TREA

with linear movement of probe

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  • CPC
  • G01R1/26
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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/26with linear movement of probe
Industries

Patents Grantslast 30 patents

  • Information Patent Grant

    Two probe low profile tuner
    • Patent number 12,199,592
    • Issue date Jan 14, 2025
    • Christos Tsironis
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Anisotropic constitutive parameters for launching a Zenneck surface...
    • Patent number 11,555,840
    • Issue date Jan 17, 2023
    • CPG TECHNOLOGIES, LLC
    • Buford Randall Jean
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Low profile high speed load pull tuner system
    • Patent number 11,428,771
    • Issue date Aug 30, 2022
    • Christos Tsironis
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Broadband probes for impedance tuners
    • Patent number 10,979,016
    • Issue date Apr 13, 2021
    • Maury Microwave, Inc.
    • M. Tekamül Büber
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Broadband probes for impedance tuners
    • Patent number 10,560,067
    • Issue date Feb 11, 2020
    • Maury Microwave, Inc.
    • M. Tekamül Büber
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Impedance tuners with mechanical stop
    • Patent number 8,461,946
    • Issue date Jun 11, 2013
    • Christos Tsironis
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Self adjustable probes for slide screw impedance tuners
    • Patent number 8,427,255
    • Issue date Apr 23, 2013
    • Christos Tsironis
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Multi-probes as single RF tuning element for RF slide-screw tuners
    • Patent number 7,280,012
    • Issue date Oct 9, 2007
    • Philippe Boulerne
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3659468
    • Patent number 3,659,468
    • Issue date May 2, 1972
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3422350
    • Patent number 3,422,350
    • Issue date Jan 14, 1969
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3391355
    • Patent number 3,391,355
    • Issue date Jul 2, 1968
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2996692
    • Patent number 2,996,692
    • Issue date Aug 15, 1961
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2838670
    • Patent number 2,838,670
    • Issue date Jun 10, 1958
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2663754
    • Patent number 2,663,754
    • Issue date Dec 22, 1953
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2571055
    • Patent number 2,571,055
    • Issue date Oct 9, 1951
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2534437
    • Patent number 2,534,437
    • Issue date Dec 19, 1950
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2516169
    • Patent number 2,516,169
    • Issue date Jul 25, 1950
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2496837
    • Patent number 2,496,837
    • Issue date Feb 7, 1950
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2439527
    • Patent number 2,439,527
    • Issue date Apr 13, 1948
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2404797
    • Patent number 2,404,797
    • Issue date Jul 30, 1946
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents