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G01B9/0203
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PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B9/00
Instruments as specified in the subgroups and characterised by the use of optical measuring means
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G01B9/0203
With imaging systems
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Patents Grants
last 30 patents
Information
Patent Grant
Method and a system for characterising structures etched in a subst...
Patent number
11,959,736
Issue date
Apr 16, 2024
UNITY SEMICONDUCTOR
Wolfgang Alexander Iff
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and a system for combined characterisation of structures etc...
Patent number
11,959,737
Issue date
Apr 16, 2024
UNITY SEMICONDUCTOR
Wolfgang Alexander Iff
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inertial point-source matter-wave atom interferometer gyroscope and...
Patent number
11,940,276
Issue date
Mar 26, 2024
GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
John Edward Kitching
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Method and device for characterizing the surface shape of an optica...
Patent number
11,927,500
Issue date
Mar 12, 2024
Carl Zeiss SMT GmbH
Steffen Siegler
G01 - MEASURING TESTING
Information
Patent Grant
Light-sheet photonic-force optical coherence elastography
Patent number
11,920,930
Issue date
Mar 5, 2024
Cornell University
Steven G Adie
G01 - MEASURING TESTING
Information
Patent Grant
Frequency-domain interferometric based imaging systems and methods
Patent number
11,890,052
Issue date
Feb 6, 2024
Carl Zeiss Meditec, Inc.
Tilman Schmoll
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems of holographic interferometry
Patent number
11,892,292
Issue date
Feb 6, 2024
RD Synergy Ltd.
Dov Furman
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Measuring apparatus for interferometrically determining a surface s...
Patent number
11,892,283
Issue date
Feb 6, 2024
Carl Zeiss SMT GmbH
Stefan Schulte
G01 - MEASURING TESTING
Information
Patent Grant
Interferometric measurement method and interferometric measurement...
Patent number
11,879,721
Issue date
Jan 23, 2024
Carl Zeiss SMT GmbH
Alexander Wolf
G01 - MEASURING TESTING
Information
Patent Grant
Image analysis
Patent number
11,861,830
Issue date
Jan 2, 2024
MERIT CRO, INC.
Yijun Huang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Simultaneous phase-shift point diffraction interferometer and metho...
Patent number
11,788,829
Issue date
Oct 17, 2023
Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
Peng Feng
G01 - MEASURING TESTING
Information
Patent Grant
Method for calibrating a measuring apparatus
Patent number
11,774,237
Issue date
Oct 3, 2023
Carl Zeiss SMT GmbH
Jochen Hetzler
G01 - MEASURING TESTING
Information
Patent Grant
System for spatial multiplexing
Patent number
11,768,068
Issue date
Sep 26, 2023
Ramot at Tel Aviv University Ltd.
Natan Tzvi Shaked
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Multi-environment Rayleigh interferometer
Patent number
11,761,750
Issue date
Sep 19, 2023
Aaron Pung
G01 - MEASURING TESTING
Information
Patent Grant
Dual-optical displacement sensor alignment using knife edges
Patent number
11,740,356
Issue date
Aug 29, 2023
Honeywell International Inc.
Michael Kon Yew Hughes
G01 - MEASURING TESTING
Information
Patent Grant
Laser interferometry systems and methods
Patent number
11,703,315
Issue date
Jul 18, 2023
Nordson Corporation
Jerome Joseph Dapore
G01 - MEASURING TESTING
Information
Patent Grant
Surface shape measurement device and surface shape measurement method
Patent number
11,635,289
Issue date
Apr 25, 2023
UNIVERSITY OF HYOGO
Kunihiro Sato
G01 - MEASURING TESTING
Information
Patent Grant
Ophthalmic optical coherence tomography with multiple resolutions
Patent number
11,602,272
Issue date
Mar 14, 2023
Alcon Inc.
Brent Duchon
G02 - OPTICS
Information
Patent Grant
Apparatus for optical coherence tomography
Patent number
11,604,060
Issue date
Mar 14, 2023
Nokia Technologies Oy
Michael Eggleston
G01 - MEASURING TESTING
Information
Patent Grant
Cost-effective line-scan optical coherence tomography apparatus
Patent number
11,578,965
Issue date
Feb 14, 2023
Hong Kong Applied Science and Technology Research Institute Company Limited
Vladislav Nikitin
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Methods and systems for coherent imaging and feedback control for m...
Patent number
11,534,858
Issue date
Dec 27, 2022
IPG Photonics Corporation
Paul J. L. Webster
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Automatic optical path adjustment in home OCT
Patent number
11,464,408
Issue date
Oct 11, 2022
Notal Vision Ltd.
Amit Pascal
G01 - MEASURING TESTING
Information
Patent Grant
Optical coherence tomographic apparatus and method for the same
Patent number
11,464,409
Issue date
Oct 11, 2022
Canon Kabushiki Kaisha
Slawomir Orlowski
G01 - MEASURING TESTING
Information
Patent Grant
Optical coherence tomography eye imaging techniques
Patent number
11,435,177
Issue date
Sep 6, 2022
Tesseract Health, Inc.
Tyler S. Ralston
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method for generating a two-dimensional interferogram using a miche...
Patent number
11,421,979
Issue date
Aug 23, 2022
VISOTEC GMBH
Michael Münst
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Shape measurement system, probe tip unit, and shape measurement method
Patent number
11,421,976
Issue date
Aug 23, 2022
Hitachi, Ltd.
Tatsuo Hariyama
G01 - MEASURING TESTING
Information
Patent Grant
Frequency-domain optical interferometry imaging apparatus and metho...
Patent number
11,415,407
Issue date
Aug 16, 2022
The University of Liverpool
Yaochun Shen
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Laser interference device
Patent number
11,378,386
Issue date
Jul 5, 2022
Mitutoyo Corporation
Yuichiro Yokoyama
G01 - MEASURING TESTING
Information
Patent Grant
Interferometry with pixelated color discriminating elements combine...
Patent number
11,353,316
Issue date
Jun 7, 2022
Onto Innovation Inc.
Neal Brock
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for enhanced resolution imaging based on multip...
Patent number
11,326,870
Issue date
May 10, 2022
Duke University
Joseph Izatt
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Solid-State Distinct-Unidirectional Photonic Interferometers for Co...
Publication number
20240133672
Publication date
Apr 25, 2024
Val Parker
G01 - MEASURING TESTING
Information
Patent Application
FREQUENCY-DOMAIN INTERFEROMETRIC BASED IMAGING SYSTEMS AND METHODS
Publication number
20240115128
Publication date
Apr 11, 2024
Carl Zeiss Meditec, Inc.
Tilman Schmoll
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
Methods and Apparatuses for Fabricating Polymeric Conformal Coating...
Publication number
20240042481
Publication date
Feb 8, 2024
UCL Business LTD
Paul Beard
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
SINGLE FRAME-TILTED WAVE INTERFEROMETER
Publication number
20240003672
Publication date
Jan 4, 2024
UNIVERSITAT STUTTGART
Christof PRUß
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND A SYSTEM FOR CHARACTERISING STRUCTURES ETCHED IN A SUBST...
Publication number
20230375332
Publication date
Nov 23, 2023
Unity Semiconductor
Wolfgang Alexander IFF
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND A SYSTEM FOR COMBINED CHARACTERISATION OF STRUCTURES ETC...
Publication number
20230375333
Publication date
Nov 23, 2023
Unity Semiconductor
Wolfgang Alexander IFF
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
THREE-DIMENSIONAL MEASUREMENT DEVICE
Publication number
20230366668
Publication date
Nov 16, 2023
CKD CORPORATION
Hiroyuki Ishigaki
G01 - MEASURING TESTING
Information
Patent Application
COMPACT SHEAROGRAPHY SYSTEM WITH ADJUSTABLE SHEAR DISTANCE
Publication number
20230296368
Publication date
Sep 21, 2023
Nikon Corporation
Eric Peter Goodwin
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL COMPLEX AMPLITUDE MEASUREMENT DEVICE AND OPTICAL COMPLEX AM...
Publication number
20230288182
Publication date
Sep 14, 2023
Nippon Telegraph and Telephone Corporation
Hiroki SAKUMA
G01 - MEASURING TESTING
Information
Patent Application
Multi-environment Rayleigh Interferometer
Publication number
20230273009
Publication date
Aug 31, 2023
Utah State University Space Dynamics Laboratory
Aaron Pung
G02 - OPTICS
Information
Patent Application
THREE-DIMENSIONAL MEASUREMENT DEVICE
Publication number
20230243643
Publication date
Aug 3, 2023
CKD CORPORATION
Hiroyuki Ishigaki
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR OPERATING AN OPTICAL TOMOGRAPHIC IMAGING APPARATUS
Publication number
20230213328
Publication date
Jul 6, 2023
DELAWAVE, INC.
Kenji TAIRA
G01 - MEASURING TESTING
Information
Patent Application
Apparatus For Optical Coherence Tomography
Publication number
20230213329
Publication date
Jul 6, 2023
Nokia Technologies Oy
Michael Eggleston
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASUREMENT APPARATUS, MEASURING METHOD USING THE SAME, AND...
Publication number
20230184535
Publication date
Jun 15, 2023
Samsung Electronics Co., Ltd.
Seung Woo LEE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COMPACT SNAPSHOT DUAL-MODE INTERFEROMETRIC SYSTEM
Publication number
20230168075
Publication date
Jun 1, 2023
Arizona Board of Regents on behalf of The University of Arizona
Rongguang Liang
G01 - MEASURING TESTING
Information
Patent Application
SIMULTANEOUS PHASE-SHIFT POINT DIFFRACTION INTERFEROMETER AND METHO...
Publication number
20230160684
Publication date
May 25, 2023
Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
Peng FENG
G01 - MEASURING TESTING
Information
Patent Application
HETEROGENEOUS INTEGRATION DETECTING METHOD AND HETEROGENEOUS INTEGR...
Publication number
20230152086
Publication date
May 18, 2023
Industrial Technology Research Institute
Hsiang-Chun Wei
G01 - MEASURING TESTING
Information
Patent Application
Automatic Optical Path Adjustment in Home OCT
Publication number
20230101855
Publication date
Mar 30, 2023
NOTAL VISION LTD.
Amit Pascal
G01 - MEASURING TESTING
Information
Patent Application
LIGHT-SHEET PHOTONIC-FORCE OPTICAL COHERENCE ELASTOGRAPHY
Publication number
20230072425
Publication date
Mar 9, 2023
Cornell University
Steven G ADIE
G01 - MEASURING TESTING
Information
Patent Application
Cost-Effective Line-Scan Optical Coherence Tomography Apparatus
Publication number
20220381551
Publication date
Dec 1, 2022
Hong Kong Applied Science and Technology Research Institute Company Limited
Vladislav Nikitin
G01 - MEASURING TESTING
Information
Patent Application
MEASURING APPARATUS FOR INTERFEROMETRIC SHAPE MEASUREMENT
Publication number
20220349700
Publication date
Nov 3, 2022
Carl Zeiss SMT GMBH
Jochen HETZLER
G01 - MEASURING TESTING
Information
Patent Application
Surface Shape Measurement Device and Surface Shape Measurement Method
Publication number
20220349699
Publication date
Nov 3, 2022
UNIVERSITY OF HYOGO
Kunihiro Sato
G01 - MEASURING TESTING
Information
Patent Application
INTERFEROMETRIC MEASUREMENT METHOD AND INTERFEROMETRIC MEASUREMENT...
Publication number
20220307822
Publication date
Sep 29, 2022
Carl Zeiss SMT GMBH
Alexander Wolf
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR SPATIAL MULTIPLEXING
Publication number
20220307815
Publication date
Sep 29, 2022
Ramot at Tel Aviv University Ltd.
Natan Tzvi SHAKED
G01 - MEASURING TESTING
Information
Patent Application
PRE-CONDITIONING INTERFEROMETER
Publication number
20220299310
Publication date
Sep 22, 2022
Arizona Board of Regents on behalf of The University of Arizona
Dae Wook Kim
G01 - MEASURING TESTING
Information
Patent Application
IMAGE ANALYSIS
Publication number
20220254011
Publication date
Aug 11, 2022
EyeKor, LLC
Yijun Huang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICA...
Publication number
20220236139
Publication date
Jul 28, 2022
Carl Zeiss SMT GMBH
Steffen SIEGLER
G01 - MEASURING TESTING
Information
Patent Application
Photonic Quantum Networking for Large Superconducting Qubit Modules
Publication number
20220222567
Publication date
Jul 14, 2022
Rigetti & Co, LLC
Matthew J. Reagor
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEASURING APPARATUS FOR INTERFEROMETRICALLY DETERMINING A SURFACE S...
Publication number
20220221269
Publication date
Jul 14, 2022
Carl Zeiss SMT GMBH
Stefan SCHULTE
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, SYSTEMS AND METHODS FOR DETECTING LIGHT
Publication number
20220196385
Publication date
Jun 23, 2022
Nokia Technologies Oy
Xin YUAN
G01 - MEASURING TESTING