Membership
Tour
Register
Log in
Wavefront phase distribution
Follow
Industry
CPC
G01J2009/002
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
Current Industry
G01J2009/002
Wavefront phase distribution
Industries
Overview
Organizations
People
Information
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Wavefront curvature sensor involving temporal sampling of the image...
Patent number
12,146,796
Issue date
Nov 19, 2024
WOOPTIX S.L.
Sergio Bonaque González
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
On-chip wavefront sensor, optical chip, and communication device
Patent number
12,068,778
Issue date
Aug 20, 2024
PENG CHENG LABORATORY
Shupeng Deng
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Wavefront sensor and method of reconstructing distorted wavefronts
Patent number
11,874,178
Issue date
Jan 16, 2024
King Abdullah University of Science and Technology
Congli Wang
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
System, method and apparatus for high speed non-mechanical atmosphe...
Patent number
11,835,839
Issue date
Dec 5, 2023
EXCITING TECHNOLOGY LLC
Paul F. McManamon
G02 - OPTICS
Information
Patent Grant
Wavefront sensor and associated metrology apparatus
Patent number
11,815,402
Issue date
Nov 14, 2023
ASML Netherlands B.V.
Sietse Thijmen Van Der Post
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Sensor and measurement apparatus for wavefront of light from optica...
Patent number
11,513,344
Issue date
Nov 29, 2022
Canon Kabushiki Kaisha
Tomohiro Sugimoto
G01 - MEASURING TESTING
Information
Patent Grant
Adaptive optics system and optical device
Patent number
11,422,363
Issue date
Aug 23, 2022
Inter-University Research Institute Corporation National Institutes of Natura...
Masayuki Hattori
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Methods and apparatus for predicting performance of a measurement m...
Patent number
11,391,677
Issue date
Jul 19, 2022
ASML Netherlands B.V.
Stefan Michiel Witte
G01 - MEASURING TESTING
Information
Patent Grant
Method for high-accuracy wavefront measurement base on grating shea...
Patent number
11,340,118
Issue date
May 24, 2022
Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
Yunjun Lu
G01 - MEASURING TESTING
Information
Patent Grant
Wavefront sensor and method of using it
Patent number
11,293,806
Issue date
Apr 5, 2022
PXE COMPUTATIONAL IMAGIMG LTD
Yoav Berlatzky
G01 - MEASURING TESTING
Information
Patent Grant
Virtual image display apparatus, and method for reducing in real ti...
Patent number
11,294,174
Issue date
Apr 5, 2022
BOE Technology Group Co., Ltd.
Yanjun Chen
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Adaptive optical system and adaptive optical method comprising a co...
Patent number
11,163,150
Issue date
Nov 2, 2021
Mitsubishi Heavy Industries, Ltd.
Masashi Iwashimizu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wavefront sensor and method of reconstructing distorted wavefronts
Patent number
11,073,427
Issue date
Jul 27, 2021
King Abdullah University of Science and Technology
Congli Wang
G01 - MEASURING TESTING
Information
Patent Grant
Wavefront measurement device and wavefront measurement system
Patent number
11,067,477
Issue date
Jul 20, 2021
Mitsubishi Electric Corporation
Masataka Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
RGB wavefront sensor for turbulence mitigation
Patent number
11,054,637
Issue date
Jul 6, 2021
Mission Support and Test Services, LLC
Mary D. O'Neill
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and device for analysing an electromagnetic wave in high def...
Patent number
11,029,214
Issue date
Jun 8, 2021
PHASICS
Benoît Wattellier
G01 - MEASURING TESTING
Information
Patent Grant
Method and optical system for acquiring the tomographical distribut...
Patent number
11,015,981
Issue date
May 25, 2021
Wooptix S.L.
Juan José Fernández Valdivia
G01 - MEASURING TESTING
Information
Patent Grant
Device for testing optical properties and method for testing optica...
Patent number
10,823,892
Issue date
Nov 3, 2020
LG Chem, Ltd.
Min Yeong Jo
G01 - MEASURING TESTING
Information
Patent Grant
Arrangement and method for wavefront analysis
Patent number
10,746,606
Issue date
Aug 18, 2020
Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
Peter Hartmann
G01 - MEASURING TESTING
Information
Patent Grant
Free space optical communication system, apparatus and a method the...
Patent number
10,673,525
Issue date
Jun 2, 2020
THE SECRETARY, DEPARTMENT OF ELECTRONICS AND INFORMATION TECHNOLOGY
Bosanta Ranjan Boruah
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for predicting performance of a measurement m...
Patent number
10,648,919
Issue date
May 12, 2020
ASML Netherlands B.V.
Stefan Michiel Witte
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Rapid image correction method for a simplified adaptive optical system
Patent number
10,628,927
Issue date
Apr 21, 2020
Christian-Albrechts-Universitaet Zu Kiel
Claudius Zelenka
G01 - MEASURING TESTING
Information
Patent Grant
Optical system phase acquisition method and optical system evaluati...
Patent number
10,378,963
Issue date
Aug 13, 2019
Ushio Denki Kabushiki Kaisha
Masashi Okamoto
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and apparatus for wavefront sensing
Patent number
10,371,580
Issue date
Aug 6, 2019
Ram Photonics, LLC
Seung-Whan Bahk
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Adaptive optics system and optical device
Patent number
10,254,538
Issue date
Apr 9, 2019
Inter-University Research Institute Corporation National Institutes of Natura...
Masayuki Hattori
G01 - MEASURING TESTING
Information
Patent Grant
Wavefront sensor and method for determining differences in piston a...
Patent number
10,175,115
Issue date
Jan 8, 2019
ONERA (OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES)
Cindy Bellanger
G01 - MEASURING TESTING
Information
Patent Grant
Aero-wave instrument for the measurement of the optical wave-front...
Patent number
10,057,468
Issue date
Aug 21, 2018
The Boeing Company
Bryan Lee Kelchner
F41 - WEAPONS
Information
Patent Grant
Full characterization wavefront sensor
Patent number
9,976,911
Issue date
May 22, 2018
Beam Engineering for Advanced Measurements Co.
Nelson V. Tabirian
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for wavefront sensing
Patent number
9,921,111
Issue date
Mar 20, 2018
Ram Photonics, LLC
Seung-Whan Bahk
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Correction of rotational inaccuracy in lateral shearing interferometry
Patent number
9,863,814
Issue date
Jan 9, 2018
Korea Research Institute of Standards and Science
Hyug-Gyo Rhee
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
WAVEFRONT MEASUREMENT DEVICE AND WAVEFRONT MEASUREMENT METHOD
Publication number
20240418575
Publication date
Dec 19, 2024
Hamamatsu Photonics K.K.
Kazuki KAWAI
G01 - MEASURING TESTING
Information
Patent Application
TELESCOPE AND SPACECRAFT SYSTEM
Publication number
20240402478
Publication date
Dec 5, 2024
Canon Denshi Kabushiki Kaisha
Satoshi Kozu
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Application
METALENS ARRAY AND WAVEFRONT SENSOR SYSTEM
Publication number
20240319016
Publication date
Sep 26, 2024
SHENZHEN METALENX TECHNOLOGY CO.,LTD
Chenglong HAO
G01 - MEASURING TESTING
Information
Patent Application
On-Chip Wavefront Sensor, Optical Chip, and Communication Device
Publication number
20240039628
Publication date
Feb 1, 2024
PENG CHENG LABORATORY
Shupeng Deng
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
RECONSTRUCTION OF A WAVEFRONT OF A LIGHT BEAM CONTAINING OPTICAL VO...
Publication number
20230296444
Publication date
Sep 21, 2023
UNIVERSITÉ PARIS CITÉ
Marc GUILLON
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM, METHOD AND APPARATUS FOR HIGH SPEED NON-MECHANICAL ATMOSPHE...
Publication number
20230259000
Publication date
Aug 17, 2023
Exciting Technology LLC
Paul F. McManamon
G02 - OPTICS
Information
Patent Application
METHOD AND OPTICAL SYSTEM FOR CHARACTERIZING DISPLAYS
Publication number
20230152162
Publication date
May 18, 2023
Wooptix S.L.
David CARMONA BALLESTER
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
AMPLIFIED LASER DEVICE USING A MEMS MMA HAVING TIP, TILT AND PISTON...
Publication number
20230069658
Publication date
Mar 2, 2023
Raytheon Company
Gerald P. Uyeno
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS AND METHOD FOR QUALIFYING LIGHT SOURCES FOR USE IN OPTICA...
Publication number
20220404210
Publication date
Dec 22, 2022
ZyConn Corporation
Weiyao ZOU
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
WAVEFRONT SENSOR AND ASSOCIATED METROLOGY APPARATUS
Publication number
20220099498
Publication date
Mar 31, 2022
ASML NETHERLANDS B.V.
Sietse Thijmen VAN DER POST
G02 - OPTICS
Information
Patent Application
METHOD FOR HIGH-ACCURACY WAVEFRONT MEASUREMENT BASE ON GRATING SHEA...
Publication number
20220074793
Publication date
Mar 10, 2022
Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
Yunjun LU
G01 - MEASURING TESTING
Information
Patent Application
VIRTUAL IMAGE DISPLAY APPARATUS, AND METHOD FOR REDUCING IN REAL TI...
Publication number
20210325670
Publication date
Oct 21, 2021
BOE TECHNOLOGY GROUP CO., LTD.
Yanjun Chen
B60 - VEHICLES IN GENERAL
Information
Patent Application
WAVEFRONT SENSOR AND METHOD OF RECONSTRUCTING DISTORTED WAVEFRONTS
Publication number
20210310872
Publication date
Oct 7, 2021
King Abdullah University of Science and Technology
Congli WANG
G01 - MEASURING TESTING
Information
Patent Application
Systems, Methods and Apparatus for Measuring Atmospheric Turbulence
Publication number
20210239880
Publication date
Aug 5, 2021
Government of the United States, as represented by the secrectary of the Air...
Steven M. Zuraski
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR MEASURING A CURVED WAVEFRONT USING AT LEAS...
Publication number
20200370964
Publication date
Nov 26, 2020
MICRO-EPSILON OPTRONIC GMBH
Georg Schitter
G01 - MEASURING TESTING
Information
Patent Application
WAVEFRONT SENSOR AND METHOD OF USING IT
Publication number
20200278257
Publication date
Sep 3, 2020
PXE COMPUTATIONAL IMAGING LTD
Yoav Berlatzky
G01 - MEASURING TESTING
Information
Patent Application
WAVEFRONT MEASUREMENT DEVICE AND WAVEFRONT MEASUREMENT SYSTEM
Publication number
20200256761
Publication date
Aug 13, 2020
Mitsubishi Electric Corporation
Masataka SUZUKI
G01 - MEASURING TESTING
Information
Patent Application
Methods and Apparatus for Predicting Performance of a Measurement M...
Publication number
20200232931
Publication date
Jul 23, 2020
ASML NETHERLANDS B.V.
Stefan Michiel WITTE
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Refraction Measurement of the Human Eye with a Reverse Wavefront Se...
Publication number
20200178793
Publication date
Jun 11, 2020
EyeQue Inc.
Noam Sapiens
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
METHOD AND OPTICAL SYSTEM FOR ACQUIRING THE TOMOGRAPHICAL DISTRIBUT...
Publication number
20200011738
Publication date
Jan 9, 2020
Wooptix S.L.
Juan Jose` Ferna`ndez Valdivia
G01 - MEASURING TESTING
Information
Patent Application
WAVEFRONT SENSOR, WAVEFRONT MEASUREMENT APPARATUS, METHOD OF MANUFA...
Publication number
20190361226
Publication date
Nov 28, 2019
Canon Kabushiki Kaisha
Tomohiro Sugimoto
G02 - OPTICS
Information
Patent Application
ARRANGEMENT AND METHOD FOR WAVEFRONT ANALYSIS
Publication number
20190285480
Publication date
Sep 19, 2019
Fraunhofer-Gesellschaft zur foerderung der Angewandten Forschung e.V.
Peter HARTMANN
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR ANALYSING AN ELECTROMAGNETIC WAVE IN HIGH DEF...
Publication number
20190285481
Publication date
Sep 19, 2019
PHASICS
Benoît WATTELLIER
G02 - OPTICS
Information
Patent Application
WAVEFRONT SENSOR AND METHOD OF RECONSTRUCTING DISTORTED WAVEFRONTS
Publication number
20190265107
Publication date
Aug 29, 2019
King Abdullah University of Science and Technology
Congli WANG
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
RGB WAVEFRONT SENSOR FOR TURBULENCE MITIGATION
Publication number
20190212552
Publication date
Jul 11, 2019
Mission Support and Test Services, LLC
Mary D. O'Neill
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEVICE FOR TESTING OPTICAL PROPERTIES AND METHOD FOR TESTING OPTICA...
Publication number
20190196081
Publication date
Jun 27, 2019
LG CHEM, LTD.
Min Yeong JO
G02 - OPTICS
Information
Patent Application
RAPID IMAGE CORRECTION METHOD FOR A SIMPLIFIED ADAPTIVE OPTICAL SYSTEM
Publication number
20190188834
Publication date
Jun 20, 2019
Claudius Zelenka
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FREE SPACE OPTICAL COMMUNICATION SYSTEM, APPARATUS AND A METHOD THE...
Publication number
20190013865
Publication date
Jan 10, 2019
THE SECRETARY, DEPARTMENT OF ELECTRONICS AND INFORMATION TECHNOLOGY
Bosanta Ranjan Boruah
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR WAVEFRONT SENSING
Publication number
20180292268
Publication date
Oct 11, 2018
RAM Photonics, LLC
Seung-Whan Bahk
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SYSTEM PHASE ACQUISITION METHOD AND OPTICAL SYSTEM EVALUATI...
Publication number
20170370780
Publication date
Dec 28, 2017
Ushio Denki Kabushiki Kaisha
Masashi OKAMOTO
G01 - MEASURING TESTING