using temporal phase variation

Industry

CPC
G01B9/0201

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/0201using temporal phase variation

Industries

Patents Grantslast 30 patents

Information Patent Grant
High-resolution handheld OCT imaging system
- Patent number 12,298,133
- Issue date May 13, 2025
- Shuixing Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Identifying desirable T lymphocytes by change in mass responses
- Patent number 12,287,325
- Issue date Apr 29, 2025
- The Regents of the University of California
- Michael A. Teitell
- G01 - MEASURING TESTING
Information Patent Grant
Compact dual pass interferometer for a plane mirror interferometer
- Patent number 12,270,644
- Issue date Apr 8, 2025
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G02 - OPTICS
Information Patent Grant
Bidirectional Littrow two-degree-of-freedom grating interference me...
- Patent number 12,241,739
- Issue date Mar 4, 2025
- Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of...
- Wenhao Li
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and media for multiple beam optical coherence tom...
- Patent number 12,222,202
- Issue date Feb 11, 2025
- The General Hospital Corporation
- Benjamin Vakoc
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement apparatus, measuring method using the same, and...
- Patent number 12,215,974
- Issue date Feb 4, 2025
- Samsung Electronics Co., Ltd.
- Seung Woo Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for analog in situ laser process monitoring
- Patent number 12,209,860
- Issue date Jan 28, 2025
- UNIVERSITAET BAYREUTH
- Georg Herink
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Methods and apparatus for an adjustable beam directing optical system
- Patent number 12,203,751
- Issue date Jan 21, 2025
- UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
- Brett F. Bathel
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement system
- Patent number 12,196,550
- Issue date Jan 14, 2025
- National Cheng Kung University
- Chien-Sheng Liu
- G01 - MEASURING TESTING
Information Patent Grant
Quantum network devices, systems, and methods
- Patent number 12,184,769
- Issue date Dec 31, 2024
- The Research Foundation for the State University of New York
- Eden Figueroa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Composite measurement system for measuring nanometer displacement
- Patent number 12,174,017
- Issue date Dec 24, 2024
- National Institute of Metrology, China
- Yushu Shi
- G01 - MEASURING TESTING
Information Patent Grant
Frequency control of orthogonal polarisation modes in an optical ca...
- Patent number 12,174,015
- Issue date Dec 24, 2024
- The University of Birmingham
- Kai Bongs
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring a substrate and method for correcting cyclic e...
- Patent number 12,135,211
- Issue date Nov 5, 2024
- Carl Zeiss SMT GmbH
- Stephan Zschaeck
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Detector that detects relative positions of marks while blocking no...
- Patent number 12,098,913
- Issue date Sep 24, 2024
- Canon Kabushiki Kaisha
- Takamitsu Komaki
- G01 - MEASURING TESTING
Information Patent Grant
Multi-frequency hybrid heterodyne laser tracker system based on sin...
- Patent number 12,055,391
- Issue date Aug 6, 2024
- Harbin Institute of Technology
- Hongxing Yang
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring material processing using imaging signal density determi...
- Patent number 12,053,835
- Issue date Aug 6, 2024
- IPG Photonics Corporation
- Christopher M. Galbraith
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Tomography convergence-type oral scanner
- Patent number 12,011,336
- Issue date Jun 18, 2024
- HUVITS CO., LTD.
- Hyo Sang Jeong
- G01 - MEASURING TESTING
Information Patent Grant
Variable synthetic wavelength absolute distance measuring device lo...
- Patent number 12,007,250
- Issue date Jun 11, 2024
- Zhejiang Sci-Tech University
- Liping Yan
- G01 - MEASURING TESTING
Information Patent Grant
Polarization-separated, phase-shifted interferometer
- Patent number 12,000,698
- Issue date Jun 4, 2024
- Massachusetts Institute of Technology
- Noah Gilbert
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and optical instrument with integrated optical compo...
- Patent number 11,933,609
- Issue date Mar 19, 2024
- Yokogawa Electric Corporation
- Nobuhide Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for determining the position of a target stru...
- Patent number 11,927,891
- Issue date Mar 12, 2024
- ASML Netherlands B.V.
- Nitesh Pandey
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for characterizing the surface shape of an optica...
- Patent number 11,927,500
- Issue date Mar 12, 2024
- Carl Zeiss SMT GmbH
- Steffen Siegler
- G01 - MEASURING TESTING
Information Patent Grant
Light-sheet photonic-force optical coherence elastography
- Patent number 11,920,930
- Issue date Mar 5, 2024
- Cornell University
- Steven G Adie
- G01 - MEASURING TESTING
Information Patent Grant
Locking a self-homodyne mixed beat frequency to an external frequen...
- Patent number 11,914,038
- Issue date Feb 27, 2024
- Aeva, Inc.
- Bryce Bradford
- G01 - MEASURING TESTING
Information Patent Grant
Thickness evaluation method of cell sheet
- Patent number 11,906,301
- Issue date Feb 20, 2024
- SCREEN Holdings Co., Ltd.
- Ryo Hasebe
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measurement system and method using optical signal tran...
- Patent number 11,906,368
- Issue date Feb 20, 2024
- Fluke Corporation
- Mohammad Amin Tadayon
- G01 - MEASURING TESTING
Information Patent Grant
Optical module, signal processing system, and signal processing method
- Patent number 11,898,841
- Issue date Feb 13, 2024
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Active quadrature demodulation for subsampled/circular ranging opti...
- Patent number 11,852,474
- Issue date Dec 26, 2023
- The General Hospital Corporation
- Benjamin J. Vakoc
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical systems with controlled mirror arrangements
- Patent number 11,841,223
- Issue date Dec 12, 2023
- Lockheed Martin Corporation
- Brian James Howley
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne grating interferometric method and system for two-degree...
- Patent number 11,802,757
- Issue date Oct 31, 2023
- Harbin Institute of Technology
- Pengcheng Hu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL DISPLACEMENT SENSOR ARRANGEMENT AND METHOD OF OPERATION
- Publication number 20250172377
- Publication date May 29, 2025
- SensiBel AS
- Hallvard Angelskår
- G01 - MEASURING TESTING
Information Patent Application
DEMODULATION SYSTEM FOR OPTICAL FIBER FABRY-PEROT SENSOR
- Publication number 20250164233
- Publication date May 22, 2025
- BEIJING BYWAVE SENSING TECHNOLOGY CO., LTD.
- Meng QIAO
- G01 - MEASURING TESTING
Information Patent Application
Line-field OCT System with Multi Transverse Mode Laser
- Publication number 20250164234
- Publication date May 22, 2025
- KineoLabs, Inc.
- Yisi Liu
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC METHOD FOR MEASURING OPTICAL DISTANCE
- Publication number 20250123093
- Publication date Apr 17, 2025
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Application
QUANTUM NETWORK DEVICES, SYSTEMS, AND METHODS
- Publication number 20250097021
- Publication date Mar 20, 2025
- The Research Foundation for the State University of New York
- Eden Figueroa
- G01 - MEASURING TESTING
Information Patent Application
Self-Configuration and Error Correction in Linear Photonic Circuits
- Publication number 20250085100
- Publication date Mar 13, 2025
- Massachusetts Institute of Technology
- Ryan HAMERLY
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, METHODS, AND MEDIA FOR MULTIPLE BEAM OPTICAL COHERENCE TOM...
- Publication number 20250067552
- Publication date Feb 27, 2025
- The General Hospital Corporation
- Benjamin Vakoc
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PARALLELISM
- Publication number 20250052559
- Publication date Feb 13, 2025
- Samsung Electronics Co., Ltd.
- Minhwan Seo
- G01 - MEASURING TESTING
Information Patent Application
MACHINE TOOL
- Publication number 20250035435
- Publication date Jan 30, 2025
- Mitsubishi Electric Corporation
- Hiroki GOTO
- G01 - MEASURING TESTING
Information Patent Application
DOUBLE-MIRROR SHEAR INTERFEROMETER
- Publication number 20240418499
- Publication date Dec 19, 2024
- HOCHSCHULE TRIER
- Christopher PETRY
- G01 - MEASURING TESTING
Information Patent Application
Switchable Multi-Configuration OCT
- Publication number 20240344820
- Publication date Oct 17, 2024
- OPTOS PLC
- Bavishna Balagopal
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER APPARATUS
- Publication number 20240318952
- Publication date Sep 26, 2024
- NIREOS S.r.l
- Antonio PERRI
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC DISPLACEMENT MEASUREMENT APPARATUS
- Publication number 20240310158
- Publication date Sep 19, 2024
- Oxford University Innovation Limited
- Armin REICHOLD
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SENSING DEVICE FOR MEASURING DEFORMATION OF A SAMPLE
- Publication number 20240295395
- Publication date Sep 5, 2024
- OPTICS11 B.V.
- Niek RIJNVELD
- G01 - MEASURING TESTING
Information Patent Application
BROADBAND PROFILER SYSTEM AND METHOD FOR CONSTRUCTING A THREE-DIMEN...
- Publication number 20240288261
- Publication date Aug 29, 2024
- AP Infosense Limited
- Kam Chiu LAU
- G01 - MEASURING TESTING
Information Patent Application
HIGH-RESOLUTION HANDHELD OCT IMAGING SYSTEM
- Publication number 20240230315
- Publication date Jul 11, 2024
- THE FIRST AFFILIATED HOSPITAL OF JINAN UNIVERSITY (GUANGZHOU OVERSEAS CHINESE
- Shuixing Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
REFLECTIVE INTERFEROMETER SYSTEMS AND METHODS THEREOF
- Publication number 20240230311
- Publication date Jul 11, 2024
- OptiPro Systems, LLC
- Robert D. NIEDERRITER
- G01 - MEASURING TESTING
Information Patent Application
Pixel-Diversity Nanoparticle Detection by Interferometric Reflectan...
- Publication number 20240201084
- Publication date Jun 20, 2024
- Trustees of Boston University
- M. Selim Ünlü
- G01 - MEASURING TESTING
Information Patent Application
Optical Modulator And Laser Interferometer
- Publication number 20240176157
- Publication date May 30, 2024
- SEIKO EPSON CORPORATION
- Kohei YAMADA
- G02 - OPTICS
Information Patent Application
ACTIVE QUADRATURE DEMODULATION FOR SUBSAMPLED/CIRCULAR RANGING OPTI...
- Publication number 20240151509
- Publication date May 9, 2024
- The General Hospital Corporation
- Benjamin J. Vakoc
- G01 - MEASURING TESTING
Information Patent Application
HIGH-RESOLUTION HANDHELD OCT IMAGING SYSTEM
- Publication number 20240133674
- Publication date Apr 25, 2024
- THE FIRST AFFILIATED HOSPITAL OF JINAN UNIVERSITY (GUANGZHOU OVERSEAS CHINESE
- Shuixing Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
PHOTOLITHOGRAPHY MASK AND PHOTOLITHOGRAPHY SYSTEM COMPRISING SAID P...
- Publication number 20240085776
- Publication date Mar 14, 2024
- TECHNOLOGIES DIGITHO INC.
- Richard BEAUDRY
- G01 - MEASURING TESTING
Information Patent Application
MEASURING INSTRUMENT WITH A SCANNING ABSOLUTE DISTANCE METER
- Publication number 20240077301
- Publication date Mar 7, 2024
- Leica Geosystems AG
- Thomas LÜTHI
- G01 - MEASURING TESTING
Information Patent Application
Methods and Apparatuses for Fabricating Polymeric Conformal Coating...
- Publication number 20240042481
- Publication date Feb 8, 2024
- UCL Business LTD
- Paul Beard
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
OPTICAL MEASUREMENT SYSTEM
- Publication number 20240035801
- Publication date Feb 1, 2024
- National Cheng Kung University
- Chien-Sheng Liu
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR AN ADJUSTABLE BEAM DIRECTING OPTICAL SYSTEM
- Publication number 20240019240
- Publication date Jan 18, 2024
- United States of America as represented by the Administrator of NASA
- Brett F. Bathel
- G01 - MEASURING TESTING
Information Patent Application
COMPACT DUAL PASS INTERFEROMETER FOR A PLANE MIRROR INTERFEROMETER
- Publication number 20240011762
- Publication date Jan 11, 2024
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G01 - MEASURING TESTING
Information Patent Application
THZ SENSOR AND THZ METHOD FOR MEASURING AN OBJECT TO BE MEASURED
- Publication number 20240003676
- Publication date Jan 4, 2024
- CiTEX Holding GmbH
- David WINKING
- G01 - MEASURING TESTING
Information Patent Application
QUANTUM NETWORK DEVICES, SYSTEMS, AND METHODS
- Publication number 20230421367
- Publication date Dec 28, 2023
- The Research Foundation for the State University of New York
- Eden Figueroa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND SYSTEM FOR PUPIL RETRO ILLUMINATION USING SAMPLE ARM OF...
- Publication number 20230414098
- Publication date Dec 28, 2023
- AMO Development, LLC
- Richard J. Copland
- G01 - MEASURING TESTING

using temporal phase variation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

High-resolution handheld OCT imaging system

Identifying desirable T lymphocytes by change in mass responses

Compact dual pass interferometer for a plane mirror interferometer

Bidirectional Littrow two-degree-of-freedom grating interference me...

Systems, methods, and media for multiple beam optical coherence tom...

Optical measurement apparatus, measuring method using the same, and...

Method and device for analog in situ laser process monitoring

Methods and apparatus for an adjustable beam directing optical system

Optical measurement system

Quantum network devices, systems, and methods

Composite measurement system for measuring nanometer displacement

Frequency control of orthogonal polarisation modes in an optical ca...

Device for measuring a substrate and method for correcting cyclic e...

Detector that detects relative positions of marks while blocking no...

Multi-frequency hybrid heterodyne laser tracker system based on sin...

Monitoring material processing using imaging signal density determi...

Tomography convergence-type oral scanner

Variable synthetic wavelength absolute distance measuring device lo...

Polarization-separated, phase-shifted interferometer

Interferometer and optical instrument with integrated optical compo...

Apparatus and methods for determining the position of a target stru...

Method and device for characterizing the surface shape of an optica...

Light-sheet photonic-force optical coherence elastography

Locking a self-homodyne mixed beat frequency to an external frequen...

Thickness evaluation method of cell sheet

Temperature measurement system and method using optical signal tran...

Optical module, signal processing system, and signal processing method

Active quadrature demodulation for subsampled/circular ranging opti...

Optical systems with controlled mirror arrangements

Heterodyne grating interferometric method and system for two-degree...

Patents Applicationslast 30 patents

OPTICAL DISPLACEMENT SENSOR ARRANGEMENT AND METHOD OF OPERATION

DEMODULATION SYSTEM FOR OPTICAL FIBER FABRY-PEROT SENSOR

Line-field OCT System with Multi Transverse Mode Laser

INTERFEROMETRIC METHOD FOR MEASURING OPTICAL DISTANCE

QUANTUM NETWORK DEVICES, SYSTEMS, AND METHODS

Self-Configuration and Error Correction in Linear Photonic Circuits

SYSTEMS, METHODS, AND MEDIA FOR MULTIPLE BEAM OPTICAL COHERENCE TOM...

MEASURING PARALLELISM

MACHINE TOOL

DOUBLE-MIRROR SHEAR INTERFEROMETER

Switchable Multi-Configuration OCT

INTERFEROMETER APPARATUS

INTERFEROMETRIC DISPLACEMENT MEASUREMENT APPARATUS

OPTICAL SENSING DEVICE FOR MEASURING DEFORMATION OF A SAMPLE

BROADBAND PROFILER SYSTEM AND METHOD FOR CONSTRUCTING A THREE-DIMEN...

HIGH-RESOLUTION HANDHELD OCT IMAGING SYSTEM

REFLECTIVE INTERFEROMETER SYSTEMS AND METHODS THEREOF

Pixel-Diversity Nanoparticle Detection by Interferometric Reflectan...

Optical Modulator And Laser Interferometer

ACTIVE QUADRATURE DEMODULATION FOR SUBSAMPLED/CIRCULAR RANGING OPTI...

HIGH-RESOLUTION HANDHELD OCT IMAGING SYSTEM

PHOTOLITHOGRAPHY MASK AND PHOTOLITHOGRAPHY SYSTEM COMPRISING SAID P...

MEASURING INSTRUMENT WITH A SCANNING ABSOLUTE DISTANCE METER

Methods and Apparatuses for Fabricating Polymeric Conformal Coating...

OPTICAL MEASUREMENT SYSTEM

METHODS AND APPARATUS FOR AN ADJUSTABLE BEAM DIRECTING OPTICAL SYSTEM

COMPACT DUAL PASS INTERFEROMETER FOR A PLANE MIRROR INTERFEROMETER

THZ SENSOR AND THZ METHOD FOR MEASURING AN OBJECT TO BE MEASURED

QUANTUM NETWORK DEVICES, SYSTEMS, AND METHODS

METHOD AND SYSTEM FOR PUPIL RETRO ILLUMINATION USING SAMPLE ARM OF...