with cylindrical mirrors

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H01J49/482

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/482with cylindrical mirrors

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Variable reduction ratio spherical aberration correction electrosta...
- Patent number 11,791,148
- Issue date Oct 17, 2023
- University Corporation National Nara Institute of Science and Technology
- Hiroyuki Matsuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion injection into an electrostatic linear ion trap using Zeno pulsing
- Patent number 11,764,052
- Issue date Sep 19, 2023
- DH Technologies Development Pte. Ltd.
- Eric Thomas Dziekonski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for simultaneously analyzing multiple ions wit...
- Patent number 11,562,896
- Issue date Jan 24, 2023
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer and method for improving mass and...
- Patent number 11,264,229
- Issue date Mar 1, 2022
- Guennadi Lebedev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Parallel radial mirror analyser with an angled zero-volt equipotent...
- Patent number 8,981,292
- Issue date Mar 17, 2015
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle energy analysers and methods of operating charged...
- Patent number 8,866,103
- Issue date Oct 21, 2014
- Shimadzu Corporation
- Dane Cubric
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 8,134,120
- Issue date Mar 13, 2012
- Bayer Technology Services GmbH
- Joerg Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder apparatus to reduce energy of electrons in an analyze...
- Patent number 8,071,942
- Issue date Dec 6, 2011
- Physical Electronics USA, Inc.
- David G. Watson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multichannel energy analyzer for charged particles
- Patent number 7,902,502
- Issue date Mar 8, 2011
- The Regents of the University of Colorado, a Body Corporate
- Donald E. David
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrically-charged particle energy analyzers
- Patent number 6,762,408
- Issue date Jul 13, 2004
- Shimadzu Research Laboratory (Europe) Ltd.
- Frank Henry Read
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution charged particle-energy detecting, multiple sequent...
- Patent number 6,184,523
- Issue date Feb 6, 2001
- Board of Regents of the University of Nebraska
- Peter A. Dowben
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduced diameter retractable cylindrical mirror analyzer
- Patent number 5,541,410
- Issue date Jul 30, 1996
- Board of Regents, University of Nebraska-Lincoln
- Peter A. Dowben
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reducing interferences, in plasma source mass spectrometers
- Patent number 5,514,868
- Issue date May 7, 1996
- Fisons plc
- Andrew Dixon
- G01 - MEASURING TESTING
Information Patent Grant
Dual electron analyzer
- Patent number 5,466,933
- Issue date Nov 14, 1995
- Surface Interface, Inc.
- Charles E. Bryson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry probe, particularly in magnetized plasma
- Patent number 5,453,614
- Issue date Sep 26, 1995
- Commissariat a l'Energie Atomique
- Antoine C. La Fontaine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for filtering electrically charged particles and energy filter
- Patent number 5,365,064
- Issue date Nov 15, 1994
- Balzers Aktiengesellschaft
- Gerhard Rettinghaus
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic deflector with generally cylindrical configuration
- Patent number 5,357,107
- Issue date Oct 18, 1994
- Forschungszentrum Julich GmbH
- Harald Ibach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron spectroscopy analyzer and a method of correcting a shift o...
- Patent number 5,352,894
- Issue date Oct 4, 1994
- Sharp Kabushiki Kaisha
- Fumitoshi Yasuo
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle energy analyzer
- Patent number 5,032,723
- Issue date Jul 16, 1991
- Tosoh Corporation
- Shozo Kono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multichannel charged-particle analyzer
- Patent number 5,032,724
- Issue date Jul 16, 1991
- The Perkin-Elmer Corporation
- Robert L. Gerlach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface analysis spectroscopy apparatus
- Patent number 4,860,224
- Issue date Aug 22, 1989
- 501 Tekscan Limited
- Edmund M. Cashell
- G01 - MEASURING TESTING
Information Patent Grant
High luminosity spherical analyzer for charged particles
- Patent number 4,806,754
- Issue date Feb 21, 1989
- The Perkin-Elmer Corporation
- Robert L. Gerlach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle energy analyzer
- Patent number 4,769,542
- Issue date Sep 6, 1988
- VG Instruments Group Limited
- Peter Rockett
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic spectrometer for identifying element conditions of a sam...
- Patent number 4,752,685
- Issue date Jun 21, 1988
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Auger electron spectrometer capable of attaining a high resolution
- Patent number 4,639,597
- Issue date Jan 27, 1987
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multistage cylindrical mirror analyzer incorporating a coaxial elec...
- Patent number 4,224,518
- Issue date Sep 23, 1980
- Varian Associates, Inc.
- Norman J. Taylor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charge-particle energy analyzer
- Patent number 4,219,730
- Issue date Aug 26, 1980
- Hitachi, Ltd.
- Isao Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement for preventing the alteration of the primary beam by un...
- Patent number 4,205,232
- Issue date May 27, 1980
- Gesellschaft fur Kernenergieverwertung in Schiffbau und Schiffahrt mbH
- Uwe Maixner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Auger electron spectroscopy
- Patent number 4,205,226
- Issue date May 27, 1980
- The Perkin-Elmer Corporation
- Robert Gerlach
- G01 - MEASURING TESTING
Information Patent Grant
Charged-particle analyzer
- Patent number 4,135,088
- Issue date Jan 16, 1979
- Hitachi, Ltd.
- Isao Ishikawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSTRUMENT FOR SEPARATING IONS INCLUDING AN ELECTROSTATIC LINEAR IO...
- Publication number 20230154741
- Publication date May 18, 2023
- THE TRUSTEES OF INDIANA UNIVERSITY
- Martin F. JARROLD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VARIABLE REDUCTION RATIO SPHERICAL ABERRATION CORRECTION ELECTROSTA...
- Publication number 20210193448
- Publication date Jun 24, 2021
- National University Corporation Nara Institute of Science and Technology
- Hiroyuki MATSUDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARALLEL RADIAL MIRROR ANALYSER FOR SCANNING MICROSCOPES
- Publication number 20140042317
- Publication date Feb 13, 2014
- National University of Singapore
- Anjam KHURSHEED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE ENERGY ANALYSERS AND METHODS OF OPERATING CHARGED...
- Publication number 20130105687
- Publication date May 2, 2013
- Shimadzu Corporation
- Dane Cubric
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER APPARATUS TO REDUCE ENERGY OF ELECTRONS IN AN ANALYZE...
- Publication number 20100237240
- Publication date Sep 23, 2010
- Physical Electronics USA, Inc.
- David G. Watson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20100090103
- Publication date Apr 15, 2010
- Bayer Technology Services GmbH
- Joerg Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multichannel Energy Analyzer for Charged Particles
- Publication number 20080290287
- Publication date Nov 27, 2008
- The Regents of the University of Colorado
- Donald E. David
- H01 - BASIC ELECTRIC ELEMENTS

with cylindrical mirrors

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Variable reduction ratio spherical aberration correction electrosta...

Ion injection into an electrostatic linear ion trap using Zeno pulsing

Apparatus and method for simultaneously analyzing multiple ions wit...

Time-of-flight mass spectrometer and method for improving mass and...

Parallel radial mirror analyser with an angled zero-volt equipotent...

Charged particle energy analysers and methods of operating charged...

Mass spectrometer

Sample holder apparatus to reduce energy of electrons in an analyze...

Multichannel energy analyzer for charged particles

Electrically-charged particle energy analyzers

High resolution charged particle-energy detecting, multiple sequent...

Reduced diameter retractable cylindrical mirror analyzer

Reducing interferences, in plasma source mass spectrometers

Dual electron analyzer

Mass spectrometry probe, particularly in magnetized plasma

Process for filtering electrically charged particles and energy filter

Electrostatic deflector with generally cylindrical configuration

Electron spectroscopy analyzer and a method of correcting a shift o...

Charged particle energy analyzer

Multichannel charged-particle analyzer

Surface analysis spectroscopy apparatus

High luminosity spherical analyzer for charged particles

Charged particle energy analyzer

Electronic spectrometer for identifying element conditions of a sam...

Auger electron spectrometer capable of attaining a high resolution

Multistage cylindrical mirror analyzer incorporating a coaxial elec...

Charge-particle energy analyzer

Arrangement for preventing the alteration of the primary beam by un...

Auger electron spectroscopy

Charged-particle analyzer

Patents Applicationslast 30 patents

INSTRUMENT FOR SEPARATING IONS INCLUDING AN ELECTROSTATIC LINEAR IO...

VARIABLE REDUCTION RATIO SPHERICAL ABERRATION CORRECTION ELECTROSTA...

PARALLEL RADIAL MIRROR ANALYSER FOR SCANNING MICROSCOPES

CHARGED PARTICLE ENERGY ANALYSERS AND METHODS OF OPERATING CHARGED...

SAMPLE HOLDER APPARATUS TO REDUCE ENERGY OF ELECTRONS IN AN ANALYZE...

MASS SPECTROMETER

Multichannel Energy Analyzer for Charged Particles