Membership
Tour
Register
Log in
using temporal phase variation
Follow
Industry
CPC
G01B9/0201
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B9/00
Instruments as specified in the subgroups and characterised by the use of optical measuring means
Current Industry
G01B9/0201
using temporal phase variation
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Interferometer and optical instrument with integrated optical compo...
Patent number
11,933,609
Issue date
Mar 19, 2024
Yokogawa Electric Corporation
Nobuhide Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for determining the position of a target stru...
Patent number
11,927,891
Issue date
Mar 12, 2024
ASML Netherlands B.V.
Nitesh Pandey
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for characterizing the surface shape of an optica...
Patent number
11,927,500
Issue date
Mar 12, 2024
Carl Zeiss SMT GmbH
Steffen Siegler
G01 - MEASURING TESTING
Information
Patent Grant
Light-sheet photonic-force optical coherence elastography
Patent number
11,920,930
Issue date
Mar 5, 2024
Cornell University
Steven G Adie
G01 - MEASURING TESTING
Information
Patent Grant
Locking a self-homodyne mixed beat frequency to an external frequen...
Patent number
11,914,038
Issue date
Feb 27, 2024
Aeva, Inc.
Bryce Bradford
G01 - MEASURING TESTING
Information
Patent Grant
Temperature measurement system and method using optical signal tran...
Patent number
11,906,368
Issue date
Feb 20, 2024
Fluke Corporation
Mohammad Amin Tadayon
G01 - MEASURING TESTING
Information
Patent Grant
Thickness evaluation method of cell sheet
Patent number
11,906,301
Issue date
Feb 20, 2024
SCREEN Holdings Co., Ltd.
Ryo Hasebe
G01 - MEASURING TESTING
Information
Patent Grant
Optical module, signal processing system, and signal processing method
Patent number
11,898,841
Issue date
Feb 13, 2024
Hamamatsu Photonics K.K.
Tomofumi Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Active quadrature demodulation for subsampled/circular ranging opti...
Patent number
11,852,474
Issue date
Dec 26, 2023
The General Hospital Corporation
Benjamin J. Vakoc
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical systems with controlled mirror arrangements
Patent number
11,841,223
Issue date
Dec 12, 2023
Lockheed Martin Corporation
Brian James Howley
G01 - MEASURING TESTING
Information
Patent Grant
Heterodyne grating interferometric method and system for two-degree...
Patent number
11,802,757
Issue date
Oct 31, 2023
Harbin Institute of Technology
Pengcheng Hu
G01 - MEASURING TESTING
Information
Patent Grant
Integrated photonic chip with coherent receiver and variable optica...
Patent number
11,802,759
Issue date
Oct 31, 2023
Eric Swanson
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and apparatus for an adjustable beam directing optical system
Patent number
11,796,306
Issue date
Oct 24, 2023
UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
Brett F. Bathel
G01 - MEASURING TESTING
Information
Patent Grant
Light emitting device, optical detection system, optical detection...
Patent number
11,796,311
Issue date
Oct 24, 2023
SKYVERSE TECHNOLOGY CO., LTD.
Lu Chen
G01 - MEASURING TESTING
Information
Patent Grant
Quantum network devices, systems, and methods
Patent number
11,784,806
Issue date
Oct 10, 2023
The Research Foundation for the State University of New York
Eden Figueroa
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and system for pupil retro illumination using sample arm of...
Patent number
11,751,763
Issue date
Sep 12, 2023
AMO Development, LLC
Richard J. Copland
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Methods and apparatus for decomposition to account for imperfect be...
Patent number
11,747,132
Issue date
Sep 5, 2023
Xanadu Quantum Technologies Inc.
Ish Dhand
G01 - MEASURING TESTING
Information
Patent Grant
Single-laser light source system for cold atom interferometers
Patent number
11,733,028
Issue date
Aug 22, 2023
NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY
Jun Yang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Single pass peak detection in LIDAR sensor data stream
Patent number
11,733,384
Issue date
Aug 22, 2023
Samsung Electronics Co., Ltd.
Lilong Shi
G01 - MEASURING TESTING
Information
Patent Grant
Multiple beam range measurement process
Patent number
11,719,819
Issue date
Aug 8, 2023
DSCG Solutions, Inc.
Richard Sebastian
G01 - MEASURING TESTING
Information
Patent Grant
Overlay metrology using spectroscopic phase
Patent number
11,713,959
Issue date
Aug 1, 2023
KLA Corporation
Andrei V. Shchegrov
G01 - MEASURING TESTING
Information
Patent Grant
Laser interferometry systems and methods
Patent number
11,703,315
Issue date
Jul 18, 2023
Nordson Corporation
Jerome Joseph Dapore
G01 - MEASURING TESTING
Information
Patent Grant
Multi-fiber optical probe and optical coherence tomography system
Patent number
11,701,004
Issue date
Jul 18, 2023
SYNAPTIVE MEDICAL INC.
Siu Wai Jacky Mak
G01 - MEASURING TESTING
Information
Patent Grant
Interferometry with pulse broadened diode laser
Patent number
11,680,787
Issue date
Jun 20, 2023
Carl Zeiss Meditec, Inc.
Alexandre R. Tumlinson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Laser interferometer
Patent number
11,668,555
Issue date
Jun 6, 2023
Seiko Epson Corporation
Kohei Yamada
G02 - OPTICS
Information
Patent Grant
System and method of phase-locked fiber interferometry
Patent number
11,644,301
Issue date
May 9, 2023
National Technology & Engineering Solutions of Sandia, LLC
Aaron Michael Katzenmeyer
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Registration mark, positional deviation detection method and device...
Patent number
11,646,239
Issue date
May 9, 2023
Kioxia Corporation
Sho Kawadahara
G01 - MEASURING TESTING
Information
Patent Grant
Optical interferometry proximity sensor with optical path extender
Patent number
11,629,948
Issue date
Apr 18, 2023
Apple Inc.
Nathan Shou
G01 - MEASURING TESTING
Information
Patent Grant
Method of characterizing, calibrating, and controlling galvanometer...
Patent number
11,624,812
Issue date
Apr 11, 2023
James MacMillan
G01 - MEASURING TESTING
Information
Patent Grant
Position measurement system, interferometer system and lithographic...
Patent number
11,619,886
Issue date
Apr 4, 2023
ASML Netherlands B.V.
Johannes Mathias Theodorus Antonius Adriaens
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ACTIVE QUADRATURE DEMODULATION FOR SUBSAMPLED/CIRCULAR RANGING OPTI...
Publication number
20240151509
Publication date
May 9, 2024
The General Hospital Corporation
Benjamin J. Vakoc
G01 - MEASURING TESTING
Information
Patent Application
HIGH-RESOLUTION HANDHELD OCT IMAGING SYSTEM
Publication number
20240133674
Publication date
Apr 25, 2024
THE FIRST AFFILIATED HOSPITAL OF JINAN UNIVERSITY (GUANGZHOU OVERSEAS CHINESE
Shuixing Zhang
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
PHOTOLITHOGRAPHY MASK AND PHOTOLITHOGRAPHY SYSTEM COMPRISING SAID P...
Publication number
20240085776
Publication date
Mar 14, 2024
TECHNOLOGIES DIGITHO INC.
Richard BEAUDRY
G01 - MEASURING TESTING
Information
Patent Application
MEASURING INSTRUMENT WITH A SCANNING ABSOLUTE DISTANCE METER
Publication number
20240077301
Publication date
Mar 7, 2024
Leica Geosystems AG
Thomas LÜTHI
G01 - MEASURING TESTING
Information
Patent Application
Methods and Apparatuses for Fabricating Polymeric Conformal Coating...
Publication number
20240042481
Publication date
Feb 8, 2024
UCL Business LTD
Paul Beard
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
OPTICAL MEASUREMENT SYSTEM
Publication number
20240035801
Publication date
Feb 1, 2024
National Cheng Kung University
Chien-Sheng Liu
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR AN ADJUSTABLE BEAM DIRECTING OPTICAL SYSTEM
Publication number
20240019240
Publication date
Jan 18, 2024
United States of America as represented by the Administrator of NASA
Brett F. Bathel
G01 - MEASURING TESTING
Information
Patent Application
COMPACT DUAL PASS INTERFEROMETER FOR A PLANE MIRROR INTERFEROMETER
Publication number
20240011762
Publication date
Jan 11, 2024
ASML NETHERLANDS B.V.
Maarten Jozef JANSEN
G01 - MEASURING TESTING
Information
Patent Application
THZ SENSOR AND THZ METHOD FOR MEASURING AN OBJECT TO BE MEASURED
Publication number
20240003676
Publication date
Jan 4, 2024
CiTEX Holding GmbH
David WINKING
G01 - MEASURING TESTING
Information
Patent Application
QUANTUM NETWORK DEVICES, SYSTEMS, AND METHODS
Publication number
20230421367
Publication date
Dec 28, 2023
The Research Foundation for the State University of New York
Eden Figueroa
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
METHOD AND SYSTEM FOR PUPIL RETRO ILLUMINATION USING SAMPLE ARM OF...
Publication number
20230414098
Publication date
Dec 28, 2023
AMO Development, LLC
Richard J. Copland
G01 - MEASURING TESTING
Information
Patent Application
CHROMATIC CONFOCAL MEASURING DEVICE
Publication number
20230417533
Publication date
Dec 28, 2023
PRECITEC OPTRONIK GMBH
Christoph Dietz
G01 - MEASURING TESTING
Information
Patent Application
LASER PROCESSING SYSTEM HAVING OPTICAL DIFFRACTION TOMOGRAPHY FUNCTION
Publication number
20230356324
Publication date
Nov 9, 2023
INNOFOCUS PHOTONICS TECHNOLOGY PTY LTD
Baohua JIA
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
MEASUREMENT METHOD AND MEASUREMENT APPARATUS FOR MEASURING THICKNES...
Publication number
20230349688
Publication date
Nov 2, 2023
SANTEC CORPORATION
Hiroyuki ITOH
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS, METHODS, AND MEDIA FOR MULTIPLE BEAM OPTICAL COHERENCE TOM...
Publication number
20230341222
Publication date
Oct 26, 2023
The General Hospital Corporation
Benjamin Vakoc
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL INTERFEROMETRIC RANGE SENSOR
Publication number
20230314122
Publication date
Oct 5, 2023
Omron Corporation
Masayuki HAYAKAWA
G02 - OPTICS
Information
Patent Application
SOUND MEASUREMENT METHOD
Publication number
20230288247
Publication date
Sep 14, 2023
Nippon Telegraph and Telephone Corporation
Kenji ISHIKAWA
G01 - MEASURING TESTING
Information
Patent Application
FREQUENCY CONTROL OF ORTHOGONAL POLARISATION MODES IN AN OPTICAL CA...
Publication number
20230288183
Publication date
Sep 14, 2023
The University of Birmingham
Kai BONGS
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL INTERFERENCE RANGE SENSOR
Publication number
20230288185
Publication date
Sep 14, 2023
Omron Corporation
Yusuke NAGASAKI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL COMPLEX AMPLITUDE MEASUREMENT DEVICE AND OPTICAL COMPLEX AM...
Publication number
20230288182
Publication date
Sep 14, 2023
Nippon Telegraph and Telephone Corporation
Hiroki SAKUMA
G01 - MEASURING TESTING
Information
Patent Application
Optical Coherence Tomography With Self-Inspecting Imaging Device
Publication number
20230280153
Publication date
Sep 7, 2023
LightLab Imaging, Inc.
Steven M. Stromski
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SYSTEMS WITH CONTROLLED MIRROR ARRANGEMENTS
Publication number
20230266116
Publication date
Aug 24, 2023
Lockheed Martin Corporation
Brian James HOWLEY
G01 - MEASURING TESTING
Information
Patent Application
SINE-COSINE OPTICAL FREQUENCY DETECTION DEVICES FOR PHOTONICS INTEG...
Publication number
20230236295
Publication date
Jul 27, 2023
Xiaotian Steve Yao
G01 - MEASURING TESTING
Information
Patent Application
SINGLE-LASER LIGHT SOURCE SYSTEM FOR COLD ATOM INTERFEROMETERS
Publication number
20230228555
Publication date
Jul 20, 2023
NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY
Jun YANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPTICAL MEASUREMENT APPARATUS, MEASURING METHOD USING THE SAME, AND...
Publication number
20230184535
Publication date
Jun 15, 2023
Samsung Electronics Co., Ltd.
Seung Woo LEE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS FOR COLLIMATING ATOMIC BEAM, ATOMIC INTERFEROMETER, AND A...
Publication number
20230160683
Publication date
May 25, 2023
Japan Aviation Electronics Industry, Limited
Mikio KOZUMA
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
INTERFEROMETER WITH A LOOPED OR STRAIGHT OPTICAL FIBRE
Publication number
20230160697
Publication date
May 25, 2023
IXBLUE
Eric DUCLOUX
G01 - MEASURING TESTING
Information
Patent Application
Polarization-Separated, Phase-Shifted Interferometer
Publication number
20230160682
Publication date
May 25, 2023
Massachusetts Institute of Technology
Noah GILBERT
G01 - MEASURING TESTING
Information
Patent Application
Laser Interferometer
Publication number
20230095129
Publication date
Mar 30, 2023
SEIKO EPSON CORPORATION
Takeshi Shimizu
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL INTERFERENCE RANGE SENSOR
Publication number
20230090501
Publication date
Mar 23, 2023
Omron Corporation
Yusuke NAGASAKI
G01 - MEASURING TESTING