using several gratings with variable grating pitch, projected on the object with the same angle of incidence

Industry

CPC
G01B11/2536

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/2536using several gratings with variable grating pitch, projected on the object with the same angle of incidence

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Estimation method, measurement method, and estimation apparatus
- Patent number 11,754,389
- Issue date Sep 12, 2023
- Seiko Epson Corporation
- Taisuke Yamauchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multiple channel locating
- Patent number 11,680,790
- Issue date Jun 20, 2023
- Cognex Corporation
- Benjamin Braker
- G01 - MEASURING TESTING
Information Patent Grant
Metrology apparatus and method for determining a characteristic of...
- Patent number 11,650,047
- Issue date May 16, 2023
- ASML Netherlands B.V.
- Patricius Aloysius Jacobus Tinnemans
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Camera assembly with programmable diffractive optical element for d...
- Patent number 11,586,036
- Issue date Feb 21, 2023
- Meta Platforms Technologies, LLC
- Andrew Matthew Bardagjy
- G01 - MEASURING TESTING
Information Patent Grant
Position detection system and position detection method for detecti...
- Patent number 11,519,722
- Issue date Dec 6, 2022
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Kunihiro Mima
- G01 - MEASURING TESTING
Information Patent Grant
Switchable fringe pattern illuminator
- Patent number 11,516,457
- Issue date Nov 29, 2022
- Meta Platforms Technologies, LLC
- Zihe Gao
- G01 - MEASURING TESTING
Information Patent Grant
Method for augmenting a scene in real space with projected visual c...
- Patent number 11,455,739
- Issue date Sep 27, 2022
- Lightform, Inc.
- Kevin Karsch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for three-dimensional shape measurement
- Patent number 11,199,394
- Issue date Dec 14, 2021
- BENANO INC.
- Liang-Pin Yu
- G01 - MEASURING TESTING
Information Patent Grant
Eye surface topographer
- Patent number 11,154,190
- Issue date Oct 26, 2021
- Eaglet Eye B.V.
- Henricus M. M. Kessels
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Hybrid light measurement method for measuring three-dimensional pro...
- Patent number 11,105,617
- Issue date Aug 31, 2021
- XI 'AN CHISHINE OPTOELECTRONICS TECHNOLOGY CO., LTD
- Xiang Zhou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology apparatus and method for determining a characteristic of...
- Patent number 11,009,343
- Issue date May 18, 2021
- ASML Netherlands B.V.
- Patricius Aloysius Jacobus Tinnemans
- G01 - MEASURING TESTING
Information Patent Grant
Shape reconstruction of specular and/or diffuse objects using multi...
- Patent number 10,692,232
- Issue date Jun 23, 2020
- Canon Kabushiki Kaisha
- Francisco Imai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems, methods, and media for performing shape measurement
- Patent number 10,690,489
- Issue date Jun 23, 2020
- The Trustees of Columbia University In the City of New York
- Mohit Gupta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Projection system
- Patent number 10,674,124
- Issue date Jun 2, 2020
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Kazuhiro Minami
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional (3D) image system and electronic device
- Patent number 10,659,765
- Issue date May 19, 2020
- SHENZHEN GOODIX TECHNOLOGY CO., LTD.
- Meng-Ta Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for projecting a time-variable optical pattern onto an ob...
- Patent number 10,648,798
- Issue date May 12, 2020
- Cognex Corporation
- Jens Petersen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and methods for shape measurement using dual frequency fring...
- Patent number 10,584,963
- Issue date Mar 10, 2020
- Brown University
- Gabriel Taubin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for measuring 3D form or deformation of an obj...
- Patent number 10,551,177
- Issue date Feb 4, 2020
- 4D SENSOR INC.
- Yoshiharu Morimoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Meta projectors emitting structured light or uniform light based on...
- Patent number 10,378,887
- Issue date Aug 13, 2019
- Samsung Electronics Co., Ltd.
- Byunghoon Na
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Control of amplitude and phase of diffraction orders using polarizi...
- Patent number 10,337,991
- Issue date Jul 2, 2019
- KLA-Tencor Corporation
- Vladimir Levinski
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Multiple channel locating
- Patent number 10,317,193
- Issue date Jun 11, 2019
- Cognex Corporation
- Benjamin Braker
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system, measurement method, and vision chip
- Patent number 10,240,915
- Issue date Mar 26, 2019
- Panasonic Intellectual Property Corporation of America
- Ryuji Fuchikami
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for generating multispectral or hyperspectral lig...
- Patent number 10,066,997
- Issue date Sep 4, 2018
- Universitat Stuttgart
- Klaus Körner
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional imaging using a multi-phase projector
- Patent number 10,036,630
- Issue date Jul 31, 2018
- ASM Technology Singapore Pte. Ltd.
- Wui Fung Sze
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
3D scanner using structured lighting
- Patent number 9,982,995
- Issue date May 29, 2018
- Koninklijke Philips N.V.
- Dmitry Nikolayevich Znamenskiy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic digital fringe projection techniques for measuring warpage
- Patent number 9,885,563
- Issue date Feb 6, 2018
- Georgia Tech Research Corporation
- Ifeanyi Charles Ume
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and media for performing shape measurement
- Patent number 9,857,168
- Issue date Jan 2, 2018
- The Trustees of Columbia University In the City of New York
- Mohit Gupta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing apparatus, information processing method, an...
- Patent number 9,739,604
- Issue date Aug 22, 2017
- Canon Kabushiki Kaisha
- Hisayoshi Furihata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multiple channel locating
- Patent number 9,696,137
- Issue date Jul 4, 2017
- Cognex Corporation
- Benjamin Braker
- G01 - MEASURING TESTING
Information Patent Grant
Projection device, and projection method
- Patent number 9,654,748
- Issue date May 16, 2017
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Tomohisa Tagami
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
DETERMINING AND RECONSTRUCTING A SHAPE AND A MATERIAL PROPERTY OF A...
- Publication number 20240369352
- Publication date Nov 7, 2024
- Meta Platforms Technologies, LLC
- Salim BOUTAMI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MULTIPLE CHANNEL LOCATING
- Publication number 20230392920
- Publication date Dec 7, 2023
- COGNEX CORPORATION
- Eric Moore
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY FOR ADDITIVE MANUFACTURING
- Publication number 20220252392
- Publication date Aug 11, 2022
- Nikon Corporation
- Eric Peter Goodwin
- B22 - CASTING POWDER METALLURGY
Information Patent Application
THREE DIMENSIONAL IMAGING
- Publication number 20220074738
- Publication date Mar 10, 2022
- Hewlett-Packard Development Company, L.P.
- Stephen Bernard Pollard
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY APPARATUS AND METHOD FOR DETERMINING A CHARACTERISTIC OF...
- Publication number 20210325174
- Publication date Oct 21, 2021
- ASML NETHERLANDS B.V.
- Patricius Aloysius Jacobus TINNEMANS
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR AUGMENTING A SCENE IN REAL SPACE WITH PROJECTED VISUAL C...
- Publication number 20200402247
- Publication date Dec 24, 2020
- Lightform, Inc.
- Kevin Karsch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POSITION DETECTION SYSTEM AND POSITION DETECTION METHOD FOR DETECTI...
- Publication number 20200386542
- Publication date Dec 10, 2020
- Panasonic Intellectual Property Management Co., Ltd.
- Kunihiro MIMA
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURED LIGHT PROJECTION
- Publication number 20200355494
- Publication date Nov 12, 2020
- HEPTAGON MICRO OPTICS PTE. LTD.
- Markus Rossi
- G01 - MEASURING TESTING
Information Patent Application
PROJECTION SYSTEM
- Publication number 20200260058
- Publication date Aug 13, 2020
- Panasonic Intellectual Property Management Co., Ltd.
- Kazuhiro MINAMI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF MEASURING 3D PROFILE
- Publication number 20200240774
- Publication date Jul 30, 2020
- Industry-Academic Cooperation Foundation, Dankook University
- Daekeun KIM
- G01 - MEASURING TESTING
Information Patent Application
Three-Dimensional (3D) Image System and Electronic Device
- Publication number 20200213577
- Publication date Jul 2, 2020
- Shenzhen Goodix Technology Co., Ltd.
- Meng-Ta Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HYBRID LIGHT MEASUREMENT METHOD FOR MEASURING THREE-DIMENSIONAL PRO...
- Publication number 20200166333
- Publication date May 28, 2020
- Ki 'an Chishine Optoelectronics Technology Co., Ltd.
- Xiang ZHOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CAMERA ASSEMBLY WITH PROGRAMMABLE DIFFRACTIVE OPTICAL ELEMENT FOR D...
- Publication number 20200150419
- Publication date May 14, 2020
- Facebook Technologies, LLC
- Andrew Matthew Bardagjy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
IMPROVED EYE SURFACE TOPOGRAPHER
- Publication number 20200138286
- Publication date May 7, 2020
- Eaglet Eye B.V.
- Henricus M.M. Kessels
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
MULTIPLE CHANNEL LOCATING
- Publication number 20190353472
- Publication date Nov 21, 2019
- Benjamin Braker
- G01 - MEASURING TESTING
Information Patent Application
Metrology Apparatus and Method for Determining a Characteristic of...
- Publication number 20190265028
- Publication date Aug 29, 2019
- Stichting VU
- Patricius Aloysius Jacobus TINNEMANS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
APPARATUS FOR PROJECTING A TIME-VARIABLE OPTICAL PATTERN ONTO AN OB...
- Publication number 20190137267
- Publication date May 9, 2019
- Cognex Corporation, Inc.
- Jens Petersen
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, METHODS, AND MEDIA FOR PERFORMING SHAPE MEASUREMENT
- Publication number 20180347971
- Publication date Dec 6, 2018
- The Trustrees of Columbia University in the City of New York
- Mohit Gupta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Methods for Shape Measurement Using Dual Frequency Fring...
- Publication number 20180306577
- Publication date Oct 25, 2018
- Brown University
- Gabriel Taubin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIPLE CHANNEL LOCATING
- Publication number 20180045503
- Publication date Feb 15, 2018
- COGNEX CORPORATION
- Benjamin Braker
- G01 - MEASURING TESTING
Information Patent Application
Control of Amplitude and Phase of Diffraction Orders Using Polarizi...
- Publication number 20180031470
- Publication date Feb 1, 2018
- KLA-Tencor Corporation
- Vladimir Levinski
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Digital Fringe Projection Techniques For Measuring Warpage
- Publication number 20170254642
- Publication date Sep 7, 2017
- Georgia Tech Research Corporation
- Ifeanyi Charles Ume
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
- Publication number 20160069669
- Publication date Mar 10, 2016
- Canon Kabushiki Kaisha
- Hisayoshi Furihata
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, METHODS, AND MEDIA FOR PERFORMING SHAPE MEASUREMENT
- Publication number 20150292875
- Publication date Oct 15, 2015
- The Trustees of Columbia University in the Coty of New York
- Mohit Gupta
- G01 - MEASURING TESTING
Information Patent Application
Compound structured light projection system for 3-D surface profiling
- Publication number 20140320605
- Publication date Oct 30, 2014
- Philip Martin Johnson
- G01 - MEASURING TESTING
Information Patent Application
COMPUTING DEVICE AND METHOD OF IMAGE MATCHING
- Publication number 20140293081
- Publication date Oct 2, 2014
- HON HAI PRECISION INDUSTRY CO., LTD.
- XIN-YUAN WU
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND TECHNIQUES FOR DETERMINING OBJECT DEPTH IN IMAGES
- Publication number 20140267701
- Publication date Sep 18, 2014
- ZIV AVIV
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE CHANNEL LOCATING
- Publication number 20130321791
- Publication date Dec 5, 2013
- Chiaro Technologies LLC
- Daniel Feldkhun
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT APPARATUS, METHOD FOR THREE-DIMENSION...
- Publication number 20130155417
- Publication date Jun 20, 2013
- Canon Kabushiki Kaisha
- Hiroyuki Ohsawa
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT APPARATUS, THREE-DIMENSIONAL MEASUREM...
- Publication number 20130076896
- Publication date Mar 28, 2013
- Canon Kabushiki Kaisha
- Shiki Takabayashi
- G01 - MEASURING TESTING

using several gratings with variable grating pitch, projected on the object with the same angle of incidence

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Estimation method, measurement method, and estimation apparatus

Multiple channel locating

Metrology apparatus and method for determining a characteristic of...

Camera assembly with programmable diffractive optical element for d...

Position detection system and position detection method for detecti...

Switchable fringe pattern illuminator

Method for augmenting a scene in real space with projected visual c...

Apparatus for three-dimensional shape measurement

Eye surface topographer

Hybrid light measurement method for measuring three-dimensional pro...

Metrology apparatus and method for determining a characteristic of...

Shape reconstruction of specular and/or diffuse objects using multi...

Systems, methods, and media for performing shape measurement

Projection system

Three-dimensional (3D) image system and electronic device

Apparatus for projecting a time-variable optical pattern onto an ob...

System and methods for shape measurement using dual frequency fring...

Apparatus and method for measuring 3D form or deformation of an obj...

Meta projectors emitting structured light or uniform light based on...

Control of amplitude and phase of diffraction orders using polarizi...

Multiple channel locating

Measurement system, measurement method, and vision chip

Method and device for generating multispectral or hyperspectral lig...

Three-dimensional imaging using a multi-phase projector

3D scanner using structured lighting

Dynamic digital fringe projection techniques for measuring warpage

Systems, methods, and media for performing shape measurement

Information processing apparatus, information processing method, an...

Multiple channel locating

Projection device, and projection method

Patents Applicationslast 30 patents

DETERMINING AND RECONSTRUCTING A SHAPE AND A MATERIAL PROPERTY OF A...

MULTIPLE CHANNEL LOCATING

METROLOGY FOR ADDITIVE MANUFACTURING

THREE DIMENSIONAL IMAGING

METROLOGY APPARATUS AND METHOD FOR DETERMINING A CHARACTERISTIC OF...

METHOD FOR AUGMENTING A SCENE IN REAL SPACE WITH PROJECTED VISUAL C...

POSITION DETECTION SYSTEM AND POSITION DETECTION METHOD FOR DETECTI...

STRUCTURED LIGHT PROJECTION

PROJECTION SYSTEM

METHOD OF MEASURING 3D PROFILE

Three-Dimensional (3D) Image System and Electronic Device

HYBRID LIGHT MEASUREMENT METHOD FOR MEASURING THREE-DIMENSIONAL PRO...

CAMERA ASSEMBLY WITH PROGRAMMABLE DIFFRACTIVE OPTICAL ELEMENT FOR D...

IMPROVED EYE SURFACE TOPOGRAPHER

MULTIPLE CHANNEL LOCATING

Metrology Apparatus and Method for Determining a Characteristic of...

APPARATUS FOR PROJECTING A TIME-VARIABLE OPTICAL PATTERN ONTO AN OB...

SYSTEMS, METHODS, AND MEDIA FOR PERFORMING SHAPE MEASUREMENT

System and Methods for Shape Measurement Using Dual Frequency Fring...

MULTIPLE CHANNEL LOCATING

Control of Amplitude and Phase of Diffraction Orders Using Polarizi...

Dynamic Digital Fringe Projection Techniques For Measuring Warpage

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...

SYSTEMS, METHODS, AND MEDIA FOR PERFORMING SHAPE MEASUREMENT

Compound structured light projection system for 3-D surface profiling

COMPUTING DEVICE AND METHOD OF IMAGE MATCHING

APPARATUS AND TECHNIQUES FOR DETERMINING OBJECT DEPTH IN IMAGES

MULTIPLE CHANNEL LOCATING

THREE-DIMENSIONAL MEASUREMENT APPARATUS, METHOD FOR THREE-DIMENSION...

THREE-DIMENSIONAL MEASUREMENT APPARATUS, THREE-DIMENSIONAL MEASUREM...