with phase change by in-plane movement of the patern

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CPC
G01B11/2527

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/2527with phase change by in-plane movement of the patern

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Metrology for additive manufacturing
- Patent number 12,203,745
- Issue date Jan 21, 2025
- Nikon Corporation
- Eric Peter Goodwin
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Phase shift-based three-dimensional measurement system with multipl...
- Patent number 12,196,542
- Issue date Jan 14, 2025
- Industrial Technology Research Institute
- Jhe-Ruei Li
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining three-dimensional shape of object
- Patent number 12,146,734
- Issue date Nov 19, 2024
- Koh Young Technology Inc.
- Chan Kwon Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for determining three-dimensional shape of object
- Patent number 12,135,204
- Issue date Nov 5, 2024
- Koh Young Technology Inc.
- Chan Kwon Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3D scanner using a structured beam of probe light
- Patent number 12,072,178
- Issue date Aug 27, 2024
- 3Shape A/S
- Rasmus Kjaer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measuring device, inspection device, and surface mounter
- Patent number 12,031,810
- Issue date Jul 9, 2024
- Yamaha Hatsudoki Kabushiki Kaisha
- Nobuaki Tabata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and a system for real-time high-speed three dimensional surf...
- Patent number 11,988,501
- Issue date May 21, 2024
- Institut National de la Recherche Scientifique
- Jinyang Liang
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional measuring device
- Patent number 11,982,522
- Issue date May 14, 2024
- Yamaha Hatsudoki Kabushiki Kaisha
- Nobuaki Tabata
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional measurement device and three-dimensional measurem...
- Patent number 11,927,435
- Issue date Mar 12, 2024
- CKD Corporation
- Manabu Okuda
- G01 - MEASURING TESTING
Information Patent Grant
Time-of-flight (TOF) assisted structured light imaging
- Patent number 11,867,500
- Issue date Jan 9, 2024
- Texas Instruments Incorporated
- Sanjeev Jagannatha Koppal
- G01 - MEASURING TESTING
Information Patent Grant
Fracture surface inspection device and fracture surface inspection...
- Patent number 11,821,725
- Issue date Nov 21, 2023
- YASUNAGA CORPORATION
- Ryosuke Murakami
- G01 - MEASURING TESTING
Information Patent Grant
Calibration method for fringe projection systems based on plane mir...
- Patent number 11,808,564
- Issue date Nov 7, 2023
- NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Chao Zuo
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring surface characteristics in optically distortin...
- Patent number 11,788,834
- Issue date Oct 17, 2023
- Electric Power Research Institute, Inc.
- David Stoutamire
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Estimation method, measurement method, and estimation apparatus
- Patent number 11,754,389
- Issue date Sep 12, 2023
- Seiko Epson Corporation
- Taisuke Yamauchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Large-depth-range three-dimensional (3D) measurement method, system...
- Patent number 11,740,076
- Issue date Aug 29, 2023
- GUANGDONG UNIVERSITY OF TECHNOLOGY
- Jian Gao
- G01 - MEASURING TESTING
Information Patent Grant
Mounting arrangement for optical systems
- Patent number 11,692,816
- Issue date Jul 4, 2023
- Cognex Corporation
- Andrew Goodale
- G01 - MEASURING TESTING
Information Patent Grant
Multiple channel locating
- Patent number 11,680,790
- Issue date Jun 20, 2023
- Cognex Corporation
- Benjamin Braker
- G01 - MEASURING TESTING
Information Patent Grant
3D scanner using a structured beam of probe light
- Patent number 11,650,045
- Issue date May 16, 2023
- 3Shape A/S
- Rasmus Kjaer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Image inspection apparatus and image inspection method
- Patent number 11,619,591
- Issue date Apr 4, 2023
- Omron Corporation
- Yutaka Kato
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional sensor with counterposed channels
- Patent number 11,604,062
- Issue date Mar 14, 2023
- CyberOptics Corporation
- Paul R. Haugen
- G01 - MEASURING TESTING
Information Patent Grant
Image inspection apparatus and image inspection method
- Patent number 11,536,667
- Issue date Dec 27, 2022
- Omron Corporation
- Yutaka Kato
- G01 - MEASURING TESTING
Information Patent Grant
Switchable fringe pattern illuminator
- Patent number 11,516,457
- Issue date Nov 29, 2022
- Meta Platforms Technologies, LLC
- Zihe Gao
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional shape measuring apparatus, three-dimensional shap...
- Patent number 11,493,331
- Issue date Nov 8, 2022
- Keyence Corporation
- Takuya Karube
- G01 - MEASURING TESTING
Information Patent Grant
Signal source space sensing method and apparatus, and active sensin...
- Patent number 11,486,692
- Issue date Nov 1, 2022
- Sichuan University
- Kai LiU
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional shape measuring apparatus and method thereof util...
- Patent number 11,448,500
- Issue date Sep 20, 2022
- Keyence Corporation
- Kazuki Natori
- G02 - OPTICS
Information Patent Grant
Inter-reflection detection apparatus and inter-reflection detection...
- Patent number 11,441,896
- Issue date Sep 13, 2022
- Omron Corporation
- Yasuhiro Ohnishi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for compensating for non-linear response characte...
- Patent number 11,255,662
- Issue date Feb 22, 2022
- Korea Research Institute of Standards and Science
- Young-sik Ghim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for three-dimensional shape measurement
- Patent number 11,199,394
- Issue date Dec 14, 2021
- BENANO INC.
- Liang-Pin Yu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for and method of illumination control for acquiring imag...
- Patent number 11,153,551
- Issue date Oct 19, 2021
- Samsung Electronics Co., Ltd.
- Ilia Ovsiannikov
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional shape measurement device, robot system, and three...
- Patent number 11,118,902
- Issue date Sep 14, 2021
- Seiko Epson Corporation
- Kentaro Tsukamoto
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT
- Publication number 20250027766
- Publication date Jan 23, 2025
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AN INSPECTION TOOL FOR INSPECTING A CONCRETE SURFACE
- Publication number 20250020627
- Publication date Jan 16, 2025
- HUSQVARNA AB
- Andreas Jonsson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT
- Publication number 20250012565
- Publication date Jan 9, 2025
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
3D SCANNER USING A STRUCTURED BEAM OF PROBE LIGHT
- Publication number 20240361121
- Publication date Oct 31, 2024
- 3SHAPE A/S
- Rasmus KJAER
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DEEP LEARNING-BASED DIGITAL HOLOGRAPHIC CONTINUOUS PHASE NOISE REDU...
- Publication number 20240361727
- Publication date Oct 31, 2024
- ZHEJIANG SCI-TECH UNIVERSITY
- Benyong CHEN
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY DEVICE INSPECTING APPARATUS AND METHOD
- Publication number 20240201045
- Publication date Jun 20, 2024
- SAMSUNG DISPLAY CO., LTD.
- Junsu Park
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING SURFACE CHARACTERISTICS IN OPTICALLY DISTORTIN...
- Publication number 20240044641
- Publication date Feb 8, 2024
- Electric Power Research Institute, Inc.
- David STOUTAMIRE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIPLE CHANNEL LOCATING
- Publication number 20230392920
- Publication date Dec 7, 2023
- COGNEX CORPORATION
- Eric Moore
- G01 - MEASURING TESTING
Information Patent Application
PHASE UNWRAPPING METHOD BASED ON MULTI-VIEW CONSTRAINTS OF LIGHT FI...
- Publication number 20230384085
- Publication date Nov 30, 2023
- Shenzhen University
- Xiaoli Liu
- G01 - MEASURING TESTING
Information Patent Application
DIFFRACTIVE OPTICAL ELEMENT WITH UNDIFFRACTED LIGHT EXPANSION FOR E...
- Publication number 20230332886
- Publication date Oct 19, 2023
- Microsoft Technology Licensing, LLC
- Andreas GEORGIOU
- G01 - MEASURING TESTING
Information Patent Application
3D SCANNER USING A STRUCTURED BEAM OF PROBE LIGHT
- Publication number 20230243645
- Publication date Aug 3, 2023
- 3SHAPE A/S
- Rasmus KJAER
- G02 - OPTICS
Information Patent Application
Three-Dimensional Measurement System
- Publication number 20230194248
- Publication date Jun 22, 2023
- Nippon Telegraph and Telephone Corporation
- Kei Watanabe
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR 3D IMAGE SCANNING
- Publication number 20230168081
- Publication date Jun 1, 2023
- The Research Foundation for The State Unviersity of New York
- XIANFENG GU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING DEVICE, INSPECTION DEVICE, AND SURFACE MOUNTER
- Publication number 20230080582
- Publication date Mar 16, 2023
- YAMAHA HATSUDOKI KABUSHIKI KAISHA
- Nobuaki TABATA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LARGE-DEPTH-RANGE THREE-DIMENSIONAL (3D) MEASUREMENT METHOD, SYSTEM...
- Publication number 20230074445
- Publication date Mar 9, 2023
- Guangdong University of Technology
- Jian GAO
- G01 - MEASURING TESTING
Information Patent Application
FRACTURE SURFACE INSPECTION DEVICE AND FRACTURE SURFACE INSPECTION...
- Publication number 20220373324
- Publication date Nov 24, 2022
- YASUNAGA CORPORATION
- Ryosuke Murakami
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT
- Publication number 20220364852
- Publication date Nov 17, 2022
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method For Detecting Demineralization Of Tooth Substance
- Publication number 20220361806
- Publication date Nov 17, 2022
- Alwin Kienle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
A METHOD AND A SYSTEM FOR 3D IMAGING
- Publication number 20220357151
- Publication date Nov 10, 2022
- Institut National de la Recherche Scientifique
- Jinyang LIANG
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY FOR ADDITIVE MANUFACTURING
- Publication number 20220252392
- Publication date Aug 11, 2022
- Nikon Corporation
- Eric Peter Goodwin
- B22 - CASTING POWDER METALLURGY
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT DEVICE AND THREE-DIMENSIONAL MEASUREM...
- Publication number 20220082374
- Publication date Mar 17, 2022
- CKD CORPORATION
- Manabu Okuda
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING SURFACE CHARACTERISTICS IN OPTICALLY DISTORTIN...
- Publication number 20210389124
- Publication date Dec 16, 2021
- Electric Power Research Institute, Inc.
- David STOUTAMIRE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL MEASURING DEVICE
- Publication number 20210348918
- Publication date Nov 11, 2021
- YAMAHA HATSUDOKI KABUSHIKI KAISHA
- Nobuaki TABATA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR COMPENSATING FOR NON-LINEAR RESPONSE CHARACTE...
- Publication number 20210172731
- Publication date Jun 10, 2021
- Korea Research Institute of Standards and Science
- Young-sik Ghim
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR THREE-DIMENSIONAL SHAPE MEASUREMENT
- Publication number 20210123723
- Publication date Apr 29, 2021
- BENANO INC.
- Liang-Pin Yu
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL SENSOR WITH COUNTERPOSED CHANNELS
- Publication number 20210088328
- Publication date Mar 25, 2021
- CyberOptics Corporation
- Paul R. Haugen
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL SHAPE MEASURING APPARATUS AND THREE-DIMENSIONAL S...
- Publication number 20210041230
- Publication date Feb 11, 2021
- KEYENCE CORPORATION
- Kazuki NATORI
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL SHAPE MEASURING APPARATUS, THREE-DIMENSIONAL SHAP...
- Publication number 20210041231
- Publication date Feb 11, 2021
- KEYENCE CORPORATION
- Takuya KARUBE
- G01 - MEASURING TESTING
Information Patent Application
Time-of-Flight (TOF) Assisted Structured Light Imaging
- Publication number 20200333467
- Publication date Oct 22, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Sanjeev Jagannatha Koppal
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING SURFACE STRUCTURES OF OBJECTS
- Publication number 20200263979
- Publication date Aug 20, 2020
- Hewlett-Packard Development Company, L.P.
- Alper Oktar
- G01 - MEASURING TESTING

with phase change by in-plane movement of the patern

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Metrology for additive manufacturing

Phase shift-based three-dimensional measurement system with multipl...

Apparatus and method for determining three-dimensional shape of object

Apparatus and method for determining three-dimensional shape of object

3D scanner using a structured beam of probe light

Measuring device, inspection device, and surface mounter

Method and a system for real-time high-speed three dimensional surf...

Three-dimensional measuring device

Three-dimensional measurement device and three-dimensional measurem...

Time-of-flight (TOF) assisted structured light imaging

Fracture surface inspection device and fracture surface inspection...

Calibration method for fringe projection systems based on plane mir...

Method for measuring surface characteristics in optically distortin...

Estimation method, measurement method, and estimation apparatus

Large-depth-range three-dimensional (3D) measurement method, system...

Mounting arrangement for optical systems

Multiple channel locating

3D scanner using a structured beam of probe light

Image inspection apparatus and image inspection method

Three-dimensional sensor with counterposed channels

Image inspection apparatus and image inspection method

Switchable fringe pattern illuminator

Three-dimensional shape measuring apparatus, three-dimensional shap...

Signal source space sensing method and apparatus, and active sensin...

Three-dimensional shape measuring apparatus and method thereof util...

Inter-reflection detection apparatus and inter-reflection detection...

System and method for compensating for non-linear response characte...

Apparatus for three-dimensional shape measurement

Apparatus for and method of illumination control for acquiring imag...

Three-dimensional shape measurement device, robot system, and three...

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT

AN INSPECTION TOOL FOR INSPECTING A CONCRETE SURFACE

APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT

3D SCANNER USING A STRUCTURED BEAM OF PROBE LIGHT

DEEP LEARNING-BASED DIGITAL HOLOGRAPHIC CONTINUOUS PHASE NOISE REDU...

DISPLAY DEVICE INSPECTING APPARATUS AND METHOD

METHOD FOR MEASURING SURFACE CHARACTERISTICS IN OPTICALLY DISTORTIN...

MULTIPLE CHANNEL LOCATING

PHASE UNWRAPPING METHOD BASED ON MULTI-VIEW CONSTRAINTS OF LIGHT FI...

DIFFRACTIVE OPTICAL ELEMENT WITH UNDIFFRACTED LIGHT EXPANSION FOR E...

3D SCANNER USING A STRUCTURED BEAM OF PROBE LIGHT

Three-Dimensional Measurement System

SYSTEM AND METHOD FOR 3D IMAGE SCANNING

MEASURING DEVICE, INSPECTION DEVICE, AND SURFACE MOUNTER

LARGE-DEPTH-RANGE THREE-DIMENSIONAL (3D) MEASUREMENT METHOD, SYSTEM...

FRACTURE SURFACE INSPECTION DEVICE AND FRACTURE SURFACE INSPECTION...

APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT

Method For Detecting Demineralization Of Tooth Substance

A METHOD AND A SYSTEM FOR 3D IMAGING

METROLOGY FOR ADDITIVE MANUFACTURING

THREE-DIMENSIONAL MEASUREMENT DEVICE AND THREE-DIMENSIONAL MEASUREM...

METHOD FOR MEASURING SURFACE CHARACTERISTICS IN OPTICALLY DISTORTIN...

THREE-DIMENSIONAL MEASURING DEVICE

SYSTEM AND METHOD FOR COMPENSATING FOR NON-LINEAR RESPONSE CHARACTE...

APPARATUS FOR THREE-DIMENSIONAL SHAPE MEASUREMENT

THREE-DIMENSIONAL SENSOR WITH COUNTERPOSED CHANNELS

THREE-DIMENSIONAL SHAPE MEASURING APPARATUS AND THREE-DIMENSIONAL S...

THREE-DIMENSIONAL SHAPE MEASURING APPARATUS, THREE-DIMENSIONAL SHAP...

Time-of-Flight (TOF) Assisted Structured Light Imaging

DETERMINING SURFACE STRUCTURES OF OBJECTS