-
Electronic device
-
Patent number 12,205,974
-
Issue date Jan 21, 2025
-
Innolux Corporation
-
Chandra Lius
-
H01 - BASIC ELECTRIC ELEMENTS
-
-
X-ray device and sensing panel
-
Patent number 12,196,893
-
Issue date Jan 14, 2025
-
InnoCare Optoelectronics Corporation
-
Zhi-Hong Wang
-
G01 - MEASURING TESTING
-
-
-
Radiation detection system
-
Patent number 12,186,779
-
Issue date Jan 7, 2025
-
ISO-PACIFIC REMEDIATION TECHNOLOGIES, INC.
-
Michael John Dillon
-
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
-
-
-
-
-
-
-
-
Radiographic device
-
Patent number 12,153,173
-
Issue date Nov 26, 2024
-
National University Corporation Shizuoka University
-
Toru Aoki
-
G01 - MEASURING TESTING
-
-
-
-
Programmable SiPM arrays
-
Patent number 12,147,000
-
Issue date Nov 19, 2024
-
Waymo LLC
-
Simon Verghese
-
G01 - MEASURING TESTING
-
Layered scintillating neutron detector
-
Patent number 12,130,393
-
Issue date Oct 29, 2024
-
United States of America as represented by the Secretary of the Navy
-
Kyle Alan Nelson
-
G01 - MEASURING TESTING
-
-
-
-
-
Radiography apparatus
-
Patent number 12,117,572
-
Issue date Oct 15, 2024
-
FUJIFILM Corporation
-
Kengo Nomura
-
G01 - MEASURING TESTING
-
-
-
Plastic wavelength shifting fiber
-
Patent number 12,105,320
-
Issue date Oct 1, 2024
-
Kuraray Co., Ltd.
-
Masashi Akari
-
C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
-
-
-