using surface ionisation

Industry

CPC
H01J49/16

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/16using surface ionisation

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Method and device for improved performance with micro-electrospray...
- Patent number 12,211,684
- Issue date Jan 28, 2025
- NEW OBJECTIVE, INC.
- Gary A. Valaskovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining the integrity of a deposit of a complex base...
- Patent number 12,211,681
- Issue date Jan 28, 2025
- bioMerieux
- Denis Leroux
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample supports for solid-substrate electrospray mass spectrometry
- Patent number 12,205,811
- Issue date Jan 21, 2025
- Thermo Finnigan LLC.
- Maria Theresa Dulay
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interface for electrospray ionization (ESI) in capillary electropho...
- Patent number 12,205,812
- Issue date Jan 21, 2025
- GMJ Technologies, Inc.
- Oluwatosin O. Dada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analyzer
- Patent number 12,203,886
- Issue date Jan 21, 2025
- Shimadzu Corporation
- Shosei Yamauchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for detecting and mapping the spatial distribution of organ...
- Patent number 12,203,919
- Issue date Jan 21, 2025
- Petroleo Brasileiro S.A. Petrobras
- Igor Pereira Da Silva
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-mode ionization apparatus and uses thereof
- Patent number 12,205,807
- Issue date Jan 21, 2025
- MSTM, LLC
- Milan Pophristic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analyzer
- Patent number 12,198,920
- Issue date Jan 14, 2025
- Shimadzu Corporation
- Masaru Nishiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry assay for congenital adrenal hyperplasia
- Patent number 12,196,765
- Issue date Jan 14, 2025
- Quest Diagnostics Investments Incorporated
- Amit Ghoshal
- G01 - MEASURING TESTING
Information Patent Grant
Method for mass spectrometry
- Patent number 12,191,132
- Issue date Jan 7, 2025
- DH Technologies Development Pte. Ltd.
- Yves Le Blanc
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry method for identifying and/or authenticating a sa...
- Patent number 12,191,133
- Issue date Jan 7, 2025
- ORVINUM AG
- Frank Jochen Dieterle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
C peptide detection by mass spectrometry
- Patent number 12,188,943
- Issue date Jan 7, 2025
- Quest Diagnostics Investments Incorporated
- Nigel Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry apparatus
- Patent number 12,183,564
- Issue date Dec 31, 2024
- Kratos Analytical Limited
- Andrew Bowdler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for electrospray ionization with integrated LC column and el...
- Patent number 12,181,454
- Issue date Dec 31, 2024
- DIONEX CORPORATION
- Brandon Howard Robson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method of analysis of a protein using liquid chromatogra...
- Patent number 12,174,199
- Issue date Dec 24, 2024
- REGENERON PHARMACEUTICALS, INC.
- Shunhai Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Information management device for mass spectrometer
- Patent number 12,176,197
- Issue date Dec 24, 2024
- Shimadzu Corporation
- Shinichi Iwamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thread spray ambient ionization
- Patent number 12,169,197
- Issue date Dec 17, 2024
- OHIO STATE INNOVATION FOUNDATION
- Abraham Badu-Tawiah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for separating ions at about or above atmospher...
- Patent number 12,154,779
- Issue date Nov 26, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for the acoustic loading of an analytical instrum...
- Patent number 12,154,776
- Issue date Nov 26, 2024
- Labcyte Inc.
- Sammy Datwani
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Imaging mass spectrometer
- Patent number 12,154,772
- Issue date Nov 26, 2024
- Shimadzu Corporation
- Kenichi Mishima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrophoretic mass spectrometry probes and systems and uses thereof
- Patent number 12,142,472
- Issue date Nov 12, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Package comprising an ion-trap and method of fabrication
- Patent number 12,142,473
- Issue date Nov 12, 2024
- Duke University
- Jungsang Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Articles and methods involving detection of binding
- Patent number 12,135,330
- Issue date Nov 5, 2024
- CHARLES RIVER LABORATORIES INTERNATIONAL, INC.
- Michael D. Scholle
- C40 - COMBINATORIAL CHEMISTRY
Information Patent Grant
System for electrospray ionization with integrated lc column and el...
- Patent number 12,130,268
- Issue date Oct 29, 2024
- DIONEX CORPORATION
- Brandon Howard Robson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas phase sample preparation for cryo-electron microscopy
- Patent number 12,130,217
- Issue date Oct 29, 2024
- Wisconsin Alumni Research Foundation
- Joshua Coon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for conducting reactions and screening for reac...
- Patent number 12,125,693
- Issue date Oct 22, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for sample analysis using swabs
- Patent number 12,125,691
- Issue date Oct 22, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dendritic detergents for the analysis of proteins by mass spectrometry
- Patent number 12,122,805
- Issue date Oct 22, 2024
- Oxford University Innovation Limited
- Carol V. Robinson
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Dielectric barrier discharge ionization, analytical instrument and...
- Patent number 12,106,954
- Issue date Oct 1, 2024
- Shimadzu Corporation
- Yiming Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for the analytical measurement of sample material on a sampl...
- Patent number 12,105,049
- Issue date Oct 1, 2024
- Andreas Haase
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Mass Spectrometer
- Publication number 20250029826
- Publication date Jan 23, 2025
- Shimadzu Corporation
- Koichi KIMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR CONDUCTING REACTIONS AND SCREENING FOR REAC...
- Publication number 20250029827
- Publication date Jan 23, 2025
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VOLUMETRIC MEASUREMENT OF MICRO DROPLETS
- Publication number 20250018412
- Publication date Jan 16, 2025
- DH Technologies Development Pte. Ltd.
- Thomas R Covey
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
AN AUTOMATED SYSTEM FOR PROVIDING AT LEAST ONE SAMPLE FOR ELECTROSP...
- Publication number 20250014882
- Publication date Jan 9, 2025
- Deutsches Krebsforschungszentrum Stiftung des Oeffentlichen Rechts
- Mogjiborahman Salek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANO-LITER PHOTOIONIZATION MASS SPECTROMETRY ION SOURCE DEVICE AND...
- Publication number 20250006482
- Publication date Jan 2, 2025
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- Xiaoyun GONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC POSITIONING OF AN ELECTROSPRAY IONIZATION EMITTER
- Publication number 20240404817
- Publication date Dec 5, 2024
- Thermo Finnigan LLC
- Joshua A. Silveira
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR ACOUSTIC MANIPULATION AND SAMPLING OF LIPID...
- Publication number 20240404818
- Publication date Dec 5, 2024
- University of South Florida
- Theresa Evans-Nguyen
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Application
SUPPORT UNIT, SUPPORT BODY, AND IONIZATION METHOD
- Publication number 20240404816
- Publication date Dec 5, 2024
- Hamamatsu Photonics K.K.
- Masahiro KOTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR FLASH BOILING OF A LIQUID SAMPLE
- Publication number 20240395527
- Publication date Nov 28, 2024
- DH Technologies Development Pte. Ltd.
- Peter KOVARIK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method for mass spectrometry imaging
- Publication number 20240389905
- Publication date Nov 28, 2024
- Trace Matters Scientific LLC
- Mazdak Taghioskoui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE ASSEMBLY
- Publication number 20240395530
- Publication date Nov 28, 2024
- Micromass UK Limited
- Andrew Whatley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS OF RAPID AND AUTONOMOUS DETECTION OF AEROSOL PA...
- Publication number 20240379337
- Publication date Nov 14, 2024
- Zeteo Tech, Inc.
- Michael MCLOUGHLIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ionizer
- Publication number 20240379339
- Publication date Nov 14, 2024
- Shimadzu Corporation
- Keisuke ISO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION IMAGING APPARATUS AND METHOD
- Publication number 20240371622
- Publication date Nov 7, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADVECTION-BASED TRANSPORT OF ABLATED MATERIAL
- Publication number 20240371623
- Publication date Nov 7, 2024
- Agilent Technologies, Inc.
- Trygve RISTROPH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED FESEM AND LDI-TOF-MS ANALYSIS SYSTEM
- Publication number 20240369504
- Publication date Nov 7, 2024
- LG ENERGY SOLUTION, LTD.
- Soeun KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NEBULISER OUTLET ASSEMBLY
- Publication number 20240363322
- Publication date Oct 31, 2024
- Micromass UK Limited
- Suloke Mathai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR THE SPECTROMETRIC ANALYSIS OF SAMPLE MATERIAL
- Publication number 20240355610
- Publication date Oct 24, 2024
- Bruker Daltonics GmbH & Co. KG
- Sebastian BÖHM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANOMATERIAL-ENHANCED CHIPS AND THEIR APPLICATIONS IN LASER DESORPT...
- Publication number 20240353420
- Publication date Oct 24, 2024
- SHANGHAI JIAO TONG UNIVERSITY
- Kun QIAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Improved Low-Power Mass Interrogation System and Assay For Determin...
- Publication number 20240347330
- Publication date Oct 17, 2024
- Leidos, Inc.
- Noah Peter Christian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Capture Probe
- Publication number 20240344938
- Publication date Oct 17, 2024
- UT-Battelle, LLC
- Vilmos KERTESZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Systems for Increasing Sensitivity of Direct Sampling I...
- Publication number 20240347333
- Publication date Oct 17, 2024
- DH Technologies Development Pte. Ltd.
- Don W. Arnold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STANDARD ADDITION WORKFLOW FOR QUANTITATIVE ANALYSIS
- Publication number 20240339311
- Publication date Oct 10, 2024
- DH Technologies Development Pte. Ltd.
- Thomas R. COVEY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIQUID TRANSPORT SYSTEM HAVING MULTIPLE NEBULIZER NOZZLES
- Publication number 20240331992
- Publication date Oct 3, 2024
- DH Technologies Development Pte. Ltd.
- Peter KOVARIK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHODS FOR DEPOSITING IONS ONTO A SURFACE
- Publication number 20240319054
- Publication date Sep 26, 2024
- ION DX, INC.
- W. Henry Benner
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING OF SPATIALLY RESOLVED, ION-SPECTROMETRIC MEASUREMENT SIG...
- Publication number 20240321565
- Publication date Sep 26, 2024
- Bruker Daltonics GmbH & Co. KG
- Tobias BOSKAMP
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20240321566
- Publication date Sep 26, 2024
- KIOXIA Corporation
- Jun ASAKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Feedback Control Of High-Vaccum Cold-Ion Sources Using Rydberg Atom...
- Publication number 20240304433
- Publication date Sep 12, 2024
- The Regents of the University of Michigan
- David ANDERSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE ANALYSIS
- Publication number 20240297032
- Publication date Sep 5, 2024
- Micromass UK Limited
- Emrys Jones
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR SAMPLING
- Publication number 20240290599
- Publication date Aug 29, 2024
- HELSINGIN YLIOPISTO
- Ari SALMI
- H01 - BASIC ELECTRIC ELEMENTS

using surface ionisation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and device for improved performance with micro-electrospray...

Method for determining the integrity of a deposit of a complex base...

Sample supports for solid-substrate electrospray mass spectrometry

Interface for electrospray ionization (ESI) in capillary electropho...

Ion analyzer

Methods for detecting and mapping the spatial distribution of organ...

Multi-mode ionization apparatus and uses thereof

Ion analyzer

Mass spectrometry assay for congenital adrenal hyperplasia

Method for mass spectrometry

Mass spectrometry method for identifying and/or authenticating a sa...

C peptide detection by mass spectrometry

Mass spectrometry apparatus

System for electrospray ionization with integrated LC column and el...

System and method of analysis of a protein using liquid chromatogra...

Information management device for mass spectrometer

Thread spray ambient ionization

Systems and methods for separating ions at about or above atmospher...

System and method for the acoustic loading of an analytical instrum...

Imaging mass spectrometer

Electrophoretic mass spectrometry probes and systems and uses thereof

Package comprising an ion-trap and method of fabrication

Articles and methods involving detection of binding

System for electrospray ionization with integrated lc column and el...

Gas phase sample preparation for cryo-electron microscopy

Systems and methods for conducting reactions and screening for reac...

Systems and methods for sample analysis using swabs

Dendritic detergents for the analysis of proteins by mass spectrometry

Dielectric barrier discharge ionization, analytical instrument and...

Method for the analytical measurement of sample material on a sampl...

Patents Applicationslast 30 patents

Mass Spectrometer

SYSTEMS AND METHODS FOR CONDUCTING REACTIONS AND SCREENING FOR REAC...

VOLUMETRIC MEASUREMENT OF MICRO DROPLETS

AN AUTOMATED SYSTEM FOR PROVIDING AT LEAST ONE SAMPLE FOR ELECTROSP...

NANO-LITER PHOTOIONIZATION MASS SPECTROMETRY ION SOURCE DEVICE AND...

AUTOMATIC POSITIONING OF AN ELECTROSPRAY IONIZATION EMITTER

SYSTEMS AND METHODS FOR ACOUSTIC MANIPULATION AND SAMPLING OF LIPID...

SUPPORT UNIT, SUPPORT BODY, AND IONIZATION METHOD

SYSTEMS AND METHODS FOR FLASH BOILING OF A LIQUID SAMPLE

System and method for mass spectrometry imaging

ION SOURCE ASSEMBLY

SYSTEMS AND METHODS OF RAPID AND AUTONOMOUS DETECTION OF AEROSOL PA...

Ionizer

HIGH RESOLUTION IMAGING APPARATUS AND METHOD

ADVECTION-BASED TRANSPORT OF ABLATED MATERIAL

INTEGRATED FESEM AND LDI-TOF-MS ANALYSIS SYSTEM

NEBULISER OUTLET ASSEMBLY

DEVICE AND METHOD FOR THE SPECTROMETRIC ANALYSIS OF SAMPLE MATERIAL

NANOMATERIAL-ENHANCED CHIPS AND THEIR APPLICATIONS IN LASER DESORPT...

Improved Low-Power Mass Interrogation System and Assay For Determin...

Capture Probe

Methods and Systems for Increasing Sensitivity of Direct Sampling I...

STANDARD ADDITION WORKFLOW FOR QUANTITATIVE ANALYSIS

LIQUID TRANSPORT SYSTEM HAVING MULTIPLE NEBULIZER NOZZLES

APPARATUS AND METHODS FOR DEPOSITING IONS ONTO A SURFACE

PROCESSING OF SPATIALLY RESOLVED, ION-SPECTROMETRIC MEASUREMENT SIG...

MASS SPECTROMETER

Feedback Control Of High-Vaccum Cold-Ion Sources Using Rydberg Atom...

SAMPLE ANALYSIS

SYSTEM AND METHOD FOR SAMPLING