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PRESSURE DETECTION SENSOR
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Publication number 20190234814
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Publication date Aug 1, 2019
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LG Innotek Co., Ltd.
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Hyung YOON
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G01 - MEASURING TESTING
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GALVANIC ISOLATION COUPLING DEVICE
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Publication number 20190043671
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Publication date Feb 7, 2019
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Commissariat A L'Energie Atomique et Aux Energies Alternatives
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Ayrat Galisultanov
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H03 - BASIC ELECTRONIC CIRCUITRY
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TUNABLE CAPACITOR
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Publication number 20150262756
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Publication date Sep 17, 2015
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MCV Technologies, Inc.
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Edward C. Liang
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H01 - BASIC ELECTRIC ELEMENTS
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TUNABLE MEMS CAPACITOR
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Publication number 20150092315
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Publication date Apr 2, 2015
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NXP B.V.
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PETER G. STEENEKEN
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H01 - BASIC ELECTRIC ELEMENTS
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TUNABLE CAPACITOR
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Publication number 20140285945
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Publication date Sep 25, 2014
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MCV Technologies, Inc.
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Edward C. Liang
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H01 - BASIC ELECTRIC ELEMENTS
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MEMS ELECTROSTATIC ACTUATOR
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Publication number 20120055768
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Publication date Mar 8, 2012
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NXP B.V.
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Klaus Reimann
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H01 - BASIC ELECTRIC ELEMENTS
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VACUUM CAPACITOR
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Publication number 20110235231
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Publication date Sep 29, 2011
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MEIDENSHA CORPORATION
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Eiichi Takahashi
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H01 - BASIC ELECTRIC ELEMENTS
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VACUUM CAPACITOR
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Publication number 20110228441
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Publication date Sep 22, 2011
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MEIDENSHA CORPORATION
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Eiichi Takahashi
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H01 - BASIC ELECTRIC ELEMENTS
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VANADIUM OXIDE THERMAL MICROPROBES
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Publication number 20100289613
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Publication date Nov 18, 2010
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Palo Alto Research Center Incorporated
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Dirk De Bruyker
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G01 - MEASURING TESTING
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TUNABLE MEMS CAPACITOR
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Publication number 20100182731
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Publication date Jul 22, 2010
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NXP B.V.
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Peter G. Steeneken
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H03 - BASIC ELECTRONIC CIRCUITRY
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Device for varing capacitance
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Publication number 20070180923
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Publication date Aug 9, 2007
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Hanwang Technology Co., Ltd.
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Yingjian Liu
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G06 - COMPUTING CALCULATING COUNTING
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