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G01J2003/452
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2003/452
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Patents Grants
last 30 patents
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Patent Grant
Optical coherence tomography apparatus and image generation method...
Patent number
11,578,964
Issue date
Feb 14, 2023
Kyungpook National University Industry-Academic Cooperation Foundation
Jeehyun Kim
G01 - MEASURING TESTING
Information
Patent Grant
Technologies for high resolution and wide swath spectrometer
Patent number
11,307,097
Issue date
Apr 19, 2022
ABB Schweiz AG
Florent M. Prel
G01 - MEASURING TESTING
Information
Patent Grant
Curved volume phase holographic (VPH) diffraction grating with tilt...
Patent number
9,810,825
Issue date
Nov 7, 2017
The University of North Carolina at Chapel Hill
J. Christopher Clemens
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Ultracompact fabry-perot array for ultracompact hyperspectral imaging
Patent number
9,778,113
Issue date
Oct 3, 2017
The Trustees of Columbia University In the City of New York
Dirk R. Englund
G01 - MEASURING TESTING
Information
Patent Grant
Curved volume phase holographic (VPH) diffraction grating with tilt...
Patent number
9,594,201
Issue date
Mar 14, 2017
The University of North Carolina at Chapel Hill
J. Christopher Clemens
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Snapshot spatial heterodyne imaging polarimetry
Patent number
9,442,015
Issue date
Sep 13, 2016
The Arizona Board of Regents on behalf of the University of Arizona
Michael W. Kudenov
G01 - MEASURING TESTING
Information
Patent Grant
Ultra-compact snapshot imaging fourier transform spectrometer
Patent number
9,046,422
Issue date
Jun 2, 2015
The Arizona Board of Regents on behalf of the University of Arizona
Michael W. Kudenov
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
COMPACT HOLOGRAPHIC SLM SPECTROMETER
Publication number
20240077356
Publication date
Mar 7, 2024
ORTA DOGU TEKNIK UNIVERSITESI
Emre YUCE
G01 - MEASURING TESTING
Information
Patent Application
SPECTRUM MEASUREMENT DEVICE
Publication number
20220341785
Publication date
Oct 27, 2022
NEC Corporation
Takeshi AKAGAWA
G01 - MEASURING TESTING
Information
Patent Application
TECHNOLOGIES FOR HIGH RESOLUTION AND WIDE SWATH SPECTROMETER
Publication number
20220113192
Publication date
Apr 14, 2022
ABB Schweiz AG
Florent M. Prel
G01 - MEASURING TESTING
Information
Patent Application
CURVED VOLUME PHASE HOLOGRAPHIC (VPH) DIFFRACTION GRATING WITH TILT...
Publication number
20150168625
Publication date
Jun 18, 2015
The University of North Carolina at Chapel Hill
J. Christopher Clemens
G02 - OPTICS
Information
Patent Application
Ultracompact Fabry-Perot Array For Ultracompact Hyperspectral Imaging
Publication number
20140354999
Publication date
Dec 4, 2014
THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK
Dirk R. Englund
G01 - MEASURING TESTING
Information
Patent Application
SNAPSHOT SPATIAL HETERODYNE IMAGING POLARIMETRY
Publication number
20140078298
Publication date
Mar 20, 2014
Michael W. Kudenov
G02 - OPTICS
Information
Patent Application
CURVED VOLUME PHASE HOLOGRAPHIC (VPH) DIFFRACTION GRATING WITH TILT...
Publication number
20140022615
Publication date
Jan 23, 2014
J. Christopher Clemens
G02 - OPTICS
Information
Patent Application
ULTRA-COMPACT SNAPSHOT IMAGING FOURIER TRANSFORM SPECTROMETER
Publication number
20120268745
Publication date
Oct 25, 2012
Arizona Board of Regents on Behalf of The University of Arizona
Michael W. Kudenov
G01 - MEASURING TESTING