with magnetic and electrostatic sectors of 90 degrees

Industry

  • CPC
  • H01J49/326
This industry / category may be too specific. Please go to a parent level for more data

Patents Grantslast 30 patents

  • Information Patent Grant

    Multiple beam secondary ion mass spectrometry device

    • Patent number 11,545,352
    • Issue date Jan 3, 2023
    • LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
    • Marina Verruno
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Ultra-compact mass analysis device and ultra-compact particle accel...

    • Patent number 10,804,087
    • Issue date Oct 13, 2020
    • Takashi Hosaka
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Ultra-compact mass analysis device and ultra-compact particle accel...

    • Patent number 10,249,483
    • Issue date Apr 2, 2019
    • Takashi Hosaka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Mass spectrometer having a multichannel detector

    • Patent number 5,198,666
    • Issue date Mar 30, 1993
    • Robert H. Bateman
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged-particle energy analyzer and mass spectrometer incorporatin...

    • Patent number 5,194,732
    • Issue date Mar 16, 1993
    • Robert H. Bateman
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Double-focusing mass spectrometer having Wien filter and MS/MS inst...

    • Patent number 4,866,267
    • Issue date Sep 12, 1989
    • Jeol Ltd.
    • Hisashi Matsuda
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometers

    • Patent number 4,672,204
    • Issue date Jun 9, 1987
    • Thomson-CSF
    • Georges Slodzian
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    High clarity mass spectrometer capable of multiple simultaneous det...

    • Patent number 4,638,160
    • Issue date Jan 20, 1987
    • Office National d'Etudes et de Recherche Aerospatiales (ONERA)
    • Georges Slodzian
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer

    • Patent number 4,480,187
    • Issue date Oct 30, 1984
    • Esco Co., Ltd.
    • Hisashi Matsuda
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Double focussing mass spectrometer

    • Patent number 4,427,885
    • Issue date Jan 24, 1984
    • Shimadzu Seisakusho Ltd.
    • Takehiro Takeda
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer beam monitor

    • Patent number 4,099,052
    • Issue date Jul 4, 1978
    • E. I. Du Pont de Nemours and Company
    • Charles R. McKinney
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Methods of mass spectrometry and mass spectrometers

    • Patent number 3,950,641
    • Issue date Apr 13, 1976
    • Associated Electrical Industries Limited
    • Sydney Evans
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    3870881

    • Patent number 3,870,881
    • Issue date Mar 11, 1975
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3831026

    • Patent number 3,831,026
    • Issue date Aug 20, 1974
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    3814936

    • Patent number 3,814,936
    • Issue date Jun 4, 1974
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    3803410

    • Patent number 3,803,410
    • Issue date Apr 9, 1974
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    3796872

    • Patent number 3,796,872
    • Issue date Mar 12, 1974
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    3770337

    • Patent number 3,770,337
    • Issue date Nov 6, 1973
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    3745343

    • Patent number 3,745,343
    • Issue date Jul 10, 1973
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    3740551

    • Patent number 3,740,551
    • Issue date Jun 19, 1973
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    3689764

    • Patent number 3,689,764
    • Issue date Sep 5, 1972
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    3657531

    • Patent number 3,657,531
    • Issue date Apr 18, 1972
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    3641339

    • Patent number 3,641,339
    • Issue date Feb 8, 1972
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3573453

    • Patent number 3,573,453
    • Issue date Apr 6, 1971
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    3504174

    • Patent number 3,504,174
    • Issue date Mar 31, 1970
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    3469092

    • Patent number 3,469,092
    • Issue date Sep 23, 1969
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    3465142

    • Patent number 3,465,142
    • Issue date Sep 2, 1969
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    3187180

    • Patent number 3,187,180
    • Issue date Jun 1, 1965
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents