with optical means

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CPC
Y10S977/868

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YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10USPC classification Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10S977/00Nanotechnology

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Y10S977/868with optical means

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Substrate unit of nanostructure assembly type, optical imaging appa...
- Patent number 10,371,874
- Issue date Aug 6, 2019
- Yonsei University, University—Industry Foundation (UIF)
- Donghyun Kim
- G02 - OPTICS
Information Patent Grant
Fluorescent nanoscopy device and method
- Patent number 9,028,757
- Issue date May 12, 2015
- Super Resolution Technologies LLC
- Andrey Alexeevich Klimov
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Fluorescent nanoscopy device and method
- Patent number 8,668,872
- Issue date Mar 11, 2014
- Super Resolution Technologies LLC
- Andrey Alexeevich Klimov
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Upconverting device for enhanced recogntion of certain wavelengths...
- Patent number 8,444,264
- Issue date May 21, 2013
- Jefferson Science Associates, LLC
- Brian Kross
- G02 - OPTICS
Information Patent Grant
Fluorescent nanoscopy method
- Patent number 8,334,143
- Issue date Dec 18, 2012
- Stereonic International, Inc.
- Andrey Alexeevich Klimov
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Fluorescent nanoscopy method
- Patent number 8,110,405
- Issue date Feb 7, 2012
- Stereonic International, Inc.
- Andrey Alexeevich Klimov
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Fluorescent nanoscopy method
- Patent number 7,803,634
- Issue date Sep 28, 2010
- Andrey Alexeevich Klimov
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical detection alignment/tracking method and apparatus
- Patent number 7,478,552
- Issue date Jan 20, 2009
- Veeco Instruments Inc.
- Doug Gotthard
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for a scanning probe microscope
- Patent number 7,473,894
- Issue date Jan 6, 2009
- JPK Instruments AG
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for analyzing a specimen using atomic force mic...
- Patent number 7,430,898
- Issue date Oct 7, 2008
- KLA-Tencor Technologies Corp.
- Michael Weber-Grabau
- G01 - MEASURING TESTING
Information Patent Grant
Probe, near-field light generation apparatus including probe, expos...
- Patent number 7,297,933
- Issue date Nov 20, 2007
- Canon Kabushiki Kaisha
- Tomohiro Yamada
- G11 - INFORMATION STORAGE
Information Patent Grant
Shape measuring apparatus, shape measuring method, and aligning method
- Patent number 7,271,882
- Issue date Sep 18, 2007
- Canon Kabushiki Kaisha
- Hideki Ina
- B24 - GRINDING POLISHING
Information Patent Grant
Dual stage instrument for scanning a specimen
- Patent number 7,100,430
- Issue date Sep 5, 2006
- KLA-Tencor Corporation
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for a scanning probe microscope
- Patent number 7,022,985
- Issue date Apr 4, 2006
- JPK Instruments AG
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Grant
Method of and an apparatus for measuring a specimen by means of a s...
- Patent number 6,998,602
- Issue date Feb 14, 2006
- JPK Instruments AG
- Jörn Kamps
- G01 - MEASURING TESTING
Information Patent Grant
Electrical scanning probe microscope apparatus
- Patent number 6,975,129
- Issue date Dec 13, 2005
- National Applied Research Labratories
- Mao-Nan Chang
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring apparatus, shape measuring method, and aligning method
- Patent number 6,950,179
- Issue date Sep 27, 2005
- Canon Kabushiki Kaisha
- Hideki Ina
- B24 - GRINDING POLISHING
Information Patent Grant
Removable probe sensor assembly and scanning probe microscope
- Patent number 6,910,368
- Issue date Jun 28, 2005
- Raymax Technology, Inc.
- David J Ray
- G01 - MEASURING TESTING
Information Patent Grant
Optical equipment assemblies and techniques
- Patent number 6,898,037
- Issue date May 24, 2005
- Seagate Technology LLC
- Joseph Leigh
- G11 - INFORMATION STORAGE
Information Patent Grant
Locally enhanced raman spectroscopy with an atomic force microscope
- Patent number 6,850,323
- Issue date Feb 1, 2005
- California Institute of Technology
- Mark S. Anderson
- G01 - MEASURING TESTING
Information Patent Grant
Method for replacing a probe sensor assembly on a scanning probe mi...
- Patent number 6,748,794
- Issue date Jun 15, 2004
- David James Ray
- G01 - MEASURING TESTING
Information Patent Grant
Scanning tunneling microscope light emitting/condensing device
- Patent number 6,746,144
- Issue date Jun 8, 2004
- Japan Science and Technology Corporation
- Ryuichi Arafune
- G01 - MEASURING TESTING
Information Patent Grant
Light receiving and emitting probe and light receiving and emitting...
- Patent number 6,703,615
- Issue date Mar 9, 2004
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Use and evaluation of a [2+2] photoaddition...
- Patent number 6,664,061
- Issue date Dec 16, 2003
- Amersham Biosciences AB
- Robert Elghanian
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Implantable micro-pump assembly
- Patent number 6,589,198
- Issue date Jul 8, 2003
- David Soltanpour
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Grant
Cantilever assembly and scanning tip therefor with associated optic...
- Patent number 6,479,817
- Issue date Nov 12, 2002
- Advanced Micro Devices, Inc.
- Sanjay K. Yedur
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for chemical and topographical microanalysis
- Patent number 6,466,309
- Issue date Oct 15, 2002
- California Institute of Technology
- Dmitri A. Kossakovski
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope having optical fiber spaced from point of hp
- Patent number 6,452,161
- Issue date Sep 17, 2002
- Advanced Micro Devices, Inc.
- Sanjay K. Yedur
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope system including removable probe sensor a...
- Patent number 6,415,654
- Issue date Jul 9, 2002
- David J. Ray
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical microscope stage for scanning probe microscope
- Patent number 6,310,342
- Issue date Oct 30, 2001
- ThermoMicroscopes Corporation
- David Braunstein
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
FLUORESCENT NANOSCOPY DEVICE AND METHOD
- Publication number 20140127079
- Publication date May 8, 2014
- Super Resolution Technologies LLC
- Andrey Alexeevich Klimov
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENT NANOSCOPY DEVICE AND METHOD
- Publication number 20130099136
- Publication date Apr 25, 2013
- Stereonic International, Inc.
- Andrey Alexeevich Klimov
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENT NANOSCOPY METHOD
- Publication number 20120133740
- Publication date May 31, 2012
- Stereonic International, Inc.
- Andrey Alexeevich KLIMOV
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD OF FLUORESCENT NANOSCOPY
- Publication number 20110175982
- Publication date Jul 21, 2011
- Andrey Alexeevich Klimov
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Fluorescent nanoscopy method
- Publication number 20090045353
- Publication date Feb 19, 2009
- Klimov Andrey Alexeevich
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Optical detection alignment/tracking method and apparatus
- Publication number 20070220958
- Publication date Sep 27, 2007
- Veeco Instruments Inc.
- Doug Gotthard
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for a scanning probe microscope
- Publication number 20060168703
- Publication date Jul 27, 2006
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Application
Shape measuring apparatus, shape measuring method, and aligning method
- Publication number 20050206877
- Publication date Sep 22, 2005
- Canon Kabushiki Kaisha
- Hideki Ina
- B24 - GRINDING POLISHING
Information Patent Application
Apparatus and method for a scanning probe microscope
- Publication number 20050061970
- Publication date Mar 24, 2005
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Application
Electrical scanning probe microscope apparatus
- Publication number 20050030054
- Publication date Feb 10, 2005
- Mao-Nan Chang
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF AND AN APPARATUS FOR MEASURING A SPECIMEN BY MEANS OF A S...
- Publication number 20050023481
- Publication date Feb 3, 2005
- Jorn Kamps
- G01 - MEASURING TESTING
Information Patent Application
Dual stage instrument for scanning a specimen
- Publication number 20050005688
- Publication date Jan 13, 2005
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Application
Removable probe sensor assembly and scanning probe microscope
- Publication number 20040250608
- Publication date Dec 16, 2004
- David J. Ray
- G01 - MEASURING TESTING
Information Patent Application
Probe, near-field light generation apparatus including probe, expos...
- Publication number 20030230709
- Publication date Dec 18, 2003
- Canon Kabushiki Kaisha
- Tomohiro Yamada
- G01 - MEASURING TESTING
Information Patent Application
Use and evaluation of a [2+2] photocycloaddition in immobilization...
- Publication number 20030124525
- Publication date Jul 3, 2003
- Robert Elghanian
- C40 - COMBINATORIAL CHEMISTRY
Information Patent Application
Dual stage instrument for scanning a specimen
- Publication number 20030089162
- Publication date May 15, 2003
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Application
Shape measuring apparatus, shape measuring method, and aligning method
- Publication number 20020180983
- Publication date Dec 5, 2002
- Canon Kabushiki Kaisha
- Hideki Ina
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method for replacing a probe sensor assembly on a scanning probe mi...
- Publication number 20020174716
- Publication date Nov 28, 2002
- David James Ray
- B82 - NANO-TECHNOLOGY
Information Patent Application
Optical equipment assemblies and techniques
- Publication number 20020171969
- Publication date Nov 21, 2002
- Joseph Leigh
- G11 - INFORMATION STORAGE
Information Patent Application
Light receiving and emitting probe and light receiving and emitting...
- Publication number 20020109082
- Publication date Aug 15, 2002
- YOSHIKAZU NAKAYAMA and DAIKEN CHEMICAL CO., LTD.
- Yoshikazu Nakayama
- B82 - NANO-TECHNOLOGY
Information Patent Application
Locally enhanced raman spectroscopy with an atomic force microscope
- Publication number 20020105641
- Publication date Aug 8, 2002
- Mark S. Anderson
- B82 - NANO-TECHNOLOGY
Information Patent Application
Dual stage instrument for scanning a specimen
- Publication number 20010047682
- Publication date Dec 6, 2001
- Amin Samsavar
- B82 - NANO-TECHNOLOGY

with optical means

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Substrate unit of nanostructure assembly type, optical imaging appa...

Fluorescent nanoscopy device and method

Fluorescent nanoscopy device and method

Upconverting device for enhanced recogntion of certain wavelengths...

Fluorescent nanoscopy method

Fluorescent nanoscopy method

Fluorescent nanoscopy method

Optical detection alignment/tracking method and apparatus

Apparatus and method for a scanning probe microscope

Methods and systems for analyzing a specimen using atomic force mic...

Probe, near-field light generation apparatus including probe, expos...

Shape measuring apparatus, shape measuring method, and aligning method

Dual stage instrument for scanning a specimen

Apparatus and method for a scanning probe microscope

Method of and an apparatus for measuring a specimen by means of a s...

Electrical scanning probe microscope apparatus

Shape measuring apparatus, shape measuring method, and aligning method

Removable probe sensor assembly and scanning probe microscope

Optical equipment assemblies and techniques

Locally enhanced raman spectroscopy with an atomic force microscope

Method for replacing a probe sensor assembly on a scanning probe mi...

Scanning tunneling microscope light emitting/condensing device

Light receiving and emitting probe and light receiving and emitting...

Use and evaluation of a &#x0005B;2&#x0002B;2&#x0005D; photoaddition...

Implantable micro-pump assembly

Cantilever assembly and scanning tip therefor with associated optic...

Method and apparatus for chemical and topographical microanalysis

Scanning probe microscope having optical fiber spaced from point of hp

Scanning probe microscope system including removable probe sensor a...

Optical microscope stage for scanning probe microscope

Patents Applicationslast 30 patents

FLUORESCENT NANOSCOPY DEVICE AND METHOD

FLUORESCENT NANOSCOPY DEVICE AND METHOD

FLUORESCENT NANOSCOPY METHOD

METHOD OF FLUORESCENT NANOSCOPY

Fluorescent nanoscopy method

Optical detection alignment/tracking method and apparatus

Apparatus and method for a scanning probe microscope

Shape measuring apparatus, shape measuring method, and aligning method

Apparatus and method for a scanning probe microscope

Electrical scanning probe microscope apparatus

METHOD OF AND AN APPARATUS FOR MEASURING A SPECIMEN BY MEANS OF A S...

Dual stage instrument for scanning a specimen

Removable probe sensor assembly and scanning probe microscope

Probe, near-field light generation apparatus including probe, expos...

Use and evaluation of a [2+2] photocycloaddition in immobilization...

Dual stage instrument for scanning a specimen

Shape measuring apparatus, shape measuring method, and aligning method

Method for replacing a probe sensor assembly on a scanning probe mi...

Optical equipment assemblies and techniques

Light receiving and emitting probe and light receiving and emitting...

Locally enhanced raman spectroscopy with an atomic force microscope

Dual stage instrument for scanning a specimen

Use and evaluation of a [2+2] photoaddition...