using temporal polarization variation

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

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G01B9/02011using temporal polarization variation

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Patents Grantslast 30 patents

Information Patent Grant
Detector that detects relative positions of marks while blocking no...
- Patent number 12,098,913
- Issue date Sep 24, 2024
- Canon Kabushiki Kaisha
- Takamitsu Komaki
- G01 - MEASURING TESTING
Information Patent Grant
Multi-frequency hybrid heterodyne laser tracker system based on sin...
- Patent number 12,055,391
- Issue date Aug 6, 2024
- Harbin Institute of Technology
- Hongxing Yang
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and optical instrument with integrated optical compo...
- Patent number 11,933,609
- Issue date Mar 19, 2024
- Yokogawa Electric Corporation
- Nobuhide Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for characterizing the surface shape of an optica...
- Patent number 11,927,500
- Issue date Mar 12, 2024
- Carl Zeiss SMT GmbH
- Steffen Siegler
- G01 - MEASURING TESTING
Information Patent Grant
Integrated photonic chip with coherent receiver and variable optica...
- Patent number 11,802,759
- Issue date Oct 31, 2023
- Eric Swanson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for measuring the thickness and refractive ind...
- Patent number 11,466,978
- Issue date Oct 11, 2022
- KOREA RESEARCH INSTITUTE OF STANDARD AND SCIENCE
- Young-sik Ghim
- G01 - MEASURING TESTING
Information Patent Grant
Polarization enhanced interferometric imaging
- Patent number 11,428,626
- Issue date Aug 30, 2022
- Trustees of Boston University
- M. Selim Ünlü
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring complex degree of coherence of random optical...
- Patent number 11,366,017
- Issue date Jun 21, 2022
- Soochow University
- Yahong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Polarization holographic microscope system and sample image acquisi...
- Patent number 11,365,961
- Issue date Jun 21, 2022
- Korea University Research and Business Foundation
- Youngwoon Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for characterizing the surface shape of an optica...
- Patent number 11,326,872
- Issue date May 10, 2022
- Carl Zeiss SMT GmbH
- Steffen Siegler
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for deriving a topography of an object surface
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- Issue date Feb 15, 2022
- QSO Interferometer Systems AB
- Lars Baath
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Two-dimensional second harmonic dispersion interferometer
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- Issue date Jan 11, 2022
- Frank Joseph Wessel
- G01 - MEASURING TESTING
Information Patent Grant
Ellipsometer and inspection device for semiconductor device
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- Issue date Dec 7, 2021
- Samsung Electronics Co., Ltd.
- Yasuhiro Hidaka
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Information Patent Grant
Method and apparatus for super-resolution optical metrology
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- Issue date Nov 30, 2021
- University of Southampton
- Nikolay Ivanovich Zheludev
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Information Patent Grant
Optical refraction barometer
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- GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
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- G01 - MEASURING TESTING
Information Patent Grant
Partial coherence range sensor pen connected to the source/detector...
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- Issue date Sep 14, 2021
- QUALITY VISION INTERNATIONAL INC.
- David B. Kay
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional measurement device
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- Issue date Jul 6, 2021
- CKD Corporation
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Grant
System and method for cutting a flap using polarization sensitive o...
- Patent number 11,007,080
- Issue date May 18, 2021
- Alcon Inc.
- Muhammad Al-Qaisi
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer with pixelated phase shift mask
- Patent number 10,830,709
- Issue date Nov 10, 2020
- Onto Innovation Inc.
- Nigel P. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Optical image measurement apparatus and optical image measurement m...
- Patent number 10,746,528
- Issue date Aug 18, 2020
- Hitachi-LG Data Storage, Inc.
- Kentaro Osawa
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional measurement device
- Patent number 10,704,888
- Issue date Jul 7, 2020
- CKD Corporation
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Grant
Optical coherence tomography system using polarization switching
- Patent number 10,677,580
- Issue date Jun 9, 2020
- Santec Corporation
- Changho Chong
- G01 - MEASURING TESTING
Information Patent Grant
Coherent optical imaging for detecting neural signatures and medica...
- Patent number 10,667,692
- Issue date Jun 2, 2020
- The Johns Hopkins University
- David W. Blodgett
- G01 - MEASURING TESTING
Information Patent Grant
Dual beam optical coherence tomography with simultaneous orthogonal...
- Patent number 10,641,601
- Issue date May 5, 2020
- Korea University Research and Business Foundation
- Beop-Min Kim
- G01 - MEASURING TESTING
Information Patent Grant
Polarization sensitive optical coherence tomography using multiple...
- Patent number 10,591,275
- Issue date Mar 17, 2020
- Case Western Reserve University
- Hui Wang
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Polarization enhanced interferometric imaging
- Patent number 10,488,328
- Issue date Nov 26, 2019
- Trustees of Boston University
- M. Selim Ünlü
- G01 - MEASURING TESTING
Information Patent Grant
Polarization sensitive optical coherence tomography using multiple...
- Patent number 10,480,924
- Issue date Nov 19, 2019
- Case Western Reserve University
- Hui Wang
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Inspecting a slab of material
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- Issue date Nov 19, 2019
- APPLEJACK 199 L.P.
- Wojciech Jan Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Displacement detecting device with controlled heat generation
- Patent number 10,451,401
- Issue date Oct 22, 2019
- DMG MORI CO., LTD.
- Hideaki Tamiya
- G01 - MEASURING TESTING
Information Patent Grant
Optical system, optical device, and program
- Patent number 10,422,624
- Issue date Sep 24, 2019
- Mitutoyo Corporation
- Shimpei Matsuura
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
DOUBLE-MIRROR SHEAR INTERFEROMETER
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- Publication date Dec 19, 2024
- HOCHSCHULE TRIER
- Christopher PETRY
- G01 - MEASURING TESTING
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INTERFEROMETER APPARATUS
- Publication number 20240318952
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- NIREOS S.r.l
- Antonio PERRI
- G01 - MEASURING TESTING
Information Patent Application
Pixel-Diversity Nanoparticle Detection by Interferometric Reflectan...
- Publication number 20240201084
- Publication date Jun 20, 2024
- Trustees of Boston University
- M. Selim Ünlü
- G01 - MEASURING TESTING
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LASER PROCESSING SYSTEM HAVING OPTICAL DIFFRACTION TOMOGRAPHY FUNCTION
- Publication number 20230356324
- Publication date Nov 9, 2023
- INNOFOCUS PHOTONICS TECHNOLOGY PTY LTD
- Baohua JIA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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SYSTEMS, METHODS, AND MEDIA FOR MULTIPLE BEAM OPTICAL COHERENCE TOM...
- Publication number 20230341222
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- The General Hospital Corporation
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OPTICAL COMPLEX AMPLITUDE MEASUREMENT DEVICE AND OPTICAL COMPLEX AM...
- Publication number 20230288182
- Publication date Sep 14, 2023
- Nippon Telegraph and Telephone Corporation
- Hiroki SAKUMA
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OPTICAL MEASUREMENT APPARATUS, MEASURING METHOD USING THE SAME, AND...
- Publication number 20230184535
- Publication date Jun 15, 2023
- Samsung Electronics Co., Ltd.
- Seung Woo LEE
- H01 - BASIC ELECTRIC ELEMENTS
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MULTI-FREQUENCY HYBRID HETERODYNE LASER TRACKER SYSTEM BASED ON SIN...
- Publication number 20230061358
- Publication date Mar 2, 2023
- HARBIN INSTITUTE OF TECHNOLOGY
- Hongxing YANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICA...
- Publication number 20220236139
- Publication date Jul 28, 2022
- Carl Zeiss SMT GMBH
- Steffen SIEGLER
- G01 - MEASURING TESTING
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INTERFEROMETER AND OPTICAL INSTRUMENT
- Publication number 20220196381
- Publication date Jun 23, 2022
- YOKOGAWA ELECTRIC CORPORATION
- Nobuhide Yamada
- G01 - MEASURING TESTING
Information Patent Application
Two-Dimensional Second Harmonic Dispersion Interferometer
- Publication number 20220091032
- Publication date Mar 24, 2022
- Frank Joseph Wessel
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, SYSTEMS, AND METHODS FOR DETECTING LIGHT
- Publication number 20220026193
- Publication date Jan 27, 2022
- Nokia Technologies Oy
- Xin YUAN
- G01 - MEASURING TESTING
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DETECTOR, IMPRINT APPARATUS, AND METHOD OF MANUFACTURING ARTICLE
- Publication number 20210372776
- Publication date Dec 2, 2021
- Canon Kabushiki Kaisha
- Takamitsu Komaki
- G01 - MEASURING TESTING
Information Patent Application
Integrated Photonic Chip with Coherent Receiver and Variable Optica...
- Publication number 20210356249
- Publication date Nov 18, 2021
- Eric SWANSON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POLARIZATION HOLOGRAPHIC MICROSCOPE SYSTEM AND SAMPLE IMAGE ACQUISI...
- Publication number 20210199417
- Publication date Jul 1, 2021
- Korea University Research and Business Foundation
- Youngwoon CHOI
- G02 - OPTICS
Information Patent Application
ELLIPSOMETER AND INSPECTION DEVICE FOR SEMICONDUCTOR DEVICE
- Publication number 20210156790
- Publication date May 27, 2021
- Samsung Electronics Co., Ltd.
- Yasuhiro HIDAKA
- G01 - MEASURING TESTING
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METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICA...
- Publication number 20210140762
- Publication date May 13, 2021
- Carl Zeiss SMT GMBH
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- G01 - MEASURING TESTING
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METHOD AND APPARATUS FOR SUPER-RESOLUTION OPTICAL METROLOGY
- Publication number 20210140755
- Publication date May 13, 2021
- UNIVERSITY OF SOUTHAMPTON
- Nikolay Ivanovich ZHELUDEV
- G01 - MEASURING TESTING
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OPTICAL REFRACTION BAROMETER
- Publication number 20200355606
- Publication date Nov 12, 2020
- Government of the United States of America, as Represented by the Secretary o...
- Kevin O'Connell Douglass
- G01 - MEASURING TESTING
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PARTIAL COHERENCE RANGE SENSOR PEN CONNECTED TO THE SOURCE/DETECTOR...
- Publication number 20200240766
- Publication date Jul 30, 2020
- Quality Vision International Inc.
- David B. Kay
- G01 - MEASURING TESTING
Information Patent Application
INSPECTING A SLAB OF MATERIAL
- Publication number 20200191550
- Publication date Jun 18, 2020
- Applejack 199 L.P.
- Wojciech Jan WALECKI
- G01 - MEASURING TESTING
Information Patent Application
POLARIZATION ENHANCED INTERFEROMETRIC IMAGING
- Publication number 20200150028
- Publication date May 14, 2020
- Trustees of Boston University
- M. Selim ÜNLÜ
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER WITH PIXELATED PHASE SHIFT MASK
- Publication number 20200103355
- Publication date Apr 2, 2020
- ONTO INNOVATON INC.
- Nigel P. SMITH
- H01 - BASIC ELECTRIC ELEMENTS
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SYSTEM AND A METHOD FOR DETECTING A MATERIAL IN REGION OF INTEREST
- Publication number 20200043161
- Publication date Feb 6, 2020
- THE UNIVERSITY OF WESTERN AUSTRALIA
- Abraham J. Cense
- G06 - COMPUTING CALCULATING COUNTING
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THREE-DIMENSIONAL MEASUREMENT DEVICE
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- Publication date Jul 18, 2019
- CKD CORPORATION
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- G01 - MEASURING TESTING
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POSITION MEASUREMENT SYSTEM, CALIBRATION METHOD, LITHOGRAPHIC APPAR...
- Publication number 20190137890
- Publication date May 9, 2019
- Teunis Jan IKKINK
- G01 - MEASURING TESTING
Information Patent Application
INSPECTING A SLAB OF MATERIAL
- Publication number 20190086191
- Publication date Mar 21, 2019
- Applejack 199 L.P.
- Wojciech Jan WALECKI
- G01 - MEASURING TESTING
Information Patent Application
DUAL BEAM OPTICAL COHERENCE TOMOGRAPHY WITH SIMULTANEOUS ORTHOGONAL...
- Publication number 20190078872
- Publication date Mar 14, 2019
- Korea University Research and Business Foundation
- Beop-Min KIM
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM, OPTICAL DEVICE, AND PROGRAM
- Publication number 20190041187
- Publication date Feb 7, 2019
- MITUTOYO CORPORATION
- Shimpei MATSUURA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTING A SLAB OF MATERIAL
- Publication number 20190025041
- Publication date Jan 24, 2019
- Applejack 199 L.P.
- WOJCIECH JAN WALECKI
- G01 - MEASURING TESTING

using temporal polarization variation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Detector that detects relative positions of marks while blocking no...

Multi-frequency hybrid heterodyne laser tracker system based on sin...

Interferometer and optical instrument with integrated optical compo...

Method and device for characterizing the surface shape of an optica...

Integrated photonic chip with coherent receiver and variable optica...

Apparatus and method for measuring the thickness and refractive ind...

Polarization enhanced interferometric imaging

Method for measuring complex degree of coherence of random optical...

Polarization holographic microscope system and sample image acquisi...

Method and device for characterizing the surface shape of an optica...

Method and apparatus for deriving a topography of an object surface

Two-dimensional second harmonic dispersion interferometer

Ellipsometer and inspection device for semiconductor device

Method and apparatus for super-resolution optical metrology

Optical refraction barometer

Partial coherence range sensor pen connected to the source/detector...

Three-dimensional measurement device

System and method for cutting a flap using polarization sensitive o...

Interferometer with pixelated phase shift mask

Optical image measurement apparatus and optical image measurement m...

Three-dimensional measurement device

Optical coherence tomography system using polarization switching

Coherent optical imaging for detecting neural signatures and medica...

Dual beam optical coherence tomography with simultaneous orthogonal...

Polarization sensitive optical coherence tomography using multiple...

Polarization enhanced interferometric imaging

Polarization sensitive optical coherence tomography using multiple...

Inspecting a slab of material

Displacement detecting device with controlled heat generation

Optical system, optical device, and program

Patents Applicationslast 30 patents

DOUBLE-MIRROR SHEAR INTERFEROMETER

INTERFEROMETER APPARATUS

Pixel-Diversity Nanoparticle Detection by Interferometric Reflectan...

LASER PROCESSING SYSTEM HAVING OPTICAL DIFFRACTION TOMOGRAPHY FUNCTION

SYSTEMS, METHODS, AND MEDIA FOR MULTIPLE BEAM OPTICAL COHERENCE TOM...

OPTICAL COMPLEX AMPLITUDE MEASUREMENT DEVICE AND OPTICAL COMPLEX AM...

OPTICAL MEASUREMENT APPARATUS, MEASURING METHOD USING THE SAME, AND...

MULTI-FREQUENCY HYBRID HETERODYNE LASER TRACKER SYSTEM BASED ON SIN...

METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICA...

INTERFEROMETER AND OPTICAL INSTRUMENT

Two-Dimensional Second Harmonic Dispersion Interferometer

APPARATUS, SYSTEMS, AND METHODS FOR DETECTING LIGHT

DETECTOR, IMPRINT APPARATUS, AND METHOD OF MANUFACTURING ARTICLE

Integrated Photonic Chip with Coherent Receiver and Variable Optica...

POLARIZATION HOLOGRAPHIC MICROSCOPE SYSTEM AND SAMPLE IMAGE ACQUISI...

ELLIPSOMETER AND INSPECTION DEVICE FOR SEMICONDUCTOR DEVICE

METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICA...

METHOD AND APPARATUS FOR SUPER-RESOLUTION OPTICAL METROLOGY

OPTICAL REFRACTION BAROMETER

PARTIAL COHERENCE RANGE SENSOR PEN CONNECTED TO THE SOURCE/DETECTOR...

INSPECTING A SLAB OF MATERIAL

POLARIZATION ENHANCED INTERFEROMETRIC IMAGING

INTERFEROMETER WITH PIXELATED PHASE SHIFT MASK

SYSTEM AND A METHOD FOR DETECTING A MATERIAL IN REGION OF INTEREST

THREE-DIMENSIONAL MEASUREMENT DEVICE

POSITION MEASUREMENT SYSTEM, CALIBRATION METHOD, LITHOGRAPHIC APPAR...

INSPECTING A SLAB OF MATERIAL

DUAL BEAM OPTICAL COHERENCE TOMOGRAPHY WITH SIMULTANEOUS ORTHOGONAL...

OPTICAL SYSTEM, OPTICAL DEVICE, AND PROGRAM

INSPECTING A SLAB OF MATERIAL