Wafer Test

Industry

CPC
G01R31/318511

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/318511Wafer Test

Industries

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor substrate yield prediction based on spectra data from...
- Patent number 12,111,355
- Issue date Oct 8, 2024
- Onto Innovation Inc.
- Xin Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Random characteristic evaluation of subject maps
- Patent number 12,107,019
- Issue date Oct 1, 2024
- Kabushiki Kaisha Toshiba
- Shun Hirao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built in self-test of heterogeneous integrated radio frequency chip...
- Patent number 12,099,092
- Issue date Sep 24, 2024
- PseudolithIC, Inc.
- James Buckwalter
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for wafer-level photonic testing
- Patent number 12,014,962
- Issue date Jun 18, 2024
- Ayar Labs, Inc.
- Roy Edward Meade
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer processing method and apparatus, storage medium and electroni...
- Patent number 11,995,543
- Issue date May 28, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xiaodong Pan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for determining parameters in on-wafer calibration piece model
- Patent number 11,971,451
- Issue date Apr 30, 2024
- THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
- Aihua Wu
- G01 - MEASURING TESTING
Information Patent Grant
Built in self-test of heterogeneous integrated radio frequency chip...
- Patent number 11,940,495
- Issue date Mar 26, 2024
- PseudolithIC, Inc.
- James Buckwalter
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level methods of testing semiconductor devices using internal...
- Patent number 11,867,751
- Issue date Jan 9, 2024
- Samsung Electronics Co., Ltd.
- Ahn Choi
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for detecting defects on an electronic assembly
- Patent number 11,852,684
- Issue date Dec 26, 2023
- Optimal Plus Ltd.
- Leonid Gurov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer inspection method and inspection apparatus
- Patent number 11,841,381
- Issue date Dec 12, 2023
- CHROMA ATE INC.
- Tsun-I Wang
- G01 - MEASURING TESTING
Information Patent Grant
Techniques for wafer level die testing using sacrificial structures
- Patent number 11,788,929
- Issue date Oct 17, 2023
- Aeva, Inc.
- Brett E. Huff
- G02 - OPTICS
Information Patent Grant
Wafer scale testing using a 2 signal JTAG interface
- Patent number 11,782,091
- Issue date Oct 10, 2023
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for identifying latent reliability defects in sem...
- Patent number 11,754,625
- Issue date Sep 12, 2023
- KLA Corporation
- David W. Price
- G01 - MEASURING TESTING
Information Patent Grant
Compact opto-electric probe
- Patent number 11,747,363
- Issue date Sep 5, 2023
- OpenLight Photonics, Inc.
- Molly Piels
- G01 - MEASURING TESTING
Information Patent Grant
Built in self-test of heterogeneous integrated radio frequency chip...
- Patent number 11,733,297
- Issue date Aug 22, 2023
- PseudolithIC, Inc.
- James Buckwaiter
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for wafer-level photonic testing
- Patent number 11,694,935
- Issue date Jul 4, 2023
- Ayar Labs, Inc.
- Roy Edward Meade
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer scale active thermal interposer for device testing
- Patent number 11,674,999
- Issue date Jun 13, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Compliant wafer probe assembly
- Patent number 11,675,010
- Issue date Jun 13, 2023
- International Business Machines Corporation
- David Michael Audette
- G01 - MEASURING TESTING
Information Patent Grant
Wafer testing and structures for wafer testing
- Patent number 11,650,249
- Issue date May 16, 2023
- Xilinx, Inc.
- Yan Wang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for detecting defects on an electronic assembly
- Patent number 11,650,250
- Issue date May 16, 2023
- Optimal Plus Ltd.
- Leonid Gurov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testkey and testing system which reduce leakage current
- Patent number 11,614,486
- Issue date Mar 28, 2023
- United Microelectronics Corp.
- Po-Wei Tsou
- G01 - MEASURING TESTING
Information Patent Grant
Test system and probe device
- Patent number 11,598,807
- Issue date Mar 7, 2023
- Kioxia Corporation
- Masayuki Oishi
- G01 - MEASURING TESTING
Information Patent Grant
Crack detection integrity check
- Patent number 11,585,847
- Issue date Feb 21, 2023
- STMicroelectronics Pte Ltd
- Pedro Jr Santos Peralta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer scale testing using a 2 signal JTAG interface
- Patent number 11,561,258
- Issue date Jan 24, 2023
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing probe system for testing semiconductor die, multi-channel d...
- Patent number 11,555,828
- Issue date Jan 17, 2023
- Micron Technology, Inc.
- Vikrant Upadhyaya
- G01 - MEASURING TESTING
Information Patent Grant
In-wafer reliability testing
- Patent number 11,543,453
- Issue date Jan 3, 2023
- Texas Instruments Incorporated
- Yogesh Kumar Ramadass
- G01 - MEASURING TESTING
Information Patent Grant
Sensor defect diagnostic circuit
- Patent number 11,500,020
- Issue date Nov 15, 2022
- Melexis Bulgaria Ltd
- Rumen Marinov Peev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer level methods of testing semiconductor devices using internal...
- Patent number 11,435,397
- Issue date Sep 6, 2022
- Samsung Electronics Co., Ltd.
- Ahn Choi
- G01 - MEASURING TESTING
Information Patent Grant
Method for controlling test apparatus and test apparatus
- Patent number 11,385,286
- Issue date Jul 12, 2022
- Tokyo Electron Limited
- Tomoya Endo
- G01 - MEASURING TESTING
Information Patent Grant
Crack detection integrity check
- Patent number 11,366,156
- Issue date Jun 21, 2022
- STMicroelectronics Pte Ltd
- Pedro Jr Santos Peralta
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
BUILT IN SELF-TEST OF HETEROGENEOUS INTEGRATED RADIO FREQUENCY CHIP...
- Publication number 20240329136
- Publication date Oct 3, 2024
- PseudolithIC, Inc.
- James Buckwalter
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR PERFORMING DIE-LEVEL ELECTRICAL PARAMETER...
- Publication number 20240019491
- Publication date Jan 18, 2024
- MEDIATEK INC.
- Jia-Horng Shieh
- G01 - MEASURING TESTING
Information Patent Application
WAFER LEVEL METHODS OF TESTING SEMICONDUCTOR DEVICES USING INTERNAL...
- Publication number 20240012045
- Publication date Jan 11, 2024
- Samsung Electronics Co., Ltd.
- Ahn Choi
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Wafer-Level Photonic Testing
- Publication number 20230343655
- Publication date Oct 26, 2023
- Ayar Labs, Inc.
- Roy Edward Meade
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR DETECTING DEFECTS ON AN ELECTRONIC ASSEMBLY
- Publication number 20230236245
- Publication date Jul 27, 2023
- Optimal Plus Ltd.
- Leonid Gurov
- G01 - MEASURING TESTING
Information Patent Application
WAFER CHIP TESTING METHOD AND APPARATUS, ELECTRONIC DEVICE AND STOR...
- Publication number 20230204664
- Publication date Jun 29, 2023
- Saimeite Technology Co., Ltd.
- Gangjiang LI
- G01 - MEASURING TESTING
Information Patent Application
COMPLIANT WAFER PROBE ASSEMBLY
- Publication number 20230168301
- Publication date Jun 1, 2023
- International Business Machines Corporation
- David Michael Audette
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR SUBSTRATE YIELD PREDICTION BASED ON SPECTRA DATA FRO...
- Publication number 20230160960
- Publication date May 25, 2023
- Onto Innovation
- Xin Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER SCALE TESTING USING A 2 SIGNAL JTAG INTERFACE
- Publication number 20230160959
- Publication date May 25, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Stacked Integrated Circuit Device
- Publication number 20230116320
- Publication date Apr 13, 2023
- Graphcore Limited
- Stephen FELIX
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20230105201
- Publication date Apr 6, 2023
- CHROMA ATE INC.
- TSUN-I WANG
- G01 - MEASURING TESTING
Information Patent Application
TESTKEY AND TESTING SYSTEM WHICH REDUCE LEAKAGE CURRENT
- Publication number 20230020783
- Publication date Jan 19, 2023
- UNITED MICROELECTRONICS CORP.
- Po-Wei Tsou
- G01 - MEASURING TESTING
Information Patent Application
WAFER LEVEL METHODS OF TESTING SEMICONDUCTOR DEVICES USING INTERNAL...
- Publication number 20220357393
- Publication date Nov 10, 2022
- Samsung Electronics Co., Ltd.
- Ahn Choi
- G01 - MEASURING TESTING
Information Patent Application
CRACK DETECTION INTEGRITY CHECK
- Publication number 20220291277
- Publication date Sep 15, 2022
- STMicroelectronics Pte Ltd
- Pedro Jr Santos PERALTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTING
- Publication number 20220276301
- Publication date Sep 1, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTING
- Publication number 20220155364
- Publication date May 19, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
WAFER SCALE TESTING USING A 2 SIGNAL JTAG INTERFACE
- Publication number 20220113351
- Publication date Apr 14, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPACT OPTO-ELECTRIC PROBE
- Publication number 20220107341
- Publication date Apr 7, 2022
- Juniper Networks, Inc.
- Molly Piels
- G01 - MEASURING TESTING
Information Patent Application
Method for Determining Parameters in On-Wafer Calibration Piece Model
- Publication number 20220099736
- Publication date Mar 31, 2022
- THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
- Aihua Wu
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND PROBE DEVICE
- Publication number 20220082622
- Publication date Mar 17, 2022
- KIOXIA Corporation
- Masayuki OISHI
- G01 - MEASURING TESTING
Information Patent Application
TESTING PROBE SYSTEM FOR TESTING SEMICONDUCTOR DIE, MULTI-CHANNEL D...
- Publication number 20220011344
- Publication date Jan 13, 2022
- Micron Technology, Inc.
- Vikrant Upadhyaya
- G01 - MEASURING TESTING
Information Patent Application
Photonic Wafer Level Testing Systems, Devices, and Methods of Opera...
- Publication number 20210270699
- Publication date Sep 2, 2021
- STMicroelectronics S.r.l.
- Marco Piazza
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR IDENTIFYING LATENT RELIABILITY DEFECTS IN SEM...
- Publication number 20210239757
- Publication date Aug 5, 2021
- David W. Price
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROCESSING METHOD AND APPARATUS, STORAGE MEDIUM AND ELECTRONI...
- Publication number 20210209749
- Publication date Jul 8, 2021
- Changxin Memory Technologies, Inc.
- Xiaodong PAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING APPARATUS AND INFORMATION PROCESSING METHOD
- Publication number 20210210393
- Publication date Jul 8, 2021
- KABUSHIKI KAISHA TOSHIBA
- Shun Hirao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPACT OPTO-ELECTRIC PROBE
- Publication number 20210199691
- Publication date Jul 1, 2021
- Juniper Networks, Inc.
- Molly Piels
- G01 - MEASURING TESTING
Information Patent Application
Fail Density-Based Clustering for Yield Loss Detection
- Publication number 20210181253
- Publication date Jun 17, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Istvan Bauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER SCALE TESTING USING A 2 SIGNAL JTAG INTERFACE
- Publication number 20210088584
- Publication date Mar 25, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CONTROLLING TEST APPARATUS AND TEST APPARATUS
- Publication number 20210088588
- Publication date Mar 25, 2021
- TOKYO ELECTRON LIMITED
- Tomoya ENDO
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR DETECTING DEFECTS ON AN ELECTRONIC ASSEMBLY
- Publication number 20210041501
- Publication date Feb 11, 2021
- Optimal Plus Ltd.
- Leonid GUROV
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Semiconductor substrate yield prediction based on spectra data from...

Random characteristic evaluation of subject maps

Built in self-test of heterogeneous integrated radio frequency chip...

Systems and methods for wafer-level photonic testing

Wafer processing method and apparatus, storage medium and electroni...

Method for determining parameters in on-wafer calibration piece model

Built in self-test of heterogeneous integrated radio frequency chip...

Wafer level methods of testing semiconductor devices using internal...

Methods and systems for detecting defects on an electronic assembly

Wafer inspection method and inspection apparatus

Techniques for wafer level die testing using sacrificial structures

Wafer scale testing using a 2 signal JTAG interface

System and method for identifying latent reliability defects in sem...

Compact opto-electric probe

Built in self-test of heterogeneous integrated radio frequency chip...

Systems and methods for wafer-level photonic testing

Wafer scale active thermal interposer for device testing

Compliant wafer probe assembly

Wafer testing and structures for wafer testing

Methods and systems for detecting defects on an electronic assembly

Testkey and testing system which reduce leakage current

Test system and probe device

Crack detection integrity check

Wafer scale testing using a 2 signal JTAG interface

Testing probe system for testing semiconductor die, multi-channel d...

In-wafer reliability testing

Sensor defect diagnostic circuit

Wafer level methods of testing semiconductor devices using internal...

Method for controlling test apparatus and test apparatus

Crack detection integrity check

Patents Applicationslast 30 patents

BUILT IN SELF-TEST OF HETEROGENEOUS INTEGRATED RADIO FREQUENCY CHIP...

METHOD AND APPARATUS FOR PERFORMING DIE-LEVEL ELECTRICAL PARAMETER...

WAFER LEVEL METHODS OF TESTING SEMICONDUCTOR DEVICES USING INTERNAL...

Systems and Methods for Wafer-Level Photonic Testing

METHODS AND SYSTEMS FOR DETECTING DEFECTS ON AN ELECTRONIC ASSEMBLY

WAFER CHIP TESTING METHOD AND APPARATUS, ELECTRONIC DEVICE AND STOR...

COMPLIANT WAFER PROBE ASSEMBLY

SEMICONDUCTOR SUBSTRATE YIELD PREDICTION BASED ON SPECTRA DATA FRO...

WAFER SCALE TESTING USING A 2 SIGNAL JTAG INTERFACE

Stacked Integrated Circuit Device

WAFER INSPECTION METHOD AND INSPECTION APPARATUS

TESTKEY AND TESTING SYSTEM WHICH REDUCE LEAKAGE CURRENT

WAFER LEVEL METHODS OF TESTING SEMICONDUCTOR DEVICES USING INTERNAL...

CRACK DETECTION INTEGRITY CHECK

WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTING

WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTING

WAFER SCALE TESTING USING A 2 SIGNAL JTAG INTERFACE

COMPACT OPTO-ELECTRIC PROBE

Method for Determining Parameters in On-Wafer Calibration Piece Model

TEST SYSTEM AND PROBE DEVICE

TESTING PROBE SYSTEM FOR TESTING SEMICONDUCTOR DIE, MULTI-CHANNEL D...

Photonic Wafer Level Testing Systems, Devices, and Methods of Opera...

SYSTEM AND METHOD FOR IDENTIFYING LATENT RELIABILITY DEFECTS IN SEM...

WAFER PROCESSING METHOD AND APPARATUS, STORAGE MEDIUM AND ELECTRONI...

INFORMATION PROCESSING APPARATUS AND INFORMATION PROCESSING METHOD

COMPACT OPTO-ELECTRIC PROBE

Fail Density-Based Clustering for Yield Loss Detection

WAFER SCALE TESTING USING A 2 SIGNAL JTAG INTERFACE

METHOD FOR CONTROLLING TEST APPARATUS AND TEST APPARATUS

METHODS AND SYSTEMS FOR DETECTING DEFECTS ON AN ELECTRONIC ASSEMBLY