With non-optical systems

Industry

CPC
G01B9/02031

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02031With non-optical systems

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for combining microscopic imaging with X-Ray imaging
- Patent number 11,058,388
- Issue date Jul 13, 2021
- PERIMETER MEDICAL IMAGING, INC.
- David Rempel
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Device and system for doppler optical coherence tomography (OCT) of...
- Patent number 10,682,058
- Issue date Jun 16, 2020
- Technische Universitát Dresden
- Edmund Koch
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Probing element and coordinate measuring machine for measuring at l...
- Patent number 10,495,441
- Issue date Dec 3, 2019
- Carl Zeiss Industrielle Messtechnik GmbH
- Aksel Goehnermeier
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, system, and method for non-destructive testing
- Patent number 10,495,611
- Issue date Dec 3, 2019
- Morteza Safai
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Optical detection system for determining neural activity in brain b...
- Patent number 10,420,469
- Issue date Sep 24, 2019
- HI LLC
- Daniel Sobek
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting a movement of a measuring probe and measuring i...
- Patent number 8,345,260
- Issue date Jan 1, 2013
- Mitutoyo Corporation
- Hartmut Illers
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Temperature/thickness measuring apparatus, temperature/thickness me...
- Patent number 7,379,189
- Issue date May 27, 2008
- Tokyo Electron Limited
- Tomohiro Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Configuration measuring apparatus and method
- Patent number 6,934,036
- Issue date Aug 23, 2005
- Matsushita Electric Industrial Co., Ltd.
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for obtaining an optical tomographic image of...
- Patent number 6,636,755
- Issue date Oct 21, 2003
- Fuji Photo Film Co., Ltd.
- Masahiro Toida
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Device and method for measuring deformation of a mechanical test sp...
- Patent number 6,279,404
- Issue date Aug 28, 2001
- European Atomic Energy Community (EUROTOM)
- Maurice Whelan
- G01 - MEASURING TESTING
Information Patent Grant
Compact, linear measurement interferometer with zero abbe error
- Patent number 4,509,858
- Issue date Apr 9, 1985
- GCA Corporation/Tropel Division
- Robert A. Smythe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods and Apparatuses for Fabricating Polymeric Conformal Coating...
- Publication number 20240042481
- Publication date Feb 8, 2024
- UCL Business LTD
- Paul Beard
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
OPTICAL DETECTION SYSTEM FOR DETERMINING NEURAL ACTIVITY IN BRAIN B...
- Publication number 20190150745
- Publication date May 23, 2019
- HI LLC
- Daniel Sobek
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
PROBING ELEMENT AND COORDINATE MEASURING MACHINE FOR MEASURING AT L...
- Publication number 20190107381
- Publication date Apr 11, 2019
- Carl Zeiss Industrielle Messtechnik GmbH
- Aksel Goehnermeier
- G01 - MEASURING TESTING
Information Patent Application
Device and system for Doppler optical coherence tomography (OCT) of...
- Publication number 20170251924
- Publication date Sep 7, 2017
- Technische Universitat Dresden
- Edmund Koch
- G01 - MEASURING TESTING
Information Patent Application
LASER INSPECTION SYSTEM AND METHOD FOR INSPECTING A SPECIMEN
- Publication number 20140293285
- Publication date Oct 2, 2014
- TECNATOM, S.A.
- Santiago Sánchez Prieto
- G01 - MEASURING TESTING
Information Patent Application
Method of detecting a movement of a measuring probe and measuring i...
- Publication number 20100067021
- Publication date Mar 18, 2010
- Mitutoyo Corporation
- Hans-Ullrich Danzebrink
- G01 - MEASURING TESTING
Information Patent Application
Temperature/thickness measuring apparatus, temperature/thickness me...
- Publication number 20060176490
- Publication date Aug 10, 2006
- TOKYO ELECTRON LIMITED
- Tomohiro Suzuki
- G01 - MEASURING TESTING
Information Patent Application
Configuration measuring apparatus and method
- Publication number 20020196449
- Publication date Dec 26, 2002
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for obtaining an optical tomographic image of...
- Publication number 20020037252
- Publication date Mar 28, 2002
- Fuji Photo Film Co., Ltd.
- Masahiro Toida
- G01 - MEASURING TESTING

With non-optical systems

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and system for combining microscopic imaging with X-Ray imaging

Device and system for doppler optical coherence tomography (OCT) of...

Probing element and coordinate measuring machine for measuring at l...

Apparatus, system, and method for non-destructive testing

Optical detection system for determining neural activity in brain b...

Method of detecting a movement of a measuring probe and measuring i...

Temperature/thickness measuring apparatus, temperature/thickness me...

Configuration measuring apparatus and method

Method and apparatus for obtaining an optical tomographic image of...

Device and method for measuring deformation of a mechanical test sp...

Compact, linear measurement interferometer with zero abbe error

Patents Applicationslast 30 patents

Methods and Apparatuses for Fabricating Polymeric Conformal Coating...

OPTICAL DETECTION SYSTEM FOR DETERMINING NEURAL ACTIVITY IN BRAIN B...

PROBING ELEMENT AND COORDINATE MEASURING MACHINE FOR MEASURING AT L...

Device and system for Doppler optical coherence tomography (OCT) of...

LASER INSPECTION SYSTEM AND METHOD FOR INSPECTING A SPECIMEN

Method of detecting a movement of a measuring probe and measuring i...

Temperature/thickness measuring apparatus, temperature/thickness me...

Configuration measuring apparatus and method

Method and apparatus for obtaining an optical tomographic image of...