using switching of signals between probe tips and test bed

Industry

CPC
G01R1/07385

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/07385using switching of signals between probe tips and test bed

Industries

Patents Grantslast 30 patents

Information Patent Grant
Wafer inspection method and inspection apparatus
- Patent number 11,841,381
- Issue date Dec 12, 2023
- CHROMA ATE INC.
- Tsun-I Wang
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and signal path switching module assembly
- Patent number 10,753,960
- Issue date Aug 25, 2020
- MPI Corporation
- Hao Wei
- G01 - MEASURING TESTING
Information Patent Grant
Current leakage and charge injection mitigating solid state switch
- Patent number 10,725,105
- Issue date Jul 28, 2020
- KEITHLEY INSTRUMENTS, LLC
- Matthew Holtz
- G01 - MEASURING TESTING
Information Patent Grant
Testing system and method
- Patent number 10,444,278
- Issue date Oct 15, 2019
- Xcerra Corporation
- Benjamin Brown
- G01 - MEASURING TESTING
Information Patent Grant
Testing system and method
- Patent number 10,379,154
- Issue date Aug 13, 2019
- Xcerra Corporation
- Benjamin Brown
- G01 - MEASURING TESTING
Information Patent Grant
Muxing interface platform for multiplexed handlers to reduce index...
- Patent number 9,753,081
- Issue date Sep 5, 2017
- Celerint, LLC
- Howard Roberts
- G01 - MEASURING TESTING
Information Patent Grant
Universal multiplexing interface system and method
- Patent number 9,733,301
- Issue date Aug 15, 2017
- Celerint, LLC
- Howard Roberts
- G01 - MEASURING TESTING
Information Patent Grant
Probe module supporting loopback test
- Patent number 9,500,675
- Issue date Nov 22, 2016
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Interposer to regulate current for wafer test tooling
- Patent number 9,391,447
- Issue date Jul 12, 2016
- Intel Corporation
- Evan M. Fledell
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Testing of electronic circuits using an active probe integrated cir...
- Patent number 8,928,343
- Issue date Jan 6, 2015
- Scanimetrics Inc.
- Christopher V. Sellathamby
- G01 - MEASURING TESTING
Information Patent Grant
Test schemes and apparatus for passive interposers
- Patent number 8,860,448
- Issue date Oct 14, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yun-Han Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and inspection apparatus
- Patent number 8,736,292
- Issue date May 27, 2014
- Kabushiki Kaisha Nihon Micronics
- Tatsuo Ishigaki
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus, a process of forming a probe head, and a process o...
- Patent number 8,179,153
- Issue date May 15, 2012
- Spansion LLC
- Michael D. Wedlake
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for providing a tester integrated circuit for...
- Patent number 7,944,225
- Issue date May 17, 2011
- FormFactor, Inc.
- Todd Ryland Kemmerling
- G01 - MEASURING TESTING
Information Patent Grant
Probe card cooling assembly with direct cooling of active electroni...
- Patent number 7,863,915
- Issue date Jan 4, 2011
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Efficient switching architecture with reduced stub lengths
- Patent number 7,863,888
- Issue date Jan 4, 2011
- Teradyne, Inc.
- Fang Xu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Device and method for electrical contacting semiconductor devices f...
- Patent number 7,852,095
- Issue date Dec 14, 2010
- Qimonda AG
- Bernhard Ruf
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for switching tester resources
- Patent number 7,649,366
- Issue date Jan 19, 2010
- FormFactor, Inc.
- Roy J. Henson
- G01 - MEASURING TESTING
Information Patent Grant
Probe card cooling assembly with direct cooling of active electroni...
- Patent number 7,579,847
- Issue date Aug 25, 2009
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Automatic multiplexing system for automated wafer testing
- Patent number 7,576,550
- Issue date Aug 18, 2009
- Qualitau, Inc.
- Shahriar Mostarshed
- G01 - MEASURING TESTING
Information Patent Grant
Semi-automatic multiplexing system for automated semiconductor wafe...
- Patent number 7,511,517
- Issue date Mar 31, 2009
- Qualitau, Inc.
- Shahriar Mostarshed
- G01 - MEASURING TESTING
Information Patent Grant
Intelligent probe card architecture
- Patent number 7,307,433
- Issue date Dec 11, 2007
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Test method for electronic modules using movable test contactors
- Patent number 7,279,915
- Issue date Oct 9, 2007
- Micron Technology, Inc.
- Daniel P. Cram
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly including a programmable device to selectively...
- Patent number 7,245,134
- Issue date Jul 17, 2007
- FormFactor, Inc.
- Dane C. Granicher
- G01 - MEASURING TESTING
Information Patent Grant
High speed electromechanically driven test ahead
- Patent number 7,235,993
- Issue date Jun 26, 2007
- Fong Luk
- G01 - MEASURING TESTING
Information Patent Grant
Test method for electronic modules
- Patent number 7,123,036
- Issue date Oct 17, 2006
- Micron Technology, Inc.
- Daniel P. Cram
- G01 - MEASURING TESTING
Information Patent Grant
Universal test fixture
- Patent number 7,071,717
- Issue date Jul 4, 2006
- Agilent Technologies, Inc.
- Charles D. Hoke
- G01 - MEASURING TESTING
Information Patent Grant
Efficient switching architecture with reduced stub lengths
- Patent number 6,958,598
- Issue date Oct 25, 2005
- Teradyne, Inc.
- Fang Xu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Probe module and a testing apparatus
- Patent number 6,937,040
- Issue date Aug 30, 2005
- Advantest Corporation
- Yasuhiro Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Probe card cooling assembly with direct cooling of active electroni...
- Patent number 6,891,385
- Issue date May 10, 2005
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20230105061
- Publication date Apr 6, 2023
- CHROMA ATE INC.
- TSUN-I WANG
- G01 - MEASURING TESTING
Information Patent Application
SAFETY SYSTEM FOR NEEDLE PROBE CARD FOR HIGH-VOLTAGE AND HIGH-CURRE...
- Publication number 20230071495
- Publication date Mar 9, 2023
- CREA COLLAUDI ELETTRONICI AUTOMATIZZATI S.R.L.
- Marco MARCINNO'
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND SIGNAL PATH SWITCHING MODULE ASSEMBLY
- Publication number 20190120877
- Publication date Apr 25, 2019
- MPI Corporation
- Hao WEI
- G01 - MEASURING TESTING
Information Patent Application
Current Leakage And Charge Injection Mitigating Solid State Switch
- Publication number 20190101591
- Publication date Apr 4, 2019
- KEITHLEY INSTRUMENTS, LLC
- Matthew Holtz
- G01 - MEASURING TESTING
Information Patent Application
TESTING SYSTEM AND METHOD
- Publication number 20180080979
- Publication date Mar 22, 2018
- XCERRA CORPORATION
- Benjamin Brown
- G01 - MEASURING TESTING
Information Patent Application
INTERPOSER TO REGULATE CURRENT FOR WAFER TEST TOOLING
- Publication number 20140029150
- Publication date Jan 30, 2014
- Evan M. Fledell
- G01 - MEASURING TESTING
Information Patent Application
Test Schemes and Apparatus for Passive Interposers
- Publication number 20130015872
- Publication date Jan 17, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yun-Han Lee
- G01 - MEASURING TESTING
Information Patent Application
Wafer inspection system
- Publication number 20120136614
- Publication date May 31, 2012
- King Yuan Electronics Co., Ltd.
- Ta Kang Liu
- G01 - MEASURING TESTING
Information Patent Application
MUXING INTERFACE PLATFORM FOR MULTIPLEXED HANDLERS TO REDUCE INDEX...
- Publication number 20110204914
- Publication date Aug 25, 2011
- Howard Roberts
- G01 - MEASURING TESTING
Information Patent Application
UNIVERSAL MULTIPLEXING INTERFACE SYSTEM AND METHOD
- Publication number 20110193584
- Publication date Aug 11, 2011
- Howard Roberts
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND INSPECTION APPARATUS
- Publication number 20100327898
- Publication date Dec 30, 2010
- Kabushiki Kaisha Nihon Micronics
- Tatsuo Ishigaki
- G01 - MEASURING TESTING
Information Patent Application
TESTING OF ELECTRONIC CIRCUITS USING AN ACTIVE PROBE INTEGRATED CIR...
- Publication number 20100164519
- Publication date Jul 1, 2010
- SCANIMETRICS INC.
- Christopher V. Sellathamby
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR PROVIDING A TESTER INTEGRATED CIRCUIT FOR...
- Publication number 20100079159
- Publication date Apr 1, 2010
- FormFactor, Inc.
- Todd Ryland Kemmerling
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD COOLING ASSEMBLY WITH DIRECT COOLING OF ACTIVE ELECTRONI...
- Publication number 20100052714
- Publication date Mar 4, 2010
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
PROBE APPARATUS, A PROCESS OF FORMING A PROBE HEAD, AND A PROCESS O...
- Publication number 20100013504
- Publication date Jan 21, 2010
- SPANSION LLC
- Michael D. Wedlake
- G01 - MEASURING TESTING
Information Patent Application
Node Extender for In-Circuit Test Systems
- Publication number 20090091342
- Publication date Apr 9, 2009
- AGILENT TECHNOLOGIES, INC.
- Dennis L. Dyer
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC MULTIPLEXING SYSTEM FOR AUTOMATED WAFER TESTING
- Publication number 20080238451
- Publication date Oct 2, 2008
- QUALITAU, INC.
- Shahriar Mostarshed
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR ELECTRICAL CONTACTING SEMICONDUCTOR DEVICES F...
- Publication number 20080231295
- Publication date Sep 25, 2008
- QIMONDA AG
- Bernhard Ruf
- G01 - MEASURING TESTING
Information Patent Application
Configurable interface device
- Publication number 20080191707
- Publication date Aug 14, 2008
- ARC Radar and Communication Services, LLC
- Kenneth M. Collins
- G01 - MEASURING TESTING
Information Patent Application
Probe card for test of semiconductor chips and method for test of s...
- Publication number 20080164898
- Publication date Jul 10, 2008
- Samsung Electronics Co., Ltd.
- Sung-Hoon Bae
- G01 - MEASURING TESTING
Information Patent Application
Intelligent probe card architecture
- Publication number 20080100320
- Publication date May 1, 2008
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARTUS FOR SWITCHING TESTER RESOURCES
- Publication number 20080054917
- Publication date Mar 6, 2008
- FormFactor, Inc.
- Roy J. Henson
- G01 - MEASURING TESTING
Information Patent Application
PROGRAMMABLE DEVICES TO ROUTE SIGNALS ON PROBE CARDS
- Publication number 20070261009
- Publication date Nov 8, 2007
- FormFactor, Inc.
- Dane C. Granicher
- G01 - MEASURING TESTING
Information Patent Application
Method for testing electronic modules using board with test contact...
- Publication number 20070159188
- Publication date Jul 12, 2007
- Daniel P. Cram
- G01 - MEASURING TESTING
Information Patent Application
Semi-automatic multiplexing system for automated semiconductor wafe...
- Publication number 20070103176
- Publication date May 10, 2007
- QualiTau, Inc.
- Shahriar Mostarshed
- G01 - MEASURING TESTING
Information Patent Application
Efficient switching architecture with reduced stub lengths
- Publication number 20070025257
- Publication date Feb 1, 2007
- Fang Xu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Test apparatus with tester channel availability identification
- Publication number 20070022349
- Publication date Jan 25, 2007
- AGILENT TECHNOLOGIES, INC.
- Domenico Bertocelli
- G01 - MEASURING TESTING
Information Patent Application
Programmable devices to route signals on probe cards
- Publication number 20060170435
- Publication date Aug 3, 2006
- FormFactor Inc.
- Dane C. Granicher
- G01 - MEASURING TESTING
Information Patent Application
UNIVERSAL TEST FIXTURE
- Publication number 20060097738
- Publication date May 11, 2006
- Charles D. Hoke
- G01 - MEASURING TESTING
Information Patent Application
Test method for electronic modules using movable test contactors
- Publication number 20050280430
- Publication date Dec 22, 2005
- Daniel P. Cram
- G01 - MEASURING TESTING

using switching of signals between probe tips and test bed

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Wafer inspection method and inspection apparatus

Probe card and signal path switching module assembly

Current leakage and charge injection mitigating solid state switch

Testing system and method

Testing system and method

Muxing interface platform for multiplexed handlers to reduce index...

Universal multiplexing interface system and method

Probe module supporting loopback test

Interposer to regulate current for wafer test tooling

Testing of electronic circuits using an active probe integrated cir...

Test schemes and apparatus for passive interposers

Probe card and inspection apparatus

Probe apparatus, a process of forming a probe head, and a process o...

Method and apparatus for providing a tester integrated circuit for...

Probe card cooling assembly with direct cooling of active electroni...

Efficient switching architecture with reduced stub lengths

Device and method for electrical contacting semiconductor devices f...

Method and apparatus for switching tester resources

Probe card cooling assembly with direct cooling of active electroni...

Automatic multiplexing system for automated wafer testing

Semi-automatic multiplexing system for automated semiconductor wafe...

Intelligent probe card architecture

Test method for electronic modules using movable test contactors

Probe card assembly including a programmable device to selectively...

High speed electromechanically driven test ahead

Test method for electronic modules

Universal test fixture

Efficient switching architecture with reduced stub lengths

Probe module and a testing apparatus

Probe card cooling assembly with direct cooling of active electroni...

Patents Applicationslast 30 patents

WAFER INSPECTION METHOD AND INSPECTION APPARATUS

SAFETY SYSTEM FOR NEEDLE PROBE CARD FOR HIGH-VOLTAGE AND HIGH-CURRE...

PROBE CARD AND SIGNAL PATH SWITCHING MODULE ASSEMBLY

Current Leakage And Charge Injection Mitigating Solid State Switch

TESTING SYSTEM AND METHOD

INTERPOSER TO REGULATE CURRENT FOR WAFER TEST TOOLING

Test Schemes and Apparatus for Passive Interposers

Wafer inspection system

MUXING INTERFACE PLATFORM FOR MULTIPLEXED HANDLERS TO REDUCE INDEX...

UNIVERSAL MULTIPLEXING INTERFACE SYSTEM AND METHOD

PROBE CARD AND INSPECTION APPARATUS

TESTING OF ELECTRONIC CIRCUITS USING AN ACTIVE PROBE INTEGRATED CIR...

METHOD AND APPARATUS FOR PROVIDING A TESTER INTEGRATED CIRCUIT FOR...

PROBE CARD COOLING ASSEMBLY WITH DIRECT COOLING OF ACTIVE ELECTRONI...

PROBE APPARATUS, A PROCESS OF FORMING A PROBE HEAD, AND A PROCESS O...

Node Extender for In-Circuit Test Systems

AUTOMATIC MULTIPLEXING SYSTEM FOR AUTOMATED WAFER TESTING

DEVICE AND METHOD FOR ELECTRICAL CONTACTING SEMICONDUCTOR DEVICES F...

Configurable interface device

Probe card for test of semiconductor chips and method for test of s...

Intelligent probe card architecture

METHOD AND APPARTUS FOR SWITCHING TESTER RESOURCES

PROGRAMMABLE DEVICES TO ROUTE SIGNALS ON PROBE CARDS

Method for testing electronic modules using board with test contact...

Semi-automatic multiplexing system for automated semiconductor wafe...

Efficient switching architecture with reduced stub lengths

Test apparatus with tester channel availability identification

Programmable devices to route signals on probe cards

UNIVERSAL TEST FIXTURE

Test method for electronic modules using movable test contactors