using semiconducting elements having PN junctions

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CPC
G01K7/01

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GPHYSICS G01Measuring instruments G01KMEASURING TEMPERATURE MEASURING QUANTITY OF HEAT THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR G01K7/00Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat; Power supply

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G01K7/01using semiconducting elements having PN junctions

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Variable attenuation circuit utilizing varactor diodes
- Patent number 12,231,104
- Issue date Feb 18, 2025
- Skyworks Solutions, Inc.
- Gordon Glen Rabjohn
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Switch device
- Patent number 12,224,738
- Issue date Feb 11, 2025
- Rohm Co., Ltd.
- Toru Takuma
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Temperature detection device and method using sets of DC voltages
- Patent number 12,209,917
- Issue date Jan 28, 2025
- STMicroelectronics (Rousset) SAS
- Bruno Gailhard
- G01 - MEASURING TESTING
Information Patent Grant
Ultra-fast coulomb blockade thermometer
- Patent number 12,209,918
- Issue date Jan 28, 2025
- Aalto University Foundation sr
- Jukka Pekola
- G01 - MEASURING TESTING
Information Patent Grant
Method for implementing Vptat multiplier in high accuracy thermal s...
- Patent number 12,209,919
- Issue date Jan 28, 2025
- STMICROELECTRONICS INTERNATIONAL N.V.
- Pijush Kanti Panja
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Image controller and semiconductor package
- Patent number 12,205,560
- Issue date Jan 21, 2025
- Samsung Display Co., Ltd.
- Bon Seog Gu
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Temperature calibration methods for semiconductor machine
- Patent number 12,205,834
- Issue date Jan 21, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- ShihChieh Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic circuit arrangement for monitoring temperatures
- Patent number 12,203,815
- Issue date Jan 21, 2025
- ECOM Instruments GmbH
- Patrick Cseh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temperature sensor circuits for integrated circuit devices
- Patent number 12,184,271
- Issue date Dec 31, 2024
- Samsung Electronics Co., Ltd.
- Darryl G. Walker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temperature sensor with delta base-emitter voltage amplification an...
- Patent number 12,181,350
- Issue date Dec 31, 2024
- Analog Devices International Unlimited Company
- Gaurav Singh
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor devices, semiconductor structures and methods for fab...
- Patent number 12,176,346
- Issue date Dec 24, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chia-Chung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MEMS sensor as well as method for operating a mems sensor
- Patent number 12,145,840
- Issue date Nov 19, 2024
- Robert Bosch GmbH
- Arne Dannenberg
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Enhanced temperature sensor
- Patent number 12,140,483
- Issue date Nov 12, 2024
- STMicroelectronics (Rousset) SAS
- Vincent Binet
- G01 - MEASURING TESTING
Information Patent Grant
Sensor and method for performing a reference measurement with guide...
- Patent number 12,140,514
- Issue date Nov 12, 2024
- Infineon Technologies AG
- Gerald Stocker
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for producing an electrical signal that is indicative of...
- Patent number 12,140,484
- Issue date Nov 12, 2024
- University of Surrey
- Radu Alexandru Sporea
- G01 - MEASURING TESTING
Information Patent Grant
Temperature detection
- Patent number 12,135,245
- Issue date Nov 5, 2024
- Nokia Technologies Oy
- Marijan Herceg
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor based temperature sensor
- Patent number 12,123,787
- Issue date Oct 22, 2024
- Nokia Technologies Oy
- Marijan Herceg
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Bipolar junction transistor heater circuit
- Patent number 12,119,639
- Issue date Oct 15, 2024
- Analog Devices International Unlimited Company
- Aref Kahaei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, device and system for monitoring IGBT junction temperature
- Patent number 12,117,352
- Issue date Oct 15, 2024
- Tsinghua University
- Pinjia Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device and temperature detection device thereof
- Patent number 12,095,254
- Issue date Sep 17, 2024
- LEAP Semiconductor Corp.
- Wei-Fan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
IC thermal protection
- Patent number 12,088,285
- Issue date Sep 10, 2024
- Microchip Technology Inc.
- Tamir Langer
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Semiconductor devices and methods of manufacturing thereof
- Patent number 12,087,814
- Issue date Sep 10, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chia-Chung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement device and measurement system
- Patent number 12,085,455
- Issue date Sep 10, 2024
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Masataka Maehara
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Temperature sensors
- Patent number 12,088,286
- Issue date Sep 10, 2024
- Texas Instruments Incorporated
- Chengxi Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Complementary bipolar junction transistor
- Patent number 12,078,551
- Issue date Sep 3, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Zi-Ang Su
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temperature protection circuit
- Patent number 12,078,554
- Issue date Sep 3, 2024
- Taiwan Semiconductor Manufacturing Company Limited
- Chan-Hong Chern
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single calibration temperature based temperature sensing with diffe...
- Patent number 12,066,335
- Issue date Aug 20, 2024
- MARVELL ASIA PTE. LTD.
- Sadettin Cirit
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor device and trimming method of the same
- Patent number 12,061,123
- Issue date Aug 13, 2024
- Renesas Electronics Corporation
- Shin Tamura
- G01 - MEASURING TESTING
Information Patent Grant
Analog system and associated methods thereof
- Patent number 12,057,850
- Issue date Aug 6, 2024
- Frank R. Dropps
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Sensor elements and assemblies, cutting tools comprising same and m...
- Patent number 12,044,118
- Issue date Jul 23, 2024
- ELEMENT SIX (UK) LIMITED
- Santonu Ghosh
- E21 - EARTH DRILLING MINING

Patents Applicationslast 30 patents

Information Patent Application
SENSOR DEVICE AND COOKING APPLIANCE INCLUDING THE SAME
- Publication number 20250056683
- Publication date Feb 13, 2025
- Samsung Electronics Co., Ltd.
- Hyunjoon CHOO
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROPORTIONAL TO ABSOLUTE TEMPERATURE VOLTAGE DETERMINATION WITHOUT...
- Publication number 20250013257
- Publication date Jan 9, 2025
- STMicroelectronics International N.V.
- Atul DWIVEDI
- G01 - MEASURING TESTING
Information Patent Application
CMOS-BASED TEMPERATURE SENSOR WITH FULL BAND POWER SUPPLY REJECTION
- Publication number 20250003809
- Publication date Jan 2, 2025
- Apple Inc.
- Soheil GOLARA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND CIRCUIT ARRANGEMENTS FOR DETERMINING A BARRIER-LAYER TEM...
- Publication number 20240426675
- Publication date Dec 26, 2024
- ROBERT BOSCH GmbH
- Manuel Riefer
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE CONTROL METHOD FOR POWER SUPPLY CONVERSION CHIP, RELATE...
- Publication number 20240421706
- Publication date Dec 19, 2024
- SUZHOU METABRAIN INTELLIGENT TECHNOLOGY CO., LTD.
- Jian WANG
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SEMICONDUCTOR DEVICE WITH AN ACTIVE DEVICE REGION AND A CURRENT SEN...
- Publication number 20240421021
- Publication date Dec 19, 2024
- Infineon Technologies Austria AG
- Alim Karmous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE SENSOR CIRCUITS
- Publication number 20240410764
- Publication date Dec 12, 2024
- NXP B.V.
- Peter van der Cammen
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICE AND NON-TRANSITORY COMPUTER READABLE MEDIUM
- Publication number 20240413741
- Publication date Dec 12, 2024
- DENSO CORPORATION
- Takuya IMABAYASHI
- G01 - MEASURING TESTING
Information Patent Application
POWER DEVICE TEMPERATURE ESTIMATION DEVICE FOR INVERTER
- Publication number 20240393183
- Publication date Nov 28, 2024
- Mazda Motor Corporation
- Genri Suzuki
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20240395806
- Publication date Nov 28, 2024
- Mitsubishi Electric Corporation
- Kakeru OTSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE SENSORS
- Publication number 20240396543
- Publication date Nov 28, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Chengxi LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALOG SYSTEM AND ASSOCIATED METHODS THEREOF
- Publication number 20240396561
- Publication date Nov 28, 2024
- Frank R. Dropps
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEMPERATURE INPUT/OUTPUT (I/O) MODULE WITH INTEGRATED THERMISTOR FO...
- Publication number 20240393182
- Publication date Nov 28, 2024
- ROCKWELL AUTOMATION ASIA PACIFIC BUSINESS CENTER PTE. LTD.
- Qiao Zhang
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240387713
- Publication date Nov 21, 2024
- Fuji Electric Co., Ltd.
- Masayuki MOMOSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES, SEMICONDUCTOR STRUCTURES AND METHODS FOR FAB...
- Publication number 20240387522
- Publication date Nov 21, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Chung CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPLEMENTARY BIPOLAR JUNCTION TRANSISTOR
- Publication number 20240369421
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Zi-Ang Su
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THEREOF
- Publication number 20240371931
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Chung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE PROTECTION CIRCUIT
- Publication number 20240369424
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing Company Limited
- Chan-Hong CHERN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SWITCH TUBE JUNCTION TEMPERATURE MEASUREMENT METHOD, ELECTRIC MOTOR...
- Publication number 20240361188
- Publication date Oct 31, 2024
- GUANGDONG WELLING MOTOR MANUFACTURING CO., LTD.
- Hong BIN
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONALLY STACKED MULTI-MODAL SENSOR FOR SIMULTANEOUSLY D...
- Publication number 20240337544
- Publication date Oct 10, 2024
- POSTECH Research and Business Development Foundation
- Sungjune JUNG
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Range-Aware Conversion of Sensor Readings
- Publication number 20240319712
- Publication date Sep 26, 2024
- ADVANCED MICRO DEVICES, INC.
- Jerry Anton Ahrens
- G01 - MEASURING TESTING
Information Patent Application
LOW-POWER-CONSUMPTION LOW-VOLTAGE DIGITAL TEMPERATURE SENSOR
- Publication number 20240310220
- Publication date Sep 19, 2024
- Nanjing University Of Post And Telecommunications
- Zhikuang CAI
- G01 - MEASURING TESTING
Information Patent Application
EMBEDDED MECHANICAL STOPPER FOR THERMAL SENSOR DEVICE
- Publication number 20240302219
- Publication date Sep 12, 2024
- STMicroelectronics International N.V.
- Federico VERCESI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240302218
- Publication date Sep 12, 2024
- Fuji Electric Co., Ltd.
- Daisuke ISOBE
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING A TEMPERATURE OF A DEPLETION LAYER OF A SEMI...
- Publication number 20240288318
- Publication date Aug 29, 2024
- ROBERT BOSCH GmbH
- Kanuj Sharma
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING THE JUNCTION TEMPERATURE OF A SEMICONDUCTOR DEVICE
- Publication number 20240288319
- Publication date Aug 29, 2024
- Siemens Industry Software Inc.
- Gabor Farkas
- G01 - MEASURING TESTING
Information Patent Application
JUNCTION TEMPERATURE ESTIMATION
- Publication number 20240280414
- Publication date Aug 22, 2024
- Rolls-Royce plc
- David R TRAINER
- F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information Patent Application
TEMPERATURE SENSOR
- Publication number 20240272010
- Publication date Aug 15, 2024
- Rohm Co., Ltd.
- Yoshito OTAGURO
- G01 - MEASURING TESTING
Information Patent Application
Temperature Sensor
- Publication number 20240272011
- Publication date Aug 15, 2024
- Rohm Co., Ltd.
- Yoshito OTAGURO
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT ARRANGEMENT, ELECTRICAL SYSTEM, AND METHOD FOR ASCERTAINING...
- Publication number 20240272012
- Publication date Aug 15, 2024
- ROBERT BOSCH GMBH
- Jonathan WINKLER
- G01 - MEASURING TESTING

using semiconducting elements having PN junctions

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Variable attenuation circuit utilizing varactor diodes

Switch device

Temperature detection device and method using sets of DC voltages

Ultra-fast coulomb blockade thermometer

Method for implementing Vptat multiplier in high accuracy thermal s...

Image controller and semiconductor package

Temperature calibration methods for semiconductor machine

Electronic circuit arrangement for monitoring temperatures

Temperature sensor circuits for integrated circuit devices

Temperature sensor with delta base-emitter voltage amplification an...

Semiconductor devices, semiconductor structures and methods for fab...

MEMS sensor as well as method for operating a mems sensor

Enhanced temperature sensor

Sensor and method for performing a reference measurement with guide...

Apparatus for producing an electrical signal that is indicative of...

Temperature detection

Semiconductor based temperature sensor

Bipolar junction transistor heater circuit

Method, device and system for monitoring IGBT junction temperature

Electronic device and temperature detection device thereof

IC thermal protection

Semiconductor devices and methods of manufacturing thereof

Measurement device and measurement system

Temperature sensors

Complementary bipolar junction transistor

Temperature protection circuit

Single calibration temperature based temperature sensing with diffe...

Semiconductor device and trimming method of the same

Analog system and associated methods thereof

Sensor elements and assemblies, cutting tools comprising same and m...

Patents Applicationslast 30 patents

SENSOR DEVICE AND COOKING APPLIANCE INCLUDING THE SAME

PROPORTIONAL TO ABSOLUTE TEMPERATURE VOLTAGE DETERMINATION WITHOUT...

CMOS-BASED TEMPERATURE SENSOR WITH FULL BAND POWER SUPPLY REJECTION

METHOD AND CIRCUIT ARRANGEMENTS FOR DETERMINING A BARRIER-LAYER TEM...

TEMPERATURE CONTROL METHOD FOR POWER SUPPLY CONVERSION CHIP, RELATE...

SEMICONDUCTOR DEVICE WITH AN ACTIVE DEVICE REGION AND A CURRENT SEN...

TEMPERATURE SENSOR CIRCUITS

SENSOR DEVICE AND NON-TRANSITORY COMPUTER READABLE MEDIUM

POWER DEVICE TEMPERATURE ESTIMATION DEVICE FOR INVERTER

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

TEMPERATURE SENSORS

ANALOG SYSTEM AND ASSOCIATED METHODS THEREOF

TEMPERATURE INPUT/OUTPUT (I/O) MODULE WITH INTEGRATED THERMISTOR FO...

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICES, SEMICONDUCTOR STRUCTURES AND METHODS FOR FAB...

COMPLEMENTARY BIPOLAR JUNCTION TRANSISTOR

SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THEREOF

TEMPERATURE PROTECTION CIRCUIT

SWITCH TUBE JUNCTION TEMPERATURE MEASUREMENT METHOD, ELECTRIC MOTOR...

THREE-DIMENSIONALLY STACKED MULTI-MODAL SENSOR FOR SIMULTANEOUSLY D...

Dynamic Range-Aware Conversion of Sensor Readings

LOW-POWER-CONSUMPTION LOW-VOLTAGE DIGITAL TEMPERATURE SENSOR

EMBEDDED MECHANICAL STOPPER FOR THERMAL SENSOR DEVICE

SEMICONDUCTOR DEVICE

METHOD FOR DETERMINING A TEMPERATURE OF A DEPLETION LAYER OF A SEMI...

METHOD OF MEASURING THE JUNCTION TEMPERATURE OF A SEMICONDUCTOR DEVICE

JUNCTION TEMPERATURE ESTIMATION

TEMPERATURE SENSOR

Temperature Sensor

CIRCUIT ARRANGEMENT, ELECTRICAL SYSTEM, AND METHOD FOR ASCERTAINING...