With imaging systems

Industry

CPC
G01B9/0203

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/0203With imaging systems

Industries

Patents Grantslast 30 patents

Information Patent Grant
Pre-conditioning interferometer
- Patent number 12,092,456
- Issue date Sep 17, 2024
- Arizona Board of Regents on behalf of the University of Arizona
- Dae Wook Kim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, systems and methods for detecting light
- Patent number 12,072,188
- Issue date Aug 27, 2024
- PANTECH CORPORATION
- Xin Yuan
- G01 - MEASURING TESTING
Information Patent Grant
Heterogeneous integration detecting method and heterogeneous integr...
- Patent number 12,007,221
- Issue date Jun 11, 2024
- Industrial Technology Research Institute
- Hsiang-Chun Wei
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for optical coherence tomography
- Patent number 12,000,700
- Issue date Jun 4, 2024
- Nokia Technologies Oy
- Michael Eggleston
- G01 - MEASURING TESTING
Information Patent Grant
Automatic optical path adjustment in home OCT
- Patent number 11,986,241
- Issue date May 21, 2024
- Notal Vision, Ltd.
- Amit Pascal
- G01 - MEASURING TESTING
Information Patent Grant
Full-field OCT method and system for generating an imaging of an oc...
- Patent number 11,986,242
- Issue date May 21, 2024
- VISOTEC GMBH
- Peter Koch
- G01 - MEASURING TESTING
Information Patent Grant
Method and a system for characterising structures etched in a subst...
- Patent number 11,959,736
- Issue date Apr 16, 2024
- UNITY SEMICONDUCTOR
- Wolfgang Alexander Iff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and a system for combined characterisation of structures etc...
- Patent number 11,959,737
- Issue date Apr 16, 2024
- UNITY SEMICONDUCTOR
- Wolfgang Alexander Iff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inertial point-source matter-wave atom interferometer gyroscope and...
- Patent number 11,940,276
- Issue date Mar 26, 2024
- GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
- John Edward Kitching
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and device for characterizing the surface shape of an optica...
- Patent number 11,927,500
- Issue date Mar 12, 2024
- Carl Zeiss SMT GmbH
- Steffen Siegler
- G01 - MEASURING TESTING
Information Patent Grant
Light-sheet photonic-force optical coherence elastography
- Patent number 11,920,930
- Issue date Mar 5, 2024
- Cornell University
- Steven G Adie
- G01 - MEASURING TESTING
Information Patent Grant
Frequency-domain interferometric based imaging systems and methods
- Patent number 11,890,052
- Issue date Feb 6, 2024
- Carl Zeiss Meditec, Inc.
- Tilman Schmoll
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus for interferometrically determining a surface s...
- Patent number 11,892,283
- Issue date Feb 6, 2024
- Carl Zeiss SMT GmbH
- Stefan Schulte
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems of holographic interferometry
- Patent number 11,892,292
- Issue date Feb 6, 2024
- RD Synergy Ltd.
- Dov Furman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Interferometric measurement method and interferometric measurement...
- Patent number 11,879,721
- Issue date Jan 23, 2024
- Carl Zeiss SMT GmbH
- Alexander Wolf
- G01 - MEASURING TESTING
Information Patent Grant
Image analysis
- Patent number 11,861,830
- Issue date Jan 2, 2024
- MERIT CRO, INC.
- Yijun Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Simultaneous phase-shift point diffraction interferometer and metho...
- Patent number 11,788,829
- Issue date Oct 17, 2023
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Peng Feng
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating a measuring apparatus
- Patent number 11,774,237
- Issue date Oct 3, 2023
- Carl Zeiss SMT GmbH
- Jochen Hetzler
- G01 - MEASURING TESTING
Information Patent Grant
System for spatial multiplexing
- Patent number 11,768,068
- Issue date Sep 26, 2023
- Ramot at Tel Aviv University Ltd.
- Natan Tzvi Shaked
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Multi-environment Rayleigh interferometer
- Patent number 11,761,750
- Issue date Sep 19, 2023
- Aaron Pung
- G01 - MEASURING TESTING
Information Patent Grant
Dual-optical displacement sensor alignment using knife edges
- Patent number 11,740,356
- Issue date Aug 29, 2023
- Honeywell International Inc.
- Michael Kon Yew Hughes
- G01 - MEASURING TESTING
Information Patent Grant
Laser interferometry systems and methods
- Patent number 11,703,315
- Issue date Jul 18, 2023
- Nordson Corporation
- Jerome Joseph Dapore
- G01 - MEASURING TESTING
Information Patent Grant
Surface shape measurement device and surface shape measurement method
- Patent number 11,635,289
- Issue date Apr 25, 2023
- UNIVERSITY OF HYOGO
- Kunihiro Sato
- G01 - MEASURING TESTING
Information Patent Grant
Ophthalmic optical coherence tomography with multiple resolutions
- Patent number 11,602,272
- Issue date Mar 14, 2023
- Alcon Inc.
- Brent Duchon
- G02 - OPTICS
Information Patent Grant
Apparatus for optical coherence tomography
- Patent number 11,604,060
- Issue date Mar 14, 2023
- Nokia Technologies Oy
- Michael Eggleston
- G01 - MEASURING TESTING
Information Patent Grant
Cost-effective line-scan optical coherence tomography apparatus
- Patent number 11,578,965
- Issue date Feb 14, 2023
- Hong Kong Applied Science and Technology Research Institute Company Limited
- Vladislav Nikitin
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Methods and systems for coherent imaging and feedback control for m...
- Patent number 11,534,858
- Issue date Dec 27, 2022
- IPG Photonics Corporation
- Paul J. L. Webster
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Automatic optical path adjustment in home OCT
- Patent number 11,464,408
- Issue date Oct 11, 2022
- Notal Vision Ltd.
- Amit Pascal
- G01 - MEASURING TESTING
Information Patent Grant
Optical coherence tomographic apparatus and method for the same
- Patent number 11,464,409
- Issue date Oct 11, 2022
- Canon Kabushiki Kaisha
- Slawomir Orlowski
- G01 - MEASURING TESTING
Information Patent Grant
Optical coherence tomography eye imaging techniques
- Patent number 11,435,177
- Issue date Sep 6, 2022
- Tesseract Health, Inc.
- Tyler S. Ralston
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20240361253
- Publication date Oct 31, 2024
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT APPARATUS AND METHOD OF MEASURING AN AXIAL LENGTH
- Publication number 20240271922
- Publication date Aug 15, 2024
- Occuity Limited
- James REYNOLDS
- G01 - MEASURING TESTING
Information Patent Application
Solid-State Distinct-Unidirectional Photonic Interferometers for Co...
- Publication number 20240230313
- Publication date Jul 11, 2024
- Val Parker
- G01 - MEASURING TESTING
Information Patent Application
REFLECTIVE INTERFEROMETER SYSTEMS AND METHODS THEREOF
- Publication number 20240230311
- Publication date Jul 11, 2024
- OptiPro Systems, LLC
- Robert D. NIEDERRITER
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT APPARATUS AND METHOD OF RAPID MEASUREMENT
- Publication number 20240230312
- Publication date Jul 11, 2024
- Occuity Limited
- James REYNOLDS
- G01 - MEASURING TESTING
Information Patent Application
IMAGE ANALYSIS
- Publication number 20240193771
- Publication date Jun 13, 2024
- MERIT CRO, INC.
- Yijun Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Coherent Imaging and Feedback Control for M...
- Publication number 20240189938
- Publication date Jun 13, 2024
- IPG Photonics Corporation
- Paul J.L. Webster
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
PUPIL IMAGE MEASURING DEVICE AND METHOD
- Publication number 20240167806
- Publication date May 23, 2024
- Samsung Electronics Co., Ltd.
- Seungwoo LEE
- G01 - MEASURING TESTING
Information Patent Application
Solid-State Distinct-Unidirectional Photonic Interferometers for Co...
- Publication number 20240133672
- Publication date Apr 25, 2024
- Val Parker
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY-DOMAIN INTERFEROMETRIC BASED IMAGING SYSTEMS AND METHODS
- Publication number 20240115128
- Publication date Apr 11, 2024
- Carl Zeiss Meditec, Inc.
- Tilman Schmoll
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Methods and Apparatuses for Fabricating Polymeric Conformal Coating...
- Publication number 20240042481
- Publication date Feb 8, 2024
- UCL Business LTD
- Paul Beard
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SINGLE FRAME-TILTED WAVE INTERFEROMETER
- Publication number 20240003672
- Publication date Jan 4, 2024
- UNIVERSITAT STUTTGART
- Christof PRUß
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND A SYSTEM FOR CHARACTERISING STRUCTURES ETCHED IN A SUBST...
- Publication number 20230375332
- Publication date Nov 23, 2023
- Unity Semiconductor
- Wolfgang Alexander IFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND A SYSTEM FOR COMBINED CHARACTERISATION OF STRUCTURES ETC...
- Publication number 20230375333
- Publication date Nov 23, 2023
- Unity Semiconductor
- Wolfgang Alexander IFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT DEVICE
- Publication number 20230366668
- Publication date Nov 16, 2023
- CKD CORPORATION
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Application
COMPACT SHEAROGRAPHY SYSTEM WITH ADJUSTABLE SHEAR DISTANCE
- Publication number 20230296368
- Publication date Sep 21, 2023
- Nikon Corporation
- Eric Peter Goodwin
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COMPLEX AMPLITUDE MEASUREMENT DEVICE AND OPTICAL COMPLEX AM...
- Publication number 20230288182
- Publication date Sep 14, 2023
- Nippon Telegraph and Telephone Corporation
- Hiroki SAKUMA
- G01 - MEASURING TESTING
Information Patent Application
Multi-environment Rayleigh Interferometer
- Publication number 20230273009
- Publication date Aug 31, 2023
- Utah State University Space Dynamics Laboratory
- Aaron Pung
- G02 - OPTICS
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT DEVICE
- Publication number 20230243643
- Publication date Aug 3, 2023
- CKD CORPORATION
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OPERATING AN OPTICAL TOMOGRAPHIC IMAGING APPARATUS
- Publication number 20230213328
- Publication date Jul 6, 2023
- DELAWAVE, INC.
- Kenji TAIRA
- G01 - MEASURING TESTING
Information Patent Application
Apparatus For Optical Coherence Tomography
- Publication number 20230213329
- Publication date Jul 6, 2023
- Nokia Technologies Oy
- Michael Eggleston
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT APPARATUS, MEASURING METHOD USING THE SAME, AND...
- Publication number 20230184535
- Publication date Jun 15, 2023
- Samsung Electronics Co., Ltd.
- Seung Woo LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPACT SNAPSHOT DUAL-MODE INTERFEROMETRIC SYSTEM
- Publication number 20230168075
- Publication date Jun 1, 2023
- Arizona Board of Regents on behalf of The University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Application
SIMULTANEOUS PHASE-SHIFT POINT DIFFRACTION INTERFEROMETER AND METHO...
- Publication number 20230160684
- Publication date May 25, 2023
- Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
- Peng FENG
- G01 - MEASURING TESTING
Information Patent Application
HETEROGENEOUS INTEGRATION DETECTING METHOD AND HETEROGENEOUS INTEGR...
- Publication number 20230152086
- Publication date May 18, 2023
- Industrial Technology Research Institute
- Hsiang-Chun Wei
- G01 - MEASURING TESTING
Information Patent Application
Automatic Optical Path Adjustment in Home OCT
- Publication number 20230101855
- Publication date Mar 30, 2023
- NOTAL VISION LTD.
- Amit Pascal
- G01 - MEASURING TESTING
Information Patent Application
LIGHT-SHEET PHOTONIC-FORCE OPTICAL COHERENCE ELASTOGRAPHY
- Publication number 20230072425
- Publication date Mar 9, 2023
- Cornell University
- Steven G ADIE
- G01 - MEASURING TESTING
Information Patent Application
Cost-Effective Line-Scan Optical Coherence Tomography Apparatus
- Publication number 20220381551
- Publication date Dec 1, 2022
- Hong Kong Applied Science and Technology Research Institute Company Limited
- Vladislav Nikitin
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS FOR INTERFEROMETRIC SHAPE MEASUREMENT
- Publication number 20220349700
- Publication date Nov 3, 2022
- Carl Zeiss SMT GMBH
- Jochen HETZLER
- G01 - MEASURING TESTING
Information Patent Application
Surface Shape Measurement Device and Surface Shape Measurement Method
- Publication number 20220349699
- Publication date Nov 3, 2022
- UNIVERSITY OF HYOGO
- Kunihiro Sato
- G01 - MEASURING TESTING

With imaging systems

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Pre-conditioning interferometer

Apparatus, systems and methods for detecting light

Heterogeneous integration detecting method and heterogeneous integr...

Apparatus for optical coherence tomography

Automatic optical path adjustment in home OCT

Full-field OCT method and system for generating an imaging of an oc...

Method and a system for characterising structures etched in a subst...

Method and a system for combined characterisation of structures etc...

Inertial point-source matter-wave atom interferometer gyroscope and...

Method and device for characterizing the surface shape of an optica...

Light-sheet photonic-force optical coherence elastography

Frequency-domain interferometric based imaging systems and methods

Measuring apparatus for interferometrically determining a surface s...

Methods and systems of holographic interferometry

Interferometric measurement method and interferometric measurement...

Image analysis

Simultaneous phase-shift point diffraction interferometer and metho...

Method for calibrating a measuring apparatus

System for spatial multiplexing

Multi-environment Rayleigh interferometer

Dual-optical displacement sensor alignment using knife edges

Laser interferometry systems and methods

Surface shape measurement device and surface shape measurement method

Ophthalmic optical coherence tomography with multiple resolutions

Apparatus for optical coherence tomography

Cost-effective line-scan optical coherence tomography apparatus

Methods and systems for coherent imaging and feedback control for m...

Automatic optical path adjustment in home OCT

Optical coherence tomographic apparatus and method for the same

Optical coherence tomography eye imaging techniques

Patents Applicationslast 30 patents

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

OPTICAL MEASUREMENT APPARATUS AND METHOD OF MEASURING AN AXIAL LENGTH

Solid-State Distinct-Unidirectional Photonic Interferometers for Co...

REFLECTIVE INTERFEROMETER SYSTEMS AND METHODS THEREOF

OPTICAL MEASUREMENT APPARATUS AND METHOD OF RAPID MEASUREMENT

IMAGE ANALYSIS

Methods and Systems for Coherent Imaging and Feedback Control for M...

PUPIL IMAGE MEASURING DEVICE AND METHOD

Solid-State Distinct-Unidirectional Photonic Interferometers for Co...

FREQUENCY-DOMAIN INTERFEROMETRIC BASED IMAGING SYSTEMS AND METHODS

Methods and Apparatuses for Fabricating Polymeric Conformal Coating...

SINGLE FRAME-TILTED WAVE INTERFEROMETER

METHOD AND A SYSTEM FOR CHARACTERISING STRUCTURES ETCHED IN A SUBST...

METHOD AND A SYSTEM FOR COMBINED CHARACTERISATION OF STRUCTURES ETC...

THREE-DIMENSIONAL MEASUREMENT DEVICE

COMPACT SHEAROGRAPHY SYSTEM WITH ADJUSTABLE SHEAR DISTANCE

OPTICAL COMPLEX AMPLITUDE MEASUREMENT DEVICE AND OPTICAL COMPLEX AM...

Multi-environment Rayleigh Interferometer

THREE-DIMENSIONAL MEASUREMENT DEVICE

METHOD FOR OPERATING AN OPTICAL TOMOGRAPHIC IMAGING APPARATUS

Apparatus For Optical Coherence Tomography

OPTICAL MEASUREMENT APPARATUS, MEASURING METHOD USING THE SAME, AND...

COMPACT SNAPSHOT DUAL-MODE INTERFEROMETRIC SYSTEM

SIMULTANEOUS PHASE-SHIFT POINT DIFFRACTION INTERFEROMETER AND METHO...

HETEROGENEOUS INTEGRATION DETECTING METHOD AND HETEROGENEOUS INTEGR...

Automatic Optical Path Adjustment in Home OCT

LIGHT-SHEET PHOTONIC-FORCE OPTICAL COHERENCE ELASTOGRAPHY

Cost-Effective Line-Scan Optical Coherence Tomography Apparatus

MEASURING APPARATUS FOR INTERFEROMETRIC SHAPE MEASUREMENT

Surface Shape Measurement Device and Surface Shape Measurement Method