with optical or acoustical auxiliary devices

Industry

CPC
G01R23/17

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R23/00Arrangements for measuring frequencies Arrangements for analysing frequency spectra

Current Industry

G01R23/17with optical or acoustical auxiliary devices

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Wind turbine and method for detecting low-frequency oscillations in...
- Patent number 12,066,474
- Issue date Aug 20, 2024
- Wobben Properties GmbH
- Johannes Brombach
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Minimization of drill string rotation rate effect on acoustic signa...
- Patent number 11,920,467
- Issue date Mar 5, 2024
- Saudi Arabian Oil Company
- Yunlai Yang
- E21 - EARTH DRILLING MINING
Information Patent Grant
Spectrum analyzer and method of controlling the same
- Patent number 11,906,558
- Issue date Feb 20, 2024
- Innowireless Co., Ltd.
- Young Su Kwak
- G01 - MEASURING TESTING
Information Patent Grant
Wind turbine and method for detecting low-frequency oscillations in...
- Patent number 11,899,050
- Issue date Feb 13, 2024
- Wobben Properties GmbH
- Aramis Schwanka Trevisan
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Photonic device and a terahertz signal generator
- Patent number 11,747,376
- Issue date Sep 5, 2023
- City University of Hong Kong
- Cheng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum analyzer and method of controlling the same
- Patent number 11,740,269
- Issue date Aug 29, 2023
- Innowireless Co., Ltd.
- Young Su Kwak
- G01 - MEASURING TESTING
Information Patent Grant
System for analyzing electromagnetic radiation
- Patent number 11,726,025
- Issue date Aug 15, 2023
- Rohde & Schwarz GmbH & Co. KG
- Thomas Ruster
- G05 - CONTROLLING REGULATING
Information Patent Grant
Frequency spectrum detection system
- Patent number 11,662,370
- Issue date May 30, 2023
- Institute of Semiconductors, Chinese Academy of Sciences
- Ming Li
- G01 - MEASURING TESTING
Information Patent Grant
Adjusting DFT coefficients to compensate for frequency offset durin...
- Patent number 11,638,116
- Issue date Apr 25, 2023
- Silicon Laboratories Inc.
- Wentao Li
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
High resolution spectrum monitoring
- Patent number 11,630,138
- Issue date Apr 18, 2023
- The Regents of the University of California
- Yeswanth Reddy Guddeti
- G01 - MEASURING TESTING
Information Patent Grant
System and method for wideband spectral estimation using joint spac...
- Patent number 11,630,139
- Issue date Apr 18, 2023
- Raytheon Company
- James M. Bowden
- G01 - MEASURING TESTING
Information Patent Grant
Method of calibrating a setup
- Patent number 11,428,770
- Issue date Aug 30, 2022
- Rohde & Schwarz GmbH & Co. KG
- Jan-Patrick Schultheis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for frequency analysis of a signal
- Patent number 11,415,609
- Issue date Aug 16, 2022
- Thales
- Thierry Debuisschert
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring time-frequency characteristic of hi...
- Patent number 11,287,457
- Issue date Mar 29, 2022
- BEIHANG UNIVERSITY
- Zheng Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Background suppression for MM-wave spectroscopy
- Patent number 11,204,378
- Issue date Dec 21, 2021
- Texas Instruments Incorporated
- Argyrios Dellis
- G01 - MEASURING TESTING
Information Patent Grant
Analysis of electro-optic waveforms
- Patent number 11,143,700
- Issue date Oct 12, 2021
- Advanced Micro Devices, Inc.
- Venkat Krishnan Ravikumar
- G01 - MEASURING TESTING
Information Patent Grant
Functional noise floor adjustment of signal measurement device
- Patent number 11,137,429
- Issue date Oct 5, 2021
- Keysight Technologies, Inc.
- Bruce A. Erickson
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Electro-optic waveform analysis process
- Patent number 11,125,815
- Issue date Sep 21, 2021
- Advanced Micro Devices, Inc.
- Venkat Krishnan Ravikumar
- G01 - MEASURING TESTING
Information Patent Grant
Signal processing method and material testing machine
- Patent number 11,092,630
- Issue date Aug 17, 2021
- Shimadzu Corporation
- Tohru Matsuura
- G01 - MEASURING TESTING
Information Patent Grant
Ultrahigh resolution dynamic IC chip activity detection for hardwar...
- Patent number 11,041,809
- Issue date Jun 22, 2021
- President and Fellows of Harvard College
- Linbo Shao
- G01 - MEASURING TESTING
Information Patent Grant
Optical RF spectrum analyser
- Patent number 10,921,356
- Issue date Feb 16, 2021
- The University of Sydney
- Shijie Song
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for spectral analysis
- Patent number 10,866,141
- Issue date Dec 15, 2020
- Technische Universität Darmstadt
- Sascha Preu
- G01 - MEASURING TESTING
Information Patent Grant
Multi-signal instantaneous frequency measurement system
- Patent number 10,848,191
- Issue date Nov 24, 2020
- Rohde & Schwarz GmbH & Co. KG
- Andres Espana Fresno
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating a frequency spectrum
- Patent number 10,823,595
- Issue date Nov 3, 2020
- Grundfos Holding a/s
- Ole Hartlev Pedersen
- G01 - MEASURING TESTING
Information Patent Grant
Anode materials for lithium ion batteries and methods of making and...
- Patent number 10,819,400
- Issue date Oct 27, 2020
- Johnson Matthey Public Limited Company
- Xiaohua Ma
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Apparatus and method for processing spectrum
- Patent number 10,794,942
- Issue date Oct 6, 2020
- Samsung Electronics Co., Ltd.
- Yun S Park
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and system for providing flexible reserve power for power grid
- Patent number 10,613,492
- Issue date Apr 7, 2020
- General Electric Company
- Chaitanya Ashok Baone
- G05 - CONTROLLING REGULATING
Information Patent Grant
System for analysis of a microwave frequency signal by imaging
- Patent number 10,571,498
- Issue date Feb 25, 2020
- Thales
- Mayeul Chipaux
- G01 - MEASURING TESTING
Information Patent Grant
Electret fiber sheet
- Patent number 10,512,861
- Issue date Dec 24, 2019
- Toray Industries, Inc.
- Yuji Iyama
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Spectral analysis signal identification
- Patent number 10,396,865
- Issue date Aug 27, 2019
- CommScope Technologies LLC
- Zhao Li
- C01 - INORGANIC CHEMISTRY

Patents Applicationslast 30 patents

Information Patent Application
DEVICE FOR ANALYZING RADIOFREQUENCY SIGNAL SPECTRA
- Publication number 20240241159
- Publication date Jul 18, 2024
- UNIVERSITÉ PARIS CITÉ
- Denis ZAKARI
- G01 - MEASURING TESTING
Information Patent Application
OBJECT OR SURFACE NOISE-LEVEL DETECTION USING RADARS AND/OR LIDARS
- Publication number 20240192367
- Publication date Jun 13, 2024
- General Noise Ltd
- Robert G. W. Brown
- G01 - MEASURING TESTING
Information Patent Application
MINIMIZATION OF DRILL STRING ROTATION RATE EFFECT ON ACOUSTIC SIGNA...
- Publication number 20230220769
- Publication date Jul 13, 2023
- Saudi Arabian Oil Company
- Yunlai Yang
- E21 - EARTH DRILLING MINING
Information Patent Application
SPECTRUM ANALYZER AND METHOD OF CONTROLLING THE SAME
- Publication number 20230037910
- Publication date Feb 9, 2023
- INNOWIRELESS CO., LTD.
- Young Su KWAK
- G01 - MEASURING TESTING
Information Patent Application
PHOTONIC DEVICE AND A TERAHERTZ SIGNAL GENERATOR
- Publication number 20220317166
- Publication date Oct 6, 2022
- City University of Hong Kong
- Cheng Wang
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTING DFT COEFFICIENTS TO COMPENSATE FOR FREQUENCY OFFSET DURIN...
- Publication number 20220174453
- Publication date Jun 2, 2022
- Silicon Laboratories Inc.
- Wentao Li
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
WIND TURBINE AND METHOD FOR DETECTING LOW-FREQUENCY OSCILLATIONS IN...
- Publication number 20210341523
- Publication date Nov 4, 2021
- WOBBEN PROPERTIES GMBH
- Aramis SCHWANKA TREVISAN
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
METHOD OF CALIBRATING A SETUP
- Publication number 20210302526
- Publication date Sep 30, 2021
- ROHDE & SCHWARZ GMBH & CO. KG
- Jan-Patrick Schultheis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WIND TURBINE AND METHOD FOR DETECTING LOW-FREQUENCY OSCILLATIONS IN...
- Publication number 20210208186
- Publication date Jul 8, 2021
- WOBBEN PROPERTIES GMBH
- Johannes BROMBACH
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
BACKGROUND SUPPRESSION FOR MM-WAVE SPECTROSCOPY
- Publication number 20210199702
- Publication date Jul 1, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Argyrios DELLIS
- G01 - MEASURING TESTING
Information Patent Application
Devices, Systems, and Software including Signal Power Measuring and...
- Publication number 20210123959
- Publication date Apr 29, 2021
- Astrapi Corporation
- Jerrold PROTHERO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR ANALYZING ELECTROMAGNETIC RADIATION
- Publication number 20210109010
- Publication date Apr 15, 2021
- ROHDE & SCHWARZ GMBH & CO. KG
- Thomas RUSTER
- G01 - MEASURING TESTING
Information Patent Application
ELECTRO-OPTIC WAVEFORM ANALYSIS PROCESS
- Publication number 20210096174
- Publication date Apr 1, 2021
- ADVANCED MICRO DEVICES, INC.
- Venkat Krishnan Ravikumar
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS OF ELECTRO-OPTIC WAVEFORMS
- Publication number 20210088582
- Publication date Mar 25, 2021
- ADVANCED MICRO DEVICES, INC.
- Venkat Krishnan Ravikumar
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY SPECTRUM DETECTION SYSTEM
- Publication number 20210063452
- Publication date Mar 4, 2021
- Institute of Semiconductors, Chinese Academy of Sciences
- Ming Li
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR FREQUENCY ANALYSIS OF A SIGNAL
- Publication number 20210048463
- Publication date Feb 18, 2021
- Thierry DEBUISSCHERT
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM ANALYZER AND METHOD OF CONTROLLING THE SAME
- Publication number 20200379024
- Publication date Dec 3, 2020
- INNOWIRELESS CO., LTD.
- Young Su KWAK
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION SPECTRUM MONITORING
- Publication number 20200326362
- Publication date Oct 15, 2020
- The Regents of the University of California
- Yeswanth Reddy Guddeti
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL NOISE FLOOR ADJUSTMENT OF SIGNAL MEASUREMENT DEVICE
- Publication number 20200309831
- Publication date Oct 1, 2020
- KEYSIGHT TECHNOLOGIES, INC.
- Bruce A. Erickson
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Measuring Time-Frequency Characteristic of Hi...
- Publication number 20200124650
- Publication date Apr 23, 2020
- BEIHANG UNIVERSITY
- Zheng Zheng
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR SPECTRAL ANALYSIS
- Publication number 20200025614
- Publication date Jan 23, 2020
- TECHNISCHE UNIVERSITAT DARMSTADT
- Sascha Preu
- G01 - MEASURING TESTING
Information Patent Application
Method for Detecting Normal Harmonics of Earths Electromagnetic Atm...
- Publication number 20190310293
- Publication date Oct 10, 2019
- Andres Herbert Montoya Urquizo
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
OPTICAL RF SPECTRUM ANALYSER
- Publication number 20190212377
- Publication date Jul 11, 2019
- The University of Sydney
- Shijie SONG
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PROCESSING METHOD AND MATERIAL TESTING MACHINE
- Publication number 20190187195
- Publication date Jun 20, 2019
- Shimadzu Corporation
- Tohru MATSUURA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR PROCESSING SPECTRUM
- Publication number 20190128934
- Publication date May 2, 2019
- Samsung Electronics Co., Ltd.
- Yun S PARK
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR PROVIDING FLEXIBLE RESERVE POWER FOR POWER GRID
- Publication number 20190033801
- Publication date Jan 31, 2019
- GENERAL ELECTRIC COMPANY
- Chaitanya Ashok Baone
- G05 - CONTROLLING REGULATING
Information Patent Application
ELECTRET FIBER SHEET
- Publication number 20180369729
- Publication date Dec 27, 2018
- TORAY INDUSTRIES, INC.
- Yuji Iyama
- D04 - BRAIDING LACE-MAKING KNITTING TRIMMINGS NON-WOVEN FABRICS
Information Patent Application
Ultrahigh Resolution Dynamic IC Chip Activity Detection for Hardwar...
- Publication number 20180284026
- Publication date Oct 4, 2018
- President and Fellows of Harvard College
- Linbo Shao
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT RESULT DISPLAY DEVICE AND MEASUREMENT RESULT DISPLAY ME...
- Publication number 20180236496
- Publication date Aug 23, 2018
- Anritsu Corporation
- Ryota TAKASU
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
FAILURE LOCATION SPECIFYING DEVICE AND FAILURE LOCATION SPECIFYING...
- Publication number 20180128869
- Publication date May 10, 2018
- RENESAS ELECTRONICS CORPORATION
- Junpei NONAKA
- G01 - MEASURING TESTING

with optical or acoustical auxiliary devices

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Wind turbine and method for detecting low-frequency oscillations in...

Minimization of drill string rotation rate effect on acoustic signa...

Spectrum analyzer and method of controlling the same

Wind turbine and method for detecting low-frequency oscillations in...

Photonic device and a terahertz signal generator

Spectrum analyzer and method of controlling the same

System for analyzing electromagnetic radiation

Frequency spectrum detection system

Adjusting DFT coefficients to compensate for frequency offset durin...

High resolution spectrum monitoring

System and method for wideband spectral estimation using joint spac...

Method of calibrating a setup

Device and method for frequency analysis of a signal

System and method for measuring time-frequency characteristic of hi...

Background suppression for MM-wave spectroscopy

Analysis of electro-optic waveforms

Functional noise floor adjustment of signal measurement device

Electro-optic waveform analysis process

Signal processing method and material testing machine

Ultrahigh resolution dynamic IC chip activity detection for hardwar...

Optical RF spectrum analyser

Device and method for spectral analysis

Multi-signal instantaneous frequency measurement system

Method for evaluating a frequency spectrum

Anode materials for lithium ion batteries and methods of making and...

Apparatus and method for processing spectrum

Method and system for providing flexible reserve power for power grid

System for analysis of a microwave frequency signal by imaging

Electret fiber sheet

Spectral analysis signal identification

Patents Applicationslast 30 patents

DEVICE FOR ANALYZING RADIOFREQUENCY SIGNAL SPECTRA

OBJECT OR SURFACE NOISE-LEVEL DETECTION USING RADARS AND/OR LIDARS

MINIMIZATION OF DRILL STRING ROTATION RATE EFFECT ON ACOUSTIC SIGNA...

SPECTRUM ANALYZER AND METHOD OF CONTROLLING THE SAME

PHOTONIC DEVICE AND A TERAHERTZ SIGNAL GENERATOR

ADJUSTING DFT COEFFICIENTS TO COMPENSATE FOR FREQUENCY OFFSET DURIN...

WIND TURBINE AND METHOD FOR DETECTING LOW-FREQUENCY OSCILLATIONS IN...

METHOD OF CALIBRATING A SETUP

WIND TURBINE AND METHOD FOR DETECTING LOW-FREQUENCY OSCILLATIONS IN...

BACKGROUND SUPPRESSION FOR MM-WAVE SPECTROSCOPY

Devices, Systems, and Software including Signal Power Measuring and...

SYSTEM FOR ANALYZING ELECTROMAGNETIC RADIATION

ELECTRO-OPTIC WAVEFORM ANALYSIS PROCESS

ANALYSIS OF ELECTRO-OPTIC WAVEFORMS

FREQUENCY SPECTRUM DETECTION SYSTEM

DEVICE AND METHOD FOR FREQUENCY ANALYSIS OF A SIGNAL

SPECTRUM ANALYZER AND METHOD OF CONTROLLING THE SAME

HIGH RESOLUTION SPECTRUM MONITORING

FUNCTIONAL NOISE FLOOR ADJUSTMENT OF SIGNAL MEASUREMENT DEVICE

System and Method for Measuring Time-Frequency Characteristic of Hi...

DEVICE AND METHOD FOR SPECTRAL ANALYSIS

Method for Detecting Normal Harmonics of Earths Electromagnetic Atm...

OPTICAL RF SPECTRUM ANALYSER

SIGNAL PROCESSING METHOD AND MATERIAL TESTING MACHINE

APPARATUS AND METHOD FOR PROCESSING SPECTRUM

METHOD AND SYSTEM FOR PROVIDING FLEXIBLE RESERVE POWER FOR POWER GRID

ELECTRET FIBER SHEET

Ultrahigh Resolution Dynamic IC Chip Activity Detection for Hardwar...

MEASUREMENT RESULT DISPLAY DEVICE AND MEASUREMENT RESULT DISPLAY ME...

FAILURE LOCATION SPECIFYING DEVICE AND FAILURE LOCATION SPECIFYING...