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using semiconducting elements having PN junctions
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G01K7/01
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PHYSICS
G01
Measuring instruments
G01K
MEASURING TEMPERATURE MEASURING QUANTITY OF HEAT THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
G01K7/00
Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat; Power supply
Current Industry
G01K7/01
using semiconducting elements having PN junctions
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Patents Grants
last 30 patents
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Patent Grant
Method and system for estimating junction temperature of power semi...
Patent number
11,953,386
Issue date
Apr 9, 2024
Hyundai Motor Company
Je Hwan Lee
G01 - MEASURING TESTING
Information
Patent Grant
Temperature sensor circuits for integrated circuit devices
Patent number
11,949,408
Issue date
Apr 2, 2024
Mavagail Technology, LLC
Darryl G. Walker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Temperature sensor
Patent number
11,927,493
Issue date
Mar 12, 2024
NXP B.V.
Saurabh Goyal
G01 - MEASURING TESTING
Information
Patent Grant
Technologies for tuning superconducting Josephson junctions
Patent number
11,925,126
Issue date
Mar 5, 2024
The University of Chicago
David Schuster
G01 - MEASURING TESTING
Information
Patent Grant
Thermal sensor circuit
Patent number
11,920,989
Issue date
Mar 5, 2024
STMicroelectronics S.A.
Philippe Galy
G05 - CONTROLLING REGULATING
Information
Patent Grant
Circuit assembly
Patent number
11,898,915
Issue date
Feb 13, 2024
Autonetworks Technologies, Ltd.
Akira Haraguchi
G01 - MEASURING TESTING
Information
Patent Grant
Infrared imaging device including drive and signal lines configured...
Patent number
11,902,696
Issue date
Feb 13, 2024
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Hajime Hosaka
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Device for temperature monitoring of a semiconductor device
Patent number
11,898,916
Issue date
Feb 13, 2024
Taiwan Semiconductor Manufacturing Company, Ltd
Po-Zeng Kang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Isolated temperature sensor package with embedded spacer in dielect...
Patent number
11,879,790
Issue date
Jan 23, 2024
Texas Instruments Incorporated
Enis Tuncer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Switch device
Patent number
11,876,508
Issue date
Jan 16, 2024
Rohm Co., Ltd.
Toru Takuma
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Self-turn-on temperature detector circuit
Patent number
11,867,571
Issue date
Jan 9, 2024
NXP B.V.
Ricardo Pureza Coimbra
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method for implementing Vptat multiplier in high accuracy thermal s...
Patent number
11,867,572
Issue date
Jan 9, 2024
STMicroelectron nternational N.V.
Pijush Kanti Panja
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Thermal sensor circuit
Patent number
11,867,570
Issue date
Jan 9, 2024
STMicroelectronics S.A.
Philippe Galy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device with temperature sensing component
Patent number
11,869,762
Issue date
Jan 9, 2024
Alpha Power Solutions Limited
Wai Tien Chan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Enhanced ambient temperature detection
Patent number
11,852,540
Issue date
Dec 26, 2023
X Development LLC
Phillip Yee
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Temperature sensor for non-volatile memory
Patent number
11,852,544
Issue date
Dec 26, 2023
Infineon Technologies LLC
Srikanth Machavolu
G01 - MEASURING TESTING
Information
Patent Grant
Method and electronic assembly for determining a temperature of at...
Patent number
11,852,543
Issue date
Dec 26, 2023
Bayerische Motoren Werke Aktiengesellschaft
Gerhard Woelfl
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and circuit for temperature sensing, temperature sensor and...
Patent number
11,835,398
Issue date
Dec 5, 2023
Sciosense B.V.
Sébastien Poirier
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Temperature-sensitive transistor gate driver
Patent number
11,838,011
Issue date
Dec 5, 2023
Texas Instruments Incorporated
Xiong Li
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Semiconductor integrated circuit with configurable setting based on...
Patent number
11,835,399
Issue date
Dec 5, 2023
Kioxia Corporation
Takayuki Tsukamoto
G11 - INFORMATION STORAGE
Information
Patent Grant
Placement table, testing device, and testing method
Patent number
11,828,794
Issue date
Nov 28, 2023
Tokyo Electron Limited
Shigeru Kasai
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device
Patent number
11,824,524
Issue date
Nov 21, 2023
Renesas Electronics Corporation
Hiroki Nagatomi
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Semiconductor device, electronic device and electronic system
Patent number
11,821,795
Issue date
Nov 21, 2023
Renesas Electronics Corporation
Kan Takeuchi
G08 - SIGNALLING
Information
Patent Grant
Temperature sensing of an array from temperature dependent properti...
Patent number
11,815,406
Issue date
Nov 14, 2023
ALLEGRO MICROSYSTEMS, LLC
Joseph James Judkins
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fractional mirror ratio technique for digital remote temperature se...
Patent number
11,808,641
Issue date
Nov 7, 2023
Microchip Technology Incorporated
Ajay Kumar
G01 - MEASURING TESTING
Information
Patent Grant
System for designing thermal sensor arrangement
Patent number
11,810,813
Issue date
Nov 7, 2023
Taiwan Semiconductor Manufacturing Company, Ltd
Jaw-Juinn Horng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for determining the temperature of a power electronics unit,...
Patent number
11,788,900
Issue date
Oct 17, 2023
Robert Bosch GmbH
Michael Heeb
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for reducing temperature sensor reading variati...
Patent number
11,781,918
Issue date
Oct 10, 2023
Micron Technology, Inc.
Dong Pan
G01 - MEASURING TESTING
Information
Patent Grant
Temperature sensor circuits for integrated circuit devices
Patent number
11,777,486
Issue date
Oct 3, 2023
Mavagail Technology, LLC
Darryl G. Walker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and circuit for sensing MOSFET temperature for load switch a...
Patent number
11,774,296
Issue date
Oct 3, 2023
ALPHA AND OMEGA SEMICONDUCTOR INTERNATIONAL LP
Zhenyu Wang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TEMPERATURE-SENSING DATA PROCESSING MODULE AND TEMPERATURE SENSOR
Publication number
20240133751
Publication date
Apr 25, 2024
GigaDevice Semiconductor Inc.
Yang Fan
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR DETERMINING JUNCTION TEMPERATURE OF POWER SEM...
Publication number
20240125655
Publication date
Apr 18, 2024
Mitsubishi Electric Corporation
Julio BRANDELERO
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE AND TEMPERATURE DETECTION DEVICE THEREOF
Publication number
20240113512
Publication date
Apr 4, 2024
LEAP Semiconductor Corp.
Wei-Fan Chen
G01 - MEASURING TESTING
Information
Patent Application
SWITCH DEVICE
Publication number
20240113707
Publication date
Apr 4, 2024
Rohm Co., Ltd.
Toru TAKUMA
B60 - VEHICLES IN GENERAL
Information
Patent Application
DRIVING VOLTAGE GENERATING DEVICE
Publication number
20240102868
Publication date
Mar 28, 2024
LEAP Semiconductor Corp.
Wei-Fan Chen
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
BUILT-IN TEMPERATURE SENSORS
Publication number
20240068879
Publication date
Feb 29, 2024
GLOBALFOUNDRIES U.S. Inc.
Zhixing ZHAO
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE SENSOR USING EXTERNAL DIODE
Publication number
20240068880
Publication date
Feb 29, 2024
TEXAS INSTRUMENTS INCORPORATED
Santhosh Kumar Srinivasan
G01 - MEASURING TESTING
Information
Patent Application
OVERHEAD PROTECTION CIRCUIT
Publication number
20240044718
Publication date
Feb 8, 2024
Kabushiki Kaisha Toshiba
Shiho FUNABE
G01 - MEASURING TESTING
Information
Patent Application
CMOS-BASED TEMPERATURE SENSOR
Publication number
20240044717
Publication date
Feb 8, 2024
Apple Inc.
Soheil GOLARA
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE, TEMPERATURE DETECTION SYSTEM, AND VEHICLE
Publication number
20240027282
Publication date
Jan 25, 2024
Rohm Co., Ltd.
Takahiro KOTANI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEMPERATURE SENSOR ARRAY AND MICRO-HEATER THERMAL CALIBRATION
Publication number
20230417607
Publication date
Dec 28, 2023
Iowa State University Research Foundation, Inc.
Randall Geiger
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE SENSOR CIRCUITS FOR INTEGRATED CIRCUIT DEVICES
Publication number
20230412165
Publication date
Dec 21, 2023
Mavagail Technology, LLC
Darryl G. Walker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INVERTER AND METHOD TO MEASURE JUNCTION TEMPERATURE FOR THERMAL PRO...
Publication number
20230400359
Publication date
Dec 14, 2023
STMicroelectronics (Shenzhen) R&D Co., Ltd.
Dino COSTANZO
G01 - MEASURING TESTING
Information
Patent Application
COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR TEMPERATURE SENSOR WITH WID...
Publication number
20230392991
Publication date
Dec 7, 2023
QATAR FOUNDATION FOR EDUCATION, SCIENCE AND COMMUNITY DEVELOPMENT
Bo Wang
G01 - MEASURING TESTING
Information
Patent Application
Multi-Sensing PTAT for Multiple-Location Temperature Sensing
Publication number
20230366746
Publication date
Nov 16, 2023
AyDeeKay LLC dba Indie Semiconductor
Scott David Kee
G05 - CONTROLLING REGULATING
Information
Patent Application
BIPOLAR JUNCTION TRANSISTOR HEATER CIRCUIT
Publication number
20230352928
Publication date
Nov 2, 2023
Analog Devices International Unlimited Company
Aref Kahaei
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20230318595
Publication date
Oct 5, 2023
RENESAS ELECTRONICS CORPORATION
Hiroki NAGATOMI
B60 - VEHICLES IN GENERAL
Information
Patent Application
APPARATUS FOR DETERMINING TEMPERATURE
Publication number
20230304872
Publication date
Sep 28, 2023
NXP USA, Inc.
Thierry Michel Alain Sicard
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE SENSING CIRCUIT WITH SHUT OFF
Publication number
20230296446
Publication date
Sep 21, 2023
Skyworks Solutions, Inc.
Gordon Glen Rabjohn
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
TEMPERATURE MEASUREMENT AND INFORMATION SYSTEM
Publication number
20230288267
Publication date
Sep 14, 2023
KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS
Munir A. AL-ABSI
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE SENSOR CAPABLE OF DETERMINING WHETHER TO CONVERT REFERE...
Publication number
20230273073
Publication date
Aug 31, 2023
Samsung Electronics Co., Ltd.
HAEJUNG CHOI
G01 - MEASURING TESTING
Information
Patent Application
ANALOG SYSTEM AND ASSOCIATED METHODS THEREOF
Publication number
20230275591
Publication date
Aug 31, 2023
Frank R. Dropps
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE SENSOR CIRCUITS FOR INTEGRATED CIRCUIT DEVICES
Publication number
20230246641
Publication date
Aug 3, 2023
Mavagail Technology, LLC
Darryl G. Walker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CONTROLLER AND A METHOD TO OPERATE A TEMPERATURE SENSOR
Publication number
20230228796
Publication date
Jul 20, 2023
INFINEON TECHNOLOGIES AG
Chern Sia Phillip Lim
G01 - MEASURING TESTING
Information
Patent Application
ADAPTIVE TEMPERATURE SLOPE CALIBRATION METHOD OF A THERMAL SENSOR A...
Publication number
20230228629
Publication date
Jul 20, 2023
MEDIATEK INC.
Min-Hang Hsieh
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE FOR GENERATING A REFERENCE CURRENT OR VOLTAGE...
Publication number
20230229185
Publication date
Jul 20, 2023
SK HYNIX INC.
Jong Seok JUNG
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
METHOD AND SYSTEM FOR DETERMINING THE STATE OF A SENSOR THROUGH A S...
Publication number
20230194354
Publication date
Jun 22, 2023
COMMISSARIA À L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
Ghislain DESPESSE
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE SENSOR
Publication number
20230184594
Publication date
Jun 15, 2023
NXP B.V.
Saurabh Goyal
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR APPARATUS, TEMPERATURE COMPENSATION SYSTEM, AND ALARM...
Publication number
20230163000
Publication date
May 25, 2023
Sony Semiconductor Solutions Corporation
Kaihei Hotta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ON CHIP PROGRAMMABLE TEMPERATURE REGULATION CIRCUIT
Publication number
20230152826
Publication date
May 18, 2023
NXP USA, Inc.
Yuan Gao
G01 - MEASURING TESTING