with individual probe elements

Industry

CPC
G01R1/07307

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/07307with individual probe elements

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Probe position monitoring structure and method of monitoring positi...
- Patent number 12,339,315
- Issue date Jun 24, 2025
- United Semiconductor Japan Co., Ltd.
- Yasunobu Torii
- G01 - MEASURING TESTING
Information Patent Grant
Interface board for testing image sensor, test system having the sa...
- Patent number 12,328,424
- Issue date Jun 10, 2025
- Samsung Electronics Co., Ltd.
- Shinki Jeong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Controlling alignment during a thermal cycle
- Patent number 12,298,328
- Issue date May 13, 2025
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Test system and test device
- Patent number 12,287,364
- Issue date Apr 29, 2025
- LEADPOWER-SEMI CO., LTD.
- Cheng-Jyun Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing a probe used for testing integrated electronic...
- Patent number 12,248,012
- Issue date Mar 11, 2025
- STMicroelectronics S.r.l.
- Alberto Pagani
- G01 - MEASURING TESTING
Information Patent Grant
Tilt calibration for probe systems
- Patent number 12,216,140
- Issue date Feb 4, 2025
- The Boeing Company
- Peter D. Brewer
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing fixture and process for electrode of neuromodulation...
- Patent number 12,203,960
- Issue date Jan 21, 2025
- Industrial Technology Research Institute
- Jo-Ping Lee
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing light-emitting devices
- Patent number 12,188,974
- Issue date Jan 7, 2025
- Epistar Corporation
- Sheng Jie Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Coaxial probe
- Patent number 12,111,343
- Issue date Oct 8, 2024
- Xcerra Corporation
- Yukang Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing substrate and manufacturing method thereof and probe card
- Patent number 12,108,543
- Issue date Oct 1, 2024
- Hermes Testing Solutions Inc.
- Chiao-Pei Chen
- G01 - MEASURING TESTING
Information Patent Grant
Electrical component inspection instrument
- Patent number 12,105,117
- Issue date Oct 1, 2024
- Japan Aviation Electronics Industry, Limited
- Junji Oosaka
- G01 - MEASURING TESTING
Information Patent Grant
Detection apparatus and anti-bending device thereof
- Patent number 12,099,083
- Issue date Sep 24, 2024
- JTRON TECHNOLOGY CORP.
- Chen-Nan Chen
- G01 - MEASURING TESTING
Information Patent Grant
Sensor device, water amount measurement device, water amount measur...
- Patent number 12,066,461
- Issue date Aug 20, 2024
- Sony Group Corporation
- Atsushi Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Prober controlling device, prober controlling method, and prober
- Patent number 12,007,413
- Issue date Jun 11, 2024
- Tokyo Seimitsu Co., Ltd.
- Tetsuo Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Differential measurement probe
- Patent number 12,007,412
- Issue date Jun 11, 2024
- Rohde & Schwarz GmbH & Co. KG
- Benedikt Lippert
- G01 - MEASURING TESTING
Information Patent Grant
Detection unit, semiconductor film layer inspection apparatus inclu...
- Patent number 12,000,866
- Issue date Jun 4, 2024
- EnVigth Co., Ltd.
- Hyoung Sik Kim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for the automated assembly of a probe head
- Patent number 12,000,879
- Issue date Jun 4, 2024
- Technoprobe S.p.A.
- Roberto Subranni
- G01 - MEASURING TESTING
Information Patent Grant
Probe position monitoring structure and method of monitoring positi...
- Patent number 11,994,556
- Issue date May 28, 2024
- United Semiconductor Japan Co., Ltd.
- Yasunobu Torii
- G01 - MEASURING TESTING
Information Patent Grant
System for testing an integrated circuit of a device and its method...
- Patent number 11,977,098
- Issue date May 7, 2024
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and signal transmission method
- Patent number 11,940,465
- Issue date Mar 26, 2024
- NHK Spring Co., Ltd.
- Kazuya Soma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,927,539
- Issue date Mar 12, 2024
- Tokyo Electron Limited
- Naoki Akiyama
- G01 - MEASURING TESTING
Information Patent Grant
Multiprobe measurement device and method
- Patent number 11,867,724
- Issue date Jan 9, 2024
- Gerd Bresser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Probe module
- Patent number 11,860,191
- Issue date Jan 2, 2024
- SUZHOU HYC TECHNOLOGY CO., LTD.
- Bin Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Probe unit with a free length cantilever contactor and pedestal
- Patent number 11,860,190
- Issue date Jan 2, 2024
- Kabushiki Kaisha Nihon Micronics
- Satoshi Narita
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit device structures and double-sided electrical te...
- Patent number 11,854,894
- Issue date Dec 26, 2023
- Intel Corporation
- Valluri R. Rao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing probes for testing integrated electronic c...
- Patent number 11,796,568
- Issue date Oct 24, 2023
- STMicroelectronics S.r.l.
- Alberto Pagani
- G01 - MEASURING TESTING
Information Patent Grant
Probe position monitoring structure and method of monitoring positi...
- Patent number 11,714,123
- Issue date Aug 1, 2023
- United Semiconductor Japan Co., Ltd.
- Yasunobu Torii
- G01 - MEASURING TESTING
Information Patent Grant
Multi-prober chuck assembly and channel
- Patent number 11,686,762
- Issue date Jun 27, 2023
- Korea Institute of Industrial Technology
- Kyung Tae Nam
- G01 - MEASURING TESTING
Information Patent Grant
Control method of inspection apparatus and inspection apparatus
- Patent number 11,668,747
- Issue date Jun 6, 2023
- Tokyo Electron Limited
- Naoki Akiyama
- G01 - MEASURING TESTING
Information Patent Grant
Probe pin
- Patent number 11,630,128
- Issue date Apr 18, 2023
- GENED CO., LTD.
- Byung Sung Lee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20250224423
- Publication date Jul 10, 2025
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
System-Level Testing of a Processing Device Incorporated in a Silic...
- Publication number 20250208210
- Publication date Jun 26, 2025
- Google LLC
- Bhaskar Narayana Talatam
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MANUFACTURING APPARATUS
- Publication number 20250087526
- Publication date Mar 13, 2025
- Kabushiki Kaisha Toshiba
- Shun HASEBE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACT PIN ASSEMBLY FOR KELVIN TEST AND KELVIN TEST DEVICE COMPRIS...
- Publication number 20250044321
- Publication date Feb 6, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
ELECTRO-CONDUCTIVE CONTACT PIN, MANUFACTURING METHOD THEREFOR, AND...
- Publication number 20250020691
- Publication date Jan 16, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR TESTING AN INTEGRITY OF A FACE SEAL IN AN ELE...
- Publication number 20250012856
- Publication date Jan 9, 2025
- HAMILTON SUNDSTRAND CORPORATION
- Rajkumar Sengodan
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICE, WATER AMOUNT MEASUREMENT DEVICE, WATER AMOUNT MEASUR...
- Publication number 20240377435
- Publication date Nov 14, 2024
- SONY GROUP CORPORATION
- Atsushi YAMADA
- G01 - MEASURING TESTING
Information Patent Application
MEMS PROBE MODULE STRUCTURE
- Publication number 20240377434
- Publication date Nov 14, 2024
- TAIWAN MASK CORPORATION
- SHANG-KUANG WU
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
TEST FIXTURE AND EARLY WARNING SYSTEM
- Publication number 20240329079
- Publication date Oct 3, 2024
- TRIPLE WIN TECHNOLOGY(SHENZHEN) CO.LTD.
- YING-QUAN ZHAO
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND TEST DEVICE
- Publication number 20240302427
- Publication date Sep 12, 2024
- Leadpower-semi CO., LTD.
- Cheng-Jyun WANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE POSITION MONITORING STRUCTURE AND METHOD OF MONITORING POSITI...
- Publication number 20240264225
- Publication date Aug 8, 2024
- United Semiconductor Japan Co., Ltd.
- Yasunobu Torii
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND TECHNIQUES FOR DETERMINING WHEN A PROBE TIP IS PROXIMAT...
- Publication number 20240255571
- Publication date Aug 1, 2024
- Xallent Inc.
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLING ALIGNMENT DURING A THERMAL CYCLE
- Publication number 20240230714
- Publication date Jul 11, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
MEMS probes having decoupled electrical and mechanical design
- Publication number 20240201225
- Publication date Jun 20, 2024
- Kevin John Hughes
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT DEVICE STRUCTURES AND DOUBLE-SIDED ELECTRICAL TE...
- Publication number 20240194533
- Publication date Jun 13, 2024
- Intel Corporation
- Valluri R. RAO
- G01 - MEASURING TESTING
Information Patent Application
TILT CALIBRATION FOR PROBE SYSTEMS
- Publication number 20240125817
- Publication date Apr 18, 2024
- The Boeing Company
- Peter D. Brewer
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD HAVING SPRING PROBES
- Publication number 20240118313
- Publication date Apr 11, 2024
- MPI Corporation
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
PROBER CONTROLLING DEVICE, PROBER CONTROLLING METHOD, AND PROBER
- Publication number 20240094254
- Publication date Mar 21, 2024
- TOKYO SEIMITSU CO., LTD.
- Tetsuo YOSHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for Making Probe Arrays Utilizing Deformed Templates
- Publication number 20240094636
- Publication date Mar 21, 2024
- Microfabrica Inc.
- Onnik Yaglioglu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES
- Publication number 20240044940
- Publication date Feb 8, 2024
- TECHNOPROBE S.P.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PIN AND SOCKET FOR INSPECTION
- Publication number 20240019462
- Publication date Jan 18, 2024
- Yamaichi Electronics Co., Ltd.
- Junichi MIYAAKI
- G01 - MEASURING TESTING
Information Patent Application
PROBES FOR TESTING INTEGRATED ELECTRONIC CIRCUITS AND CORRESPONDING...
- Publication number 20240012029
- Publication date Jan 11, 2024
- STMicroelectronics S.r.l
- Alberto PAGANI
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
DIFFERENTIAL MEASUREMENT PROBE
- Publication number 20230341437
- Publication date Oct 26, 2023
- Rohde& Schwarz GmbH & Co. KG
- Benedikt LIPPERT
- G01 - MEASURING TESTING
Information Patent Application
PROBE DEVICE
- Publication number 20230341439
- Publication date Oct 26, 2023
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
DETECTION UNIT, SEMICONDUCTOR FILM LAYER INSPECTION APPARATUS INCLU...
- Publication number 20230341438
- Publication date Oct 26, 2023
- ENGION CO., LTD.
- Hyoung Sik KIM
- G01 - MEASURING TESTING
Information Patent Application
PROBE POSITION MONITORING STRUCTURE AND METHOD OF MONITORING POSITI...
- Publication number 20230314504
- Publication date Oct 5, 2023
- United Semiconductor Japan Co., Ltd.
- Yasunobu Torii
- G01 - MEASURING TESTING
Information Patent Application
Vertical probe array having sliding contacts in elastic guide plate
- Publication number 20230251287
- Publication date Aug 10, 2023
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONEN...
- Publication number 20230243871
- Publication date Aug 3, 2023
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Application
TESTING SUBSTRATE AND MANUFACTURING METHOD THEREOF AND PROBE CARD
- Publication number 20230217600
- Publication date Jul 6, 2023
- HERMES TESTING SOLUTIONS INC.
- Chiao-Pei Chen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
MANUFACTURING FIXTURE AND PROCESS FOR ELECTRODE OF NEUROMODULATION...
- Publication number 20230204627
- Publication date Jun 29, 2023
- Industrial Technology Research Institute
- JO-PING LEE
- G01 - MEASURING TESTING

with individual probe elements

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Probe position monitoring structure and method of monitoring positi...

Interface board for testing image sensor, test system having the sa...

Controlling alignment during a thermal cycle

Test system and test device

Method for producing a probe used for testing integrated electronic...

Tilt calibration for probe systems

Manufacturing fixture and process for electrode of neuromodulation...

Method for testing light-emitting devices

Coaxial probe

Testing substrate and manufacturing method thereof and probe card

Electrical component inspection instrument

Detection apparatus and anti-bending device thereof

Sensor device, water amount measurement device, water amount measur...

Prober controlling device, prober controlling method, and prober

Differential measurement probe

Detection unit, semiconductor film layer inspection apparatus inclu...

Apparatus for the automated assembly of a probe head

Probe position monitoring structure and method of monitoring positi...

System for testing an integrated circuit of a device and its method...

Contact probe and signal transmission method

Inspection apparatus and inspection method

Multiprobe measurement device and method

Probe module

Probe unit with a free length cantilever contactor and pedestal

Integrated circuit device structures and double-sided electrical te...

Method for manufacturing probes for testing integrated electronic c...

Probe position monitoring structure and method of monitoring positi...

Multi-prober chuck assembly and channel

Control method of inspection apparatus and inspection apparatus

Probe pin

Patents Applicationslast 30 patents

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

System-Level Testing of a Processing Device Incorporated in a Silic...

SEMICONDUCTOR MANUFACTURING APPARATUS

CONTACT PIN ASSEMBLY FOR KELVIN TEST AND KELVIN TEST DEVICE COMPRIS...

ELECTRO-CONDUCTIVE CONTACT PIN, MANUFACTURING METHOD THEREFOR, AND...

SYSTEM AND METHOD FOR TESTING AN INTEGRITY OF A FACE SEAL IN AN ELE...

SENSOR DEVICE, WATER AMOUNT MEASUREMENT DEVICE, WATER AMOUNT MEASUR...

MEMS PROBE MODULE STRUCTURE

TEST FIXTURE AND EARLY WARNING SYSTEM

TEST SYSTEM AND TEST DEVICE

PROBE POSITION MONITORING STRUCTURE AND METHOD OF MONITORING POSITI...

METHODS AND TECHNIQUES FOR DETERMINING WHEN A PROBE TIP IS PROXIMAT...

CONTROLLING ALIGNMENT DURING A THERMAL CYCLE

MEMS probes having decoupled electrical and mechanical design

INTEGRATED CIRCUIT DEVICE STRUCTURES AND DOUBLE-SIDED ELECTRICAL TE...

TILT CALIBRATION FOR PROBE SYSTEMS

PROBE HEAD HAVING SPRING PROBES

PROBER CONTROLLING DEVICE, PROBER CONTROLLING METHOD, AND PROBER

Methods for Making Probe Arrays Utilizing Deformed Templates

CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES

CONTACT PIN AND SOCKET FOR INSPECTION

PROBES FOR TESTING INTEGRATED ELECTRONIC CIRCUITS AND CORRESPONDING...

DIFFERENTIAL MEASUREMENT PROBE

PROBE DEVICE

DETECTION UNIT, SEMICONDUCTOR FILM LAYER INSPECTION APPARATUS INCLU...

PROBE POSITION MONITORING STRUCTURE AND METHOD OF MONITORING POSITI...

Vertical probe array having sliding contacts in elastic guide plate

PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONEN...

TESTING SUBSTRATE AND MANUFACTURING METHOD THEREOF AND PROBE CARD

MANUFACTURING FIXTURE AND PROCESS FOR ELECTRODE OF NEUROMODULATION...