with measurement of absorption or reflection

Industry

CPC
G01B11/0625

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/0625with measurement of absorption or reflection

Industries

Patents Grantslast 30 patents

Information Patent Grant
Measuring device and method of operating a measuring device
- Patent number 12,146,733
- Issue date Nov 19, 2024
- Helmut Fischer GmbH Institut für Elektronik und Messtechnik
- Rüdiger Mästle
- G01 - MEASURING TESTING
Information Patent Grant
IR absorption and interferometry system for determining a thickness...
- Patent number 12,130,126
- Issue date Oct 29, 2024
- Cargill, Incorporated
- Amina Alaoui
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement apparatus and optical measurement method
- Patent number 12,111,146
- Issue date Oct 8, 2024
- Otsuka Electronics Co., Ltd.
- Kunikazu Taguchi
- G01 - MEASURING TESTING
Information Patent Grant
System, device and method for measuring the interior refractory lin...
- Patent number 12,104,890
- Issue date Oct 1, 2024
- Process Metrix, LLC
- Michel P. Bonin
- G01 - MEASURING TESTING
Information Patent Grant
In-situ film growth rate monitoring apparatus, systems, and methods...
- Patent number 12,077,880
- Issue date Sep 3, 2024
- Applied Materials, Inc.
- Zhepeng Cong
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Plasma processing apparatus and plasma processing method
- Patent number 12,074,076
- Issue date Aug 27, 2024
- HITACHI HIGH-TECH CORPORATION
- Soichiro Eto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for determining a layer thickness and method of operating...
- Patent number 12,061,077
- Issue date Aug 13, 2024
- Helmut Fischer GmbH Institut für Elektronik und Messtechnik
- Rüdiger Mästle
- G01 - MEASURING TESTING
Information Patent Grant
Optical metrology models for in-line film thickness measurements
- Patent number 12,062,583
- Issue date Aug 13, 2024
- Applied Materials Israel Ltd.
- Eric Chin Hong Ng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vacuum processing apparatus and vacuum processing method
- Patent number 12,062,530
- Issue date Aug 13, 2024
- HITACHI HIGH-TECH CORPORATION
- Yusuke Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical sensor of bio-molecules using interferometer
- Patent number 12,055,486
- Issue date Aug 6, 2024
- ACCESS MEDICAL SYSTEMS, LTD.
- Hong Tan
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting coating wear
- Patent number 12,038,268
- Issue date Jul 16, 2024
- Hamilton Sundstrand Corporation
- Kevin R. Bordage
- G01 - MEASURING TESTING
Information Patent Grant
Patient support with deck width monitoring and control
- Patent number 12,036,161
- Issue date Jul 16, 2024
- Stryker Corporation
- Jason J. Connell
- A47 - FURNITURE DOMESTIC ARTICLES OR APPLIANCES COFFEE MILLS SPICE MILLS SUCT...
Information Patent Grant
System and method for performing tear film structure measurement
- Patent number 12,023,099
- Issue date Jul 2, 2024
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Metrology system and method for determining a characteristic of one...
- Patent number 12,007,700
- Issue date Jun 11, 2024
- ASML Netherlands B.V.
- Patricius Aloysius Jacobus Tinnemans
- G01 - MEASURING TESTING
Information Patent Grant
Thin film, in-situ measurement through transparent crystal and tran...
- Patent number 12,009,191
- Issue date Jun 11, 2024
- Applied Materials, Inc.
- Patrick Tae
- G01 - MEASURING TESTING
Information Patent Grant
Detection device and pole piece manufacturing equipment
- Patent number 11,988,498
- Issue date May 21, 2024
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Liangjie Yan
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Optical unit and film thickness measurement device
- Patent number 11,988,497
- Issue date May 21, 2024
- Hamamatsu Photonics K.K.
- Ikuo Arata
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring film thickness distribution of wafer with thin...
- Patent number 11,965,730
- Issue date Apr 23, 2024
- Shin-Etsu Handotai Co., Ltd.
- Susumu Kuwabara
- G01 - MEASURING TESTING
Information Patent Grant
Film thickness measuring apparatus and film thickness measuring met...
- Patent number 11,939,665
- Issue date Mar 26, 2024
- Tokyo Electron Limted
- Masato Shinada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser absorptivity measurement device
- Patent number 11,913,830
- Issue date Feb 27, 2024
- National Technology & Engineering Solutions of Sandia, LLC
- Daniel Tung
- G01 - MEASURING TESTING
Information Patent Grant
Polishing apparatus and polishing method
- Patent number 11,911,867
- Issue date Feb 27, 2024
- Ebara Corporation
- Toshifumi Kimba
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring a surface of an object comprising d...
- Patent number 11,906,302
- Issue date Feb 20, 2024
- UNITY SEMICONDUCTOR
- Jean-François Boulanger
- G01 - MEASURING TESTING
Information Patent Grant
PECVD process
- Patent number 11,898,249
- Issue date Feb 13, 2024
- Applied Materials, Inc.
- Nagarajan Rajagopalan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Protective film thickness measuring method
- Patent number 11,892,282
- Issue date Feb 6, 2024
- Disco Corporation
- Hiroto Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement system, optical measurement method, and non-tra...
- Patent number 11,892,281
- Issue date Feb 6, 2024
- Otsuka Electronics Co., Ltd.
- Shiro Kawaguchi
- G01 - MEASURING TESTING
Information Patent Grant
System and method for liquid dispense and coverage control
- Patent number 11,883,837
- Issue date Jan 30, 2024
- Tokyo Electron Limited
- Mirko Vukovic
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Method and system for measuring coating thickness
- Patent number 11,885,610
- Issue date Jan 30, 2024
- TeraView Limited
- Ian Stephen Gregory
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring film thickness of semiconductor device
- Patent number 11,867,497
- Issue date Jan 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yongshang Sheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quality control of substrate coatings
- Patent number 11,828,584
- Issue date Nov 28, 2023
- VAXXAS PTY LIMITED
- Michael Carl Junger
- G01 - MEASURING TESTING
Information Patent Grant
Grouping spectral data from polishing substrates
- Patent number 11,774,235
- Issue date Oct 3, 2023
- Applied Materials, Inc.
- Jeffrey Drue David
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SUBSTRATE PROCESSING SYSTEM AND FILM THICKNESS MEASURING METHOD
- Publication number 20240387301
- Publication date Nov 21, 2024
- TOKYO ELECTRON LIMITED
- Hirokazu KYOKANE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR MEASURING OPTICAL THICKNESS
- Publication number 20240377186
- Publication date Nov 14, 2024
- PRECITEC OPTRONIK GMBH
- Stephan Weiß
- G01 - MEASURING TESTING
Information Patent Application
PATIENT SUPPORT WITH DECK WIDTH MONITORING AND CONTROL
- Publication number 20240366448
- Publication date Nov 7, 2024
- Stryker Corporation
- Jason J. Connell
- A47 - FURNITURE DOMESTIC ARTICLES OR APPLIANCES COFFEE MILLS SPICE MILLS SUCT...
Information Patent Application
COATING EVALUATION DEVICE AND COATING EVALUATION METHOD
- Publication number 20240369494
- Publication date Nov 7, 2024
- NISSAN MOTOR CO., LTD.
- Shota YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
Coating Thickness Measuring Apparatus and Method
- Publication number 20240344822
- Publication date Oct 17, 2024
- LG CHEM, LTD.
- Do-Hyun Lee
- G01 - MEASURING TESTING
Information Patent Application
CURVATURE CORRECTION
- Publication number 20240328781
- Publication date Oct 3, 2024
- TERAVIEW LIMITED
- Ian Alasdair Pentland
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY SYSTEM AND METHOD FOR DETERMINING A CHARACTERISTIC OF ONE...
- Publication number 20240319620
- Publication date Sep 26, 2024
- ASML NETHERLANDS B.V.
- Patricius Aloysius Jacobus TINNEMANS
- G01 - MEASURING TESTING
Information Patent Application
THIN FILM, IN-SITU MEASUREMENT THROUGH TRANSPARENT CRYSTAL AND TRAN...
- Publication number 20240290592
- Publication date Aug 29, 2024
- Applied Materials, Inc.
- Patrick Tae
- G01 - MEASURING TESTING
Information Patent Application
PAINT THICKNESS MEASURING DEVICE AND COMPUTER-IMPLEMENTED METHOD FO...
- Publication number 20240271927
- Publication date Aug 15, 2024
- Agency for Science, Technology and Research
- Hai Sheng LEONG
- G01 - MEASURING TESTING
Information Patent Application
SENSOR SYSTEM FOR DETERMINING A THICKNESS OF A MATERIAL BODY
- Publication number 20240240934
- Publication date Jul 18, 2024
- Cargill, Incorporated
- Amina ALAOUI
- G01 - MEASURING TESTING
Information Patent Application
FILM THICKNESS MEASUREMENT DEVICE AND FILM THICKNESS MEASUREMENT ME...
- Publication number 20240240933
- Publication date Jul 18, 2024
- Hamamatsu Photonics K.K.
- Kunihiko TSUCHIYA
- G01 - MEASURING TESTING
Information Patent Application
IN-SITU WAFER THICKNESS AND GAP MONITORING USING THROUGH BEAM LASER...
- Publication number 20240210163
- Publication date Jun 27, 2024
- LAM RESEARCH CORPORATION
- Goon Heng WONG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING COATING THICKNESS
- Publication number 20240167810
- Publication date May 23, 2024
- Teraview Limited
- Ian Stephen Gregory
- G01 - MEASURING TESTING
Information Patent Application
QUALITY CONTROL OF SUBSTRATE COATINGS
- Publication number 20240159516
- Publication date May 16, 2024
- Vaxxas Pty Limited
- Michael Carl JUNGER
- G01 - MEASURING TESTING
Information Patent Application
DICHROIC MIRROR AND SHORTPASS FILTER FOR IN-SITU REFLECTOMETRY
- Publication number 20240141551
- Publication date May 2, 2024
- Applied Materials, Inc.
- Khokan C. PAUL
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
IN-SITU REFLECTOMETRY FOR REAL-TIME PROCESS CONTROL
- Publication number 20240142223
- Publication date May 2, 2024
- Applied Materials, Inc.
- Khokan C. PAUL
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE COMPUTER ASSISTED DETERMINATION OF PHYSICAL PROPERTI...
- Publication number 20240118075
- Publication date Apr 11, 2024
- UNIVERSITAT KONSTANZ
- Gabriel MICARD
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETECTING ABNORMALITY IN MEASURING OF FILM THICKNESS OF W...
- Publication number 20240102791
- Publication date Mar 28, 2024
- EBARA CORPORATION
- Akira Nakamura
- B24 - GRINDING POLISHING
Information Patent Application
System and Method for Liquid Dispense and Coverage Control
- Publication number 20240042472
- Publication date Feb 8, 2024
- TOKYO ELECTRON LIMITED
- Mirko VUKOVIC
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
MACHINE OF PASTE SHRINKAGE AND EXPANSION IN Z DIRECTION
- Publication number 20230417539
- Publication date Dec 28, 2023
- Henkel AG & Co. KGaA
- Wei Xiong
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING THE TEMPERATURE OF A RUBBERY MATERIAL ENTERI...
- Publication number 20230392995
- Publication date Dec 7, 2023
- COMPAGNIE GENERALE DES ETABLISSEMENTS MICHELIN
- Aurélien MONTOY
- G01 - MEASURING TESTING
Information Patent Application
YANKEE DRYER PROFILER AND CONTROL
- Publication number 20230295875
- Publication date Sep 21, 2023
- Michael Gorden
- D21 - PAPER-MAKING PRODUCTION OF CELLULOSE
Information Patent Application
DETECTION DEVICE AND POLE PIECE MANUFACTURING EQUIPMENT
- Publication number 20230288190
- Publication date Sep 14, 2023
- Contemporary Amperex Technology Co., Limited
- Liangjie YAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING A SURFACE OF AN OBJECT COMPRISING D...
- Publication number 20230251079
- Publication date Aug 10, 2023
- Unity Semiconductor
- Jean-François BOULANGER
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING THICKNESS AND OPTICAL CONSTANTS OF DIAMOND FILM
- Publication number 20230236007
- Publication date Jul 27, 2023
- HUAQIAO UNIVERSITY
- Changcai Cui
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS TO MEASURE PROPERTIES OF MOVING PRODUCTS IN DEV...
- Publication number 20230213444
- Publication date Jul 6, 2023
- Applied Materials, Inc.
- Todd J. Egan
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR CHARACTERIZATION OF GRAPHENE OXIDE COATINGS
- Publication number 20230213332
- Publication date Jul 6, 2023
- Via Separations, Inc.
- Brandon Ian MACDONALD
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETECTING COATING WEAR
- Publication number 20230204343
- Publication date Jun 29, 2023
- HAMILTON SUNDSTRAND CORPORATION
- Kevin R. Bordage
- G01 - MEASURING TESTING
Information Patent Application
PECVD PROCESS
- Publication number 20230193466
- Publication date Jun 22, 2023
- Applied Materials, Inc.
- Nagarajan RAJAGOPALAN
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
THIN FILM CHARACTERISTIC MEASURING APPARATUS
- Publication number 20230175834
- Publication date Jun 8, 2023
- LG ELECTRONICS INC.
- Jun PARK
- G02 - OPTICS

with measurement of absorption or reflection

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Measuring device and method of operating a measuring device

IR absorption and interferometry system for determining a thickness...

Optical measurement apparatus and optical measurement method

System, device and method for measuring the interior refractory lin...

In-situ film growth rate monitoring apparatus, systems, and methods...

Plasma processing apparatus and plasma processing method

Apparatus for determining a layer thickness and method of operating...

Optical metrology models for in-line film thickness measurements

Vacuum processing apparatus and vacuum processing method

Optical sensor of bio-molecules using interferometer

Method of detecting coating wear

Patient support with deck width monitoring and control

System and method for performing tear film structure measurement

Metrology system and method for determining a characteristic of one...

Thin film, in-situ measurement through transparent crystal and tran...

Detection device and pole piece manufacturing equipment

Optical unit and film thickness measurement device

Method for measuring film thickness distribution of wafer with thin...

Film thickness measuring apparatus and film thickness measuring met...

Laser absorptivity measurement device

Polishing apparatus and polishing method

Method and system for measuring a surface of an object comprising d...

PECVD process

Protective film thickness measuring method

Optical measurement system, optical measurement method, and non-tra...

System and method for liquid dispense and coverage control

Method and system for measuring coating thickness

Method for measuring film thickness of semiconductor device

Quality control of substrate coatings

Grouping spectral data from polishing substrates

Patents Applicationslast 30 patents

SUBSTRATE PROCESSING SYSTEM AND FILM THICKNESS MEASURING METHOD

METHOD AND DEVICE FOR MEASURING OPTICAL THICKNESS

PATIENT SUPPORT WITH DECK WIDTH MONITORING AND CONTROL

COATING EVALUATION DEVICE AND COATING EVALUATION METHOD

Coating Thickness Measuring Apparatus and Method

CURVATURE CORRECTION

METROLOGY SYSTEM AND METHOD FOR DETERMINING A CHARACTERISTIC OF ONE...

THIN FILM, IN-SITU MEASUREMENT THROUGH TRANSPARENT CRYSTAL AND TRAN...

PAINT THICKNESS MEASURING DEVICE AND COMPUTER-IMPLEMENTED METHOD FO...

SENSOR SYSTEM FOR DETERMINING A THICKNESS OF A MATERIAL BODY

FILM THICKNESS MEASUREMENT DEVICE AND FILM THICKNESS MEASUREMENT ME...

IN-SITU WAFER THICKNESS AND GAP MONITORING USING THROUGH BEAM LASER...

METHOD AND SYSTEM FOR MEASURING COATING THICKNESS

QUALITY CONTROL OF SUBSTRATE COATINGS

DICHROIC MIRROR AND SHORTPASS FILTER FOR IN-SITU REFLECTOMETRY

IN-SITU REFLECTOMETRY FOR REAL-TIME PROCESS CONTROL

METHOD FOR THE COMPUTER ASSISTED DETERMINATION OF PHYSICAL PROPERTI...

METHOD OF DETECTING ABNORMALITY IN MEASURING OF FILM THICKNESS OF W...

System and Method for Liquid Dispense and Coverage Control

MACHINE OF PASTE SHRINKAGE AND EXPANSION IN Z DIRECTION

METHOD FOR DETERMINING THE TEMPERATURE OF A RUBBERY MATERIAL ENTERI...

YANKEE DRYER PROFILER AND CONTROL

DETECTION DEVICE AND POLE PIECE MANUFACTURING EQUIPMENT

METHOD AND SYSTEM FOR MEASURING A SURFACE OF AN OBJECT COMPRISING D...

METHOD FOR MEASURING THICKNESS AND OPTICAL CONSTANTS OF DIAMOND FILM

METHODS AND SYSTEMS TO MEASURE PROPERTIES OF MOVING PRODUCTS IN DEV...

APPARATUS FOR CHARACTERIZATION OF GRAPHENE OXIDE COATINGS

METHOD OF DETECTING COATING WEAR

PECVD PROCESS

THIN FILM CHARACTERISTIC MEASURING APPARATUS