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with indication of measured value by calibrated null indicator
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CPC
G01R17/14
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R17/00
Measuring arrangements involving comparison with a reference value
Current Industry
G01R17/14
with indication of measured value by calibrated null indicator
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Patents Grants
last 30 patents
Information
Patent Grant
Monitoring device and method of monitoring an impedance of a protec...
Patent number
11,486,907
Issue date
Nov 1, 2022
TE Connectivity Germany GmbH
Stefan Kipp
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Null detector devices and systems employing same
Patent number
10,845,394
Issue date
Nov 24, 2020
Guildline Instruments Limited
Tomasz Barczyk
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and circuit arrangement for the self-testing of a reference...
Patent number
7,394,239
Issue date
Jul 1, 2008
NXP B.V.
Martin Kadner
G01 - MEASURING TESTING
Information
Patent Grant
Linear low drift bridge amplifier
Patent number
4,229,692
Issue date
Oct 21, 1980
Burr-Brown Research Corporation
Jerald G. Graeme
G01 - MEASURING TESTING
Information
Patent Grant
3913392
Patent number
3,913,392
Issue date
Oct 21, 1975
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
NULL DETECTOR DEVICES AND SYSTEMS EMPLOYING SAME
Publication number
20190170796
Publication date
Jun 6, 2019
Guildline Instruments Limited
Tomasz BARCZYK
G01 - MEASURING TESTING
Information
Patent Application
Method and Circuit Arrangement for the Self-Testing of a Reference...
Publication number
20070216395
Publication date
Sep 20, 2007
Koninklijke Philips Electronics N.V.
Martin Kadner
G01 - MEASURING TESTING