using several gratings, projected with variable angle of incidence on the object, and one detection device

Industry

CPC
G01B11/2531

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/2531using several gratings, projected with variable angle of incidence on the object, and one detection device

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Collimating array for an optical sensing device
- Patent number 12,140,416
- Issue date Nov 12, 2024
- Spectricity
- Jonathan Borremans
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Dual-pattern optical 3D dimensioning
- Patent number 12,135,203
- Issue date Nov 5, 2024
- Honeywell International Inc.
- Tao Xian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for suppressing reflection of binary grating image projectio...
- Patent number 12,044,521
- Issue date Jul 23, 2024
- Zhejiang University
- Zaixing He
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional measurement device
- Patent number 11,953,313
- Issue date Apr 9, 2024
- CHENGDU PIN TAI DING FENG BUSINESS ADMINISTRATION
- Qianwen Xiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lighting system with pattern element
- Patent number 11,573,079
- Issue date Feb 7, 2023
- Lumileds LLC
- Varun Dev Kakkar
- G02 - OPTICS
Information Patent Grant
Three-dimensional shape measuring apparatus and method thereof util...
- Patent number 11,448,500
- Issue date Sep 20, 2022
- Keyence Corporation
- Kazuki Natori
- G02 - OPTICS
Information Patent Grant
Lighting system with pattern element
- Patent number 11,359,914
- Issue date Jun 14, 2022
- Lumileds LLC
- Varun Dev Kakkar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spatially self-similar patterned illumination for depth imaging
- Patent number 11,054,506
- Issue date Jul 6, 2021
- Cognex Corporation
- Benjamin Braker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for determining the 3D coordinates of an object
- Patent number 10,704,891
- Issue date Jul 7, 2020
- Carl Zeiss Industrielle Messtechnik GmbH
- Béla Pontai
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional (3D) image system and electronic device
- Patent number 10,659,765
- Issue date May 19, 2020
- SHENZHEN GOODIX TECHNOLOGY CO., LTD.
- Meng-Ta Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substrate inspection apparatus and method
- Patent number 10,650,510
- Issue date May 12, 2020
- Koh Young Technology Inc.
- Seung Ae Seo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spatially self-similar patterned illumination for depth imaging
- Patent number 10,627,489
- Issue date Apr 21, 2020
- Cognex Corporation
- Benjamin Braker
- G01 - MEASURING TESTING
Information Patent Grant
Diagnosing multipath interference and eliminating multipath interfe...
- Patent number 10,578,423
- Issue date Mar 3, 2020
- Faro Technologies, Inc.
- Robert E. Bridges
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for measuring three-dimensional shape
- Patent number 10,417,472
- Issue date Sep 17, 2019
- Koh Young Technology Inc.
- Hyunki Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Meta projectors emitting structured light or uniform light based on...
- Patent number 10,378,887
- Issue date Aug 13, 2019
- Samsung Electronics Co., Ltd.
- Byunghoon Na
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spatially self-similar patterned illumination for depth imaging
- Patent number 10,295,655
- Issue date May 21, 2019
- Cognex Corporation
- Benjamin Braker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional coordinate scanner and method of operation
- Patent number 10,267,619
- Issue date Apr 23, 2019
- Faro Technologies, Inc.
- Yazid Tohme
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for three-dimensional reconstruction of a scene b...
- Patent number 10,113,867
- Issue date Oct 30, 2018
- AREVA NP
- Yannick Caulier
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spatially self-similar patterned illumination for depth imaging
- Patent number 10,088,556
- Issue date Oct 2, 2018
- Cognex Corporation
- Benjamin Braker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional shape measuring apparatus and control method thereof
- Patent number 10,066,934
- Issue date Sep 4, 2018
- Canon Kabushiki Kaisha
- Motomi Tsuyuki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Three-dimensional imaging using a multi-phase projector
- Patent number 10,036,630
- Issue date Jul 31, 2018
- ASM Technology Singapore Pte. Ltd.
- Wui Fung Sze
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for measuring three-dimensional profile of transparent objec...
- Patent number 9,958,262
- Issue date May 1, 2018
- National Sun Yat-sen University
- Wei-Hung Su
- G01 - MEASURING TESTING
Information Patent Grant
Visual inspection apparatus and visual inspection method
- Patent number 9,933,371
- Issue date Apr 3, 2018
- Yamaha Hatsudoki Kabushiki Kaisha
- Yoshikuni Suzuki
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Measuring apparatus for three-dimensional profilometry and method t...
- Patent number 9,858,671
- Issue date Jan 2, 2018
- NATIONAL TAIWAN UNIVERSITY
- Liang-Chia Chen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Shape measurement apparatus and method
- Patent number 9,791,266
- Issue date Oct 17, 2017
- Koh Young Technology Inc.
- Joong-Ki Jeong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Shape measurement apparatus and method
- Patent number 9,739,605
- Issue date Aug 22, 2017
- Koh Young Technology Inc.
- Joong-Ki Jeong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dental measuring device for three dimensional measurement of teeth
- Patent number 9,687,330
- Issue date Jun 27, 2017
- Qioptiq Photonics GmbH & Co. KG
- Helmut Rauscher
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Device for optically scanning and measuring an environment
- Patent number 9,599,455
- Issue date Mar 21, 2017
- Faro Technologies, Inc.
- Rolf Heidemann
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for optical image correction in metrology systems
- Patent number 9,561,022
- Issue date Feb 7, 2017
- Covidien LP
- Alexey Sharonov
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Spatially self-similar patterned illumination for depth imaging
- Patent number 9,562,760
- Issue date Feb 7, 2017
- Cognex Corporation
- Benjamin Braker
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT DEVICE AND BOARD INSPECTION DEVICE
- Publication number 20240200934
- Publication date Jun 20, 2024
- YAMAHA HATSUDOKI KABUSHIKI KAISHA
- Takahiro MATSUKUBO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SUPPRESSING REFLECTION OF BINARY GRATING IMAGE PROJECTIO...
- Publication number 20240053142
- Publication date Feb 15, 2024
- ZHEJIANG UNIVERSITY
- ZAIXING HE
- G01 - MEASURING TESTING
Information Patent Application
OBJECT DETECTION
- Publication number 20230230267
- Publication date Jul 20, 2023
- FORD GLOBAL TECHNOLOGIES, L.L.C.
- David Michael Herman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DUAL-PATTERN OPTICAL 3D DIMENSIONING
- Publication number 20230184543
- Publication date Jun 15, 2023
- Honeywell International Inc.
- Tao XIAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LIGHTING SYSTEM WITH PATTERN ELEMENT
- Publication number 20220290980
- Publication date Sep 15, 2022
- Lumileds LLC
- Varun Dev Kakkar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT DEVICE
- Publication number 20210254969
- Publication date Aug 19, 2021
- CHENGDU PIN TAI DING FENG BUSINESS ADMINISTRATION
- Qianwen XIANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COLLIMATING ARRAY FOR AN OPTICAL SENSING DEVICE
- Publication number 20210140764
- Publication date May 13, 2021
- SPECTRICITY
- Jonathan Borremans
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL SHAPE MEASURING APPARATUS AND THREE-DIMENSIONAL S...
- Publication number 20210041230
- Publication date Feb 11, 2021
- KEYENCE CORPORATION
- Kazuki NATORI
- G01 - MEASURING TESTING
Information Patent Application
SPATIALLY SELF-SIMILAR PATTERNED ILLUMINATION FOR DEPTH IMAGING
- Publication number 20200309914
- Publication date Oct 1, 2020
- COGNEX CORPORATION
- Benjamin Braker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Devices and Methods for Calibrating a Measuring Apparatus Using Pro...
- Publication number 20200232789
- Publication date Jul 23, 2020
- SIEMENS AKTIENGESELLSCHAFT
- Thomas Engel
- G01 - MEASURING TESTING
Information Patent Application
LIGHTING SYSTEM WITH PATTERN ELEMENT
- Publication number 20200232790
- Publication date Jul 23, 2020
- Lumileds Holding B.V.
- Varun Dev KAKKAR
- G02 - OPTICS
Information Patent Application
Three-Dimensional (3D) Image System and Electronic Device
- Publication number 20200213577
- Publication date Jul 2, 2020
- Shenzhen Goodix Technology Co., Ltd.
- Meng-Ta Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPATIALLY SELF-SIMILAR PATTERNED ILLUMINATION FOR DEPTH IMAGING
- Publication number 20190302234
- Publication date Oct 3, 2019
- COGNEX CORPORATION
- Benjamin Braker
- G01 - MEASURING TESTING
Information Patent Application
Three-Dimensional (3D) Image System and Electronic Device
- Publication number 20190052863
- Publication date Feb 14, 2019
- Shenzhen Goodix Technology Co., Ltd.
- Meng-Ta Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPATIALLY SELF-SIMILAR PATTERNED ILLUMINATION FOR DEPTH IMAGING
- Publication number 20180335506
- Publication date Nov 22, 2018
- COGNEX CORPORATION
- Benjamin Braker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL SHAPE MEASURING APPARATUS AND CONTROL METHOD THEREOF
- Publication number 20180335298
- Publication date Nov 22, 2018
- Canon Kabushiki Kaisha
- Motomi Tsuyuki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Dynamic Digital Fringe Projection Techniques For Measuring Warpage
- Publication number 20170254642
- Publication date Sep 7, 2017
- Georgia Tech Research Corporation
- Ifeanyi Charles Ume
- G01 - MEASURING TESTING
Information Patent Application
SPATIALLY SELF-SIMILAR PATTERNED ILLUMINATION FOR DEPTH IMAGING
- Publication number 20170205495
- Publication date Jul 20, 2017
- COGNEX CORPORATION
- Benjamin Braker
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL COORDINATE SCANNER AND METHOD OF OPERATION
- Publication number 20160364874
- Publication date Dec 15, 2016
- FARO TECHNOLOGIES, INC.
- Yazid Tohme
- G01 - MEASURING TESTING
Information Patent Application
VISUAL INSPECTION APPARATUS AND VISUAL INSPECTION METHOD
- Publication number 20160320314
- Publication date Nov 3, 2016
- YAMAHA HATSUDOKI KABUSHIKI KAISHA
- Yoshikuni SUZUKI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
INSPECTION APPARATUS
- Publication number 20150253129
- Publication date Sep 10, 2015
- Omron Corporation
- Yasuhiro OHNISHI
- G01 - MEASURING TESTING
Information Patent Application
Dental Measuring Device for three dimensional measurement of teeth
- Publication number 20140377716
- Publication date Dec 25, 2014
- Helmut Rauscher
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL MEASURING DEVICE
- Publication number 20140333727
- Publication date Nov 13, 2014
- Takahiro Mamiya
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSING MULTIPATH INTERFERENCE AND ELIMINATING MULTIPATH INTERFE...
- Publication number 20140267620
- Publication date Sep 18, 2014
- FARO TECHNOLOGIES, INC.
- Robert E. Bridges
- G01 - MEASURING TESTING
Information Patent Application
Three-Dimensional Scanner With External Tactical Probe and Illumina...
- Publication number 20140267623
- Publication date Sep 18, 2014
- FARO TECHNOLOGIES, INC.
- Robert E. Bridges
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL COORDINATE SCANNER AND METHOD OF OPERATION
- Publication number 20140268093
- Publication date Sep 18, 2014
- Yazid Tohme
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSING MULTIPATH INTERFERENCE AND ELIMINATING MULTIPATH INTERFE...
- Publication number 20140267619
- Publication date Sep 18, 2014
- FARO TECHNOLOGIES, INC.
- Robert E. Bridges
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND TECHNIQUES FOR DETERMINING OBJECT DEPTH IN IMAGES
- Publication number 20140267701
- Publication date Sep 18, 2014
- ZIV AVIV
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSING MULTIPATH INTERFERENCE AND ELIMINATING MULTIPATH INTERFE...
- Publication number 20140267629
- Publication date Sep 18, 2014
- FARO TECHNOLOGIES, INC.
- Yazid Tohme
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR OPTICALLY SCANNING AND MEASURING AN ENVIRONMENT
- Publication number 20140168379
- Publication date Jun 19, 2014
- FARO TECHNOLOGIES, INC.
- Rolf Heidemann
- G01 - MEASURING TESTING

using several gratings, projected with variable angle of incidence on the object, and one detection device

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Collimating array for an optical sensing device

Dual-pattern optical 3D dimensioning

Method for suppressing reflection of binary grating image projectio...

Three-dimensional measurement device

Lighting system with pattern element

Three-dimensional shape measuring apparatus and method thereof util...

Lighting system with pattern element

Spatially self-similar patterned illumination for depth imaging

Method and apparatus for determining the 3D coordinates of an object

Three-dimensional (3D) image system and electronic device

Substrate inspection apparatus and method

Spatially self-similar patterned illumination for depth imaging

Diagnosing multipath interference and eliminating multipath interfe...

Device and method for measuring three-dimensional shape

Meta projectors emitting structured light or uniform light based on...

Spatially self-similar patterned illumination for depth imaging

Three-dimensional coordinate scanner and method of operation

Device and method for three-dimensional reconstruction of a scene b...

Spatially self-similar patterned illumination for depth imaging

Three-dimensional shape measuring apparatus and control method thereof

Three-dimensional imaging using a multi-phase projector

System for measuring three-dimensional profile of transparent objec...

Visual inspection apparatus and visual inspection method

Measuring apparatus for three-dimensional profilometry and method t...

Shape measurement apparatus and method

Shape measurement apparatus and method

Dental measuring device for three dimensional measurement of teeth

Device for optically scanning and measuring an environment

Device and method for optical image correction in metrology systems

Spatially self-similar patterned illumination for depth imaging

Patents Applicationslast 30 patents

MEASUREMENT DEVICE AND BOARD INSPECTION DEVICE

METHOD FOR SUPPRESSING REFLECTION OF BINARY GRATING IMAGE PROJECTIO...

OBJECT DETECTION

DUAL-PATTERN OPTICAL 3D DIMENSIONING

LIGHTING SYSTEM WITH PATTERN ELEMENT

THREE-DIMENSIONAL MEASUREMENT DEVICE

COLLIMATING ARRAY FOR AN OPTICAL SENSING DEVICE

THREE-DIMENSIONAL SHAPE MEASURING APPARATUS AND THREE-DIMENSIONAL S...

SPATIALLY SELF-SIMILAR PATTERNED ILLUMINATION FOR DEPTH IMAGING

Devices and Methods for Calibrating a Measuring Apparatus Using Pro...

LIGHTING SYSTEM WITH PATTERN ELEMENT

Three-Dimensional (3D) Image System and Electronic Device

SPATIALLY SELF-SIMILAR PATTERNED ILLUMINATION FOR DEPTH IMAGING

Three-Dimensional (3D) Image System and Electronic Device

SPATIALLY SELF-SIMILAR PATTERNED ILLUMINATION FOR DEPTH IMAGING

THREE-DIMENSIONAL SHAPE MEASURING APPARATUS AND CONTROL METHOD THEREOF

Dynamic Digital Fringe Projection Techniques For Measuring Warpage

SPATIALLY SELF-SIMILAR PATTERNED ILLUMINATION FOR DEPTH IMAGING

THREE-DIMENSIONAL COORDINATE SCANNER AND METHOD OF OPERATION

VISUAL INSPECTION APPARATUS AND VISUAL INSPECTION METHOD

INSPECTION APPARATUS

Dental Measuring Device for three dimensional measurement of teeth

THREE-DIMENSIONAL MEASURING DEVICE

DIAGNOSING MULTIPATH INTERFERENCE AND ELIMINATING MULTIPATH INTERFE...

Three-Dimensional Scanner With External Tactical Probe and Illumina...

THREE-DIMENSIONAL COORDINATE SCANNER AND METHOD OF OPERATION

DIAGNOSING MULTIPATH INTERFERENCE AND ELIMINATING MULTIPATH INTERFE...

APPARATUS AND TECHNIQUES FOR DETERMINING OBJECT DEPTH IN IMAGES

DIAGNOSING MULTIPATH INTERFERENCE AND ELIMINATING MULTIPATH INTERFE...

DEVICE FOR OPTICALLY SCANNING AND MEASURING AN ENVIRONMENT