with provision for recording characteristics

Industry

CPC
G01R27/30

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom

Current Industry

G01R27/30with provision for recording characteristics

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Bio-impedance analyzer
- Patent number 11,559,219
- Issue date Jan 24, 2023
- UTI Limited Partnership
- Abdulwadood Abdullah Al-Ali
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Module tuning using virtual gain correction
- Patent number 11,204,380
- Issue date Dec 21, 2021
- ANDREW WIRELESS SYSTEMS GMBH
- Thomas Rauwolf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for vector network analysis of a device under test as well a...
- Patent number 11,193,965
- Issue date Dec 7, 2021
- Rohde & Schwarz GmbH & Co. KG
- Korbinian Pfaffeneder
- G01 - MEASURING TESTING
Information Patent Grant
Device and method to prevent inter-system interference
- Patent number 9,599,639
- Issue date Mar 21, 2017
- Tektronix, Inc.
- John J. Pickerd
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Tuner characterization methods and apparatus
- Patent number 8,319,504
- Issue date Nov 27, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Christopher J. Roff
- G01 - MEASURING TESTING
Information Patent Grant
Network analyzer with adaptable sweep time between measurement points
- Patent number 5,712,573
- Issue date Jan 27, 1998
- Rohde & Schwarz GmbH & Co. KG
- Werner Held
- G01 - MEASURING TESTING
Information Patent Grant
Circuit network measurement device and calibration method
- Patent number 5,661,404
- Issue date Aug 26, 1997
- Hewlett-Packard Company
- Koichi Yanagawa
- G01 - MEASURING TESTING
Information Patent Grant
Swept signal analysis instrument and method
- Patent number 5,420,514
- Issue date May 30, 1995
- Hewlett-Packard Company
- Jay M. Wardle
- G01 - MEASURING TESTING
Information Patent Grant
Swept signal analysis instrument and method
- Patent number 5,300,878
- Issue date Apr 5, 1994
- Hewlett-Packard Company
- Jay M. Wardle
- G01 - MEASURING TESTING
Information Patent Grant
Swept signal analysis instrument and method
- Patent number 5,117,179
- Issue date May 26, 1992
- Hewlett-Packard Company
- Jay M. Wardle
- G01 - MEASURING TESTING
Information Patent Grant
Display device for complex transmission reflection characteristics
- Patent number 4,845,642
- Issue date Jul 4, 1989
- Anritsu Corporation
- Hiroshi Itaya
- G01 - MEASURING TESTING
Information Patent Grant
Vector network analyzer with integral processor
- Patent number 4,816,767
- Issue date Mar 28, 1989
- Hewlett-Packard Company
- Wayne C. Cannon
- G01 - MEASURING TESTING
Information Patent Grant
Vector network analyzer with integral processor
- Patent number 4,669,051
- Issue date May 26, 1987
- Hewlett-Packard Company
- John T. Barr
- G01 - MEASURING TESTING
Information Patent Grant
Vector network analyzer with integral processor
- Patent number 4,661,767
- Issue date Apr 28, 1987
- Hewlett-Packard Company
- David D. Sharrit
- G01 - MEASURING TESTING
Information Patent Grant
Vector network analyzer with integral processor
- Patent number 4,641,086
- Issue date Feb 3, 1987
- Hewlett-Packard Company
- John T. Barr
- G01 - MEASURING TESTING
Information Patent Grant
Vector network analyzer with integral processor
- Patent number 4,636,717
- Issue date Jan 13, 1987
- Hewlett-Packard Company
- David D. Sharrit
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for rapidly measuring frequency response of elect...
- Patent number 4,544,883
- Issue date Oct 1, 1985
- Michael Grimsland
- G01 - MEASURING TESTING
Information Patent Grant
Technique of reconstructing and displaying an analog waveform from...
- Patent number 4,455,613
- Issue date Jun 19, 1984
- Gould Inc.
- William E. Shoemaker
- G01 - MEASURING TESTING
Information Patent Grant
Automatic communication signal monitoring system
- Patent number 4,118,666
- Issue date Oct 3, 1978
- The United States of America as represented by the administrator of the Natio...
- Albert J. Bernstein
- G01 - MEASURING TESTING
Information Patent Grant
Method and circuit for generating diamond markers
- Patent number 4,092,567
- Issue date May 30, 1978
- Hewlett-Packard Company
- David D. Sharrit
- G01 - MEASURING TESTING
Information Patent Grant
Multi-frequency range operation of a network analyzer system
- Patent number 3,990,004
- Issue date Nov 2, 1976
- Hewlett-Packard Company
- Sterling Lewis Newton
- G01 - MEASURING TESTING
Information Patent Grant
3904964
- Patent number 3,904,964
- Issue date Sep 9, 1975
- G01 - MEASURING TESTING
Information Patent Grant
3904959
- Patent number 3,904,959
- Issue date Sep 9, 1975
- G01 - MEASURING TESTING
Information Patent Grant
3622889
- Patent number 3,622,889
- Issue date Nov 23, 1971
- G01 - MEASURING TESTING
Information Patent Grant
3493853
- Patent number 3,493,853
- Issue date Feb 3, 1970
- G01 - MEASURING TESTING
Information Patent Grant
3453534
- Patent number 3,453,534
- Issue date Jul 1, 1969
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
2804590
- Patent number 2,804,590
- Issue date Aug 27, 1957
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
REMOVING TEST EQUIPMENT INTERMODULATION INTERFERENCE AND NOISE FROM...
- Publication number 20240361367
- Publication date Oct 31, 2024
- LitePoint Corporation
- Chen CAO
- G01 - MEASURING TESTING
Information Patent Application
DOUBLE-BALANCE ELECTRONIC TEST APPARATUS AND MEASURING INDUCTANCE,...
- Publication number 20230349961
- Publication date Nov 2, 2023
- Government of the United States of America, as Represented by the Secretary o...
- Yicheng Wang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR VECTOR NETWORK ANALYSIS OF A DEVICE UNDER TEST AS WELL A...
- Publication number 20190369150
- Publication date Dec 5, 2019
- ROHDE & SCHWARZ GMBH & CO. KG
- Korbinian Pfaffeneder
- G01 - MEASURING TESTING
Information Patent Application
BIO-IMPEDANCE ANALYZER
- Publication number 20190313935
- Publication date Oct 17, 2019
- UTI Limited Partnership
- Abdulwadood Abdullah Al-Ali
- G01 - MEASURING TESTING
Information Patent Application
NON-INVASIVE IMPEDANCE ANALYZING APPARATUS AND METHOD
- Publication number 20170168099
- Publication date Jun 15, 2017
- National Cheng Kung University
- Ray-Lee LIN
- G01 - MEASURING TESTING
Information Patent Application
STABILITY ANALYZING APPARATUS AND STABILITY ANALYZING METHOD
- Publication number 20140312692
- Publication date Oct 23, 2014
- Ray-Lee LIN
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD TO PREVENT INTER-SYSTEM INTERFERENCE
- Publication number 20140300371
- Publication date Oct 9, 2014
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
TUNER CHARACTERIZATION METHODS AND APPARATUS
- Publication number 20100301875
- Publication date Dec 2, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Christopher J. Roff
- G01 - MEASURING TESTING

with provision for recording characteristics

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Bio-impedance analyzer

Module tuning using virtual gain correction

System for vector network analysis of a device under test as well a...

Device and method to prevent inter-system interference

Tuner characterization methods and apparatus

Network analyzer with adaptable sweep time between measurement points

Circuit network measurement device and calibration method

Swept signal analysis instrument and method

Swept signal analysis instrument and method

Swept signal analysis instrument and method

Display device for complex transmission reflection characteristics

Vector network analyzer with integral processor

Vector network analyzer with integral processor

Vector network analyzer with integral processor

Vector network analyzer with integral processor

Vector network analyzer with integral processor

Method and device for rapidly measuring frequency response of elect...

Technique of reconstructing and displaying an analog waveform from...

Automatic communication signal monitoring system

Method and circuit for generating diamond markers

Multi-frequency range operation of a network analyzer system

3904964

3904959

3622889

3493853

3453534

2804590

Patents Applicationslast 30 patents

REMOVING TEST EQUIPMENT INTERMODULATION INTERFERENCE AND NOISE FROM...

DOUBLE-BALANCE ELECTRONIC TEST APPARATUS AND MEASURING INDUCTANCE,...

SYSTEM FOR VECTOR NETWORK ANALYSIS OF A DEVICE UNDER TEST AS WELL A...

BIO-IMPEDANCE ANALYZER

NON-INVASIVE IMPEDANCE ANALYZING APPARATUS AND METHOD

STABILITY ANALYZING APPARATUS AND STABILITY ANALYZING METHOD

DEVICE AND METHOD TO PREVENT INTER-SYSTEM INTERFERENCE

TUNER CHARACTERIZATION METHODS AND APPARATUS