with flexible bodies

Industry

CPC
G01R1/07357

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/07357with flexible bodies

Industries

Patents Grantslast 30 patents

Information Patent Grant
Vertical probe pin and a probe card having same
- Patent number 12,169,211
- Issue date Dec 17, 2024
- TSE CO., LTD.
- Seok Ho Son
- G01 - MEASURING TESTING
Information Patent Grant
Multi-beam probes with decoupled structural and current carrying be...
- Patent number 12,146,898
- Issue date Nov 19, 2024
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus
- Patent number 12,140,623
- Issue date Nov 12, 2024
- Global Unichip Corporation
- Chih-Chieh Liao
- G01 - MEASURING TESTING
Information Patent Grant
Electrical contactor and electrical connecting apparatus
- Patent number 12,105,119
- Issue date Oct 1, 2024
- Kabushiki Kaisha Nihon Micronics
- Tomoaki Kuga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cantilever probe card device and elastic probe thereof
- Patent number 12,092,661
- Issue date Sep 17, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Chevron interconnect for very fine pitch probing
- Patent number 12,032,002
- Issue date Jul 9, 2024
- Intel Corporation
- Pooya Tadayon
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for electronic devices and corresponding probe card
- Patent number 12,032,003
- Issue date Jul 9, 2024
- Technoprobe, S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting device
- Patent number 12,000,867
- Issue date Jun 4, 2024
- Kabushiki Kaisha Nihon Micronics
- Takayuki Hayashizaki
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for a testing apparatus of electronic devices with enhan...
- Patent number 11,971,449
- Issue date Apr 30, 2024
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for reduced-pitch applications
- Patent number 11,953,522
- Issue date Apr 9, 2024
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and transmission structure
- Patent number 11,933,817
- Issue date Mar 19, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,921,133
- Issue date Mar 5, 2024
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Buckling beam probe arrays and methods for making such arrays inclu...
- Patent number 11,821,918
- Issue date Nov 21, 2023
- Microfabrica Inc.
- Michael S. Lockard
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,808,788
- Issue date Nov 7, 2023
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe head
- Patent number 11,774,468
- Issue date Oct 3, 2023
- MPI Corporation
- Chin-Tien Yang
- G01 - MEASURING TESTING
Information Patent Grant
Multi-layer probes having longitudinal axes and preferential probe...
- Patent number 11,768,227
- Issue date Sep 26, 2023
- Microfabrica Inc.
- Ming Ting Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,668,732
- Issue date Jun 6, 2023
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Micro-coaxial wire interconnect architecture
- Patent number 11,656,247
- Issue date May 23, 2023
- Intel Corporation
- Ronald Michael Kirby
- G01 - MEASURING TESTING
Information Patent Grant
Probe head and die set having horizontally fine adjustable die and...
- Patent number 11,619,656
- Issue date Apr 4, 2023
- MPI Corporation
- Chin-Yi Lin
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and probe module thereof
- Patent number 11,585,832
- Issue date Feb 21, 2023
- MPI CORPORATION
- Chung-Yen Huang
- G01 - MEASURING TESTING
Information Patent Grant
Double-beam test probe
- Patent number 11,543,454
- Issue date Jan 3, 2023
- Intel Corporation
- Paul J. Diglio
- G01 - MEASURING TESTING
Information Patent Grant
Contact element system with at least two contact elements having di...
- Patent number 11,519,937
- Issue date Dec 6, 2022
- Feinmetall GmbH
- Gunther Böhm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact probe and relative probe head of an apparatus for testing e...
- Patent number 11,442,080
- Issue date Sep 13, 2022
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe for a testing head for testing high-frequency devices
- Patent number 11,340,262
- Issue date May 24, 2022
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Probe on carrier architecture for vertical probe arrays
- Patent number 11,293,947
- Issue date Apr 5, 2022
- FormFactor, Inc.
- Mukesh Selvaraj
- G01 - MEASURING TESTING
Information Patent Grant
Chevron interconnect for very fine pitch probing
- Patent number 11,268,983
- Issue date Mar 8, 2022
- Intel Corporation
- Pooya Tadayon
- G01 - MEASURING TESTING
Information Patent Grant
Fine pitch probe card methods and systems
- Patent number 11,262,384
- Issue date Mar 1, 2022
- Intel Corporation
- Pooya Tadayon
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for a testing apparatus of electronic devices with enhan...
- Patent number 11,163,004
- Issue date Nov 2, 2021
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Probe head with linear probe
- Patent number 11,143,674
- Issue date Oct 12, 2021
- MPI Corporation
- Tzu Yang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly
- Patent number 11,085,949
- Issue date Aug 10, 2021
- International Business Machines Corporation
- David M. Audette
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD STRUCTURE INCLUDING PROBE SETS WITH DIFFERENT LENGTHS
- Publication number 20250004012
- Publication date Jan 2, 2025
- teCat Technologies (Suzhou) Limited
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD STRUCTURE
- Publication number 20250004013
- Publication date Jan 2, 2025
- teCat Technologies (Suzhou) Limited
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
Electrical Testing Device with Probe Having an Adjustable Angle
- Publication number 20240288473
- Publication date Aug 29, 2024
- Snap-on Incorporated
- Nicholas A. Gabbey
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES
- Publication number 20240151744
- Publication date May 9, 2024
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Application
Multi-Beam Probes with Decoupled Structural and Current Carrying Be...
- Publication number 20240094259
- Publication date Mar 21, 2024
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDI...
- Publication number 20240027495
- Publication date Jan 25, 2024
- TECHNOPROBE S.P.A.
- Riccardo VETTORI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027520
- Publication date Jan 25, 2024
- Advantest Corporation
- Hiroki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027522
- Publication date Jan 25, 2024
- Advantest Corporation
- Takayuki TANAKA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027521
- Publication date Jan 25, 2024
- Advantest Corporation
- Hiroki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027523
- Publication date Jan 25, 2024
- Advantest Corporation
- Hiroki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
BUCKLING BEAM PROBE ARRAYS AND METHODS FOR MAKING SUCH ARRAYS INCLU...
- Publication number 20240019463
- Publication date Jan 18, 2024
- Microfabrica Inc.
- MIchael S. Lockard
- G01 - MEASURING TESTING
Information Patent Application
LARGE PROBE CARD FOR TESTING ELECTRONIC DEVICES AND RELATED MANUFAC...
- Publication number 20240012028
- Publication date Jan 11, 2024
- TECHNOPROBE S.P.A.
- Flavio MAGGIONI
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD WITH AN IMPROVED CONTACT BETWEEN CONTACT PROBES AND META...
- Publication number 20240012027
- Publication date Jan 11, 2024
- TECHNOPROBE S.P.A.
- Raffaele VALLAURI
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES
- Publication number 20230333142
- Publication date Oct 19, 2023
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES
- Publication number 20230314476
- Publication date Oct 5, 2023
- TECHNOPROBE S.P.A.
- Riccardo VETTORI
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE PIN AND PROBE CARD HAVING SAME
- Publication number 20230258691
- Publication date Aug 17, 2023
- TSE CO., LTD.
- Seok Ho SON
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND SEMICONDUCTOR TEST METHOD USING THE SAME
- Publication number 20230221351
- Publication date Jul 13, 2023
- Samsung Electronics Co., Ltd.
- BYUNGWOOK CHOI
- G01 - MEASURING TESTING
Information Patent Application
PROBE TESTING DEVICE HAVING ELASTIC STRUCTURE
- Publication number 20230194570
- Publication date Jun 22, 2023
- STAR TECHNOLOGIES (WUHAN) CO., LTD.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND TRANSMISSION STRUCTURE
- Publication number 20230033013
- Publication date Feb 2, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR REDUCED-PITCH APPLICATIONS
- Publication number 20230021227
- Publication date Jan 19, 2023
- TECHNOPROBE S.P.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE HEAD
- Publication number 20230007997
- Publication date Jan 12, 2023
- MPI Corporation
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
ELASTIC PROBE ELEMENT, ELASTIC PROBE ASSEMBLY, AND TESTING DEVICE
- Publication number 20220397587
- Publication date Dec 15, 2022
- teCat Technologies (Suzhou) Limited
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
Probe Head Including a Guide Plate with Angled Holes to Determine P...
- Publication number 20220236304
- Publication date Jul 28, 2022
- Sterling Tadashi Collins
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD AND DIE SET HAVING HORIZONTALLY FINE ADJUSTABLE DIE AND...
- Publication number 20220214379
- Publication date Jul 7, 2022
- MPI Corporation
- CHIN-YI LIN
- G01 - MEASURING TESTING
Information Patent Application
CHEVRON INTERCONNECT FOR VERY FINE PITCH PROBING
- Publication number 20220178966
- Publication date Jun 9, 2022
- Intel Corporation
- Pooya Tadayon
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONTACTOR AND ELECTRICAL CONNECTING APPARATUS
- Publication number 20220155347
- Publication date May 19, 2022
- KABUSHI KAISHA NIHON MICRONICS
- TOMOAKI KUGA
- G01 - MEASURING TESTING
Information Patent Application
Probe head for electronic devices and corresponding probe card
- Publication number 20220155348
- Publication date May 19, 2022
- Technoprobe, S.p.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTING DEVICE
- Publication number 20220146553
- Publication date May 12, 2022
- Takayuki HAYASHIZAKI
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES WITH ENHAN...
- Publication number 20220034966
- Publication date Feb 3, 2022
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND PROBE MODULE THEREOF
- Publication number 20210311095
- Publication date Oct 7, 2021
- MPI Corporation
- Chung-Yen Huang
- G01 - MEASURING TESTING

with flexible bodies

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Vertical probe pin and a probe card having same

Multi-beam probes with decoupled structural and current carrying be...

Testing apparatus

Electrical contactor and electrical connecting apparatus

Cantilever probe card device and elastic probe thereof

Chevron interconnect for very fine pitch probing

Probe head for electronic devices and corresponding probe card

Electrical connecting device

Probe head for a testing apparatus of electronic devices with enhan...

Probe head for reduced-pitch applications

Probe card device and transmission structure

Testing head having improved frequency properties

Buckling beam probe arrays and methods for making such arrays inclu...

Testing head having improved frequency properties

Vertical probe head

Multi-layer probes having longitudinal axes and preferential probe...

Testing head having improved frequency properties

Micro-coaxial wire interconnect architecture

Probe head and die set having horizontally fine adjustable die and...

Probe card and probe module thereof

Double-beam test probe

Contact element system with at least two contact elements having di...

Contact probe and relative probe head of an apparatus for testing e...

Contact probe for a testing head for testing high-frequency devices

Probe on carrier architecture for vertical probe arrays

Chevron interconnect for very fine pitch probing

Fine pitch probe card methods and systems

Probe head for a testing apparatus of electronic devices with enhan...

Probe head with linear probe

Probe card assembly

Patents Applicationslast 30 patents

PROBE CARD STRUCTURE INCLUDING PROBE SETS WITH DIFFERENT LENGTHS

PROBE CARD STRUCTURE

Electrical Testing Device with Probe Having an Adjustable Angle

TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES

Multi-Beam Probes with Decoupled Structural and Current Carrying Be...

CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDI...

AUTOMATIC TEST EQUIPMENT

AUTOMATIC TEST EQUIPMENT

AUTOMATIC TEST EQUIPMENT

AUTOMATIC TEST EQUIPMENT

BUCKLING BEAM PROBE ARRAYS AND METHODS FOR MAKING SUCH ARRAYS INCLU...

LARGE PROBE CARD FOR TESTING ELECTRONIC DEVICES AND RELATED MANUFAC...

PROBE HEAD WITH AN IMPROVED CONTACT BETWEEN CONTACT PROBES AND META...

TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES

CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES

VERTICAL PROBE PIN AND PROBE CARD HAVING SAME

PROBE CARD AND SEMICONDUCTOR TEST METHOD USING THE SAME

PROBE TESTING DEVICE HAVING ELASTIC STRUCTURE

PROBE CARD DEVICE AND TRANSMISSION STRUCTURE

PROBE HEAD FOR REDUCED-PITCH APPLICATIONS

VERTICAL PROBE HEAD

ELASTIC PROBE ELEMENT, ELASTIC PROBE ASSEMBLY, AND TESTING DEVICE

Probe Head Including a Guide Plate with Angled Holes to Determine P...

PROBE HEAD AND DIE SET HAVING HORIZONTALLY FINE ADJUSTABLE DIE AND...

CHEVRON INTERCONNECT FOR VERY FINE PITCH PROBING

ELECTRICAL CONTACTOR AND ELECTRICAL CONNECTING APPARATUS

Probe head for electronic devices and corresponding probe card

ELECTRICAL CONNECTING DEVICE

PROBE HEAD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES WITH ENHAN...

PROBE CARD AND PROBE MODULE THEREOF