with a cycloidal trajectory by using crossed electric and magnetic fields

Industry

CPC
H01J49/328

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/328with a cycloidal trajectory by using crossed electric and magnetic fields

Industries

Patents Grantslast 30 patents

Information Patent Grant
Virtual slit cycloidal mass spectrometer
- Patent number 12,131,894
- Issue date Oct 29, 2024
- Duke University
- M. Bonner Denton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for mass analysis of analytes by simultaneous positive an...
- Patent number 10,720,317
- Issue date Jul 21, 2020
- MERIDION, LLC
- Nicholas Wilton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for mass analysis of analytes by simultaneous positive an...
- Patent number 10,153,150
- Issue date Dec 11, 2018
- MERIDION, LLC
- Nicholas Wilton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass separator with controlled input
- Patent number 6,956,217
- Issue date Oct 18, 2005
- Archimedes Operating, LLC
- Tihiro Ohkawa
- B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...
Information Patent Grant
Mass spectrometer and related ionizer and methods
- Patent number 6,815,674
- Issue date Nov 9, 2004
- Monitor Instruments Company, LLC
- Guenter F. Voss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High frequency wave heated plasma mass filter
- Patent number 6,787,044
- Issue date Sep 7, 2004
- Archimedes Technology Group, Inc.
- Richard L. Freeman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma mass filter with axially opposed plasma injectors
- Patent number 6,730,231
- Issue date May 4, 2004
- Archimedes Technology Group, Inc.
- Sergei Putvinski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High throughput plasma mass filter
- Patent number 6,723,248
- Issue date Apr 20, 2004
- Archimedes Technology Group, Inc.
- Tihiro Ohkawa
- B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...
Information Patent Grant
Band gap plasma mass filter
- Patent number 6,719,909
- Issue date Apr 13, 2004
- Archimedes Technology Group, Inc.
- Tihiro Ohkawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cycloidal mass spectrometer
- Patent number 6,624,410
- Issue date Sep 23, 2003
- Monitor Instruments Company, LLC
- Guenter F. Voss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cycloidal mass spectrometer with time of flight characteristics and...
- Patent number 6,617,576
- Issue date Sep 9, 2003
- Monitor Instruments Company, LLC
- Guenter F. Voss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for ionization and selective detection in mass spectrometers
- Patent number 6,590,206
- Issue date Jul 8, 2003
- Robert Evrard
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stochastic cyclotron ion filter (SCIF)
- Patent number 6,515,281
- Issue date Feb 4, 2003
- Archimedes Technology Group, Inc.
- Tihiro Ohkawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Double-focusing mass spectrometer apparatus and methods regarding same
- Patent number 6,501,074
- Issue date Dec 31, 2002
- Regents of The University of Minnesota
- W. Ronald Gentry
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Partially ionized plasma mass filter
- Patent number 6,398,920
- Issue date Jun 4, 2002
- Archimedes Technology Group, Inc.
- Tihiro Ohkawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radial plasma mass filter
- Patent number 6,322,706
- Issue date Nov 27, 2001
- Archimedes Technology Group, Inc.
- Tihiro Ohkawa
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Negative ion filter
- Patent number 6,251,281
- Issue date Jun 26, 2001
- Archimedes Technology Group, Inc.
- Tihiro Ohkawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma filter with helical magnetic field
- Patent number 6,251,282
- Issue date Jun 26, 2001
- Archimedes Technology Group, Inc.
- Sergei Putvinski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma mass filter
- Patent number 6,248,240
- Issue date Jun 19, 2001
- Archimedes Technology Group, Inc.
- Tihiro Ohkawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tandem plasma mass filter
- Patent number 6,235,202
- Issue date May 22, 2001
- Archimedes Technology Group, Inc.
- Tihiro Ohkawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Centrifugal filter for multi-species plasma
- Patent number 6,217,776
- Issue date Apr 17, 2001
- Archimedes Technology Group, Inc.
- Tihiro Ohkawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Toroidal plasma mass filter
- Patent number 6,214,223
- Issue date Apr 10, 2001
- Archimedes Technology Group, Inc.
- Tihiro Ohkawa
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Plasma mass filter
- Patent number 6,096,220
- Issue date Aug 1, 2000
- Archimedes Technology Group, Inc.
- Tihiro Ohkawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass recombinator for accelerator mass spectrometry
- Patent number 5,508,515
- Issue date Apr 16, 1996
- Harald A. Enge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cycloidal mass spectrometer and ionizer for use therein
- Patent number 5,304,799
- Issue date Apr 19, 1994
- Monitor Group, Inc.
- Lutz Kurzweg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Portable mass spectrometer
- Patent number 5,155,357
- Issue date Oct 13, 1992
- Massachusetts Institute of Technology
- Harold F. Hemond
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3670162
- Patent number 3,670,162
- Issue date Jun 13, 1972
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3577165
- Patent number 3,577,165
- Issue date May 4, 1971
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3497688
- Patent number 3,497,688
- Issue date Feb 24, 1970
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3478203
- Patent number 3,478,203
- Issue date Nov 11, 1969
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
VIRTUAL SLIT CYCLOIDAL MASS SPECTROMETER
- Publication number 20240290604
- Publication date Aug 29, 2024
- DUKE UNIVERSITY
- M. Bonner Denton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TUNING A MASS SPECTROMETER FILTER
- Publication number 20240087863
- Publication date Mar 14, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Henning Wehrs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CYCLOIDAL MASS SPECTROMETER AND METHOD FOR ADJUSTING RESOLUTION THE...
- Publication number 20230352292
- Publication date Nov 2, 2023
- Shimadzu Corporation
- Xiaoqiang ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR MASS ANALYSIS OF ANALYTES BY SIMULTANEOUS POSITIVE AN...
- Publication number 20190115201
- Publication date Apr 18, 2019
- MERIDION, LLC
- Nicholas WILTON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNET ASSEMBLY WITH IMPROVED FIELD UNIFORMITY AND METHODS OF MAKIN...
- Publication number 20190115202
- Publication date Apr 18, 2019
- DUKE UNIVERSITY
- Jason J. AMSDEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR MASS ANALYSIS OF ANALYTES BY SIMULTANEOUS POSITIVE AN...
- Publication number 20180068841
- Publication date Mar 8, 2018
- MERIDION, LLC
- Nicholas WILTON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass separator with controlled input
- Publication number 20050173630
- Publication date Aug 11, 2005
- Tihiro Ohkawa
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
HIGH FREQUENCY WAVE HEATED PLASMA MASS FILTER
- Publication number 20040178151
- Publication date Sep 16, 2004
- Richard L. Freeman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH THROUGHPUT PLASMA MASS FILTER
- Publication number 20040031740
- Publication date Feb 19, 2004
- Tihiro Ohkawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Band gap plasma mass filter
- Publication number 20030183567
- Publication date Oct 2, 2003
- Tihiro Ohkawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Plasma mass filter with axially opposed plasma injectors
- Publication number 20030183581
- Publication date Oct 2, 2003
- Sergei Putvinski
- H01 - BASIC ELECTRIC ELEMENTS

with a cycloidal trajectory by using crossed electric and magnetic fields

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Virtual slit cycloidal mass spectrometer

Apparatus for mass analysis of analytes by simultaneous positive an...

Apparatus for mass analysis of analytes by simultaneous positive an...

Mass separator with controlled input

Mass spectrometer and related ionizer and methods

High frequency wave heated plasma mass filter

Plasma mass filter with axially opposed plasma injectors

High throughput plasma mass filter

Band gap plasma mass filter

Cycloidal mass spectrometer

Cycloidal mass spectrometer with time of flight characteristics and...

System for ionization and selective detection in mass spectrometers

Stochastic cyclotron ion filter (SCIF)

Double-focusing mass spectrometer apparatus and methods regarding same

Partially ionized plasma mass filter

Radial plasma mass filter

Negative ion filter

Plasma filter with helical magnetic field

Plasma mass filter

Tandem plasma mass filter

Centrifugal filter for multi-species plasma

Toroidal plasma mass filter

Plasma mass filter

Mass recombinator for accelerator mass spectrometry

Cycloidal mass spectrometer and ionizer for use therein

Portable mass spectrometer

3670162

3577165

3497688

3478203

Patents Applicationslast 30 patents

VIRTUAL SLIT CYCLOIDAL MASS SPECTROMETER

TUNING A MASS SPECTROMETER FILTER

CYCLOIDAL MASS SPECTROMETER AND METHOD FOR ADJUSTING RESOLUTION THE...

APPARATUS FOR MASS ANALYSIS OF ANALYTES BY SIMULTANEOUS POSITIVE AN...

MAGNET ASSEMBLY WITH IMPROVED FIELD UNIFORMITY AND METHODS OF MAKIN...

APPARATUS FOR MASS ANALYSIS OF ANALYTES BY SIMULTANEOUS POSITIVE AN...

Mass separator with controlled input

HIGH FREQUENCY WAVE HEATED PLASMA MASS FILTER

HIGH THROUGHPUT PLASMA MASS FILTER

Band gap plasma mass filter

Plasma mass filter with axially opposed plasma injectors