with roll call arrangements for redundant substitutions

Industry

CPC
G11C29/835

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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/835with roll call arrangements for redundant substitutions

Industries

Patents Grantslast 30 patents

Information Patent Grant
Memory device and memory system capable of using redundancy memory...
- Patent number 11,901,032
- Issue date Feb 13, 2024
- SK Hynix Inc.
- Hyung-Sik Won
- G11 - INFORMATION STORAGE
Information Patent Grant
Redundancy in microelectronic devices, and related methods, devices...
- Patent number 11,615,845
- Issue date Mar 28, 2023
- Micron Technology, Inc.
- Toru Ishikawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Media error reporting improvements for storage drives
- Patent number 11,482,294
- Issue date Oct 25, 2022
- Kioxia Corporation
- Neil Buxton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory system for activating redundancy memory cell and operating m...
- Patent number 11,437,120
- Issue date Sep 6, 2022
- SK Hynix Inc.
- Hyung-Sik Won
- G11 - INFORMATION STORAGE
Information Patent Grant
Media error reporting improvements for storage drives
- Patent number 11,049,581
- Issue date Jun 29, 2021
- TOSHIBA MEMORY CORPORATION
- Neil Buxton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory system for activating redundancy memory cell and operating m...
- Patent number 10,998,082
- Issue date May 4, 2021
- SK Hynix Inc.
- Hyung-Sik Won
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for SOC with optimal RSMA
- Patent number 10,789,398
- Issue date Sep 29, 2020
- Synopsys, Inc.
- Suren Martirosyan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for testing MRAM device and test apparatus thereof
- Patent number 10,665,321
- Issue date May 26, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Yu Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and semiconductor system
- Patent number 10,629,249
- Issue date Apr 21, 2020
- SK Hynix Inc.
- Sang Hyun Ku
- G11 - INFORMATION STORAGE
Information Patent Grant
Media error reporting improvements for storage drives
- Patent number 10,607,712
- Issue date Mar 31, 2020
- TOSHIBA MEMORY CORPORATION
- Neil Buxton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device and semiconductor system
- Patent number 10,490,246
- Issue date Nov 26, 2019
- SK Hynix Inc.
- Sang Hyun Ku
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device
- Patent number 10,381,104
- Issue date Aug 13, 2019
- SK hynix Inc.
- Young-Kyu Noh
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device including a roll call circuit for outputting a...
- Patent number 10,068,662
- Issue date Sep 4, 2018
- Micron Technology, Inc.
- Masashi Oya
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for outputting addresses of defective memor...
- Patent number 9,704,597
- Issue date Jul 11, 2017
- Micron Technology, Inc.
- Masashi Oya
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device, semiconductor repair system including the sam...
- Patent number 9,202,596
- Issue date Dec 1, 2015
- SK Hynix Inc.
- Seon-Ki Cho
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device and operating method thereof
- Patent number 9,196,378
- Issue date Nov 24, 2015
- SK Hynix Inc.
- Seon-Ki Cho
- G11 - INFORMATION STORAGE
Information Patent Grant
Redundancy circuit and semiconductor memory device
- Patent number 8,015,457
- Issue date Sep 6, 2011
- Elpida Memory, Inc.
- Yasuji Koshikawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 7,502,258
- Issue date Mar 10, 2009
- Kabushiki Kaisha Toshiba
- Koichi Kawai
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 7,463,515
- Issue date Dec 9, 2008
- Kabushiki Kaisha Toshiba
- Masanobu Shirakawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Redundancy circuit and semiconductor apparatus having the redundanc...
- Patent number 7,411,845
- Issue date Aug 12, 2008
- Elpida Memory, Inc.
- Takuyo Kodama
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 7,286,420
- Issue date Oct 23, 2007
- Kabushiki Kaisha Toshiba
- Koichi Kawai
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 7,110,294
- Issue date Sep 19, 2006
- Kabushiki Kaisha Toshiba
- Koichi Kawai
- G11 - INFORMATION STORAGE
Information Patent Grant
Field repairable embedded memory in system-on-a-chip
- Patent number 6,886,117
- Issue date Apr 26, 2005
- Hewlett-Packard Development Company, L.P.
- Joseph Ku
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of verifying a semiconductor integrated circuit apparatus, w...
- Patent number 6,845,043
- Issue date Jan 18, 2005
- Elpida Memory, Inc.
- Chiaki Dono
- G11 - INFORMATION STORAGE
Information Patent Grant
Data memory
- Patent number 6,507,917
- Issue date Jan 14, 2003
- NEC Corporation
- Yoshifumi Mochida
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile semiconductor memory device and test method with memory...
- Patent number 6,404,683
- Issue date Jun 11, 2002
- Oki Electric Industry Co., Ltd.
- Naotaka Yumoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of testing integrated circuit including a DRAM
- Patent number 6,228,666
- Issue date May 8, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Kenji Kawano
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated memory having a self-repair function
- Patent number 6,178,124
- Issue date Jan 23, 2001
- Siemens Aktiengesllschaft
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device preventing repeated use of spare memory...
- Patent number 6,178,125
- Issue date Jan 23, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Mitsutaka Niiro
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for automatically programming a redundancy map for a redunda...
- Patent number 6,141,779
- Issue date Oct 31, 2000
- Hewlett-Packard Company
- J. Michael Hill
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
MEMORY DEVICE AND MEMORY SYSTEM
- Publication number 20220262452
- Publication date Aug 18, 2022
- SK HYNIX INC.
- Hyung-Sik WON
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE AND MEMORY SYSTEM
- Publication number 20220262454
- Publication date Aug 18, 2022
- SK HYNIX INC.
- Hyung-Sik WON
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE AND MEMORY SYSTEM
- Publication number 20220262453
- Publication date Aug 18, 2022
- SK HYNIX INC.
- Hyung-Sik WON
- G11 - INFORMATION STORAGE
Information Patent Application
MEDIA ERROR REPORTING IMPROVEMENTS FOR STORAGE DRIVES
- Publication number 20210287756
- Publication date Sep 16, 2021
- Toshiba Memory Corporation
- Neil Buxton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEDIA ERROR REPORTING IMPROVEMENTS FOR STORAGE DRIVES
- Publication number 20200303029
- Publication date Sep 24, 2020
- Toshiba Memory Corporation
- Neil Buxton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE AND MEMORY SYSTEM
- Publication number 20200279612
- Publication date Sep 3, 2020
- SK HYNIX INC.
- Hyung-Sik WON
- G11 - INFORMATION STORAGE
Information Patent Application
MEDIA ERROR REPORTING IMPROVEMENTS FOR STORAGE DRIVES
- Publication number 20200105359
- Publication date Apr 2, 2020
- Toshiba Memory Corporation
- Neil Buxton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Redundancy circuit and semiconductor memory device
- Publication number 20080144410
- Publication date Jun 19, 2008
- ELPIDA MEMORY, INC.
- Yasuji Koshikawa
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20080123410
- Publication date May 29, 2008
- Kabushiki Kaisha Toshiba
- Masanobu Shirakawa
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20080043550
- Publication date Feb 21, 2008
- Kabushiki Kaisha Toshiba
- Koichi Kawai
- G11 - INFORMATION STORAGE
Information Patent Application
Redundancy circuit and semiconductor apparatus having the redundanc...
- Publication number 20070103999
- Publication date May 10, 2007
- Takuyo Kodama
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device
- Publication number 20070081403
- Publication date Apr 12, 2007
- Yasuhiro Nanba
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device
- Publication number 20060256627
- Publication date Nov 16, 2006
- Kabushiki Kaisha Toshiba
- Koichi Kawai
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device
- Publication number 20060018157
- Publication date Jan 26, 2006
- Kabushiki Kaisha Toshiba
- Koichi Kawai
- G11 - INFORMATION STORAGE
Information Patent Application
Method of verifying a semiconductor integrated circuit apparatus, w...
- Publication number 20030107931
- Publication date Jun 12, 2003
- Chiaki Dono
- G11 - INFORMATION STORAGE
Information Patent Application
Field repairable embedded memory in system-on-a-chip
- Publication number 20030097627
- Publication date May 22, 2003
- Joseph Ku
- G11 - INFORMATION STORAGE
Information Patent Application
Nonvolatile semiconductor memory device and test method with memory...
- Publication number 20020031017
- Publication date Mar 14, 2002
- Naotaka Yumoto
- G11 - INFORMATION STORAGE

with roll call arrangements for redundant substitutions

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Memory device and memory system capable of using redundancy memory...

Redundancy in microelectronic devices, and related methods, devices...

Media error reporting improvements for storage drives

Memory system for activating redundancy memory cell and operating m...

Media error reporting improvements for storage drives

Memory system for activating redundancy memory cell and operating m...

Method and apparatus for SOC with optimal RSMA

Method for testing MRAM device and test apparatus thereof

Semiconductor device and semiconductor system

Media error reporting improvements for storage drives

Semiconductor device and semiconductor system

Semiconductor device

Semiconductor device including a roll call circuit for outputting a...

Apparatuses and methods for outputting addresses of defective memor...

Semiconductor device, semiconductor repair system including the sam...

Semiconductor memory device and operating method thereof

Redundancy circuit and semiconductor memory device

Semiconductor memory device

Semiconductor memory device

Redundancy circuit and semiconductor apparatus having the redundanc...

Semiconductor memory device

Semiconductor memory device

Field repairable embedded memory in system-on-a-chip

Method of verifying a semiconductor integrated circuit apparatus, w...

Data memory

Nonvolatile semiconductor memory device and test method with memory...

Method of testing integrated circuit including a DRAM

Integrated memory having a self-repair function

Semiconductor memory device preventing repeated use of spare memory...

Method for automatically programming a redundancy map for a redunda...

Patents Applicationslast 30 patents

MEMORY DEVICE AND MEMORY SYSTEM

MEMORY DEVICE AND MEMORY SYSTEM

MEMORY DEVICE AND MEMORY SYSTEM

MEDIA ERROR REPORTING IMPROVEMENTS FOR STORAGE DRIVES

MEDIA ERROR REPORTING IMPROVEMENTS FOR STORAGE DRIVES

MEMORY DEVICE AND MEMORY SYSTEM

MEDIA ERROR REPORTING IMPROVEMENTS FOR STORAGE DRIVES

Redundancy circuit and semiconductor memory device

SEMICONDUCTOR MEMORY DEVICE

SEMICONDUCTOR MEMORY DEVICE

Redundancy circuit and semiconductor apparatus having the redundanc...

Semiconductor memory device

Semiconductor memory device

Semiconductor memory device

Method of verifying a semiconductor integrated circuit apparatus, w...

Field repairable embedded memory in system-on-a-chip

Nonvolatile semiconductor memory device and test method with memory...