Vertical Hall-effect devices

Industry

CPC
G01R33/077

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R33/00Arrangements or instruments for measuring magnetic variables

Current Industry

G01R33/077Vertical Hall-effect devices

Industries

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 12,156,480
- Issue date Nov 26, 2024
- ABLIC Inc.
- Takaaki Hioka
- G01 - MEASURING TESTING
Information Patent Grant
Method for the detection of cable spacing in green tire
- Patent number 12,117,290
- Issue date Oct 15, 2024
- Compagnie Generale des Etablissements Michelin
- Ben Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Hall integrated circuit and corresponding method of manufacturing o...
- Patent number 12,048,166
- Issue date Jul 23, 2024
- LFOUNDRY S.R.L.
- Carsten Schmidt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with CMOS process based hall sensor and manufa...
- Patent number 12,035,637
- Issue date Jul 9, 2024
- SK keyfoundry Inc.
- Jungmun Jung
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic-field sensor arrangement and method of calibrating a magne...
- Patent number 11,977,132
- Issue date May 7, 2024
- Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.
- Markus Stahl-Offergeld
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for providing bias current to hall sensor
- Patent number 11,914,170
- Issue date Feb 27, 2024
- SAMSUNG ELECTRO-MECHANICS CO., LTD.
- Yo Sub Moon
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Traffic classification arrangement for detection of metal tires tread
- Patent number 11,915,461
- Issue date Feb 27, 2024
- Jose Humberto Cancela Bravo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hall element and electronic component
- Patent number 11,895,929
- Issue date Feb 6, 2024
- Rohm Co., Ltd.
- Tetsuya Kitade
- G01 - MEASURING TESTING
Information Patent Grant
Reduced area magnetic field sensor topology
- Patent number 11,892,524
- Issue date Feb 6, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Ezequiel Rubinsztain
- G01 - MEASURING TESTING
Information Patent Grant
Tapered magnet
- Patent number 11,874,140
- Issue date Jan 16, 2024
- Infineon Technologies AG
- Udo Ausserlechner
- G01 - MEASURING TESTING
Information Patent Grant
Stray-field-immune magnetic field sensor arrangement, magnetic torq...
- Patent number 11,852,555
- Issue date Dec 26, 2023
- Melexis Technologies SA
- Javier Bilbao De Mendizabal
- G01 - MEASURING TESTING
Information Patent Grant
High-temperature three-dimensional hall sensor with real-time worki...
- Patent number 11,828,820
- Issue date Nov 28, 2023
- Dalian University of Technology
- Huolin Huang
- G01 - MEASURING TESTING
Information Patent Grant
On-chip current sensor
- Patent number 11,821,924
- Issue date Nov 21, 2023
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Eng Huat Toh
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for reducing an offset component of a plurality of vertical...
- Patent number 11,802,922
- Issue date Oct 31, 2023
- ALLEGRO MICROSYSTEMS, LLC
- Bruno Luis Uberti
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor devices, systems and methods with error detection
- Patent number 11,789,092
- Issue date Oct 17, 2023
- Melexis Technologies SA
- Zsombor Lazar
- G01 - MEASURING TESTING
Information Patent Grant
Hall sensor with dielectric isolation and p-n junction isolation
- Patent number 11,782,102
- Issue date Oct 10, 2023
- Texas Instruments Incorporated
- Keith Ryan Green
- G01 - MEASURING TESTING
Information Patent Grant
Transistor devices and methods for producing transistor devices
- Patent number 11,774,523
- Issue date Oct 3, 2023
- Infineon Technologies AG
- Stephan Leisenheimer
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field sensor and methods of fabricating a magnetic field s...
- Patent number 11,762,042
- Issue date Sep 19, 2023
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Ping Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Angle sensor with a single die using a single target
- Patent number 11,719,527
- Issue date Aug 8, 2023
- ALLEGRO MICROSYSTEMS, LLC
- Rémy Lassalle-Balier
- G01 - MEASURING TESTING
Information Patent Grant
Frequency detection on sensor integrated circuits
- Patent number 11,686,783
- Issue date Jun 27, 2023
- ALLEGRO MICROSYSTEMS, LLC
- Jan Palascak
- G01 - MEASURING TESTING
Information Patent Grant
Electromechanical sensor and a method of sensing an object or a tac...
- Patent number 11,668,554
- Issue date Jun 6, 2023
- City University of Hong Kong
- Yajing Shen
- G01 - MEASURING TESTING
Information Patent Grant
Hall sensor with hall elements measuring magnetic field components...
- Patent number 11,662,400
- Issue date May 30, 2023
- Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Philip Beran
- G01 - MEASURING TESTING
Information Patent Grant
Electronic circuit having vertical hall elements arranged on a subs...
- Patent number 11,555,868
- Issue date Jan 17, 2023
- ALLEGRO MICROSYSTEMS, LLC
- Hernán D. Romero
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Signal compenstation system configured to measure and counteract as...
- Patent number 11,550,004
- Issue date Jan 10, 2023
- Infineon Technologies AG
- Udo Ausserlechner
- G01 - MEASURING TESTING
Information Patent Grant
Digital phase tracking filter for position sensing
- Patent number 11,536,587
- Issue date Dec 27, 2022
- Melexis Technologies SA
- Eric Sachse
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device
- Patent number 11,536,783
- Issue date Dec 27, 2022
- ABLIC INC.
- Takaaki Hioka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 11,482,665
- Issue date Oct 25, 2022
- ABLIC INC.
- Yohei Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensor test system
- Patent number 11,460,520
- Issue date Oct 4, 2022
- ADV ANTEST Corporation
- Kazunari Suga
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field sensor with stacked transducers and capacitive summi...
- Patent number 11,408,945
- Issue date Aug 9, 2022
- ALLEGRO MICROSYSTEMS, LLC
- Craig S. Petrie
- G01 - MEASURING TESTING
Information Patent Grant
Integrated hall sensor device and method for measuring a magnetic f...
- Patent number 11,391,558
- Issue date Jul 19, 2022
- Infineon Technologies AG
- Udo Ausserlechner
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
THREE-AXIS HALL ANGLE SENSOR WITH ACCURACY OF 0.3°
- Publication number 20240410961
- Publication date Dec 12, 2024
- University of Electronic Science and Technology of China
- Hua FAN
- G01 - MEASURING TESTING
Information Patent Application
HALL SENSOR WITH MAGNETIC FLUX CONCENTRATOR
- Publication number 20240329164
- Publication date Oct 3, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Dok Won Lee
- G01 - MEASURING TESTING
Information Patent Application
DUAL CHANNEL MAGNETIC FIELD SENSOR
- Publication number 20240248155
- Publication date Jul 25, 2024
- INFINEON TECHNOLOGIES AG
- Gernot BINDER
- G01 - MEASURING TESTING
Information Patent Application
DUAL CURRENT MAGNETIC FIELD SENSOR
- Publication number 20240230796
- Publication date Jul 11, 2024
- INFINEON TECHNOLOGIES AG
- Stephan LEISENHEIMER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Hall Sensor Using Face Down Structure with Through Substrate Vias
- Publication number 20240210497
- Publication date Jun 27, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Daiki Komatsu
- G01 - MEASURING TESTING
Information Patent Application
DUAL CURRENT MAGNETIC FIELD SENSOR
- Publication number 20240133981
- Publication date Apr 25, 2024
- INFINEON TECHNOLOGIES AG
- Stephan LEISENHEIMER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HALL EFFECT DEVICE WITH TRENCH ABOUT A MICRON OR GREATER IN DEPTH
- Publication number 20230413687
- Publication date Dec 21, 2023
- ALLEGRO MICROSYSTEMS, LLC
- Thomas S. Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20230403950
- Publication date Dec 14, 2023
- Rohm Co., Ltd.
- Yushi Sekiguchi
- G01 - MEASURING TESTING
Information Patent Application
THREE-AXIS HALL MAGNETOMETER
- Publication number 20230366956
- Publication date Nov 16, 2023
- SHANGHAI ORIENT-CHIP TECHNOLOGY CO., LTD
- Jie LUO
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP CURRENT SENSOR
- Publication number 20230280378
- Publication date Sep 7, 2023
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Eng Huat TOH
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE DETECTION OF CABLE SPACING IN GREEN TIRE
- Publication number 20230152078
- Publication date May 18, 2023
- COMPAGNIE GENERALE DES ETABLISSEMENTS MICHELIN
- Ben JOHNSON
- G01 - MEASURING TESTING
Information Patent Application
ANGLE SENSOR WITH A SINGLE DIE USING A SINGLE TARGET
- Publication number 20230134025
- Publication date May 4, 2023
- ALLEGRO MICROSYSTEMS, LLC
- Rémy Lassalle-Balier
- G01 - MEASURING TESTING
Information Patent Application
HALL SENSOR WITH DIELECTRIC ISOLATION AND P-N JUNCTION ISOLATION
- Publication number 20230129179
- Publication date Apr 27, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Keith Ryan Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Stray Field Immune Angle Sensor
- Publication number 20230062642
- Publication date Mar 2, 2023
- ALLEGRO MICROSYSTEMS, LLC
- Hernan D. Romero
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20230026157
- Publication date Jan 26, 2023
- ABLIC Inc.
- Takaaki HIOKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIGNAL COMPENSATION SYSTEM CONFIGURED TO MEASURE AND COUNTERACT ASY...
- Publication number 20230003814
- Publication date Jan 5, 2023
- INFINEON TECHNOLOGIES AG
- Udo Ausserlechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-TEMPERATURE THREE-DIMENSIONAL HALL SENSOR WITH REAL-TIME WORKI...
- Publication number 20220413068
- Publication date Dec 29, 2022
- DALIAN UNIVERSITY OF TECHNOLOGY
- Huolin HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC SENSOR DEVICES, SYSTEMS AND METHODS WITH ERROR DETECTION
- Publication number 20220404438
- Publication date Dec 22, 2022
- Melexis Technologies SA
- Zsombor LAZAR
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE WITH CMOS PROCESS BASED HALL SENSOR AND MANUFA...
- Publication number 20220344581
- Publication date Oct 27, 2022
- KEY FOUNDRY CO., LTD.
- Jungmun JUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC CIRCUIT HAVING VERTICAL HALL ELEMENTS ARRANGED ON A SUBS...
- Publication number 20220342010
- Publication date Oct 27, 2022
- ALLEGRO MICROSYSTEMS, LLC
- Hernán D. Romero
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Traffic Classification Arrangement for Detection of Metal Tires Tread
- Publication number 20220319313
- Publication date Oct 6, 2022
- Tecnovia S.A.
- Jose Humberto Cancela Bravo
- G08 - SIGNALLING
Information Patent Application
HALL INTEGRATED SENSOR AND CORRESPONDING MANUFACTURING PROCESS
- Publication number 20220246840
- Publication date Aug 4, 2022
- LFOUNDRY S.R.L.
- Carsten Schmidt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Circuit For Reducing An Offset Component Of A Plurality Of Vertical...
- Publication number 20220221533
- Publication date Jul 14, 2022
- ALLEGRO MICROSYSTEMS, LLC
- Bruno Luis Uberti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC FIELD SENSOR AND METHODS OF FABRICATING A MAGNETIC FIELD S...
- Publication number 20220171001
- Publication date Jun 2, 2022
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Ping ZHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC FIELD SENSOR WITH STACKED TRANSDUCERS AND CAPACITIVE SUMMI...
- Publication number 20220155387
- Publication date May 19, 2022
- ALLEGRO MICROSYSTEMS, LLC
- Craig S. Petrie
- G01 - MEASURING TESTING
Information Patent Application
TRANSISTOR DEVICES AND METHODS FOR PRODUCING TRANSISTOR DEVICES
- Publication number 20220146603
- Publication date May 12, 2022
- INFINEON TECHNOLOGIES AG
- Stephan LEISENHEIMER
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD SENSOR WITH AN ADJUSTABLE THRESHOLD FOR STRAY FIELD...
- Publication number 20220107369
- Publication date Apr 7, 2022
- ALLEGRO MICROSYSTEMS, LLC
- Florian Kulla
- G01 - MEASURING TESTING
Information Patent Application
HALL SENSOR
- Publication number 20220043079
- Publication date Feb 10, 2022
- Fraunhofer-Gesellschaft zur foerderung der Angewandten Forschung e.V.
- Philip BERAN
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC-FIELD SENSOR ARRANGEMENT AND METHOD OF CALIBRATING A MAGNE...
- Publication number 20220034977
- Publication date Feb 3, 2022
- Fraunhofer Gesellschaft zur Forderung der angewandten Forschung e.V.
- Markus STAHL-OFFERGELD
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY DETECTION ON SENSOR INTEGRATED CIRCUITS
- Publication number 20220034976
- Publication date Feb 3, 2022
- ALLEGRO MICROSYSTEMS, LLC
- Jan Palascak
- G01 - MEASURING TESTING

Vertical Hall-effect devices

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Semiconductor device and manufacturing method thereof

Method for the detection of cable spacing in green tire

Hall integrated circuit and corresponding method of manufacturing o...

Semiconductor device with CMOS process based hall sensor and manufa...

Magnetic-field sensor arrangement and method of calibrating a magne...

Apparatus for providing bias current to hall sensor

Traffic classification arrangement for detection of metal tires tread

Hall element and electronic component

Reduced area magnetic field sensor topology

Tapered magnet

Stray-field-immune magnetic field sensor arrangement, magnetic torq...

High-temperature three-dimensional hall sensor with real-time worki...

On-chip current sensor

Circuit for reducing an offset component of a plurality of vertical...

Magnetic sensor devices, systems and methods with error detection

Hall sensor with dielectric isolation and p-n junction isolation

Transistor devices and methods for producing transistor devices

Magnetic field sensor and methods of fabricating a magnetic field s...

Angle sensor with a single die using a single target

Frequency detection on sensor integrated circuits

Electromechanical sensor and a method of sensing an object or a tac...

Hall sensor with hall elements measuring magnetic field components...

Electronic circuit having vertical hall elements arranged on a subs...

Signal compenstation system configured to measure and counteract as...

Digital phase tracking filter for position sensing

Semiconductor device

Semiconductor device

Sensor test system

Magnetic field sensor with stacked transducers and capacitive summi...

Integrated hall sensor device and method for measuring a magnetic f...

Patents Applicationslast 30 patents

THREE-AXIS HALL ANGLE SENSOR WITH ACCURACY OF 0.3°

HALL SENSOR WITH MAGNETIC FLUX CONCENTRATOR

DUAL CHANNEL MAGNETIC FIELD SENSOR

DUAL CURRENT MAGNETIC FIELD SENSOR

Hall Sensor Using Face Down Structure with Through Substrate Vias

DUAL CURRENT MAGNETIC FIELD SENSOR

HALL EFFECT DEVICE WITH TRENCH ABOUT A MICRON OR GREATER IN DEPTH

SEMICONDUCTOR DEVICE

THREE-AXIS HALL MAGNETOMETER

ON-CHIP CURRENT SENSOR

METHOD FOR THE DETECTION OF CABLE SPACING IN GREEN TIRE

ANGLE SENSOR WITH A SINGLE DIE USING A SINGLE TARGET

HALL SENSOR WITH DIELECTRIC ISOLATION AND P-N JUNCTION ISOLATION

Stray Field Immune Angle Sensor

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

SIGNAL COMPENSATION SYSTEM CONFIGURED TO MEASURE AND COUNTERACT ASY...

HIGH-TEMPERATURE THREE-DIMENSIONAL HALL SENSOR WITH REAL-TIME WORKI...

MAGNETIC SENSOR DEVICES, SYSTEMS AND METHODS WITH ERROR DETECTION

SEMICONDUCTOR DEVICE WITH CMOS PROCESS BASED HALL SENSOR AND MANUFA...

ELECTRONIC CIRCUIT HAVING VERTICAL HALL ELEMENTS ARRANGED ON A SUBS...

Traffic Classification Arrangement for Detection of Metal Tires Tread

HALL INTEGRATED SENSOR AND CORRESPONDING MANUFACTURING PROCESS

Circuit For Reducing An Offset Component Of A Plurality Of Vertical...

MAGNETIC FIELD SENSOR AND METHODS OF FABRICATING A MAGNETIC FIELD S...

MAGNETIC FIELD SENSOR WITH STACKED TRANSDUCERS AND CAPACITIVE SUMMI...

TRANSISTOR DEVICES AND METHODS FOR PRODUCING TRANSISTOR DEVICES

MAGNETIC FIELD SENSOR WITH AN ADJUSTABLE THRESHOLD FOR STRAY FIELD...

HALL SENSOR

MAGNETIC-FIELD SENSOR ARRANGEMENT AND METHOD OF CALIBRATING A MAGNE...

FREQUENCY DETECTION ON SENSOR INTEGRATED CIRCUITS