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G01R31/3025
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Current Industry
G01R31/3025
Wireless interface with the DUT
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Patents Grants
last 30 patents
Information
Patent Grant
Module and method for initializing and calibrating a product during...
Patent number
11,953,551
Issue date
Apr 9, 2024
Continental Automotive Technologies GmbH
Eduardo Lopez Arce Vivas
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Measurement system for characterizing a device under test
Patent number
11,933,848
Issue date
Mar 19, 2024
National Instruments Ireland Resources Limited
Marc Vanden Bossche
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for providing wireless FPGA programming download...
Patent number
11,923,847
Issue date
Mar 5, 2024
Gowin Semiconductor Corporation
Jinghui Zhu
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Test circuit and method
Patent number
11,852,672
Issue date
Dec 26, 2023
TAIWAN SEMICONDUCTORMANUFACTURING COMPANY LIMITED
Mill-Jer Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method of over-the-air testing of a device under test
Patent number
11,828,801
Issue date
Nov 28, 2023
Rohde & Schwarz GmbH & Co. KG
Mert Celik
G01 - MEASURING TESTING
Information
Patent Grant
Antenna assembly, test system and method of establishing a test system
Patent number
11,789,068
Issue date
Oct 17, 2023
Rohde & Schwarz GmbH & Co. KG
Corbett Rowell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test and measurement probe having a touchscreen
Patent number
11,719,721
Issue date
Aug 8, 2023
Tektronix, Inc.
Karl A. Rinder
G01 - MEASURING TESTING
Information
Patent Grant
Systems, devices, and methods for performing a non-contact electric...
Patent number
11,668,746
Issue date
Jun 6, 2023
PDF Solutions, Inc.
Indranil De
G01 - MEASURING TESTING
Information
Patent Grant
Measurement system for characterizing a device under test
Patent number
11,644,505
Issue date
May 9, 2023
National Instruments Ireland Resources Limited
Marc Vanden Bossche
G01 - MEASURING TESTING
Information
Patent Grant
Interface to full and reduced pin JTAG devices
Patent number
11,630,151
Issue date
Apr 18, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
System and method for compensating for power loss due to a radio fr...
Patent number
11,598,803
Issue date
Mar 7, 2023
LITEPOINT CORPORATION
Chen Cao
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Antenna in package production test
Patent number
11,592,479
Issue date
Feb 28, 2023
Infineon Technologies AG
Saverio Trotta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Testing device, testing system, and testing method
Patent number
11,536,760
Issue date
Dec 27, 2022
ASE TEST, INC.
Hung-Jen Huang
G01 - MEASURING TESTING
Information
Patent Grant
Side-channel signature based PCB authentication using JTAG architec...
Patent number
11,480,614
Issue date
Oct 25, 2022
University of Florida Research Foundation, Inc.
Swarup Bhunia
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Test circuit and method
Patent number
11,467,203
Issue date
Oct 11, 2022
Taiwan Semiconductor Manufacturing Co., Ltd.
Mill-Jer Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for testing a tractor trailer
Patent number
11,448,679
Issue date
Sep 20, 2022
Allan Gendelman
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Composite integrated circuits and methods for wireless interactions...
Patent number
11,387,683
Issue date
Jul 12, 2022
Taiwan Semiconductor Manufacturing Company, Ltd
Min-Jer Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Circuit board and method for delivering program to plurality of cir...
Patent number
11,379,210
Issue date
Jul 5, 2022
FUJIFILM Business Innovation Corp.
Masaaki Takei
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods for performing a non-contact electrical measurement on a ce...
Patent number
11,340,293
Issue date
May 24, 2022
PDF Solutions, Inc.
Indranil De
G01 - MEASURING TESTING
Information
Patent Grant
Automatic laser distance calibration kit for wireless charging test...
Patent number
11,293,753
Issue date
Apr 5, 2022
Sichuan Energy Internet Research Institute, Tsinghua University
Tun Li
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Method and device for testing at a specific channel condition
Patent number
11,255,911
Issue date
Feb 22, 2022
Rohde & Schwarz GmbH & Co.
Robert Fischer
G01 - MEASURING TESTING
Information
Patent Grant
System and method for aligning a measurement antenna suitable for r...
Patent number
11,231,458
Issue date
Jan 25, 2022
Rohde & Schwarz GmbH & Co. KG
Steffen Neidhardt
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Over-the-air measurement system
Patent number
11,175,337
Issue date
Nov 16, 2021
Rohde & Schwarz GmbH & Co. KG
Christoph Toben-Heiken
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Robotics for theme park wearable software testing
Patent number
11,135,723
Issue date
Oct 5, 2021
Universal City Studios LLC
Joshua Aaron Berry
G01 - MEASURING TESTING
Information
Patent Grant
Wireless Rogowski coil system
Patent number
11,125,783
Issue date
Sep 21, 2021
Fluke Corporation
Matthew Carl-Robert Bannister
G01 - MEASURING TESTING
Information
Patent Grant
Antenna-coupled radio frequency (RF) probe with a replaceable tip
Patent number
11,112,454
Issue date
Sep 7, 2021
OHIO STATE INNOVATION FOUNDATION
Kubilay Sertel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Antenna-in-package production test
Patent number
11,092,643
Issue date
Aug 17, 2021
Infineon Technologies AG
Saverio Trotta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Switching FPI between FPI and RPI from received bit sequence
Patent number
11,085,963
Issue date
Aug 10, 2021
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
System and method for testing data packet signal transceivers with...
Patent number
11,032,725
Issue date
Jun 8, 2021
LITEPOINT CORPORATION
Christian Volf Olgaard
G01 - MEASURING TESTING
Information
Patent Grant
Inductive connection structure for use in an integrated circuit
Patent number
10,991,654
Issue date
Apr 27, 2021
STMicroelectronics S.r.l.
Alberto Pagani
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
VOLTAGE PROBE DEVICE WITH ADJUSTABLE BIAS
Publication number
20240133921
Publication date
Apr 25, 2024
KEYSIGHT TECHNOLOGIES, INC.
Hal Robert Paver
G01 - MEASURING TESTING
Information
Patent Application
GRPC-Based Chip Test Method, GRPC-Based Chip Test Apparatus, and St...
Publication number
20240103075
Publication date
Mar 28, 2024
Beijing ESWIN Computing Technology Co., Ltd.
Zeliang Xie
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...
Publication number
20230358804
Publication date
Nov 9, 2023
PDF Solutions, Inc.
Indranil DE
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF OVER-THE-AIR TESTING OF A DEVICE UNDER TEST
Publication number
20230305056
Publication date
Sep 28, 2023
ROHDE & SCHWARZ GMBH & CO. KG
Mert Celik
G01 - MEASURING TESTING
Information
Patent Application
Over the air test chamber with optimized air circulation
Publication number
20230266383
Publication date
Aug 24, 2023
Rohde& Schwarz GmbH & Co. KG
Ralf Meissner
G01 - MEASURING TESTING
Information
Patent Application
INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES
Publication number
20230251309
Publication date
Aug 10, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
Measurement System for Characterizing a Device Under Test
Publication number
20230251312
Publication date
Aug 10, 2023
National Instruments Ireland Resources Limited
Marc Vanden Bossche
G01 - MEASURING TESTING
Information
Patent Application
DEVICES AND METHODS FOR TESTING OF FAR-FIELD WIRELESS CHARGING
Publication number
20230168299
Publication date
Jun 1, 2023
ROHDE & SCHWARZ GMBH & CO. KG
Daniela RADDINO
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
SYSTEM FOR TESTING ANTENNA-IN-PACKAGE MODULES AND METHOD FOR USING...
Publication number
20230160955
Publication date
May 25, 2023
OHMPLUS TECHNOLOGY INC.
HSI-TSENG CHOU
G01 - MEASURING TESTING
Information
Patent Application
TESTBENCHES FOR ELECTRONIC SYSTEMS WITH AUTOMATIC INSERTION OF VERI...
Publication number
20230111938
Publication date
Apr 13, 2023
Arteris, Inc
Benoit LAFAGE
G01 - MEASURING TESTING
Information
Patent Application
USAGE-AWARE COMPRESSION FOR STREAMING DATA FROM A TEST AND MEASUREM...
Publication number
20230012393
Publication date
Jan 12, 2023
Tektronix, Inc.
Keith D. Rule
G01 - MEASURING TESTING
Information
Patent Application
CAPACITIVE INTELLIGENT WORKSTATION DETECTION SYSTEM
Publication number
20220397594
Publication date
Dec 15, 2022
Espressif Systems (Shanghai) Co., Ltd.
Yu XIONG
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...
Publication number
20220365134
Publication date
Nov 17, 2022
PDF SOLUTIONS, INC.
Indranil DE
G01 - MEASURING TESTING
Information
Patent Application
TEST CIRCUIT AND METHOD
Publication number
20220357389
Publication date
Nov 10, 2022
Taiwan Semiconductor Manufacturing Company Limited
Mill-Jer WANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
A METHOD AND APPARATUS FOR DETECTION OF COUNTERFEIT PARTS, COMPROMI...
Publication number
20220341990
Publication date
Oct 27, 2022
PALITRONICA INC.
CARLOS MORENO
G01 - MEASURING TESTING
Information
Patent Application
MODULE AND METHOD FOR INITIALIZING AND CALIBRATING A PRODUCT DURING...
Publication number
20220317183
Publication date
Oct 6, 2022
Continental Teves AG & Co. OHG
Eduardo Lopez Arce Vivas
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TEST EQUIPMENT FOR TESTING A DEVICE UNDER TEST HAVING AN ANTENNA
Publication number
20220308107
Publication date
Sep 29, 2022
ADVANTEST CORPORATION
Jan Hesselbarth
G01 - MEASURING TESTING
Information
Patent Application
Measurement System for Characterizing a Device Under Test
Publication number
20220229110
Publication date
Jul 21, 2022
National Instruments Ireland Resources Limited
Marc Vanden Bossche
G01 - MEASURING TESTING
Information
Patent Application
NEAR FIELD WIRELESS COMMUNICATION SYSTEM FOR MOTHER TO PACKAGE AND...
Publication number
20220206064
Publication date
Jun 30, 2022
Intel Corporation
Zhen ZHOU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ANTENNA ASSEMBLY, TEST SYSTEM AND METHOD OF ESTABLISHING A TEST SYSTEM
Publication number
20220034961
Publication date
Feb 3, 2022
ROHDE & SCHWARZ GMBH & CO. KG
Corbett Rowell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR ALIGNING A MEASUREMENT ANTENNA SUITABLE FOR R...
Publication number
20210356516
Publication date
Nov 18, 2021
ROHDE & SCHWARZ GMBH & CO. KG
Steffen Neidhardt
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Antenna in Package Production Test
Publication number
20210341536
Publication date
Nov 4, 2021
INFINEON TECHNOLOGIES AG
Saverio Trotta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES
Publication number
20210333325
Publication date
Oct 28, 2021
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
Test and Measurement Probe Having a Touchscreen
Publication number
20210263074
Publication date
Aug 26, 2021
Tektronix, Inc.
Karl A. Rinder
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR PROVIDING WIRELESS FPGA PROGRAMMING DOWNLOAD...
Publication number
20210226633
Publication date
Jul 22, 2021
Gowin Semiconductor Corporation
Jinghui Zhu
G01 - MEASURING TESTING
Information
Patent Application
System and Method for Testing a Tractor Trailer
Publication number
20210190846
Publication date
Jun 24, 2021
Allan Gendelman
B60 - VEHICLES IN GENERAL
Information
Patent Application
SIDE-CHANNEL SIGNATURE BASED PCB AUTHENTICATION USING JTAG ARCHITEC...
Publication number
20210148977
Publication date
May 20, 2021
University of Florida Research Foundation, Inc.
SWARUP BHUNIA
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR PROVIDING WIRELESS FPGA PROGRAMMING DOWNLOAD...
Publication number
20210119632
Publication date
Apr 22, 2021
Gowin Semiconductor Corporation
Jinghui Zhu
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...
Publication number
20210096179
Publication date
Apr 1, 2021
Indranil DE
G01 - MEASURING TESTING
Information
Patent Application
OVER-THE-AIR MEASUREMENT SYSTEM
Publication number
20210063480
Publication date
Mar 4, 2021
ROHDE & SCHWARZ GMBH & CO. KG
Christoph Toben-Heiken
G01 - MEASURING TESTING