voids

Industry

CPC
G01N2223/648

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/648voids

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Performance evaluation method for elastic material
- Patent number 12,203,904
- Issue date Jan 21, 2025
- Sumitomo Rubber Industries, Ltd.
- Ryo Mashita
- G01 - MEASURING TESTING
Information Patent Grant
Inspection position identification method, three-dimensional image...
- Patent number 11,835,475
- Issue date Dec 5, 2023
- Saki Corporation
- Takuma Hirayama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection position identification method, three-dimensional image...
- Patent number 11,422,099
- Issue date Aug 23, 2022
- Saki Corporation
- Takuma Hirayama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for calculating a recording trajectory
- Patent number 11,016,041
- Issue date May 25, 2021
- Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Richard Schielein
- G01 - MEASURING TESTING
Information Patent Grant
Method and system using x-ray pinhole camera for in-situ monitoring...
- Patent number 10,502,701
- Issue date Dec 10, 2019
- General Electric Company
- Vladimir Anatolievich Lobastov
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
X-ray sidescatter inspection of laminates
- Patent number 10,393,680
- Issue date Aug 27, 2019
- The Boeing Company
- Nathan R. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Void evaluation apparatus and void evaluation method in the solder
- Patent number 9,965,849
- Issue date May 8, 2018
- Osaka University
- Takashi Suzuki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray diffraction method of mapping grain structures in a crystalli...
- Patent number 9,222,900
- Issue date Dec 29, 2015
- Danmarks Tekniske Universitet of Anker Engelundsvej
- Erik Mejdal Lauridsen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction method of mapping grain structures in a crystalli...
- Patent number 9,222,901
- Issue date Dec 29, 2015
- Danmarks Tekniske Universitet Anker Engelundsvej
- Erik Mejdal Lauridsen
- G01 - MEASURING TESTING
Information Patent Grant
Detection of voids in semiconductor wafer processing
- Patent number 6,351,516
- Issue date Feb 26, 2002
- Jordan Valley Applied Radiation Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION POSITION IDENTIFICATION METHOD, THREE-DIMENSIONAL IMAGE...
- Publication number 20220291147
- Publication date Sep 15, 2022
- SAKI CORPORATION
- Takuma HIRAYAMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM USING X-RAY PINHOLE CAMERA FOR IN-SITU MONITORING...
- Publication number 20190302043
- Publication date Oct 3, 2019
- GENERAL ELECTRIC COMPANY
- Vladimir Anatolievich Lobastov
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
APPARATUS AND METHOD FOR CALCULATING A RECORDING TRAJECTORY
- Publication number 20190170667
- Publication date Jun 6, 2019
- FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG e.V.
- Richard SCHIELEIN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SIDESCATTER INSPECTION OF LAMINATES
- Publication number 20180202949
- Publication date Jul 19, 2018
- The Boeing Company
- Nathan R. Smith
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...
- Publication number 20140307854
- Publication date Oct 16, 2014
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Erik Mejdal LAURIDSEN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...
- Publication number 20140254763
- Publication date Sep 11, 2014
- DANMARKS TEKNISKE UNIVERSITET
- Erik Mejdal LAURIDSEN
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Performance evaluation method for elastic material

Inspection position identification method, three-dimensional image...

Inspection position identification method, three-dimensional image...

Apparatus and method for calculating a recording trajectory

Method and system using x-ray pinhole camera for in-situ monitoring...

X-ray sidescatter inspection of laminates

Void evaluation apparatus and void evaluation method in the solder

X-ray diffraction method of mapping grain structures in a crystalli...

X-ray diffraction method of mapping grain structures in a crystalli...

Detection of voids in semiconductor wafer processing

Patents Applicationslast 30 patents

INSPECTION POSITION IDENTIFICATION METHOD, THREE-DIMENSIONAL IMAGE...

METHOD AND SYSTEM USING X-RAY PINHOLE CAMERA FOR IN-SITU MONITORING...

APPARATUS AND METHOD FOR CALCULATING A RECORDING TRAJECTORY

X-RAY SIDESCATTER INSPECTION OF LAMINATES

X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...

X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...