using surface ionisation

Industry

CPC
H01J49/16

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/16using surface ionisation

Industries

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for separating ions at about or above atmospher...
- Patent number 12,154,779
- Issue date Nov 26, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for the acoustic loading of an analytical instrum...
- Patent number 12,154,776
- Issue date Nov 26, 2024
- Labcyte Inc.
- Sammy Datwani
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Imaging mass spectrometer
- Patent number 12,154,772
- Issue date Nov 26, 2024
- Shimadzu Corporation
- Kenichi Mishima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrophoretic mass spectrometry probes and systems and uses thereof
- Patent number 12,142,472
- Issue date Nov 12, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Package comprising an ion-trap and method of fabrication
- Patent number 12,142,473
- Issue date Nov 12, 2024
- Duke University
- Jungsang Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Articles and methods involving detection of binding
- Patent number 12,135,330
- Issue date Nov 5, 2024
- CHARLES RIVER LABORATORIES INTERNATIONAL, INC.
- Michael D. Scholle
- C40 - COMBINATORIAL CHEMISTRY
Information Patent Grant
System for electrospray ionization with integrated lc column and el...
- Patent number 12,130,268
- Issue date Oct 29, 2024
- DIONEX CORPORATION
- Brandon Howard Robson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas phase sample preparation for cryo-electron microscopy
- Patent number 12,130,217
- Issue date Oct 29, 2024
- Wisconsin Alumni Research Foundation
- Joshua Coon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for conducting reactions and screening for reac...
- Patent number 12,125,693
- Issue date Oct 22, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for sample analysis using swabs
- Patent number 12,125,691
- Issue date Oct 22, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dendritic detergents for the analysis of proteins by mass spectrometry
- Patent number 12,122,805
- Issue date Oct 22, 2024
- Oxford University Innovation Limited
- Carol V. Robinson
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Dielectric barrier discharge ionization, analytical instrument and...
- Patent number 12,106,954
- Issue date Oct 1, 2024
- Shimadzu Corporation
- Yiming Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for the analytical measurement of sample material on a sampl...
- Patent number 12,105,049
- Issue date Oct 1, 2024
- Andreas Haase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrospray ion source for spectrometry using inductively heated gas
- Patent number 12,100,583
- Issue date Sep 24, 2024
- Anil Mavanur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus, system, and method for transferring ions
- Patent number 12,089,932
- Issue date Sep 17, 2024
- Trace Matters Scientific LLC
- Mazdak Taghioskoui
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for identification of primary immune resistanc...
- Patent number 12,094,587
- Issue date Sep 17, 2024
- Biodesix, Inc.
- Carlos Oliveira
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mass spectrometer
- Patent number 12,087,565
- Issue date Sep 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Kouji Ishiguro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Devices and methods for laser-assisted micro mass spectroscopy
- Patent number 12,080,532
- Issue date Sep 3, 2024
- Chemring Sensors and Electronic Systems, Inc.
- Ashish Chaudhary
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inline chemical agent addition for inline reaction with fluid sampl...
- Patent number 12,074,017
- Issue date Aug 27, 2024
- Elemental Scientific, Inc.
- Charles D. Quarles
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Mass spectrometers that utilize ionic wind and methods of use thereof
- Patent number 12,068,148
- Issue date Aug 20, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for analyzing biological samples
- Patent number 12,061,136
- Issue date Aug 13, 2024
- Olfactomics Oy
- Antti Roine
- G01 - MEASURING TESTING
Information Patent Grant
Correlative multimodal chemical imaging via machine learning
- Patent number 12,057,304
- Issue date Aug 6, 2024
- UT-Battelle, LLC
- Olga S. Ovchinnikova
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Coaxial introduction of calibrant in a flow path with analyte to an...
- Patent number 12,051,582
- Issue date Jul 30, 2024
- Waters Technologies Corporation
- Michael O. Fogwill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stack for an energy storage device
- Patent number 12,040,452
- Issue date Jul 16, 2024
- Dyson Technology Limited
- Michael Edward Rendall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Volumetric measurement of micro droplets
- Patent number 12,036,568
- Issue date Jul 16, 2024
- DH Technologies Development Pte. Ltd.
- Thomas R Covey
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Processing of spatially resolved, ion-spectrometric measurement sig...
- Patent number 12,040,169
- Issue date Jul 16, 2024
- Tobias Boskamp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analyzer
- Patent number 12,031,943
- Issue date Jul 9, 2024
- Shimadzu Corporation
- Hidenori Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrospray fog generation for fountain solution image generation
- Patent number 12,017,245
- Issue date Jun 25, 2024
- Xerox Corporation
- David K. Biegelsen
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Methods and systems for detecting aerosol particles without using c...
- Patent number 11,996,280
- Issue date May 28, 2024
- Zeteo Tech, Inc.
- Michael Mcloughlin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for detecting aerosol particles
- Patent number 11,996,279
- Issue date May 28, 2024
- Zeteo Tech, Inc.
- Michael McLoughlin
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS OF RAPID AND AUTONOMOUS DETECTION OF AEROSOL PA...
- Publication number 20240379337
- Publication date Nov 14, 2024
- Zeteo Tech, Inc.
- Michael MCLOUGHLIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ionizer
- Publication number 20240379339
- Publication date Nov 14, 2024
- Shimadzu Corporation
- Keisuke ISO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION IMAGING APPARATUS AND METHOD
- Publication number 20240371622
- Publication date Nov 7, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADVECTION-BASED TRANSPORT OF ABLATED MATERIAL
- Publication number 20240371623
- Publication date Nov 7, 2024
- Agilent Technologies, Inc.
- Trygve RISTROPH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED FESEM AND LDI-TOF-MS ANALYSIS SYSTEM
- Publication number 20240369504
- Publication date Nov 7, 2024
- LG ENERGY SOLUTION, LTD.
- Soeun KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NEBULISER OUTLET ASSEMBLY
- Publication number 20240363322
- Publication date Oct 31, 2024
- Micromass UK Limited
- Suloke Mathai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR THE SPECTROMETRIC ANALYSIS OF SAMPLE MATERIAL
- Publication number 20240355610
- Publication date Oct 24, 2024
- Bruker Daltonics GmbH & Co. KG
- Sebastian BÖHM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANOMATERIAL-ENHANCED CHIPS AND THEIR APPLICATIONS IN LASER DESORPT...
- Publication number 20240353420
- Publication date Oct 24, 2024
- SHANGHAI JIAO TONG UNIVERSITY
- Kun QIAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Improved Low-Power Mass Interrogation System and Assay For Determin...
- Publication number 20240347330
- Publication date Oct 17, 2024
- Leidos, Inc.
- Noah Peter Christian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Capture Probe
- Publication number 20240344938
- Publication date Oct 17, 2024
- UT-Battelle, LLC
- Vilmos KERTESZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Systems for Increasing Sensitivity of Direct Sampling I...
- Publication number 20240347333
- Publication date Oct 17, 2024
- DH Technologies Development Pte. Ltd.
- Don W. Arnold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STANDARD ADDITION WORKFLOW FOR QUANTITATIVE ANALYSIS
- Publication number 20240339311
- Publication date Oct 10, 2024
- DH Technologies Development Pte. Ltd.
- Thomas R. COVEY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIQUID TRANSPORT SYSTEM HAVING MULTIPLE NEBULIZER NOZZLES
- Publication number 20240331992
- Publication date Oct 3, 2024
- DH Technologies Development Pte. Ltd.
- Peter KOVARIK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHODS FOR DEPOSITING IONS ONTO A SURFACE
- Publication number 20240319054
- Publication date Sep 26, 2024
- ION DX, INC.
- W. Henry Benner
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING OF SPATIALLY RESOLVED, ION-SPECTROMETRIC MEASUREMENT SIG...
- Publication number 20240321565
- Publication date Sep 26, 2024
- Bruker Daltonics GmbH & Co. KG
- Tobias BOSKAMP
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20240321566
- Publication date Sep 26, 2024
- KIOXIA Corporation
- Jun ASAKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Feedback Control Of High-Vaccum Cold-Ion Sources Using Rydberg Atom...
- Publication number 20240304433
- Publication date Sep 12, 2024
- The Regents of the University of Michigan
- David ANDERSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE ANALYSIS
- Publication number 20240297032
- Publication date Sep 5, 2024
- Micromass UK Limited
- Emrys Jones
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR SAMPLING
- Publication number 20240290599
- Publication date Aug 29, 2024
- HELSINGIN YLIOPISTO
- Ari SALMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Microorganism Mass Spectrometry Method
- Publication number 20240290602
- Publication date Aug 29, 2024
- Shimadzu Corporation
- Kanae TERAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR SPECTROMETRIC ANALYSIS
- Publication number 20240288439
- Publication date Aug 29, 2024
- Bruker Daltonics GmbH & Co. KG
- Tanja BIEN
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR DETECTING AEROSOL PARTICLES
- Publication number 20240282568
- Publication date Aug 22, 2024
- Zeteo Tech, Inc.
- Michael McLoughlin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR DETECTING AEROSOL PARTICLES WITHOUT USING C...
- Publication number 20240282567
- Publication date Aug 22, 2024
- Zeteo Tech, Inc.
- MICHAEL MCLOUGHLIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for full Os isotope static measurement at low-content/small-...
- Publication number 20240274423
- Publication date Aug 15, 2024
- Guangzhou Institute of Geochemistry (GIG), Chinese Academy of Sciences (CAS)
- Guiqin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR IMPROVED INTENSIT Y DETERMINATIONS IN MASS...
- Publication number 20240258090
- Publication date Aug 1, 2024
- DH Technologies Development Pte. Ltd.
- Yves LE BLANC
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR PERFORMING A CHECK OF A DIFFERENTIAL MOBILI...
- Publication number 20240255467
- Publication date Aug 1, 2024
- DH Technologies Development Pte. Ltd.
- Leigh BEDFORD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ASYMMETRICAL FLOW FIELD-FLOW FRACTIONATION WITH MASS SPECTROMETRY F...
- Publication number 20240255519
- Publication date Aug 1, 2024
- Regeneron Pharmaceuticals, Inc.
- Yuetian Yan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Apparatus for Trapping and Accumulation of Ions
- Publication number 20240248062
- Publication date Jul 25, 2024
- MOBILion Systems, Inc.
- John Daniel DeBord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION FOCUSING AND MANIPULATION
- Publication number 20240242953
- Publication date Jul 18, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TAYLOR CONE EMITTER DEVICES AND TAYLOR CONE ANALYSIS SYSTEMS
- Publication number 20240242956
- Publication date Jul 18, 2024
- RESTEK CORPORATION
- German A. Gomez-Rios
- H01 - BASIC ELECTRIC ELEMENTS

using surface ionisation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for separating ions at about or above atmospher...

System and method for the acoustic loading of an analytical instrum...

Imaging mass spectrometer

Electrophoretic mass spectrometry probes and systems and uses thereof

Package comprising an ion-trap and method of fabrication

Articles and methods involving detection of binding

System for electrospray ionization with integrated lc column and el...

Gas phase sample preparation for cryo-electron microscopy

Systems and methods for conducting reactions and screening for reac...

Systems and methods for sample analysis using swabs

Dendritic detergents for the analysis of proteins by mass spectrometry

Dielectric barrier discharge ionization, analytical instrument and...

Method for the analytical measurement of sample material on a sampl...

Electrospray ion source for spectrometry using inductively heated gas

Apparatus, system, and method for transferring ions

Apparatus and method for identification of primary immune resistanc...

Mass spectrometer

Devices and methods for laser-assisted micro mass spectroscopy

Inline chemical agent addition for inline reaction with fluid sampl...

Mass spectrometers that utilize ionic wind and methods of use thereof

Method and apparatus for analyzing biological samples

Correlative multimodal chemical imaging via machine learning

Coaxial introduction of calibrant in a flow path with analyte to an...

Stack for an energy storage device

Volumetric measurement of micro droplets

Processing of spatially resolved, ion-spectrometric measurement sig...

Ion analyzer

Electrospray fog generation for fountain solution image generation

Methods and systems for detecting aerosol particles without using c...

Methods and systems for detecting aerosol particles

Patents Applicationslast 30 patents

SYSTEMS AND METHODS OF RAPID AND AUTONOMOUS DETECTION OF AEROSOL PA...

Ionizer

HIGH RESOLUTION IMAGING APPARATUS AND METHOD

ADVECTION-BASED TRANSPORT OF ABLATED MATERIAL

INTEGRATED FESEM AND LDI-TOF-MS ANALYSIS SYSTEM

NEBULISER OUTLET ASSEMBLY

DEVICE AND METHOD FOR THE SPECTROMETRIC ANALYSIS OF SAMPLE MATERIAL

NANOMATERIAL-ENHANCED CHIPS AND THEIR APPLICATIONS IN LASER DESORPT...

Improved Low-Power Mass Interrogation System and Assay For Determin...

Capture Probe

Methods and Systems for Increasing Sensitivity of Direct Sampling I...

STANDARD ADDITION WORKFLOW FOR QUANTITATIVE ANALYSIS

LIQUID TRANSPORT SYSTEM HAVING MULTIPLE NEBULIZER NOZZLES

APPARATUS AND METHODS FOR DEPOSITING IONS ONTO A SURFACE

PROCESSING OF SPATIALLY RESOLVED, ION-SPECTROMETRIC MEASUREMENT SIG...

MASS SPECTROMETER

Feedback Control Of High-Vaccum Cold-Ion Sources Using Rydberg Atom...

SAMPLE ANALYSIS

SYSTEM AND METHOD FOR SAMPLING

Microorganism Mass Spectrometry Method

METHOD AND DEVICE FOR SPECTROMETRIC ANALYSIS

METHODS AND SYSTEMS FOR DETECTING AEROSOL PARTICLES

METHODS AND SYSTEMS FOR DETECTING AEROSOL PARTICLES WITHOUT USING C...

Method for full Os isotope static measurement at low-content/small-...

SYSTEMS AND METHODS FOR IMPROVED INTENSIT Y DETERMINATIONS IN MASS...

SYSTEMS AND METHODS FOR PERFORMING A CHECK OF A DIFFERENTIAL MOBILI...

ASYMMETRICAL FLOW FIELD-FLOW FRACTIONATION WITH MASS SPECTROMETRY F...

Methods and Apparatus for Trapping and Accumulation of Ions

ION FOCUSING AND MANIPULATION

TAYLOR CONE EMITTER DEVICES AND TAYLOR CONE ANALYSIS SYSTEMS