with electrons

Industry

CPC
H01J49/147

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/147with electrons

Industries

Patents Grantslast 30 patents

Information Patent Grant
Ionization device and mass spectrometer
- Patent number 12,176,199
- Issue date Dec 24, 2024
- LEYBOLD GMBH
- Yessica Brachthaeuser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Software for microfluidic systems interfacing with mass spectrometry
- Patent number 12,174,144
- Issue date Dec 24, 2024
- INTABIO, LLC
- Erik Gentalen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wide range electron impact ion source for a mass spectrometer
- Patent number 12,106,953
- Issue date Oct 1, 2024
- Inficon, Inc.
- Norbert Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen imaging systems and methods
- Patent number 12,094,701
- Issue date Sep 17, 2024
- Georgia Tech Research Corporation
- Andrei G. Fedorov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Size selected clusters and nanoparticles
- Patent number 12,068,147
- Issue date Aug 20, 2024
- Universität Innsbruck
- Paul Scheier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry ION source
- Patent number 12,033,843
- Issue date Jul 9, 2024
- Agilent Technologies, Inc.
- Bruce D. Quimby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Axial CI source—off-axis electron beam
- Patent number 12,014,916
- Issue date Jun 18, 2024
- Thermo Finnigan LLC.
- Scott T. Quarmby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Filament assembly
- Patent number 11,972,937
- Issue date Apr 30, 2024
- Micromass UK Limited
- Alastair Booth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inner source assembly and associated components
- Patent number 11,848,186
- Issue date Dec 19, 2023
- Micromass UK Limited
- Alastair Booth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stimulated or non-equilibrium energy-loss and energy-gain spectrosc...
- Patent number 11,830,718
- Issue date Nov 28, 2023
- Centre National de la Recherche Scientifique
- Mathieu Kociak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of detecting radicals using mass spectrometry
- Patent number 11,784,031
- Issue date Oct 10, 2023
- Inficon, Inc.
- Norbert Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source with gas delivery for high-fidelity analysis
- Patent number 11,768,176
- Issue date Sep 26, 2023
- MKS Instruments, Inc.
- James Edward Blessing
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry system
- Patent number 11,699,579
- Issue date Jul 11, 2023
- APPLIED SCIENCE & TECHNOLOGY SOLUTIONS LTD
- Andrew David Morse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionizer and mass spectrometer
- Patent number 11,495,447
- Issue date Nov 8, 2022
- Shimadzu Corporation
- Masaru Nishiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Emission current measurement for superior instrument-to-instrument...
- Patent number 11,145,502
- Issue date Oct 12, 2021
- Thermo Finnigan LLC.
- Lawrence G. Baldwin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method to increase surface friction across a hydrophobic...
- Patent number 11,120,978
- Issue date Sep 14, 2021
- QUANTUM INNOVATIONS, INC.
- Norman L. Kester
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Methods, apparatus, and system for mass spectrometry
- Patent number 11,120,983
- Issue date Sep 14, 2021
- Massachusetts Institute of Technology
- Ian W. Hunter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for measuring inert gas by ion probe
- Patent number 11,101,126
- Issue date Aug 24, 2021
- INSTITUTE OF GEOLOGY AND GEOPHYSICS, CHINESE ACADEMY OF SCIENCES
- Yu Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analysis device and ion dissociation method
- Patent number 11,075,067
- Issue date Jul 27, 2021
- Shimadzu Corporation
- Hidenori Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Robust ion source
- Patent number 10,892,153
- Issue date Jan 12, 2021
- MKS Instruments, Inc.
- James E. Blessing
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source with mixed magnets
- Patent number 10,886,118
- Issue date Jan 5, 2021
- Thermo Finnigan LLC.
- Edward B. McCauley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
GC-TOF MS with improved detection limit
- Patent number 10,794,879
- Issue date Oct 6, 2020
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for mass analysis of analytes by simultaneous positive an...
- Patent number 10,720,317
- Issue date Jul 21, 2020
- MERIDION, LLC
- Nicholas Wilton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion transfer from electron ionization sources
- Patent number 10,692,712
- Issue date Jun 23, 2020
- PerkinElmer Health Sciences, Inc.
- David G. Welkie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Off-axis ionization devices and systems using them
- Patent number 10,658,167
- Issue date May 19, 2020
- PERKINELMER HEALTH SCIENCES CANADA, INC.
- Heather Gamble
- G01 - MEASURING TESTING
Information Patent Grant
Methods, apparatus, and system for mass spectrometry
- Patent number 10,658,169
- Issue date May 19, 2020
- Massachusetts Institute of Technology
- Ian W. Hunter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual chamber electron impact and chemical ionization source
- Patent number 10,636,645
- Issue date Apr 28, 2020
- PerkinElmer Health Sciences Canada, Inc.
- Heather Gamble
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization sources and systems and methods using them
- Patent number 10,622,200
- Issue date Apr 14, 2020
- PERKINELMER HEALTH SCIENCES CANADA, INC.
- Anna Kornilova
- G01 - MEASURING TESTING
Information Patent Grant
Robust ion source
- Patent number 10,541,122
- Issue date Jan 21, 2020
- MKS Instruments, Inc.
- James E. Blessing
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Software for microfluidic systems interfacing with mass spectrometry
- Patent number 10,514,360
- Issue date Dec 24, 2019
- INTABIO, INC.
- Erik Gentalen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
AXIAL ION SOURCE
- Publication number 20240420943
- Publication date Dec 19, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Ulf Fröhlich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN IMAGING SYSTEMS AND METHODS
- Publication number 20240412961
- Publication date Dec 12, 2024
- Georgia Tech Research Corporation
- Andrei G. Fedorov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOFTWARE FOR MICROFLUIDIC SYSTEMS INTERFACING WITH MASS SPECTROMETRY
- Publication number 20240377359
- Publication date Nov 14, 2024
- INTABIO, LLC
- Luc Bousse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE ASSEMBLY WITH MULTIPLE ELLIPTICAL FILAMENTS
- Publication number 20240363325
- Publication date Oct 31, 2024
- Inficon, Inc.
- Michael Vollero
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE
- Publication number 20240339313
- Publication date Oct 10, 2024
- Agilent Technologies, Inc.
- Bruce D. QUIMBY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AN ELECTRON IMPACT IONIZATION WITHIN RADIO FREQUENCY CONFINEMENT FI...
- Publication number 20240258093
- Publication date Aug 1, 2024
- QuadroCore Corp.
- Gholamreza Javahery
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20240186134
- Publication date Jun 6, 2024
- Shimadzu Corporation
- Yoshihiro UENO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ATMOSPHERIC PRESSURE IONIZATION COUPLED TO AN ELECTRON IONIZATION M...
- Publication number 20240153753
- Publication date May 9, 2024
- Inficon Inc.
- Nigel Sousou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIDE RANGE ELECTRON IMPACT ION SOURCE FOR A MASS SPECTROMETER
- Publication number 20240038522
- Publication date Feb 1, 2024
- Inficon, Inc.
- Norbert Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOFTWARE FOR MICROFLUIDIC SYSTEMS INTERFACING WITH MASS SPECTROMETRY
- Publication number 20230417703
- Publication date Dec 28, 2023
- INTABIO, LLC
- Wei CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20230245878
- Publication date Aug 3, 2023
- SHIMADZU CORPORATION
- Masaru NISHIGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AXIAL CI SOURCE - OFF-AXIS ELECTRON BEAM
- Publication number 20230230826
- Publication date Jul 20, 2023
- Thermo Finnigan LLC
- Scott T. QUARMBY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DETECTING RADICALS USING MASS SPECTROMETRY
- Publication number 20230215711
- Publication date Jul 6, 2023
- Inficon, Inc.
- Norbert Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOFTWARE FOR MICROFLUIDIC SYSTEMS INTERFACING WITH MASS SPECTROMETRY
- Publication number 20230176009
- Publication date Jun 8, 2023
- INTABIO, LLC
- Erik GENTALEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE
- Publication number 20230101575
- Publication date Mar 30, 2023
- Beam Alpha, Inc.
- Gerald Peter Jackson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HOLDING DEVICE FOR AT LEAST ONE FILAMENT AND MASS SPECTROMETER
- Publication number 20230084351
- Publication date Mar 16, 2023
- Leybold GmbH
- Niklas Pengemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN IMAGING SYSTEMS AND METHODS
- Publication number 20220344138
- Publication date Oct 27, 2022
- Georgia Tech Research Corporation
- Andrei G. Fedorov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS CHROMATOGRAPH MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20220317089
- Publication date Oct 6, 2022
- SHIMADZU CORPORATION
- Masato TAKAKURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIZE SELECTED CLUSTERS AND NANOPARTICLES
- Publication number 20220238319
- Publication date Jul 28, 2022
- Universitat Innsbruck
- Paul SCHEIER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION DEVICE AND MASS SPECTROMETER
- Publication number 20220230865
- Publication date Jul 21, 2022
- Leybold GmbH
- Yessica Brachthaeuser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZER AND MASS SPECTROMETER
- Publication number 20210375609
- Publication date Dec 2, 2021
- SHIMADZU CORPORATION
- Masaru NISHIGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE
- Publication number 20210305036
- Publication date Sep 30, 2021
- Agilent Technologies, Inc.
- Bruce D. Quimby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY SYSTEM
- Publication number 20210287890
- Publication date Sep 16, 2021
- APPLIED SCIENCE & TECHNOLOGY SOLUTIONS LTD
- Andrew David Morse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INNER SOURCE ASSEMBLY AND ASSOCIATED COMPONENTS
- Publication number 20210265154
- Publication date Aug 26, 2021
- Micromass UK Limited
- Alastair BOOTH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FILAMENT ASSEMBLY
- Publication number 20210210324
- Publication date Jul 8, 2021
- Micromass UK Limited
- Alastair BOOTH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EMISSION CURRENT MEASUREMENT FOR SUPERIOR INSTRUMENT-TO-INSTRUMENT...
- Publication number 20210193449
- Publication date Jun 24, 2021
- Thermo Finnigan LLC
- Lawrence G. BALDWIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AXIAL CI SOURCE - OFF-AXIS ELECTRON BEAM
- Publication number 20210175063
- Publication date Jun 10, 2021
- Thermo Finnigan LLC
- Scott T. QUARMBY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE ANALYSIS APPARATUS HAVING IMPROVED INPUT OPTICS AND COMPONEN...
- Publication number 20210151304
- Publication date May 20, 2021
- ADAPTAS SOLUTIONS PTY LTD
- Russell Jurek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR MEASURING INERT GAS BY ION PROBE
- Publication number 20210057204
- Publication date Feb 25, 2021
- Institute of Geology and Geophysics, Chinese Academy of Sciences
- Yu LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS, APPARATUS, AND SYSTEM FOR MASS SPECTROMETRY
- Publication number 20200388479
- Publication date Dec 10, 2020
- Massachusetts Institute of Technology
- Ian W. HUNTER
- H01 - BASIC ELECTRIC ELEMENTS

with electrons

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Ionization device and mass spectrometer

Software for microfluidic systems interfacing with mass spectrometry

Wide range electron impact ion source for a mass spectrometer

Specimen imaging systems and methods

Size selected clusters and nanoparticles

Mass spectrometry ION source

Axial CI source—off-axis electron beam

Filament assembly

Inner source assembly and associated components

Stimulated or non-equilibrium energy-loss and energy-gain spectrosc...

Method of detecting radicals using mass spectrometry

Ion source with gas delivery for high-fidelity analysis

Mass spectrometry system

Ionizer and mass spectrometer

Emission current measurement for superior instrument-to-instrument...

System and method to increase surface friction across a hydrophobic...

Methods, apparatus, and system for mass spectrometry

Method and system for measuring inert gas by ion probe

Ion analysis device and ion dissociation method

Robust ion source

Ion source with mixed magnets

GC-TOF MS with improved detection limit

Apparatus for mass analysis of analytes by simultaneous positive an...

Ion transfer from electron ionization sources

Off-axis ionization devices and systems using them

Methods, apparatus, and system for mass spectrometry

Dual chamber electron impact and chemical ionization source

Ionization sources and systems and methods using them

Robust ion source

Software for microfluidic systems interfacing with mass spectrometry

Patents Applicationslast 30 patents

AXIAL ION SOURCE

SPECIMEN IMAGING SYSTEMS AND METHODS

SOFTWARE FOR MICROFLUIDIC SYSTEMS INTERFACING WITH MASS SPECTROMETRY

ION SOURCE ASSEMBLY WITH MULTIPLE ELLIPTICAL FILAMENTS

ION SOURCE

AN ELECTRON IMPACT IONIZATION WITHIN RADIO FREQUENCY CONFINEMENT FI...

Mass Spectrometer

ATMOSPHERIC PRESSURE IONIZATION COUPLED TO AN ELECTRON IONIZATION M...

WIDE RANGE ELECTRON IMPACT ION SOURCE FOR A MASS SPECTROMETER

SOFTWARE FOR MICROFLUIDIC SYSTEMS INTERFACING WITH MASS SPECTROMETRY

MASS SPECTROMETER

AXIAL CI SOURCE - OFF-AXIS ELECTRON BEAM

METHOD OF DETECTING RADICALS USING MASS SPECTROMETRY

SOFTWARE FOR MICROFLUIDIC SYSTEMS INTERFACING WITH MASS SPECTROMETRY

ION SOURCE

HOLDING DEVICE FOR AT LEAST ONE FILAMENT AND MASS SPECTROMETER

SPECIMEN IMAGING SYSTEMS AND METHODS

GAS CHROMATOGRAPH MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

SIZE SELECTED CLUSTERS AND NANOPARTICLES

IONIZATION DEVICE AND MASS SPECTROMETER

IONIZER AND MASS SPECTROMETER

ION SOURCE

MASS SPECTROMETRY SYSTEM

INNER SOURCE ASSEMBLY AND ASSOCIATED COMPONENTS

FILAMENT ASSEMBLY

EMISSION CURRENT MEASUREMENT FOR SUPERIOR INSTRUMENT-TO-INSTRUMENT...

AXIAL CI SOURCE - OFF-AXIS ELECTRON BEAM

SAMPLE ANALYSIS APPARATUS HAVING IMPROVED INPUT OPTICS AND COMPONEN...

METHOD AND SYSTEM FOR MEASURING INERT GAS BY ION PROBE

METHODS, APPARATUS, AND SYSTEM FOR MASS SPECTROMETRY