSTEMS, METHODS, AND APPARATUS FOR SENSITIVE THERMAL IMAGING

ELECTROMAGNETIC WAVE DETECTOR AND ELECTROMAGNETIC WAVE DETECTOR ARRAY

SENSOR

Optically Transitioning Thermal Detector Structures

FREQUENCY SELECTIVE ELECTROMAGNETIC DETECTOR

Wavelength-Selective, Integrated resonance Detector for Electromagn...

FREQUENCY SELECTIVE ELECTROMAGNETIC DETECTOR

DETECTION DEVICE, SENSOR DEVICE, AND ELECTRONIC APPARATUS

Optically transitioning thermal detector structures

Pixel-level optical elements for uncooled infrared detector devices

RADIATION THERMOMETRY AND RADIATION THERMOMETRY SYSTEM